GB8319574D0 - Self-test method - Google Patents

Self-test method

Info

Publication number
GB8319574D0
GB8319574D0 GB838319574A GB8319574A GB8319574D0 GB 8319574 D0 GB8319574 D0 GB 8319574D0 GB 838319574 A GB838319574 A GB 838319574A GB 8319574 A GB8319574 A GB 8319574A GB 8319574 D0 GB8319574 D0 GB 8319574D0
Authority
GB
United Kingdom
Prior art keywords
self
test method
test
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
GB838319574A
Other versions
GB2125973A (en
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tektronix Inc
Original Assignee
Tektronix Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tektronix Inc filed Critical Tektronix Inc
Publication of GB8319574D0 publication Critical patent/GB8319574D0/en
Publication of GB2125973A publication Critical patent/GB2125973A/en
Withdrawn legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/30—Marginal testing, e.g. by varying supply voltage
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/316—Testing of analog circuits
    • G01R31/3161—Marginal testing

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
GB08319574A 1982-08-23 1983-07-20 Self-test method and apparatus Withdrawn GB2125973A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US41021682A 1982-08-23 1982-08-23

Publications (2)

Publication Number Publication Date
GB8319574D0 true GB8319574D0 (en) 1983-08-24
GB2125973A GB2125973A (en) 1984-03-14

Family

ID=23623764

Family Applications (1)

Application Number Title Priority Date Filing Date
GB08319574A Withdrawn GB2125973A (en) 1982-08-23 1983-07-20 Self-test method and apparatus

Country Status (6)

Country Link
JP (1) JPS5965270A (en)
CA (1) CA1198775A (en)
DE (1) DE3330270A1 (en)
FR (1) FR2532056A1 (en)
GB (1) GB2125973A (en)
NL (1) NL8302920A (en)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01170875A (en) * 1987-12-25 1989-07-05 Pfu Ltd Voltage guarantee testing device
DE59509782D1 (en) * 1995-08-23 2001-12-06 Siemens Building Tech Ag Fire alarm
US6985826B2 (en) * 2003-10-31 2006-01-10 Hewlett-Packard Development Company, L.P. System and method for testing a component in a computer system using voltage margining
WO2006075374A1 (en) * 2005-01-13 2006-07-20 Hitachi Ulsi Systems Co., Ltd. Semiconductor device and test method thereof

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3577073A (en) * 1969-02-18 1971-05-04 Control Data Corp Apparatus for automated computer maintenance comprising means for varying the input signal switching threshold voltage for any of a plurality of electronic circuits
JPS55119074A (en) * 1979-03-09 1980-09-12 Toshiba Corp Test apparatus for ic
US4335457A (en) * 1980-08-08 1982-06-15 Fairchild Camera & Instrument Corp. Method for semiconductor memory testing
WO1982000896A1 (en) * 1980-09-08 1982-03-18 Proebsting R Go/no go margin test circuit for semiconductor memory
DE3134995A1 (en) * 1981-02-06 1983-03-17 Robert Bosch Gmbh, 7000 Stuttgart Process and apparatus for detecting changes in information in programmable memories
US4503538A (en) * 1981-09-04 1985-03-05 Robert Bosch Gmbh Method and system to recognize change in the storage characteristics of a programmable memory

Also Published As

Publication number Publication date
CA1198775A (en) 1985-12-31
GB2125973A (en) 1984-03-14
DE3330270A1 (en) 1984-02-23
NL8302920A (en) 1984-03-16
JPS5965270A (en) 1984-04-13
FR2532056A1 (en) 1984-02-24

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Legal Events

Date Code Title Description
WAP Application withdrawn, taken to be withdrawn or refused ** after publication under section 16(1)