GB2582065B - On-chip resonance detection and transfer function mapping of resistive-inductive-capacitive sensors - Google Patents

On-chip resonance detection and transfer function mapping of resistive-inductive-capacitive sensors Download PDF

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Publication number
GB2582065B
GB2582065B GB2001341.3A GB202001341A GB2582065B GB 2582065 B GB2582065 B GB 2582065B GB 202001341 A GB202001341 A GB 202001341A GB 2582065 B GB2582065 B GB 2582065B
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United Kingdom
Prior art keywords
inductive
resistive
transfer function
capacitive sensors
resonance detection
Prior art date
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Active
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GB2001341.3A
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GB2582065A (en
GB202001341D0 (en
Inventor
Das Tejasvi
Maru Siddharth
Beardsworth Matthew
E Duewer Bruce
Allan Kost Michael
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Cirrus Logic International Semiconductor Ltd
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Cirrus Logic International Semiconductor Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
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Priority claimed from US16/455,437 external-priority patent/US10935620B2/en
Application filed by Cirrus Logic International Semiconductor Ltd filed Critical Cirrus Logic International Semiconductor Ltd
Publication of GB202001341D0 publication Critical patent/GB202001341D0/en
Publication of GB2582065A publication Critical patent/GB2582065A/en
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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D18/00—Testing or calibrating apparatus or arrangements provided for in groups G01D1/00 - G01D15/00
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D18/00—Testing or calibrating apparatus or arrangements provided for in groups G01D1/00 - G01D15/00
    • G01D18/002—Automatic recalibration
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
    • G01R31/2829—Testing of circuits in sensor or actuator systems
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables
    • G01R27/2688—Measuring quality factor or dielectric loss, e.g. loss angle, or power factor

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Gyroscopes (AREA)
GB2001341.3A 2019-02-26 2020-01-31 On-chip resonance detection and transfer function mapping of resistive-inductive-capacitive sensors Active GB2582065B (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US201962810696P 2019-02-26 2019-02-26
US16/455,437 US10935620B2 (en) 2019-02-26 2019-06-27 On-chip resonance detection and transfer function mapping of resistive-inductive-capacitive sensors

Publications (3)

Publication Number Publication Date
GB202001341D0 GB202001341D0 (en) 2020-03-18
GB2582065A GB2582065A (en) 2020-09-09
GB2582065B true GB2582065B (en) 2021-09-08

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Application Number Title Priority Date Filing Date
GB2001341.3A Active GB2582065B (en) 2019-02-26 2020-01-31 On-chip resonance detection and transfer function mapping of resistive-inductive-capacitive sensors

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GB (1) GB2582065B (en)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10948313B2 (en) 2019-02-26 2021-03-16 Cirrus Logic, Inc. Spread spectrum sensor scanning using resistive-inductive-capacitive sensors
US11579030B2 (en) 2020-06-18 2023-02-14 Cirrus Logic, Inc. Baseline estimation for sensor system
US11835410B2 (en) 2020-06-25 2023-12-05 Cirrus Logic Inc. Determination of resonant frequency and quality factor for a sensor system
US11868540B2 (en) 2020-06-25 2024-01-09 Cirrus Logic Inc. Determination of resonant frequency and quality factor for a sensor system
US11619519B2 (en) 2021-02-08 2023-04-04 Cirrus Logic, Inc. Predictive sensor tracking optimization in multi-sensor sensing applications
US11808669B2 (en) * 2021-03-29 2023-11-07 Cirrus Logic Inc. Gain and mismatch calibration for a phase detector used in an inductive sensor
US11821761B2 (en) 2021-03-29 2023-11-21 Cirrus Logic Inc. Maximizing dynamic range in resonant sensing
US11979115B2 (en) 2021-11-30 2024-05-07 Cirrus Logic Inc. Modulator feedforward compensation
US11854738B2 (en) 2021-12-02 2023-12-26 Cirrus Logic Inc. Slew control for variable load pulse-width modulation driver and load sensing

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20090278685A1 (en) * 2008-05-12 2009-11-12 General Electric Company Methods and systems for calibration of rfid sensors
WO2016032704A1 (en) * 2014-08-25 2016-03-03 3M Innovative Properties Company Capacitive-based touch apparatus and method with reduced interference
GB2573644A (en) * 2018-03-29 2019-11-13 Cirrus Logic Int Semiconductor Ltd Resonant phase sensing of resistive-inductive-capacitive sensors

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20090278685A1 (en) * 2008-05-12 2009-11-12 General Electric Company Methods and systems for calibration of rfid sensors
WO2016032704A1 (en) * 2014-08-25 2016-03-03 3M Innovative Properties Company Capacitive-based touch apparatus and method with reduced interference
GB2573644A (en) * 2018-03-29 2019-11-13 Cirrus Logic Int Semiconductor Ltd Resonant phase sensing of resistive-inductive-capacitive sensors

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Publication number Publication date
GB2582065A (en) 2020-09-09
GB202001341D0 (en) 2020-03-18

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