GB2529496A - Microphotonic spectrum detecting apparatus - Google Patents

Microphotonic spectrum detecting apparatus Download PDF

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Publication number
GB2529496A
GB2529496A GB1423067.6A GB201423067A GB2529496A GB 2529496 A GB2529496 A GB 2529496A GB 201423067 A GB201423067 A GB 201423067A GB 2529496 A GB2529496 A GB 2529496A
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United Kingdom
Prior art keywords
light
rectifying
microphotonic
analysis
light source
Prior art date
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Withdrawn
Application number
GB1423067.6A
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GB2529496A8 (en
Inventor
Yan Jiuzhou
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
CHENGDU ZHONGYUAN QIANYE TECHNOLOGY CO Ltd
Original Assignee
CHENGDU ZHONGYUAN QIANYE TECHNOLOGY CO Ltd
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Priority to GB1423067.6A priority Critical patent/GB2529496A/en
Publication of GB2529496A publication Critical patent/GB2529496A/en
Publication of GB2529496A8 publication Critical patent/GB2529496A8/en
Withdrawn legal-status Critical Current

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Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28Investigating the spectrum
    • G01J3/443Emission spectrometry
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02Details
    • G01J3/0205Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
    • G01J3/0208Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows using focussing or collimating elements, e.g. lenses or mirrors; performing aberration correction
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02Details
    • G01J3/0205Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
    • G01J3/0224Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows using polarising or depolarising elements
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02Details
    • G01J3/0297Constructional arrangements for removing other types of optical noise or for performing calibration
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02Details
    • G01J3/10Arrangements of light sources specially adapted for spectrometry or colorimetry
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/12Generating the spectrum; Monochromators
    • G01J3/18Generating the spectrum; Monochromators using diffraction elements, e.g. grating
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28Investigating the spectrum
    • G01J2003/2866Markers; Calibrating of scan

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  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)

Abstract

A microphotonic spectrum detecting apparatus for photon spectroscopy comprises a beam introducing device 1, a light filter plate 2, a beam rectifying device 3, a light polarizing device 4, a harmonic beam apparatus 5, a grating device 6, a beam folding device 7, an octagonal lens 8, a standard light source device 9, a conversion device 10, an amplification device 11, a steady flow device 12, and recording and display devices 13. The beam introducing device 1 is mainly used to import and select a beam for analysis and may contain a triangular polarizing lens. The standard light source 9 contains a light beam generating electrode where the electrode material is osmium oxide and ruthenium oxide alloy composite material. The standard light source 9 is used for calibration of instrument errors and exclusion of interference errors. By control of the beam polarization attenuation of the light beam is reduced.

Description

MICROPHOTONIC SPECTRUM DETECTING APPARATUS
FIELD OF THE INVENTION
[0001] This invention relates to the field of photon speetroseopy, and in particular the microphotonie spectrum detecting apparatus.
GENERAL BACKGROUND
[0002] Photon spectroscopy is of great significance for the analysis of atomic structure characteristics and the group nature; both single atom gas and metal vapor waves were issued as linear spectrum; when the atomic transition from a higher energy level to the amount of low-level occurs, a single wavelength of light waves is radiated: this single wavelength monochromatic light is absent, since the level itself has a certain width and the reason of Dopp'er ElTect, atomic radiation spectral lines always have spectra lines with width.
[0003] Within a narrow range of wavelengths, the spectra still contain components of different wavelengths; the distribution of Atomic Spectroscopy wavelength reflect the internal structure of atoms; each atom has its own unique spectral series; through the study of atomic spectra. the internal structure of atoms can be understood; the qualitative and quantitative analysis for the component contained in the sample can be achieved.
[0004]But existing photon spectroscopy techniques cannot achieve effective analysis for molecular electronic states due to changes in the generated photons associated with molecular rotation and vibration between states; therefore, prior art need to be improved and to design a new microphotonic spectrum detecting apparatus.
I
SUMMARY
[0005]In order to overcome the deficiencies of prior devices, the present invention adopts the technical solution as follows: [0006]A microphotonic spectrum dctccting apparatus compriscs: a beam introducing device(1), a light filter plate(2) , a beam rectifying device(3), a light polarizing device (4). a harmonic beam apparatus( ), a grating device(6). a beam folding device(7), an octagonal lens (8), a standard light source device(9). a conversion device(1O). a amplification dcvice(11), a steady flow device(12), a recording and display devices(13); wherein the light filter plate(2) is located between beam introducing device(l) and beam rectifying device(3); light polarizing device (4) is connected with beam rectifying device(3); the beam introducing device (1) is mainly used to import and select beam for analysis; the light filter plate (2) is applied to remove foreign interference beam; the beam rectifying device(3) is employed fcr regulation and restraint in the scattering beam; the light polarizing dcvicc(4) is utilized for controlling the polarization of the light beam, to achieve an efficiency promotion of beam delivery and reduce the rapid attenuation of light beam; the harmonic beam apparatus (5) is adopted for adjusting the waveform of the light beam, to avoid the abnormal light beam band; the grating device (6) is introduced for the spcctruin scparation and analysis with the cxtcnt of diffraction spcctrum; the bcani folding device (7)is used for guiding the main light beam propagation path; the octagonal lens (8) is appfied for standard beam isolated analysis; the standard light source device (9) is used to provide correcting light source, for calibration of instrument errors and of exclusion of interference errors; the conversion device(lO) is utilized to convert opticai signals, to achieve visua' analysis of spectral signal; the amplification device (11) is adopted for amplifying the transmission signal; the steady flow device (12) is used for stability control of the transmission signal, preventing cxccssive volatility signals over thc instrument payload; thc recording and display devices (13) is mainly used for display and preservation of signal detection and analysis: the standard light source device (9) contains the light beam generating electrode, the electrode material is osmium oxide and ruthenium oxide alloy composite material.
[0007]The microphotonic spectrum detecting apparatus according to claim 1.
wherein the beam introducing device (I) contains a triangular p&arizing lenses, the lens surface is covered with a thickness of 9.77um hexamethyl chromium bromate nanocomposite filter membrane.
[0008]The beam filter plates (2) contains a filter lens, the lens surface is covered with cadmium triphosphate and tin hexafluorophosphate composite film.
[0009]The beam rectifying device(3) contains transparent rectifying film,whose materiai is zirconium sul late and alluminium sulfate triiodide composite material.
1001 OjThe light polarizing device (4) comprises a p&arizing minor, the minor surface is covered with compound dodecyl rhenium bromate composite material reflective film.
[00l1]Compared with the prior art, the present invention has the advantages that: (1) By control of the beam polarization, realize highly efficient light conduction, reducing the excessive attenuation of the light beam: (2) Through the beam waveform adjusting to avoid abnormal light band; (3) By providing a light source calibration, the instrument error calibration and interference errors exclusion can he achieve;
BRIEF DESCRIPTION OF THE DRAWING
[001 2]Figurc I is a schematic diagram of the present invention; List of reference characters: I beam introducing device, 2 light filter plate, 3 beam rectifying device, 4 light polarizing device, harmonic beam apparatus, 6 grating device, 7 beam folding device, 8 octagonal lens 9 standard light source device, conversion device, 11 amplification device, 12 steady flow device, 13 recording and display devices
DETAILED DESCRIPTION OF PREFERRED EMBODIMENTS
Embodiment I [OOl3jAs shown in Fig. 1, a mierophotonic spectrum detecting apparatus comprises: a beam introducing device(1), a light filter plate(2) , a beam rectifying device(3), a light polarizing device (4), a harmonic beam apparatus(S), a grating device(6). a beam folding device(7), an octagonal lens (8), a standard light source device(9). a conversion device(10). a amplification deviee(11), a steady flow deviee(l2), a recording and display devices(13); wherein the light filter plate(2) is located between beam introducing device(l) and beam rectifying device(3); light polariLing device (4) is connected with beam rectifying device(3); the beam introducing device (1) is mainly used to import and select beam for analysis; the light filter plate (2) is applied to remove foreign
S
interference beam; the beam rectifying device(3) is employed for regulation and restraint in the scattering beam; the light polarizing device(4) is utilized for controlling the polarization of the light beam, to achieve an efficiency pro motion of beam delivery and reduce the rapid attenuation of light beam; the harmonic beam apparatus (5) is adopted icr adjusting the waveform of the light beam, o avoid the abnormal light beam band; the grating device (6) is introduced for the spectrum separation and analysis with the extent of diffraction spectrum; the beam folding device (7)is used for guiding the main light beam propagation path; the octagonal lens (8) is applied for standard beam isolated analysis; the standard light source device (9) is used to provide correcting light source, for calibration of instrument errors and of exclusion of interference errors; the conversion device(lO) is utilized to convert optical signals to achieve visual analysis of spectral signal; the amplification device (11) is adopted for amplifying the transmission signa'; the steady flow device (12) is used for stability control of the transmission signal, preventing excessive volatility signa's over the instrument payload; the recording and display devices (13) is mainly used for disphy and preservation of signal detection and analysis; the standard hght source device (9) contains the light beam generating electrode, the electrode material is osmium oxide and ruthenium oxide alloy composite material.
[00l4]In the present invention, the beam introducing device (1) contains a triangular polarizing knses, the lens surface is covered with a thickness of 5. 77um hexamethyl chro miu in bro mate nanoco mposite filter membrane.
OO1 5] In the present invention, the beam filter plates (2) contains a filter lens, the lens surface is covered with cadmium triphosphate and tin hexafluorophosphate composite film.
Embodiment 2 [0016]A microphotonic spectrum detecting apparatus comprises: a beam introducing dcvice(l), a light filter plate(2) , a beam rectifying dcvice(3), a light polarizing device (4). a harmonic beam apparatus( ), a grating device(6). a beam folding device(7), an octagonal lens (8), a standard light source device(9). a conversion device(1O), a amplification device(1l). a steady flow device(12). a recording and display devices(l3); wherein the light filter plate(2) is located between beam introducing dcviec(1) and beam rectifying dcvicc(3): light polarizing device (4) is connected with beam rectifying device(3); the beam introducing device (1) is mainly used to import and select beam for analysis; the light filter plate (2) is applied to remove foreign interference beam; the beam rectifying device(3) is employed for regulation and restraint in the scattering beam; the light polarizing device(4) is utilized for controlling the polarization of (lie light beam. to achieve an efficiency promotion of beam delivery and reduce the rapid attenuation of light beam; the harmonic beam apparatus (5) is adopted for adjusting the waveform of (lie Ught beam, to avoid the abnormal light beam band: the grating device (6) is introduced for the spectrum separation and analysis with the extent of diffraction spectrum; the beam folding device (7)is used for guiding the main light beam propagation path; the octagonal lens (8) is applied for standard beam isolated analysis; the standard light source device (9) is used to provide correcting light source, for calibration of instrument errors and of exclusion of interference errors; the conversion device( 1(J) is utilized to convert opticai signals, to achieve visua' analysis of spectral signal; the amplification device (11) is adopted for amplifying the transmission signal; the steady flow device (12) is used for stability eontr& of the transmission signal, preventing excessive volatility signals over the instrument payload; the recording and display devices (13) is mainly used for display and preservation of signal detection and analysis; the standard light source device (9) contains the light beam generating electrode, the electrode material is osmium oxide and ruthenium oxide alloy composite material.
[0017]In the present invention, the beam rectifying device(3) contains transparent rectifying film,whose material is zirconium sulfate and alluminium sulfate triiodidc composite material.
[OOl8]In the present invention, the light polarizing device (4) comprises a polarizing mirror, the mirror surlace is covered with compound dodecyl rhenium bromate composite material reflective film.

Claims (4)

  1. SCLAIMS1 A microphotonic spectrum detectrng apparatus comprises: a beam introducing dcvice(l), a light filter plate(2) , a beam rectifying dcvice(3), a light polarizing device (4). a harmonic beam apparatus( ), a grating devicc(6). a beam folding device(7), an octagonal lens (8), a standard light source device(9). a conversion device(1O), a amplification device(1l). a steady flow device(12). a recording and display devices(13); wherein the light filter plate(2) is located between beam introducing dcvicc(1) and beam rectifying dcvicc(3): light polarizing device (4) is connected with beam rectifying device(3); the beam introducing device (1) is mainly used to import and select beam for analysis; the light filter plate (2) is applied to remove foreign interference beam; the beam rectifying device(3) is employed for regulation and restraint in the scattering beam; the light polarizing device(4) is utilized for controlling the polarization of the light beam, to achieve an efficiency promotion of beam delivery and reduce the rapid attenuation of light beam; the harmonic beam apparatus (5) is adopted for adjusting the waveform of the light beam, to avoid the abnormal light beam band: the grating device (6) is introduced for the spectrum separation and analysis with the extent of diffraction spectrum; the beam folding device (7)is used for guiding the main light beam propagation path; the octagonal lens (8) is applied for standard beam isolated analysis; the standard light source device (9) is used to provide correcting light source, for calibration of instrument errors and of exclusion of interference errors; the conversion deviee( 1(J) is utilized to convert opticai signals, to achieve visua' analysis of spectral signal; the amplification device (11) is adopted for amplifying the transmission signal; the steady flow device (12) is used for stability contr& of the transmission signal, preventing excessive volatility signals over the instrument payload; the recording and display devices (13) is mainly used for display and preservation of signal detection and analysis; the standard light source device (9) contains the light beam generating electrode, the electrode material is osmium oxide and ruthenium oxide alloy composite material.
  2. 2 The microphotonic spectrum detecting apparatus according to claim 1, wherein the beam introducing device (1) contains a triangular polarizing lenses, the lens surface is covered with a thickness of 9.77um hexamethyl chromium bromate nanocomposite filter membrane.
  3. 3 The microphotonic spectrum detecting apparatus according to claim 1, wherein the beam filter patcs (2) contains a filter lens, the lens surface is covered with cadmium triphosphate and tin hexafluorophosphate composite film.
  4. 4 The microphotonic spectrum detecting apparatus according to claim 1.wherein the beam rectifying device(3) contains transparent rectifying film,whose materia' is zirconium sul late and alluminium sulfate triiodide composite material.The microphotonic spectrum detecting apparatus according to claim 1, wherein the light polarizing device (4) comprises a polarizing mirror, the mirror surface is covered with compound dodecyl rhenium bromate composite material reflective film.
GB1423067.6A 2014-12-23 2014-12-23 Microphotonic spectrum detecting apparatus Withdrawn GB2529496A (en)

Priority Applications (1)

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GB1423067.6A GB2529496A (en) 2014-12-23 2014-12-23 Microphotonic spectrum detecting apparatus

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GB2529496A8 GB2529496A8 (en) 2016-05-04

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Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002228521A (en) * 2001-02-01 2002-08-14 Hamamatsu Photonics Kk Spectroscope and method of spectroscopy
GB2424696A (en) * 2005-03-29 2006-10-04 Spectrum Medical Llp Spectrometer fault detection using optical reference source
WO2011142848A2 (en) * 2010-01-27 2011-11-17 The University Of North Carolina At Chapel Hill Nanoparticle electrodes and methods of preparation
JP2012025633A (en) * 2010-07-26 2012-02-09 Nagase Chemtex Corp Method for producing metal oxide microparticle
WO2013126548A2 (en) * 2012-02-21 2013-08-29 Massachusetts Institute Of Technology Spectrometer device

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002228521A (en) * 2001-02-01 2002-08-14 Hamamatsu Photonics Kk Spectroscope and method of spectroscopy
GB2424696A (en) * 2005-03-29 2006-10-04 Spectrum Medical Llp Spectrometer fault detection using optical reference source
WO2011142848A2 (en) * 2010-01-27 2011-11-17 The University Of North Carolina At Chapel Hill Nanoparticle electrodes and methods of preparation
JP2012025633A (en) * 2010-07-26 2012-02-09 Nagase Chemtex Corp Method for producing metal oxide microparticle
WO2013126548A2 (en) * 2012-02-21 2013-08-29 Massachusetts Institute Of Technology Spectrometer device

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