GB2508556B - Signal analysis apparatus, signal analysis method, and computer program - Google Patents
Signal analysis apparatus, signal analysis method, and computer programInfo
- Publication number
- GB2508556B GB2508556B GB1404450.7A GB201404450A GB2508556B GB 2508556 B GB2508556 B GB 2508556B GB 201404450 A GB201404450 A GB 201404450A GB 2508556 B GB2508556 B GB 2508556B
- Authority
- GB
- United Kingdom
- Prior art keywords
- signal analysis
- computer program
- analysis method
- analysis apparatus
- signal
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 238000004458 analytical method Methods 0.000 title 2
- 238000004590 computer program Methods 0.000 title 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/28—Investigating the spectrum
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/28—Investigating the spectrum
- G01J3/44—Raman spectrometry; Scattering spectrometry ; Fluorescence spectrometry
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/225—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material using electron or ion
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/65—Raman scattering
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/07—Investigating materials by wave or particle radiation secondary emission
- G01N2223/076—X-ray fluorescence
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Analytical Chemistry (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2011179834 | 2011-08-19 | ||
PCT/JP2012/069719 WO2013027553A1 (en) | 2011-08-19 | 2012-08-02 | Signal analyzing apparatus, signal analyzing method, and computer program |
Publications (3)
Publication Number | Publication Date |
---|---|
GB201404450D0 GB201404450D0 (en) | 2014-04-30 |
GB2508556A GB2508556A (en) | 2014-06-04 |
GB2508556B true GB2508556B (en) | 2018-02-14 |
Family
ID=50649891
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
GB1404450.7A Expired - Fee Related GB2508556B (en) | 2011-08-19 | 2012-08-02 | Signal analysis apparatus, signal analysis method, and computer program |
Country Status (1)
Country | Link |
---|---|
GB (1) | GB2508556B (en) |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0821808A (en) * | 1994-07-06 | 1996-01-23 | Jeol Ltd | Analysis position determining method |
JPH0886762A (en) * | 1994-09-16 | 1996-04-02 | Horiba Ltd | Method for identifying material contained in sample and method for measuring its distribution |
JP2006119076A (en) * | 2004-10-25 | 2006-05-11 | Jasco Corp | Apparatus and method for analyzing mapping data |
-
2012
- 2012-08-02 GB GB1404450.7A patent/GB2508556B/en not_active Expired - Fee Related
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0821808A (en) * | 1994-07-06 | 1996-01-23 | Jeol Ltd | Analysis position determining method |
JPH0886762A (en) * | 1994-09-16 | 1996-04-02 | Horiba Ltd | Method for identifying material contained in sample and method for measuring its distribution |
JP2006119076A (en) * | 2004-10-25 | 2006-05-11 | Jasco Corp | Apparatus and method for analyzing mapping data |
Non-Patent Citations (2)
Title |
---|
SHIGEYUKI OBA ET AL.: 'Comparative study on various clustering methods with a Gaussian mixture distribution model' IEICE TECHNICAL REPORT vol. 99, no. 494, 11 December 1999, pages 109 - 116 * |
SHIORI OKAWA ET AL.: 'An application to a paper classification support by Fuzzy K-means' IPSJ SIG NOTES vol. 2006, no. 135, p81-84, 21 December 2006, pages 81 - 84 * |
Also Published As
Publication number | Publication date |
---|---|
GB201404450D0 (en) | 2014-04-30 |
GB2508556A (en) | 2014-06-04 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
PCNP | Patent ceased through non-payment of renewal fee |
Effective date: 20200802 |