GB778552A - Gauging head and master fixture for multiprobe gauging apparatus - Google Patents

Gauging head and master fixture for multiprobe gauging apparatus

Info

Publication number
GB778552A
GB778552A GB5751/56A GB575156A GB778552A GB 778552 A GB778552 A GB 778552A GB 5751/56 A GB5751/56 A GB 5751/56A GB 575156 A GB575156 A GB 575156A GB 778552 A GB778552 A GB 778552A
Authority
GB
United Kingdom
Prior art keywords
probe
probes
pins
head
probe head
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB5751/56A
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Individual
Original Assignee
Individual
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Individual filed Critical Individual
Publication of GB778552A publication Critical patent/GB778552A/en
Expired legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B5/00Measuring arrangements characterised by the use of mechanical techniques
    • G01B5/20Measuring arrangements characterised by the use of mechanical techniques for measuring contours or curvatures
    • G01B5/204Measuring arrangements characterised by the use of mechanical techniques for measuring contours or curvatures of screw-threads

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Recording Measured Values (AREA)

Abstract

778,552. Contour gauges. TANDLER, W. S. Feb. 24, 1956 [April 13, 1955], No. 5751/56. Class 106 (2). The profile e.g. of a turbine blade is gauged by means of a probe head having a plurality of probes, 30-33, 30a-33a, 30b-33b, Fig. 2, mounted on a support in a two-dimensional array, transverse and normal to the transverse, to the longitudinal direction of the probes, the probes being independently adjustable in the longitudinal direction and means being provided for adjusting the relative spacing. As shown, the probes are adjustably mounted in carriers 70-73 with respect to which they are also resiliently displaceable on contacting the workpiece and the carriers are supported on platforms 42 secured to L-shaped edging members 60, 60<SP>1</SP> in turn supported on shelves 50-50<SP>1</SP>, the edging members and the shelves being adjustably bolted to slotted standards 41, 41<SP>1</SP>. In use, the probe head is set up with reference to a master fixture 25, Fig. 7, having a number of pins 90, each corresponding to a probe, adjustably mounted in a block supported on a base 81 having an accurately machined bottom face, and accurately machined reference pins 83, 84 by means of which the block may be accurately positioned on a surface 10 with reference edges 121, 122. By means of a probe 130 following the path shown in dotted lines in Fig. 7, each pin may be accurately adjusted in space, it being locked in position by the corresponding screw 105. The pins are set up to correspond in location and contour with the desired contour. The probe head is then positioned with the edge 26 of its base along a reference line 27, Fig. 1, and the probes adjusted to engage with the pins. The head is then retracted and the part 12 under test substituted for the master fixture 25. The probe head is then moved forwardly until each probe has contacted the workpiece. On contact, a circuit is closed by each probe to mark a record sheet 35 by means of associated stylii 30<SP>1</SP>-33<SP>1</SP>. The deviation from standard is shown by the deviation of the recorded marks 36 from the line 27<SP>1</SP> corresponding to the datum 27.
GB5751/56A 1955-04-13 1956-02-24 Gauging head and master fixture for multiprobe gauging apparatus Expired GB778552A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US778552XA 1955-04-13 1955-04-13

Publications (1)

Publication Number Publication Date
GB778552A true GB778552A (en) 1957-07-10

Family

ID=22140449

Family Applications (1)

Application Number Title Priority Date Filing Date
GB5751/56A Expired GB778552A (en) 1955-04-13 1956-02-24 Gauging head and master fixture for multiprobe gauging apparatus

Country Status (1)

Country Link
GB (1) GB778552A (en)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2977533A (en) * 1957-11-07 1961-03-28 Sheffield Corp Gaging device
US4400884A (en) * 1980-10-02 1983-08-30 The Boeing Company Skin contour inspection system
US4549358A (en) * 1983-05-27 1985-10-29 Jean Auge Apparatus for automatic measurement and classification of carcases
GB2167862A (en) * 1984-12-01 1986-06-04 Sigma Ltd Component inspection apparatus
CN112985218A (en) * 2021-03-10 2021-06-18 苏州船用动力系统股份有限公司 Center positioning tool
CN113772378A (en) * 2021-09-13 2021-12-10 天津昌润鹏科技有限公司 Automatic probe placing device and using method

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2977533A (en) * 1957-11-07 1961-03-28 Sheffield Corp Gaging device
US4400884A (en) * 1980-10-02 1983-08-30 The Boeing Company Skin contour inspection system
US4549358A (en) * 1983-05-27 1985-10-29 Jean Auge Apparatus for automatic measurement and classification of carcases
GB2167862A (en) * 1984-12-01 1986-06-04 Sigma Ltd Component inspection apparatus
CN112985218A (en) * 2021-03-10 2021-06-18 苏州船用动力系统股份有限公司 Center positioning tool
CN113772378A (en) * 2021-09-13 2021-12-10 天津昌润鹏科技有限公司 Automatic probe placing device and using method
CN113772378B (en) * 2021-09-13 2023-06-13 天津昌润鹏科技有限公司 Automatic probe wobble plate device and use method

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