GB2552195A

GB2552195A - Interferometric scattering microscopy

Info

Publication number: GB2552195A
Application number: GB1612182.4A
Authority: GB
Inventors: Kukura Philipp; Alexander Weigel
Original assignee: Oxford University Innovation Ltd
Current assignee: Oxford University Innovation Ltd
Priority date: 2016-07-13
Filing date: 2016-07-13
Publication date: 2018-01-17
Also published as: WO2018011591A1; JP7260467B2; JP2019520612A; US20190004299A1; ES2845077T3; US10775597B2; US20230359009A1; CN109477955A; EP3485309A1; CN109477955B; LT3485309T; GB201612182D0; EP3923054A1; US20200386975A1; EP3485309B1; KR20190028448A; KR102402863B1

Abstract

An interferometric scattering microscope 1 suitable for medical use with biological samples, such as proteins, viruses or nanoparticles, has a sample holder 2, an illumination source 4, a detector 5, an optical system which directs illuminating light onto the sample and directs both light reflected and scattered from the sample to the detector and a spatial filter 20 which produces a greater reduction in intensity of light within a predetermined numerical aperture than at larger apertures. The predetermined numerical aperture may be the numerical aperture of the illuminating light reflected from the sample location. The spatial filter may reduce intensity within said numerical aperture to 10-2 of the incident intensity or less. The illuminating light may be spatially and temporally coherent. The optical system may comprise a beam splitter arranged to split the optical paths for the illuminating light and the output light, the spatial filter being part of the beam splitter. A spatial filter as used in the microscope and method of adapting an interferometric scattering microscope to produce the microscope above are also claimed.

Description

(54) Title of the Invention: Interferometric scattering microscopy

Abstract Title: Interferometric scattering microscope with selective spatial filter (57) An interferometric scattering microscope 1 suitable for medical use with biological samples, such as proteins, viruses or nanoparticles, has a sample holder 2, an illumination source 4, a detector 5, an optical system which directs illuminating light onto the sample and directs both light reflected and scattered from the sample to the detector and a spatial filter 20 which produces a greater reduction in intensity of light within a predetermined numerical aperture than at larger apertures. The predetermined numerical aperture may be the numerical aperture of the illuminating light reflected from the sample location. The spatial filter may reduce intensity within said numerical aperture to 10² of the incident intensity or less. The illuminating light may be spatially and temporally coherent. The optical system may comprise a beam splitter arranged to split the optical paths for the illuminating light and the output light, the spatial filter being part of the beam splitter. A spatial filter as used in the microscope and method of adapting an interferometric scattering microscope to produce the microscope above are also claimed.

Fig. 1

At least one drawing originally filed was informal and the print reproduced here is taken from a later filed formal copy.

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Interferometric Scattering Microscopy

The present invention relates to interferometric scattering microscopy (referred to herein as iSCAT).

iSCAT has materialized as a powerful approach to both single particle tracking with unique spatiotemporal resolution and label-free sensitivity down to the single molecule level. iSCAT is disclosed, for example in Kukura et al., “High-speed nanoscopic tracking of the position and orientation of a single virus”, Nature Methods 2009 6:923-935, and in Ortega-Arroyo et al. “Interferometric scattering microscopy (iSCAT): new frontiers in ultrafast and ultrasensitive optical microscopy”, Physical Chemistry Chemical Physics 2012 14:15625-15636. Despite considerable potential, widespread application of iSCAT has been limited by the requirement for custom-built microscopes, unconventional cameras and complex sample illumination.

It would be desirable to provide microscopy having similar benefits to iSCAT with a simplified microscope.

According to a first aspect of the present invention, there is provided an interferometric scattering microscope comprising: a sample holder for holding a sample in a sample location; an illumination source arranged to provide illuminating light; a detector; an optical system being arranged to direct illuminating light onto the sample location and being arranged to collect output light, comprising both light scattered from the sample location and illuminating light reflected from or transmitted through the sample location, and direct the output light to the detector; and a spatial filter positioned to filter the output light, the spatial filter being arranged to pass output light but with a reduction in intensity that is greater within a predetermined numerical aperture than at larger numerical apertures.

Whereas the overall arrangement of the microscope may be similar to a conventional iSCAT microscope, there is additionally provided a spatial filter, which affects the output light. Specifically, the spatial filter passes the output light but with a reduction in intensity that is greater within a predetermined numerical aperture than at larger numerical apertures. As a result, the spatial filter selectively reduces the intensity of the illuminating light over scattered light, by taking advantage of the mismatch between the numerical aperture of reflected illuminating light and of light scattered from objects in a sample at the sample location. Thus, the spatial filter takes advantage of the different directionalities of these two sources of light. The reflected illuminating light will typically have a relatively small numerical aperture, whereas sub-diffraction-sized objects near a surface of the sample scatter light preferentially into high numerical apertures. Therefore, the reduction in intensity by the spatial filter at low numerical apertures predominantly affects the illuminating light and has a minimal effect on the scattered light, thereby maximising the imaging contrast.

This effect may be maximised by arranging the spatial filter so that the predetermined numerical aperture is identical or similar to the numerical aperture of the illuminating light reflected from the sample location.

The first aspect of the present invention relates to a microscope that operates in reflection. In that case, the illuminating light that reaches the detector is reflected predominantly from a surface of the sample, typically an interface between the sample and the sample holder, thereby providing interference with objects in the sample close to that surface. This provides an image with high contrast. This effect differs from a microscope operating in transmission wherein the illuminating light that reaches the detector is transmitted through the depth of the sample.

These factors enhance the imaging contrast and thereby enables high contrast detection of weakly scattering objects. This improvement allows the experimental implementation of iSCAT to be dramatically simplified, for example to the point of trivial compatibility with existing microscopes. Compared to existing iSCAT microscopes, this allows similar sensitivity to be achieved, but with much simplified microscopes, for example without requiring an optical table, or expensive and complex optics, electronics and expert operation. For example, larger fields of view may be provided without complex scanning arrangements and the use of low cost imaging cameras is enabled without loss of imaging performance or sensitivity.

These advantages apply particularly for imaging of objects that scatter light so weakly that imaging with other techniques is difficult. For example, the present invention may be applied with advantage to a sample comprising objects having a scattering cross section with respect to the illuminating light of 10'¹² m² or less. Typically such objects may also have a scattering cross section with respect to the illuminating light of IO'²⁰ m² or more, i.e. within a range from 10'¹² m² from IO'²⁰ m². Examples of objects that may be studied include proteins, viruses or nanoparticles.

In order to image objects that are relatively weak scatterers, the spatial filter is arranged to pass output light with a reduction in intensity within the predetermined numerical aperture to 10'² of the incident intensity or less. Typically, the spatial filter may be arranged to pass output light with a reduction in intensity within the predetermined numerical aperture to 10'⁴ of the incident intensity or more, for example in the range from 10'² to 10'⁴ of the incident intensity.

The illuminating light may be spatially and temporally coherent, for example using a laser as the light source. Widefield illumination in a microscope is commonly achieved by focussing a collimated laser beam into the back focal plane of the imaging objective, implying that it can be efficiently coupled in and out of the microscope while minimally affecting the overall imaging performance.

The microscope may be an existing commercial microscope, which is adapted by incorporating the spatial filter. Such adaptation can be performed very cheaply and simply, in contrast to existing iSCAT microscopes, which have complex and expensive optical and electronic setups in order to provide the required sensitivity. That allows the present invention to be implemented in an extremely cost-effective manner.

According to a second aspect of the present invention, there is provided a spatial filter for filtering output light of an interferometric scattering microscope, the spatial filter having a similar function to that of the first aspect.

According to a third aspect of the present invention, there is provided a method of adapting an interferometric scattering microscope by performing spatial filtering of output light, the spatial filtering being similar to that performed in the first aspect.

To allow better understanding, embodiments of the present invention will now be described by way of non-limitative example with reference to the accompanying drawings, in which:

Fig. 1 is a schematic diagram of an iSCAT microscope;

Fig. 2 is an image captured by the iSCAT microscope; and

Figs. 3 to 5 are schematic diagrams of modified iSCAT microscopes.

In the microscopes and methods described herein, the light used may be: ultraviolet light (which may be defined herein as having wavelengths in the range from lOnm to 380nm); visible light (which may be defined herein as having wavelengths in the range from 380nm to 740nm); infrared light (which may be defined herein as having wavelengths in the range from 740nm to 300pm). The light may be a mixture of wavelengths. Herein, the terms ‘optical’ and ‘optics’ are used to refer generally to the light to which the methods are applied.

Fig. 1 illustrates an iSCAT microscope 1 which is arranged as follows.

The microscope 1 includes the following components that, except for the spatial filter described in more detail below, have a construction that is conventional in the field of microscopy.

The microscope 1 comprises a sample holder 2 for holding a sample 3 at a sample location. The sample 3 may be a liquid sample comprising objects to be imaged, which are described in more detail below. The sample holder 2 may take any form suitable for holding the sample 3. Typically, the sample holder 2 holds the sample 3 on a surface which forms an interface between the sample holder 2 and the sample 3. For example, the sample holder 2 may be a coverslip and/or may be made from glass. The sample 3 may be provided on the sample holder 2 in a straightforward manner, for example using a micropipette.

The microscope 1 further comprises an illumination source 4 and a detector 5.

The illumination source 4 is arranged to provide illuminating light. The illuminating light may be coherent light. For example, the illumination source 4 may be a laser. The wavelength of the illuminating light may be selected in dependence on the nature of the sample 3 and/or the properties to be examined. In one example, the illuminating light has a wavelength of 405nm.

The detector 5 receives output light from the sample location. Typically, the microscope 1 may operate in a wide-field mode, in which case the detector 5 may be an image sensor that captures an image of the sample 3. The microscope 1 may alternatively operate in a confocal mode, in which case the detector 5 may be an image sensor or may be a point-like detector, such as a photo-diode, in which case a scanning arrangement may be used to scan a region of the sample 3 to build up an image. Examples of image sensors that may be employed as the detector 5 include a CMOS (complementary metal-oxide semiconductor) image sensor or a CCD (charge-coupled device).

The microscope 1 further comprises an optical system 10 arranged between the sample holder 2, the illumination source 4 and the detector 5. The optical system 10 is arranged as follows to direct illuminating light onto the sample location for illuminating the sample 3, and to collect output light from the sample location and to direct the output light to the detector 5.

The optical system 10 includes an objective lens 11 which is a lens system disposed in front of the sample holder 2. The optical system 10 also includes a condenser lens 12 and a tube lens 13.

The condenser lens 12 condenses illuminating light from the light source 11 (shown by continuous lines in Fig. 1) through the objective lens 11 onto the sample 3 at the sample location.

The objective lens 11 collects the output light which comprises both (a) illuminating light reflected from the sample location (shown by continuous lines in Fig. 1), and (b) light scattered from the sample 3 at the sample location (shown by dotted lines in Fig. 1). The reflected light is predominantly reflected from the interface between the sample holder 2 and the sample 3. Typically, this is a relatively weak reflection, for example a glass-water reflection. For example, the intensity of the reflected illuminating light may be of the order of 0.5% of the intensity of the incident illuminating light. The scattered light is scattered by objects in the sample 3.

In a similar manner to conventional iSCAT, scattered light from objects at or close to the surface of the sample constructively interfere with the reflected light and so are visible in the image captured by the detector 5. This effect differs from a microscope operating in transmission wherein the illuminating light that reaches the detector is transmitted through the depth of the sample leading to a much smaller imaging contrast.

As shown in Fig. 1, the reflected illuminating light and the scattered light have different directionalities. In particular, the reflected illuminating light has a numerical aperture resulting from the geometry of the beam of light output by the light source 4 and the optical system 6. The scattered light is scattered over a large range of angles and so fills larger numerical aperture than the reflected illuminating light.

The tube lens 13 focuses the output light from the objective lens 11 onto the detector

5.

The optical system 6 also includes a beam splitter 14 that is arranged to split the optical paths for the illuminating light from the light source 4 and the output light directed to the detector 5. Except for the provision of a spatial filter as described below, the beam splitter 14 may have a conventional construction that provides partial reflection and partial transmission of light incident thereon. For example, the beam splitter 14 may be a plate, typically provided with a film, which may be metallic or dielectric, arranged at 45° to the optical paths. Alternatively, the beam splitter 14 may be a cube beam splitter formed by a matched pair of prisms having a partially reflective film at the interface between the prisms.

In the example shown in Fig. 1, the light source 4 is offset from the optical path of the objective lens 11 so that the illuminating light from the light source 4 is reflected by the beam splitter 14 into the objective lens 11, and conversely the detector 5 is aligned with the optical path of the objective lens 11 so that the output light from the sample location is transmitted through the beam splitter 14 towards the detector 5.

In addition to the components described above that may be of a conventional construction, the microscope 1 includes a spatial filter 20. In the example shown in Fig. 1, the spatial filter 20 is formed on the beam splitter 14 and is thereby positioned behind the back aperture of the objective lens 11, and so behind the back focal plane 15 of the objective lens 11. Thus, the spatial filter 20 may be implemented without entering the objective lens as in phase contrast microscopy. However this location is not essential and a spatial filter having an equivalent function may be provided elsewhere as described below.

The spatial filter 20 is thereby positioned to filter the output light passing to the detector 5. In the example shown in Fig. 1 in which the detector 5 is aligned with the optical path of the objective lens 11, the spatial filter 20 is therefore transmissive.

The spatial filter 20 is partially transmissive and therefore passes the output light, which includes the reflected illumination light, but with a reduction in intensity. The spatial filter 20 is also aligned with the optical axis and has a predetermined aperture so that it provides a reduction in intensity within a predetermined numerical aperture. Herein, numerical aperture is defined in its normal manner as being a dimensionless quantity characterising a range of angles with respect to the sample location from which the output light originates. Specifically, the numerical aperture NA may be defined by the equation NA=n»sin(0), where Θ is the half angle of collection and n is the refractive index of the material through which the output light passes (for example the material of the components of the optical system 6).

The spatial filter 20 provides no intensity reduction outside the predetermined numerical aperture. In principle, the spatial filter 20 could alternatively provide a reduction in intensity outside its predetermined aperture, but a reduction in intensity that is less than the reduction in intensity within the predetermined numerical aperture, although this is less desirable.

The spatial filter 20 may be formed in any suitable manner, typically comprising a layer of deposited material. The material may be, for example, a metal such as silver. The deposition may be performed using any suitable technique.

As sub-diffraction sized objects near an interface scatter light preferentially into a larger numerical aperture than the reflected illuminating light, the reduction in intensity provided by the spatial filter 20 preferentially reduces the intensity in detection of the reflected illuminating light over the scattered light. Accordingly, the reduction in intensity by the spatial filter 20 at low numerical apertures predominantly affects the reflected illuminating light and has a minimal effect on the scattered light, thereby maximising the contrast in the capture image. The enhanced imaging contrast enables high contrast detection of objects that are weak scatterers.

The contrast enhancement may be understood as follows. As the spatial filter 20 passes part of the output light in the predetermined numerical aperture (i.e. is partially transmissive in this example), fractions of illuminating light and scattered light fields reach the detector and interfere for a sufficiently coherent illumination source. The light intensity reaching the detector Idet is then given by Idet = \E_mc\²{r^+ls’F-KZrZjs’lcos^}, where E_mc is the incident light field, r² is the reflectivity of the interface and t² is the transmissivity of the spatial filter 20, s is the scattering amplitude of the object, and Φ is the phase difference between transmitted illuminating light and the scattered light. Thus, the scattering contrast is enhanced, albeit at the expense of the total number of detected photons.

Thus, contrast is provided in a similar manner to conventional iSCAT, but controlled additionally by the transmissivity of the spatial filter. This provides the ability to tune the amplitude of the reference field directly through selection of the transmissivity t² of the spatial filter 20 as opposed to being fixed by the reflectivity of a glass-water interface as in standard iSCAT. In the case that the spatial filter 20 is a layer of deposited material, the transmissivity t² may be selected by choice of the material and/or thickness of the layer. Such tuning may be performed according to, for example, the scattering object of interest, the camera full well capacity and magnification.

To maximise these beneficial effects to iSCAT, the predetermined numerical aperture may be the numerical aperture of the reflected illuminating light within the output light, but that is not essential. For example, benefits of a similar nature could be achieved if the predetermined numerical aperture was slightly smaller than, or larger than the numerical aperture of the reflected illuminating light.

Use of the spatial filter 20 does not fundamentally alter the sensitivity limits or SNR (signal to noise ratio) achievable for scattering by a given object, incident light intensity and exposure time. However, by improving the contrast and reducing the overall detected photon flux, it does, however, dramatically simplify the implementation of iSCAT to achieve a given sensitivity or SNR. Existing iSCAT microscopes have complex and expensive components, for example requiring an optical table, and expensive and complex optics, electronics, as well as needing expert operation. Such requirements are greatly relaxed by the use of the spatial filter 20. Equivalent performance to existing iSCAT microscopes may be achieved, for example, simply by adding the spatial filter 20 to an existing commercial microscope that does not have the complex and expensive components mentioned above. The spatial filter 20 itself is of course a simple and cheap component. In addition, the spatial filter 20 enables use of standard CMOS or CCD cameras with low full well capacity without loss of imaging sensitivity.

Thus, the microscope 1 may be an existing commercial microscope, which is adapted by incorporating the spatial filter 20. Such an adaptation can be performed very cheaply and simply. The adaption may be performed by forming the spatial filter in an adaptor arranged to be received in an accessory slot of an existing commercial microscope, for example in a similar manner to the adaptor disclosed in WO-2015/092778 that is used to incorporate a mirror into a microscope.

Alternatively, the microscope 1 may be designed specifically for use with the spatial filter 20.

An image acquired using an example of the microscope 1 is shown in Fig. 2. In this example, coherent brightfield illuminating light was provided and the spatial filter 20 comprised by a layer of silver of thickness 180 nm deposited on fused silica with a 3.5 mm diameter so as to transmit 1 χ 10^-2 of the reflected light intensity. This results in a scattering contrast of 1% for a single 395 kDa protein and a SNR of 10 (at an image capture rate of 10 frames s^_1, and with an intensity of illuminating light of 10 kW/cm²). Fig. 2 is an image captured using a low cost CMOS camera as the detector 5. As can be seen, a high contrast image is achieved. Moreover, brightfield illumination ensures that the strongest unwanted back-reflections, usually originating from the objective are directed away from the detector 5, minimising imaging background and enabling large fields of view without complex scanning of the beam of illuminating light.

The advantages of enhanced contrast allow imaging of objects that scatter light so weakly that imaging with other techniques is difficult. For example, the present invention may be applied with advantage to a sample comprising objects having a scattering cross section with respect to the illuminating light of 10'¹² m² or less. Typically such objects may also have a scattering cross section with respect to the illuminating light within a range from IO'¹² m² from 10'²° m². Scattering cross section is a fundamental, measurable property relating to the effective size of an object to incident light of a particular wavelength, independent of the technique used to measure it. Scattering cross sections can be, for example, measured by dark field microscopy.

Examples of objects to which the present invention may be applied include proteins, viruses or nanoparticles.

In order to image objects that are relatively weak scatterers, the spatial filter 20 may be arranged to pass reflected illuminating light with a reduction in intensity within the predetermined numerical aperture to an intensity in the range from 10'² tolO'⁴ of the incident intensity (in this context, the intensity of the output light that is incident on the spatial filter 20).

Otherwise, the microscope 1 may be designed and operated without reference to the spatial filter 20. For example, the field of view is adjustable by changing the focusing conditions of the illumination light. Similarly, multi-colour imaging requires no more than coupling additional laser sources into a single mode fibre, if such a fibre is used to deliver the illumination light. In general terms, the microscope 1 may be adapted to use other components and techniques known for iSCAT, for example as disclosed in Kukura et al., “High-speed nanoscopic tracking of the position and orientation of a single virus”, Nature Methods 2009 6:923-935, and in Ortega-Arroyo et al. “Interferometric scattering microscopy (iSCAT): new frontiers in ultrafast and ultrasensitive optical microscopy”, Physical Chemistry Chemical Physics 2012 14:15625-15636.

Some examples of specific modifications that may be made to microscope 1 will now be described with reference to Figs. 3 to 5, although these examples are without limitation. Apart from the modifications described below, the microscope 1 has the same construction and operation as described above. For brevity, common components are given the same reference numerals, and the above description thereof is not repeated.

Fig. 3 illustrates the microscope 1 with a modification to position the spatial filter 20 at a conjugate focal plane 21 of the back focal plane 15 of the objective lens 11, instead of being behind the back aperture of the objective lens 11. The conjugate focal plane 21 of the back focal plane 15 of the objective lens 11 is formed between a pair of telescope lenses 22 and 23 positioned behind the tube lens 13. The first telescope lens 22 in the optical path images the back focal plane 15 of the objective lens 11 to form the conjugate focal plane 21 and the second telescope lens 23 images the conjugate focal plane 21 onto the detector 5.

The spatial filter 20 is provided at the conjugate focal plane 21 and is formed on a transparent plate 24. The configuration and operation of the spatial filter 20 are the same as described above with reference to Fig. 1, for example being aligned with the optical axis and having a predetermined aperture so that it provides reduction in intensity within the same, predetermined numerical aperture as described above (although the spatial filter 20 is now nearly perpendicular to the optical path, rather than at 45° to the optical path).

Fig. 4 illustrates the microscope 1 with a modification in which the spatial filter 20 is reflective, instead of being transmissive. In this modification, the positions of the light source 4 and the detector 5 are reversed so that the illuminating light from the light source 4 is transmitted through the beam splitter 14 into the objective lens 11, and conversely the output light from the sample location is reflected by the beam splitter 14 towards the detector 5.

The spatial filter 20 is formed on the beam splitter 14, but in view of the reversal of the light source 4 and the detector 5, the spatial filter 20 is reflective. Despite being reflective, the spatial filter 20 is arranged to operate in the same manner as described above. That is, the spatial filter 20 filters the output light passing to the detector 5 passes the output light but with reduction in intensity. Although achieved in this case by being partially reflective, the configuration and operation of the spatial filter 20 is otherwise the same, for example being aligned with the optical axis and having a predetermined aperture so that it provides reduction in intensity within a predetermined numerical aperture, as described above.

Fig. 5 illustrates the microscope 1 with a modification similar to that of Fig. 3 to position the spatial filter 20 at a conjugate focal plane 25 of the back focal plane 15 of the objective lens 11, instead of being behind the back aperture of the objective lens 11, and with a further modification in which the spatial filter 20 is reflective, instead of being transmissive. The conjugate focal plane 25 of the back focal plane 15 of the objective lens 11 is formed between a pair of telescope lenses 22 and 23 positioned behind the tube lens 13, in the same manner is in the modification of Fig. 3. However, a reflective plate 26 is provided between the telescope lenses 22 and 23 at the conjugate focal plane 25 but arranged at 45° to deflect the optical path so that the reflection at the reflective plate 26 diverts the optical path by 90°. The spatial filter 20 is provided at the conjugate focal plane 25 by being formed on the reflective plate 26, and so is reflective instead of transmissive. Despite being reflective, the spatial filter 20 is arranged to operate in the same manner as described above, that is in a similar manner to the modification of Fig. 4.

The microscope 1 may be used to perform iSCAT for a wide range of applications including single molecule detection. In general, the contrast enhancement is beneficial and may be applied to all imaging of sub-diffraction and weakly scattering objects. A particular application is label-free imaging of weak scatterers, where objects of interest have to be invariably detected on top of a large background, which reduces the imaging contrast. The microscope 1 may be used for a wide range of studies and measurements, for example to measure any changes in refractive index, which includes, for example: single molecule binding/unbinding, phase transitions, clustering, assembly/disassembly, aggregation, protein/protein interactions, protein/small molecule interactions, high-sensitivity label-free imaging.

Thus, there are numerous applications for the microscope 1, ranging from fundamental research to industrial applications, for example in the pharmaceutical industry. In particular, it opens up iSCAT to fields precluded by the complex experimental setups currently needed to perform iSCAT. As an example, iSCAT is currently the world’s most sensitive label-free single molecule imaging biosensor, which could have significant impact for example on the surface plasmon resonance sensing market.

Claims

1. An interferometric scattering microscope comprising:

a sample holder for holding a sample in a sample location; an illumination source arranged to provide illuminating light; a detector;

an optical system being arranged to direct illuminating light onto the sample location and being arranged to collect output light, comprising both light scattered from the sample location and illuminating light reflected from the sample location, and direct the output light to the detector; and a spatial filter positioned to filter the output light, the spatial filter being arranged to pass output light but with a reduction in intensity that is greater within a predetermined numerical aperture than at larger numerical apertures.

2. An interferometric scattering microscope according to claim 1, wherein the predetermined numerical aperture is the numerical aperture of the illuminating light reflected from the sample location that is comprised in the output light.

3. An interferometric scattering microscope according to claim 1 or 2, wherein the spatial filter is arranged to pass output light with a reduction in intensity within said predetermined numerical aperture to 10'2 of the incident intensity or less.

4. An interferometric scattering microscope according to any one of the preceding claims, wherein the spatial filter is arranged to pass output light with a reduction in intensity within said predetermined numerical aperture to 10'4 of the incident intensity or more.

5. An interferometric scattering microscope according to any one of the preceding claims, wherein the predetermined numerical aperture is less than 0.5.

6. An interferometric scattering microscope according to any one of the preceding claims, wherein the illuminating light is spatially and temporally coherent.

7. An interferometric scattering microscope according to any one of the preceding claims, wherein the optical system comprises a beam splitter arranged to split the optical paths for the illuminating light and the output light, the spatial filter being part of the beam splitter.

8. An interferometric scattering microscope according to any one of the preceding claims, wherein the spatial filter is transmissive.

9. An interferometric scattering microscope according to any one of claims 1 to 7, wherein the spatial filter is reflective.

10. An interferometric scattering microscope according to any one of the preceding claims, wherein the optical system includes an objective lens and the spatial filter is positioned behind the back aperture of the objective lens.

11. An interferometric scattering microscope according to any one of claims 1 to 9, wherein the optical system includes an objective lens and the spatial filter is positioned at a conjugate focal plane of the back focal plane of the objective lens.

12. An interferometric scattering microscope according to any one of the preceding claims, wherein the sample holder holds a sample comprising objects having a scattering cross section with respect to the illuminating light of 10'12 m2 or less.

13. An interferometric scattering microscope according to claim 12, wherein the sample holder holds a sample comprising objects having a scattering cross section with respect to the illuminating light of IO'20 m2 or more.

14. An interferometric scattering microscope according to any one of the preceding claims, wherein the sample holder holds a sample comprising objects that are proteins or viruses or nanoparticles.

15. A spatial filter for filtering output light of an interferometric scattering microscope, which output light comprises both light scattered from a sample location and illuminating light reflected from the sample location, prior to detection of the output light, the spatial filter being arranged to pass the output light but with a reduction in intensity that is greater within a predetermined numerical aperture than at larger numerical apertures.

16. A spatial filter according to claim 15, wherein the predetermined numerical aperture is the numerical aperture of the illuminating light reflected from the sample location that is comprised in the output light.

17. A spatial filter according to claim 15 or 16, wherein the spatial filter is arranged to pass output light with reduction in intensity within said predetermined numerical aperture to 10'2 of the incident intensity or less.

18. A spatial filter according to any one of claims 15 to 17, wherein the spatial filter is arranged to pass output light with reduction in intensity within said predetermined numerical aperture to 10'4 of the incident intensity or more.

19. A method of adapting an interferometric scattering microscope, the method comprising providing a spatial filter that performs spatial filtering of output light, that comprises both light scattered from a sample at a sample location and illuminating light reflected from the sample location, prior to detection of the output light, the spatial filtering passing the output light but with an intensity reduction that is greater within a predetermined numerical aperture than at larger numerical apertures.

20. A method according to claim 19, wherein the predetermined numerical aperture is the numerical aperture of the illuminating light reflected from the sample location that is comprised in the output light.

21. A method according to claim 19 or 20, wherein the spatial filter is arranged to pass output light with a reduction in intensity within said predetermined numerical aperture 10'2 of the incident intensity or less.

22. A method according to any one of claims 19 to 21, wherein the spatial filter is arranged to pass output light with reduction in intensity within said predetermined numerical aperture to 10'4 of the incident intensity or more.

23. A method according to any one of claims 19 to 22, wherein the predetermined numerical aperture is less than 0.5.

24. A method according to any one of claims 19 to 23, wherein the illuminating light is spatially and temporally coherent.

5

25. A method according to any one of claims 19 to 24, wherein the sample comprises objects having a scattering cross section with respect to the illuminating light of 10'12 m2 or less.

26. A method according to claim 25, wherein the sample comprises objects having a

10 scattering cross section with respect to the illuminating light of IO'20 m2 or more.

27. A method according to any one of claims 19 to 26, wherein the sample comprises objects that are proteins, viruses or nanoparticles.

Intellectual

Property

Office

Application No: GB1612182.4 Examiner: Sophie Cartmell