GB2446005B - Apparatus and method relating to removal of selected particles from a charged particle beam - Google Patents
Apparatus and method relating to removal of selected particles from a charged particle beamInfo
- Publication number
- GB2446005B GB2446005B GB0701265.1A GB0701265A GB2446005B GB 2446005 B GB2446005 B GB 2446005B GB 0701265 A GB0701265 A GB 0701265A GB 2446005 B GB2446005 B GB 2446005B
- Authority
- GB
- United Kingdom
- Prior art keywords
- removal
- charged particle
- particle beam
- method relating
- selected particles
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 239000002245 particle Substances 0.000 title 2
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/44—Energy spectrometers, e.g. alpha-, beta-spectrometers
- H01J49/46—Static spectrometers
- H01J49/48—Static spectrometers using electrostatic analysers, e.g. cylindrical sector, Wien filter
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/06—Electron- or ion-optical arrangements
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/04—Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement, ion-optical arrangement
- H01J37/05—Electron or ion-optical arrangements for separating electrons or ions according to their energy or mass
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/30—Electron-beam or ion-beam tubes for localised treatment of objects
- H01J37/317—Electron-beam or ion-beam tubes for localised treatment of objects for changing properties of the objects or for applying thin layers thereon, e.g. for ion implantation
- H01J37/3171—Electron-beam or ion-beam tubes for localised treatment of objects for changing properties of the objects or for applying thin layers thereon, e.g. for ion implantation for ion implantation
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/20—Magnetic deflection
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/22—Electrostatic deflection
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/44—Energy spectrometers, e.g. alpha-, beta-spectrometers
- H01J49/443—Dynamic spectrometers
- H01J49/446—Time-of-flight spectrometers
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Particle Accelerators (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GB0701265.1A GB2446005B (en) | 2007-01-23 | 2007-01-23 | Apparatus and method relating to removal of selected particles from a charged particle beam |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GB0701265.1A GB2446005B (en) | 2007-01-23 | 2007-01-23 | Apparatus and method relating to removal of selected particles from a charged particle beam |
Publications (3)
Publication Number | Publication Date |
---|---|
GB0701265D0 GB0701265D0 (en) | 2007-02-28 |
GB2446005A GB2446005A (en) | 2008-07-30 |
GB2446005B true GB2446005B (en) | 2012-03-21 |
Family
ID=37846814
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
GB0701265.1A Expired - Fee Related GB2446005B (en) | 2007-01-23 | 2007-01-23 | Apparatus and method relating to removal of selected particles from a charged particle beam |
Country Status (1)
Country | Link |
---|---|
GB (1) | GB2446005B (en) |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB2478265B (en) * | 2008-09-03 | 2013-06-19 | Superion Ltd | Apparatus and method relating to the focusing of charged particles |
GB2467548B (en) | 2009-02-04 | 2013-02-27 | Nu Instr Ltd | Detection arrangements in mass spectrometers |
CN103681204B (en) * | 2012-09-08 | 2016-09-07 | 复旦大学 | Inductivity coupled plasma mass spectrometry ion transmission system |
US9767984B2 (en) * | 2014-09-30 | 2017-09-19 | Fei Company | Chicane blanker assemblies for charged particle beam systems and methods of using the same |
Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH07191169A (en) * | 1993-12-24 | 1995-07-28 | Toshiba Corp | Ion deflecting magnet and method for ion deflecting |
EP0952607A2 (en) * | 1998-04-20 | 1999-10-27 | Micromass Limited | Simultaneous detection isotopic ratio mass spectrometer |
US20020100880A1 (en) * | 1999-10-15 | 2002-08-01 | Jin-Liang Chen | Apparatus for decelerating ion beams for reducing the energy contamination |
US6710358B1 (en) * | 2000-02-25 | 2004-03-23 | Advanced Ion Beam Technology, Inc. | Apparatus and method for reducing energy contamination of low energy ion beams |
WO2006060378A2 (en) * | 2004-11-30 | 2006-06-08 | Purser Kenneth H | Broad energy-range ribbon ion beam collimation using a variable-gradient dipole |
WO2008042664A2 (en) * | 2006-09-29 | 2008-04-10 | Varian Semiconductor Equipment Associates, Inc. | Technique for improved ion beam transport |
WO2008042094A2 (en) * | 2006-09-29 | 2008-04-10 | Axcelis Technologies, Inc. | New and improved beam line architecture for ion implanter |
-
2007
- 2007-01-23 GB GB0701265.1A patent/GB2446005B/en not_active Expired - Fee Related
Patent Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH07191169A (en) * | 1993-12-24 | 1995-07-28 | Toshiba Corp | Ion deflecting magnet and method for ion deflecting |
EP0952607A2 (en) * | 1998-04-20 | 1999-10-27 | Micromass Limited | Simultaneous detection isotopic ratio mass spectrometer |
US20020100880A1 (en) * | 1999-10-15 | 2002-08-01 | Jin-Liang Chen | Apparatus for decelerating ion beams for reducing the energy contamination |
US6710358B1 (en) * | 2000-02-25 | 2004-03-23 | Advanced Ion Beam Technology, Inc. | Apparatus and method for reducing energy contamination of low energy ion beams |
WO2006060378A2 (en) * | 2004-11-30 | 2006-06-08 | Purser Kenneth H | Broad energy-range ribbon ion beam collimation using a variable-gradient dipole |
WO2008042664A2 (en) * | 2006-09-29 | 2008-04-10 | Varian Semiconductor Equipment Associates, Inc. | Technique for improved ion beam transport |
WO2008042094A2 (en) * | 2006-09-29 | 2008-04-10 | Axcelis Technologies, Inc. | New and improved beam line architecture for ion implanter |
Also Published As
Publication number | Publication date |
---|---|
GB2446005A (en) | 2008-07-30 |
GB0701265D0 (en) | 2007-02-28 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
PCNP | Patent ceased through non-payment of renewal fee |
Effective date: 20120621 |