GB2506991A - Measuring the mass of particulate matter in a gas - Google Patents
Measuring the mass of particulate matter in a gas Download PDFInfo
- Publication number
- GB2506991A GB2506991A GB201316822A GB201316822A GB2506991A GB 2506991 A GB2506991 A GB 2506991A GB 201316822 A GB201316822 A GB 201316822A GB 201316822 A GB201316822 A GB 201316822A GB 2506991 A GB2506991 A GB 2506991A
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- 239000013618 particulate matter Substances 0.000 title abstract description 6
- 239000002245 particle Substances 0.000 claims abstract description 72
- 239000010453 quartz Substances 0.000 claims abstract description 22
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 claims abstract description 22
- 239000013078 crystal Substances 0.000 claims abstract description 20
- 239000011362 coarse particle Substances 0.000 claims abstract description 11
- 238000009833 condensation Methods 0.000 claims abstract description 6
- 230000005494 condensation Effects 0.000 claims abstract description 6
- 230000004044 response Effects 0.000 claims abstract description 5
- 150000002500 ions Chemical class 0.000 claims abstract description 4
- 238000000034 method Methods 0.000 claims description 14
- 238000004458 analytical method Methods 0.000 claims description 8
- 238000000151 deposition Methods 0.000 claims description 4
- 230000007246 mechanism Effects 0.000 claims description 3
- 238000005259 measurement Methods 0.000 abstract description 5
- 239000003570 air Substances 0.000 description 20
- 238000005070 sampling Methods 0.000 description 10
- 238000010586 diagram Methods 0.000 description 7
- 239000007789 gas Substances 0.000 description 5
- 239000002184 metal Substances 0.000 description 4
- 229910052751 metal Inorganic materials 0.000 description 4
- 239000000126 substance Substances 0.000 description 4
- 238000012544 monitoring process Methods 0.000 description 3
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 3
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 2
- 239000000809 air pollutant Substances 0.000 description 2
- 231100001243 air pollutant Toxicity 0.000 description 2
- 239000012080 ambient air Substances 0.000 description 2
- 230000007613 environmental effect Effects 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- 239000012716 precipitator Substances 0.000 description 2
- 238000000926 separation method Methods 0.000 description 2
- ZICZZIRIRHGROF-UHFFFAOYSA-N 1-$l^{1}-oxidanyl-2,2,4,5,5-pentamethylimidazole Chemical compound CC1=NC(C)(C)N([O])C1(C)C ZICZZIRIRHGROF-UHFFFAOYSA-N 0.000 description 1
- 101100323157 Arabidopsis thaliana LAP1 gene Proteins 0.000 description 1
- 241001137251 Corvidae Species 0.000 description 1
- 230000008901 benefit Effects 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 239000006185 dispersion Substances 0.000 description 1
- 230000005684 electric field Effects 0.000 description 1
- 230000005284 excitation Effects 0.000 description 1
- 238000001914 filtration Methods 0.000 description 1
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 1
- 239000010931 gold Substances 0.000 description 1
- 229910052737 gold Inorganic materials 0.000 description 1
- 230000036541 health Effects 0.000 description 1
- 239000011261 inert gas Substances 0.000 description 1
- 239000011810 insulating material Substances 0.000 description 1
- 239000012212 insulator Substances 0.000 description 1
- 239000000203 mixture Substances 0.000 description 1
- 229910052757 nitrogen Inorganic materials 0.000 description 1
- 235000015108 pies Nutrition 0.000 description 1
- 238000003380 quartz crystal microbalance Methods 0.000 description 1
- 230000001105 regulatory effect Effects 0.000 description 1
- 229910001220 stainless steel Inorganic materials 0.000 description 1
- 239000010935 stainless steel Substances 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
- G01N15/02—Investigating particle size or size distribution
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
- G01N15/02—Investigating particle size or size distribution
- G01N15/0255—Investigating particle size or size distribution with mechanical, e.g. inertial, classification, and investigation of sorted collections
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
- G01N15/02—Investigating particle size or size distribution
- G01N15/0272—Investigating particle size or size distribution with screening; with classification by filtering
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N5/00—Analysing materials by weighing, e.g. weighing small particles separated from a gas or liquid
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N1/00—Sampling; Preparing specimens for investigation
- G01N1/02—Devices for withdrawing samples
- G01N1/22—Devices for withdrawing samples in the gaseous state
- G01N1/2273—Atmospheric sampling
Landscapes
- Chemical & Material Sciences (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Dispersion Chemistry (AREA)
- Sampling And Sample Adjustment (AREA)
Abstract
Measuring the mass of particulate matter in a gas by allowing the gas to enter through an inlet 110 and removing coarse particles larger than a selected size while permitting filtered particles of less than the selected size through to a measurement chamber 170. The particles are deposited on a quartz crystal sensor (600, Fig.4) which outputs an electrical signal in response to the deposited particle mass. A second chamber 210, 250 may be included for removing particles larger than a second selected size and the particles may be deposited on the sensor by means of ions from a corona discharge. The apparatus may comprise a filter, pump 180, flow sensor and controller 190 to maintain the gas flow at a set value and may be maintained at a suitable temperature to prevent condensation forming on the sensor. The apparatus is suitable for measuring airborne particulate matter with the selected sizes corresponding to PM10, PM2.5 or PM1 pollution standards.
Description
PAWDCLE SAMPLiNG AND MEASUREMENT IN THE. AMBiENT MR
CROSS REFERENCE TO RELATED APPLIcATION
[000fl The present. application is based on and. clthms the benefit of hiS. non-provisionni patent application Serial No. 14031.661. filed September 19,2013. and nwsionai patent application Serial No. 61/704i 48. flIed September 21. 2012, the content of which are hereby incorporated by reference in their entirety.
BACKGROUND OF THE thSCLOSURE
DOO2 instruments for sampling and measurina particulate matter in air are usefiui for a variety of purposes. They can he used the scientific research. to study the nawre of a paiicuiate air pollutant and its transport ano. dispersion in the amhient atmosphere.. They arc also useful for studying the elThct of a particulate air pollutant on human health. In addition, such insu-unrents can aso he used thr samoling and measuring airborne particulate matte--for regulatory compliance, purposes to determine if the. ambient level is within safe limits prescribed by law.
SUMMARY OF THE DISCLOSURE
The present disclosure describes a method and an apparatus for sampline and measuring airborne particulate matter in the ambient atmosphere. rhe method and apparatus are particularly use,tu for compliance measurement purposes where ease of use and. accuracy of measurement are most important.
100041 The apparatus of this disclosure includes an inlet for particulate containing gas to enter. A mechanism then removes coarse particles larger than a selected size while permitting particles of less than the selected size to pass through. A chamber containing a quartz crystal sensor permits the pu-ticies that have passed throuiii to denosit to create an output signal in response to the deposited particle mass.
100051 The. pies ant disclosure also includes a method fin measuring the concentration of particles in a gas using an apparatus in which the particulate containing gas enters into the chamber, The chamber contains a cunrtz cr stal sensor on which particles deposit to create an output signal in response to the deposited particle ni.ass The chanter is maintained at a temperature sufficient to prevent vapor condensation on t:he sensor. The method includes re.inovuie coarse particles arger than about 10 tim in equivalent aerodynamic diameter ermotitin part.ele.s smaller than about 10.un in equivalent aerodynamic. diameter to pass throutth. Charging the particles of less than about 10 jam in equivalent aerodynamic diameter with ions generated in a corona discharge. Depositing the passed through panicles on the quartz crysta! sensor and measuring the output signal of the quartz crystal sensor.
BRIEF DESCRIPTION OF THE DRAWINGS
[0006] FIG. I is a schematic diagram of the system for sampling and measurir airborne particles in the ambient atmosphere in one preferred embodiment..
[0907] FiG, 2 is a schematic diagram of an inlet particle separator to remove particles larger than 10 itm in diameter.
[0008] FIG, 3 is a schematic diauram of a lifter sampler fbi collecting airborne particles Ibr gravimetnc or chemical analysis [0009] FIG. 4isa sampler for denositing airborne particles onto a mass-sensing transducer in one preferred embodiment.
[0010] FIG SA and FR. ¶8 are schematic diagrams of a quartz. crystal micro-balance for sensing the deposited particle mass on the quartz crystal.
DESCRiPTION OF THE EMBODIMENTS
[0011] FIG. I illustrates a system for sampling and. measuring airborne particies according to the present disclosure. The system, shown generally located at lOt), has a sampling inlet 110 for ambient air carrying suspended particles to enter. The inlet 110 is provided with a particle separator to remove coarse particles larger than approximately 10 am. thus ailowina only smaller particles. i.e. those smaller than approximately it) urn to flow through and reach the downstream components for sample collection and analysis.
[0012] One part of the air flowing along path 120 enters a sampling chamber 130 containing a filter 134 for collecting aIrborne particles on a filter for analysis, the rate of air flow aung this path being maintamed by a small electric pump 140. The flow rate of air is measured by a flow sensor and electronte controller 150. With the help of the electronic controller 150. od,ich has feedback control, the flow rate can he maintained rita specific set-point value. The flow rate is typically tess than about 30 liters per minute.
Higher flow rates can he used. However a small amount of material is capable of being accurately analyzed for mass and/or chemical composition analysis using the apparatus -a-and method dóticribed herein. K is unnecessary to use a high sampling flow rate to collect a large amouni of materIal for analysis. A small and compact instrument as descrIbed herein is easy to setup and use in the laboratory or in the field, while providing the needed accuracy for the measurement in comparison, traditional air sampLers for environmental: monitoring operate at a flow rare of approximately 40 cubic feet per mitts j.e 1120 liters per minute. The 30 liter per minute flow rate described here Is only approximately 2.5% of the traditional flow rate used for this purpose.
100131 Another part of the airflow along path 160 titters a chamber 170 containing a partifle mass sensing transducer 174 to monitor the mass of particles deposited on the sensIng surface of the transducer 174. The airflow along this path is also maintained by a small pump 180, the flow rate being measured by a flow sensor and controller 194) to maintain the air flow at a speciflcset-point value, 100141 A third pan of the air flows aling path 200 and enters another coarse particle separator 210 to remove eoare partIcles larger than approximately 2.5 or approxmately 1,0 zrn. After the coarse particle separator the air is divided into two downstream paths 224) and 230. Air path 220 leads to chamber 240 which contains a filter swi pier collect airborne particle samples lbr analysit The other air path 230 leads to chamber 250 which contains a transducer 254 for monitoring the mass of particles deposited en the transducer sensing surface for monitoring the mass concentration of airborne particles smaller than approximately 2.5 or approximately 1.0 tmin diameter.
IO01SJ Downstream of each of the chambers 240 and 250 are small electrIc pumps, 260 and 270 and flow sensors and contallets, 280 and 294); for conirGiJing the rate of gas flow through the chambers 240 and 250 to their respective set-point values. The schematic diagram of the system located generally at 14)0 is therefore capable of collecting airborne particle samples itt the PMl0 and PM2.5 or PM1S size ranges for mass and/or chemical analyses; as well as providing airborne mass coneentraion values for PMIO and PM2.5, or PM 10 and PM 1.0 determination. lbs terms PM 10. PM25 and PM 1.0 particles are defined as atmospheric particulate matters from which pwticles larger than 1 0gm. .5jnn or 1.0 urn in aerodynamic equivalent diameter have been removed. (p the context of the present disclosure concernhg method and apparatus for sampling and measuring atmospheric partkulate matter, the term refErs to a sample $ream from which particles larger than the 10pm, 2.Spn or IA) pm in aerodynamie equivalànt diameter have been retnoved [Ot}16j PlO. 2 is a scbematic diagram of the sampling inlet 110 of Figure 1 being identified In Figure 2 generally at 300, for sampling air from the ambient atmosphere; Air as indicated by arrows 312 is sampled into this inlet under cap 310. Located downs ream of this sasnpDng inlet is an inertial impactor (particle separaot), shown generally located at 320. The ktpactor is provided with an inlet nozzle 330 to accelerate the airflow indicated by arrow 332 to a high velocity. Lsge pastioles, because of their large size and their momentum, are impacted onto the impaction surhce 340 and removed from the flowing air stream 332. The impactor is designed to remove particles that are larger than approximately 10 pm in aerodynamic equivalent diarneters Particks smaller than: apprwcimafely 10 inn in aerodynamic equivalent diameter are carried by the air flow through flow tubes 350 and 360 into th4 downstream flow passageway 370 as indicated by arrows 372, and then exit the linpactor through oUtlet 380.
100171 The aerodynamic equivalent diameter of a particle is the diameter of a unit dtnslty sphere having the same settling seed as the particle in question The concept of aerodynamic equivalent diameter and size separation by inertial impaction are well known to those skilled in the art in. designing inertial particle separation devices and there%re will not b t'qrther discussed.
100181 FIG. 3 is a schematic diagram of a filter sampler for collecting airborne particles for gravimetric and/or chemical analysis. The filtration apparatus is shown generally locate4 at 400. The lifter sampler 400 is located in chambers 130 and 240 and was identifIed in Figure.1. Air as indicated by arrow 405 issampled Through the inlet 410of housing 420. The air carrying suspended particles smaller than 10 pm in dimeter,, then flows through the filter 430 located inside. Piker 430 is clamped tighdy between two metal pieces 440 and 450 to prevent flow leakage around the edges; The filter is supported on the downstream side by a rigid porous metal support 460. Alternatively, a rigid perhmted metal plate can be used as the filter support. The filter is generally of circular, he. of a round shape, but other filter shapes such as a reøangle, or a square, can also beused.
[0019J Th filter sanipiing apparatus of P10.3 is generally kept at a temperture ffiat is near the ambknt air temperature to make sure that the sizes of aitbome particles, which may contain certain amount of water, are not greatly affected. Sometimes, the sampler may be operated at a few degrees Celsius above the ambient air temperature to prevent a large amount of water being present in the collected particle mass.
100201 FIG. 4 illustrates an apparatus for charging airborne particles and dcpsiting them on a quartz ctystai micro-balance for sensing the deposited particle mass. The apparatus is shown generally located at 500 and the apparatus 500 is located in chambers 171) and 250 and provided with two chambers, An upper chamber $10 is for charging the particles, while the lower chanter 520 lirnctions as a particle precipitator to deposit the charged. particles onto a mass-sending transducer for particle mass t*ncentratión detennint (0021J The upper chamber SIC is constructed of a conducting materi4 such as staInless steel. Air, carrying particles smaller than about 10 m in diameter enter the chamber through inlet 530: Inside the chamber there is a needle 545w1th a fine tip 555. The ncedie is embedded in an: insulator 540 and conne ted to a source 55Q of hIgh DC voltage to create a corona discharge from the needle tip 555 to an inside conical surface 560 of the chamber. Most of the corona current is collected on the conical surthce 560 Inside the chamber. Surfaces that ate farther away, such as 575 and 570, wIlt have very little of the current collected there because of the much weaker electric field there. The high voltage source 550 is provided: with electronic control circuitry in order to provide a stable voltage asd/or current output to insure a high charging efficiency and repeatable performance charaeteristic.
[0022J The walls 610 of the 1ostr chamber 520 are constructed of an insulating material, such as plastic or & ceranlic. A metal electrode 590 is placed above the quartz crysçal mass sepflng tratsduce 600. The source of high voltage 550 is connected to electrode 590 while the quartz crystal transducer 600 is grounded. The high: voltage source 55Q is also provided with control cfrcuitry (not shown) in order to vazy the voltage to achieve optimal performance, while pros4ding a repeatable voltage output to insure stable operatIon of the precipitator.
100231 To prevent water vapor in air to condense on the transducer 600 both the upper and lower chambers of' PIG. 4 are maintaifled at a suitably high temperature to prevent nzer vapor condensation in the chamber. A typical temperature is 40°C. A hIgher or a lower temperature cap be used depending on the environmental conditions and the specific application of the apparatus.
100241 FIG. Sa and Sb are schematic diagrams of a quartz crystal micro-balance for sensing the deposited particle itass on the quartz crystaL FIG. Sa shows the front side of the transducer while FlOe 51, shows its back side.
(00251 The mass sensing area 610 is on the front side of the transducer. PartIcles to be sensed are deposited in this a The central area for mass sensing is surrounded by an annular electrode area 620 which is usually coated with a thin layer of gokE There is a[so an edge exclusive zone 630 where uncoated quartz is present. One suitable quartz i an AT cut crystal.
[ft026J On the backside of the quartz crystal transducer, there is also a gold coated electroe 640 whkh is apptzjmately the same diameter as the sensing zone on the from sids, The uneeated quartz area is shown at 650. The transducer is set to vibrate at its resonant frequency by applying an excitation voltage to the electrodes, With the conventional AT cut quartz crystal used for mass sending, the vIbration is in the transverse mode, i.e. in the dIrection parallel to the surface on which the particles are deposited. With. deposited particle mass on the crystal surfttce, the resonant frequency of the crystal will become smaller compared to the resonant frequency when the crystal is clean. The change in frequency is thus proportional to the deposited particle mass, whiéh cap be used for particle mass determination.
10021 The above description of the instrument has been described ii terms of its usc for airborne particle pieasuremçnt The same apparatus can also be used to measure partkutate matttr suspended ma gas media other than aIr. Particulate matter suspended in nitrogen, argo; and other inert gases may also contain suspended particles that need to be measured. The method and apparatus described berehi re also suitable for such applications as well.
[OO28J Although the present invention has been described with reference to prefetred embodiments, workers skifled In the art will, reogni" thtehanges may be made in form and detail witheut departing from the spIrit and scope!= the invention.
Claims (4)
- WHAT IS CLAIMED IS: 1. An apparatus for measuring particles in a gas, said apparatus comprising: an inlet for said gas to entr: a mechanism to remove coarse particles larger than a selected size permitting smaller particles of less than the selected size to pass through; rnd a first chamber containing a quartz cystai sensor on which the particles of less than the selected size can deposIt to create an output signal in response to a deposited particle mass.
- 2. The apparatus of elaitn I said chamber beIng maintained at a temperature sufficient to prevent vapor condensation on said sensor.
- 3. The apparatus of claim 2 said temperature being in the appreximate range from 25°C to 55°C.
- 4. The apparatus of any one of the preceding claims, said apparatus including a meóhathsm to maintain gas flow through said chamber at a specific setpthnt valut 5, The apparatus of any one oldie preceding claims, said apparatus including a gas filter for collecting a particle sample tbr analysis.6. The apparatus of any one of the preceding claims, said gas filter including a tnechanistn to main a gas flow through said filter at a specific set-point value.7. The apparatus of any one of the preceding claims said coarse partkiès b&ng removed are larger than about lOtm in equivalent acrndynamic diameter.8. The apparatus of any one of the preceding claims, including an additional coarse particle collector for removing particles larger than approximately 2.5 or approxImately I A) inn in equivalent aerodynamic diameter.9. The apparatus of any one otthepreceding claims, inctudthg a second chamber similar to said first chamber of claim 1 for charging particles with ions generated in a corona discharge and depositing charged particles on a quartz crystal sensor to geneate an output signal in response to the deposited particle mass 10. The apparatus of' any one of claims 6 to 9, wherein said mechanism to makttain the gas flow at a specific set-point vaiue includes a variable speed puwp a flow sensor and an electronic controller.ii. The apparatus of ctaim 10 wherein said gas flow through said fitter being less than approxinate1y 100 liters per minute.2. The apparatus of claIm 10 or claim.11 wherein said gas flow through said ôhamber being at a temperature not higher than appreximat1y 10°C above the temperature of the gas entering the inlet.13. A method kw measuring concentration of particles in a gas usingan apparatus having an inlet for the gas to triter, a chamber containing a quartz crystal sensor on which particles would deposit to aeate an output sIgnal in respotise to a deposited particle mass, said chamber being maintained at a temperature sufficient to prevent vapor condensation on said sensor, comprising the steps of: Removing coarse particles larger than about 10 jim in equivalent aerodynamic dIameter permitting smaller particles of less. than about t0jim in equivalent aerodynamic diameter to pass through; ChargIng the smaller particles with ions generated in a corona discharge: DepositIng the charged particles on said quartz crystal sensor; and Measuring the output signal of said quartz crystal sensor.14. The method ot'claim 13 including the additional steps of; Removing coarse particles 1arer than,proximately 2.5 jim or approximately 1.0 pm in aerodynamioequivalentdianieter; In Charaing The particies smalier than 2.5m or LU am particles in equivalent aerodynamic diameter in another chamber containing a quart2 crystal sensor to produce charged particles; Depositing the charged particles on said quartz crystal sensor: and Measuring the output signal of said quartz crystal sensor to determine the deposited particle mass smaller than approximately 2.5 tim or approximately 1.0 am in equivalent aerodynanuc dianieiier.I SThe method of claim 13 or claim 14 said chamber being maintained at a temperature sufficient to prevent vapor condensation on said sensor.16. The method of claim IS said temperature being in the approximate range tronl 25CC to 55°C, 17. The method of any one of claims 13 to 16, said coarse particles being removed are smaller than about lOam in equivalent aerodynamic diameter.1$, The method. of any one of claims 13 to 17. including a mechanjsm to maintain steady gas flow, said steady gas flow through said filter hei.n.g less than approximately 10(1 liters er minute.19. The method of any one of claims 13 to 13, said chamber being at a temperature not higher than approximately.10°C above the temperature of the gas entering the inlet.
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US201261704148P | 2012-09-21 | 2012-09-21 | |
| US14/031,661 US9541488B2 (en) | 2012-09-21 | 2013-09-19 | Particle sampling and measurement in the ambient air |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| GB201316822D0 GB201316822D0 (en) | 2013-11-06 |
| GB2506991A true GB2506991A (en) | 2014-04-16 |
Family
ID=49553231
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| GB201316822A Withdrawn GB2506991A (en) | 2012-09-21 | 2013-09-23 | Measuring the mass of particulate matter in a gas |
Country Status (2)
| Country | Link |
|---|---|
| CN (1) | CN103674793A (en) |
| GB (1) | GB2506991A (en) |
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20150346071A1 (en) * | 2014-05-28 | 2015-12-03 | Fujitsu Limited | Measurement device and method of measuring |
| WO2018089674A1 (en) * | 2016-11-09 | 2018-05-17 | The Board Of Trustees Of The University Of Illinois | Particulate matter sensor |
| CN111830128A (en) * | 2019-04-23 | 2020-10-27 | 帕尔公司 | Aircraft air pollutant analyzer and use method |
| CN111830129A (en) * | 2019-04-23 | 2020-10-27 | 帕尔公司 | Airplane air pollutant analyzer and using method thereof |
| US10955318B2 (en) | 2019-04-23 | 2021-03-23 | Pall Corporation | Aircraft air contaminant analyzer and method of use |
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| CN104865347A (en) * | 2015-04-24 | 2015-08-26 | 北京林业大学 | Portable experiment device for analysis of particle wet deposition ability of plant |
| CN106468648B (en) | 2015-08-19 | 2019-09-10 | 财团法人工业技术研究院 | Micro-particle detector and method for manufacturing screening element |
| CN105181395A (en) * | 2015-09-10 | 2015-12-23 | 麦克传感器股份有限公司 | Multifunctional intelligent portable air sampler and detecting method thereof |
| KR20190029209A (en) * | 2017-09-12 | 2019-03-20 | 주식회사 히타치엘지 데이터 스토리지 코리아 | Dust sensor adopting impactor |
| US20200400544A1 (en) * | 2017-12-15 | 2020-12-24 | Ams International Ag | Integrated filter-based particulate matter sensors |
| CN108918321A (en) * | 2018-07-16 | 2018-11-30 | 中国烟草总公司郑州烟草研究院 | A kind of quality characterization method for dividing particles for cigarette smoke |
| FR3085482B1 (en) * | 2018-08-30 | 2020-11-27 | Esiee Paris Chambre De Commerce Et Dindustrie De Region Paris Ile De France | FINE PARTICLE SENSOR WITH CASCADE MICROBALANCES |
| CN109916694B (en) * | 2019-04-10 | 2021-03-16 | 重庆交通大学 | Virtual impacter of submicron terminal is decreased to ultralow wall |
| CN111551470A (en) * | 2019-10-02 | 2020-08-18 | 香港理工大学 | Semi-online equipment and method for measuring acid particles in atmosphere |
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2013
- 2013-09-22 CN CN201310432492.7A patent/CN103674793A/en active Pending
- 2013-09-23 GB GB201316822A patent/GB2506991A/en not_active Withdrawn
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