GB2312551A - Encapsulating semiconductor optical devices - Google Patents
Encapsulating semiconductor optical devices Download PDFInfo
- Publication number
- GB2312551A GB2312551A GB9708025A GB9708025A GB2312551A GB 2312551 A GB2312551 A GB 2312551A GB 9708025 A GB9708025 A GB 9708025A GB 9708025 A GB9708025 A GB 9708025A GB 2312551 A GB2312551 A GB 2312551A
- Authority
- GB
- United Kingdom
- Prior art keywords
- carrier
- optical module
- layer
- transmitting
- receiving element
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 230000003287 optical effect Effects 0.000 title claims description 34
- 239000004065 semiconductor Substances 0.000 title claims description 5
- 238000000034 method Methods 0.000 claims description 17
- 239000013307 optical fiber Substances 0.000 claims description 16
- 230000008878 coupling Effects 0.000 claims description 14
- 238000010168 coupling process Methods 0.000 claims description 14
- 238000005859 coupling reaction Methods 0.000 claims description 14
- 230000008569 process Effects 0.000 claims description 7
- 239000004922 lacquer Substances 0.000 claims description 6
- 239000000463 material Substances 0.000 claims description 6
- 229910052710 silicon Inorganic materials 0.000 claims description 6
- 239000010703 silicon Substances 0.000 claims description 6
- 229910000679 solder Inorganic materials 0.000 claims description 6
- 230000004888 barrier function Effects 0.000 claims description 4
- 238000003631 wet chemical etching Methods 0.000 claims description 3
- 238000002844 melting Methods 0.000 claims description 2
- 230000008018 melting Effects 0.000 claims description 2
- 238000012544 monitoring process Methods 0.000 claims description 2
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 5
- 230000007613 environmental effect Effects 0.000 description 4
- 238000004519 manufacturing process Methods 0.000 description 4
- 230000008901 benefit Effects 0.000 description 3
- 230000005540 biological transmission Effects 0.000 description 2
- 238000010276 construction Methods 0.000 description 2
- 239000011521 glass Substances 0.000 description 2
- 239000010931 gold Substances 0.000 description 2
- 229910052737 gold Inorganic materials 0.000 description 2
- 239000000203 mixture Substances 0.000 description 2
- 230000007704 transition Effects 0.000 description 2
- 239000000853 adhesive Substances 0.000 description 1
- 230000001070 adhesive effect Effects 0.000 description 1
- 230000032683 aging Effects 0.000 description 1
- 239000011324 bead Substances 0.000 description 1
- 239000013078 crystal Substances 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 230000018109 developmental process Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000005530 etching Methods 0.000 description 1
- 239000000945 filler Substances 0.000 description 1
- 239000003365 glass fiber Substances 0.000 description 1
- 150000002343 gold Chemical class 0.000 description 1
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 1
- 238000003384 imaging method Methods 0.000 description 1
- 239000012535 impurity Substances 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- 238000000465 moulding Methods 0.000 description 1
- 238000010137 moulding (plastic) Methods 0.000 description 1
- 238000000206 photolithography Methods 0.000 description 1
- 230000000644 propagated effect Effects 0.000 description 1
- 238000012216 screening Methods 0.000 description 1
- 238000007789 sealing Methods 0.000 description 1
- 238000000926 separation method Methods 0.000 description 1
- 239000012780 transparent material Substances 0.000 description 1
Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/02—Details
- H01L31/0203—Containers; Encapsulations, e.g. encapsulation of photodiodes
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/02—Structural details or components not essential to laser action
- H01S5/022—Mountings; Housings
- H01S5/023—Mount members, e.g. sub-mount members
- H01S5/02315—Support members, e.g. bases or carriers
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- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B6/00—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings
- G02B6/24—Coupling light guides
- G02B6/42—Coupling light guides with opto-electronic elements
- G02B6/4201—Packages, e.g. shape, construction, internal or external details
- G02B6/4204—Packages, e.g. shape, construction, internal or external details the coupling comprising intermediate optical elements, e.g. lenses, holograms
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- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B6/00—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings
- G02B6/24—Coupling light guides
- G02B6/42—Coupling light guides with opto-electronic elements
- G02B6/4201—Packages, e.g. shape, construction, internal or external details
- G02B6/4219—Mechanical fixtures for holding or positioning the elements relative to each other in the couplings; Alignment methods for the elements, e.g. measuring or observing methods especially used therefor
- G02B6/422—Active alignment, i.e. moving the elements in response to the detected degree of coupling or position of the elements
- G02B6/4221—Active alignment, i.e. moving the elements in response to the detected degree of coupling or position of the elements involving a visual detection of the position of the elements, e.g. by using a microscope or a camera
- G02B6/4224—Active alignment, i.e. moving the elements in response to the detected degree of coupling or position of the elements involving a visual detection of the position of the elements, e.g. by using a microscope or a camera using visual alignment markings, e.g. index methods
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- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B6/00—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings
- G02B6/24—Coupling light guides
- G02B6/42—Coupling light guides with opto-electronic elements
- G02B6/4201—Packages, e.g. shape, construction, internal or external details
- G02B6/4219—Mechanical fixtures for holding or positioning the elements relative to each other in the couplings; Alignment methods for the elements, e.g. measuring or observing methods especially used therefor
- G02B6/4228—Passive alignment, i.e. without a detection of the degree of coupling or the position of the elements
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/02—Details
- H01L31/0232—Optical elements or arrangements associated with the device
- H01L31/02325—Optical elements or arrangements associated with the device the optical elements not being integrated nor being directly associated with the device
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/12—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof structurally associated with, e.g. formed in or on a common substrate with, one or more electric light sources, e.g. electroluminescent light sources, and electrically or optically coupled thereto
- H01L31/16—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof structurally associated with, e.g. formed in or on a common substrate with, one or more electric light sources, e.g. electroluminescent light sources, and electrically or optically coupled thereto the semiconductor device sensitive to radiation being controlled by the light source or sources
- H01L31/167—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof structurally associated with, e.g. formed in or on a common substrate with, one or more electric light sources, e.g. electroluminescent light sources, and electrically or optically coupled thereto the semiconductor device sensitive to radiation being controlled by the light source or sources the light sources and the devices sensitive to radiation all being semiconductor devices characterised by potential barriers
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- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B6/00—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings
- G02B6/24—Coupling light guides
- G02B6/42—Coupling light guides with opto-electronic elements
- G02B6/4201—Packages, e.g. shape, construction, internal or external details
- G02B6/4204—Packages, e.g. shape, construction, internal or external details the coupling comprising intermediate optical elements, e.g. lenses, holograms
- G02B6/4214—Packages, e.g. shape, construction, internal or external details the coupling comprising intermediate optical elements, e.g. lenses, holograms the intermediate optical element having redirecting reflective means, e.g. mirrors, prisms for deflecting the radiation from horizontal to down- or upward direction toward a device
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- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B6/00—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings
- G02B6/24—Coupling light guides
- G02B6/42—Coupling light guides with opto-electronic elements
- G02B6/4201—Packages, e.g. shape, construction, internal or external details
- G02B6/4219—Mechanical fixtures for holding or positioning the elements relative to each other in the couplings; Alignment methods for the elements, e.g. measuring or observing methods especially used therefor
- G02B6/4228—Passive alignment, i.e. without a detection of the degree of coupling or the position of the elements
- G02B6/423—Passive alignment, i.e. without a detection of the degree of coupling or the position of the elements using guiding surfaces for the alignment
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/4805—Shape
- H01L2224/4809—Loop shape
- H01L2224/48091—Arched
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/484—Connecting portions
- H01L2224/48463—Connecting portions the connecting portion on the bonding area of the semiconductor or solid-state body being a ball bond
- H01L2224/48465—Connecting portions the connecting portion on the bonding area of the semiconductor or solid-state body being a ball bond the other connecting portion not on the bonding area being a wedge bond, i.e. ball-to-wedge, regular stitch
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/73—Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
- H01L2224/732—Location after the connecting process
- H01L2224/73251—Location after the connecting process on different surfaces
- H01L2224/73265—Layer and wire connectors
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L2224/85—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a wire connector
- H01L2224/85909—Post-treatment of the connector or wire bonding area
- H01L2224/8592—Applying permanent coating, e.g. protective coating
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- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/151—Die mounting substrate
- H01L2924/1515—Shape
- H01L2924/15153—Shape the die mounting substrate comprising a recess for hosting the device
- H01L2924/15155—Shape the die mounting substrate comprising a recess for hosting the device the shape of the recess being other than a cuboid
- H01L2924/15156—Side view
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- H—ELECTRICITY
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- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/181—Encapsulation
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/02—Structural details or components not essential to laser action
- H01S5/022—Mountings; Housings
- H01S5/02218—Material of the housings; Filling of the housings
- H01S5/02234—Resin-filled housings; the housings being made of resin
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/02—Structural details or components not essential to laser action
- H01S5/022—Mountings; Housings
- H01S5/0225—Out-coupling of light
- H01S5/02253—Out-coupling of light using lenses
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- H—ELECTRICITY
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- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/02—Structural details or components not essential to laser action
- H01S5/022—Mountings; Housings
- H01S5/0225—Out-coupling of light
- H01S5/02255—Out-coupling of light using beam deflecting elements
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/02—Structural details or components not essential to laser action
- H01S5/022—Mountings; Housings
- H01S5/023—Mount members, e.g. sub-mount members
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/02—Structural details or components not essential to laser action
- H01S5/022—Mountings; Housings
- H01S5/023—Mount members, e.g. sub-mount members
- H01S5/02325—Mechanically integrated components on mount members or optical micro-benches
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/02—Structural details or components not essential to laser action
- H01S5/022—Mountings; Housings
- H01S5/0233—Mounting configuration of laser chips
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- H—ELECTRICITY
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- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/02—Structural details or components not essential to laser action
- H01S5/022—Mountings; Housings
- H01S5/0235—Method for mounting laser chips
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- H—ELECTRICITY
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- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/06—Arrangements for controlling the laser output parameters, e.g. by operating on the active medium
- H01S5/068—Stabilisation of laser output parameters
- H01S5/0683—Stabilisation of laser output parameters by monitoring the optical output parameters
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Electromagnetism (AREA)
- Optics & Photonics (AREA)
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Computer Hardware Design (AREA)
- Power Engineering (AREA)
- Optical Couplings Of Light Guides (AREA)
Description
2312551 Optical module for coupling an optical fibre and method of
producing it State of the art The invention relates to an optical module for coupling an optical fibre with a translucent carrier and a transmitting or receiving element which is applied to a first side of the carrier. The invention also relates to a method of producing such an optical module.
A module of this type is known, for example, from the document DE 43 01456 Cl. The plate-shaped carrier made of silicon described therein is structured precisely by micromechanical production methods so a laser chip serving as a transmission element, an optical fibre and an imaging lens can be positioned with close tolerances. The final adjustment of the optical fibre of the laser chip is clearly simplified owing to the precise structuring. To protect the very sensitive laser chip from external influences. the laser chip is surrounded by a housing-like hennetically sealed arrangement. the carrier being part of the housing.
It is generally necessary 'm any case to install such semiconductor components, which are to be used, in a suitable housing to which the optical fibre is to be optically coupled. The protection of the components from environmental influences and a good optical coupling, in particular, play a decisive part in the design of the housing. The coupling is generally produced by an arrangement of one to two lenses, the position of the optical fibres relative to the lenses and the laser chip being optimised in an adjustment process. The laser chip is arranged in a housmg which is hermetically sealed from the environment, the lenses and the optical fibre being arranged either outside or in the housing. In the latter case, the optical fibre is conveyed from the housing through a hermetic bushing.
2 Scanning units are Imown from the sphere of CD devices, in which only the laser chip together with a photodiode is mounted in a hermetically sealed round housing for the monitoring of performance. This module is in the meantime also used for information transmission. The so-called coaxial housing used is a precision mechanical product made of metal and glass and - measured against the tolerance requirements for the optical coupling between laser and optical fibre in the range of below 1 im - has very considerable production tolerances which is why a complex threedimensional adjustment process is required to optimise the optical fibre coupling.
A drawback of the discussed use of a hermetically sealed housing is, in particular, that the costs incurred are becoming more significant as semiconductor prices fall.
The article Tig-tail Type Laser Modules Entirely Moulded in Plastic" Electronics Letters, 28th September 1995, vol. 3 1, No. 20, pages 1745 to 1747. discloses an arrangement in which a laser diode is protected from environmental influences by a plastic moulding composition. A drawback is that the laser diode is coupled to the glass fibre without imagmg lens by abutment.
Advantages of the invention The method according to the invention with the features of claim 1 has the advantage that an expensive housing hennetically sealing the transmitting or receiving element can be dispensed with without losing protection from environmental influences, for exaniple moisture. Since a translucent layer, for example an optically transparent moulding composition, is applied to the carrier and the transmitting or receiving element, the transmitting or receiving element is sealed from the exterior on the one hand by the carrier itself and on the other hand by the applied layer.
3 A trough-shaped recess is preferably formed on one side of the carrier, into which the transmitting or receiving element is preferably applied by means of a soldered joint, so additional protection is afforded.
A further layer which acts as a moisture barrier is preferably applied to the first layer. By means of this two-layered construction, optimisation of the first layer with respect to the optical effect and of the second layer with respect to the screening effect can be achieved better.
A lens which allows better efficiency of coupling during the coupling of an optical fibre than an abutment is preferably formed on the other side of the carrier.
The optical module according to the invention for coupling an optical fibre having the features of claim 7 also has the advantage that a housing which hermetically seals the transmitting or receiving element is not required. An optically translucent layer which essentially surrounds the transmitting or receiving element and therefore screens it from the exterior does mi fact protect the sensitive transmitting or receiving element. preferably a laser diode, from external environmental influences.
The transmitting or receiving element is preferably arranged in a troughshaped recess, of which the beam path is directed to an oblique wall of the recess and is conveyed to the underside of the carrier via a reflective surface formed in the carrier.
To increase the efficiency of coupling, a lens is preferably provided in the beam path on this underside.
4 In a development of the invention, the transmitting or receiving element, preferably a laser diode, is allocated a monitor photodiode, which is also surrounded by the first layer and by means of which the laser diode can be monitored.
Further advantageous embodiments of the invention will emerge from the remaining sub-claims.
Drawings The invention will now be described m detail with reference to the drawing which relates to an embodiment. The single figure is a schematic sectional view of an optical module.
Description of an embodiment
The figure shows an optical module 1 comprising a carrier plate 3 preferably consisting of silicon.
A trough-shaped recess 7 and a V-shaped groove 9 adjacent thereto are introduced on an upper side 5 of the carrier plate 3 by a wet chemical etching process.
A semiconductor laser diode 13 is placed on a base 11 of the recess 7, a layer of solder 15 being used to produce the connection. The laser diode 13 itself is activated via an electric lead 17 arranged on a contact point 19.
A monitor photodiode 21 is arranged on the upper side 5 of the carrier 3 adjacent to the laser diode 13. The monitor photodiode 21 is orientated relative to an oblique lateral surface 23 of the recess 7 in order thus to be able to absorb light reflected therefrom. However, the monitor photodiode 21 is fastened on the plane upper side 5 of the carrier 3, a layer of solder 25 again being used. A conductive adhesive can obviously also be used instead of the solder. The signals emitted by the photodiode 21 are transmitted via an electric lead 27, connected to the photodiode at a contact point 29, to a subsequent control and evaluating unit, not shown.
The figure also shows a layer 31 which completely surrounds both the photodiode 21 and the laser diode 13. Only the connecting faces to the upper side 5 of the carrier plate 3 do not come into contact with this layer 3 1. The groove 9 is also filled by the layer 3 1.
The layer 3 1 consists of an optically transparent material having a defined optical refractive index which is important for calculating the beam path described hereinafter.
A further layer 33 serving as a moisture barrier is applied to the domeshaped surface of the layer 3 1. This two-layered construction is used whenever the optically transparent layer has inadequate moisture-proofing properties.
The laser diode 13 which is very sensitive to external influences can easily be protected by the two layers 3 1 and 33.
It can also be inferred from the figure that an optical lens 37 which improves the coupling of the laser light into an attached optical fibre is formed on an underside 335 of the carrier plate 3.
An optical module 1 is produced in several stages, a silicon wafer being used as basic material. Recesses 7 and 9 are initially formed by wet chemical etching mi the surface of the carrier plate 3 consisting of silicon, the oblique walls 23 being 6 defined by the crystal direction and their position and size therefore having precision of the order of 1 jum.
The laser diode 13 is then introduced into the recess 7, for which purpose the solder 15 is heated spot-wise, for example with a NdYAG laser.
The laser diode is preferably orientated within the recess 7 in the longitudinal direction on the edge of the transition of an oblique wall 41 into the base 11 of the recess 7. Markings can additionally be provided for adjustment on the upper side 5 of the carrier plate 3.
Before application of the laser diode, a gold layer can additionally be applied to parts of the surface 5 to improve electrical contact with the carrier plate 3. In addition to improving the electrical conductivity, this gold layer - not shown in the figure - acts as a reflector, for example on the oblique wall 23.
The interfaces of the carrier plate 3 at which light enters or issues are provided with a non-reflective layer, for which a quarter wavelength layer having a suitable refractive index deposited over the entire face on both sides 5 and 35 suffices.
When both photodiode 21 and laser diode 13 are applied, the layer 31 is initially applied and then the outer moisture-proofing layer 33.
A lacquer lens, produced by photolithography and melting of the lacquer, is transferred into the silicon to form the lens 37. A further possibifity is to form a lens by etching a trough-shaped recess and self- adjusted introduction of a glass bead. Individual adjustment is unnecessary in both cases, so the adjustment process only takes place once during production of the carrier plate.
7 The individual optical modifies 1 formed on a wafer are finally separated by sawing or breaking. The laser diode 13 is undamaged owing to the layers 3 1 and 3 3 and the recessed arrangement of the laser diode 13. The underside 35 can be protected with a lacquer layer before separation in order to provide protection from impurities.
Additional adjustment marks which serve for pre-orientation during the final optical coupling of the separated modules with the optical fibre arranged, for example, on a similar carrier plate can also be applied on the underside 35 during production so the necessary adjustment process is simplified and accelerated.
Operation of the optical module will now be described briefly hereinafter.
The laser diode 13 emits laser light in a wavelength range above 1100 rim in the direction of the oblique wall 41 of the recess 7. Owing to the optical transparency for this wavelength range of the layer 3 1, the beams reach the wall 41 where they are refi-acted vertically. However, this is conditional on the material of the layer 1 having an appropriate refractive index. The light then propagated within the carrier plate 3, which is also translucent for the specified wavelength range, and impinges on an oblique wall 43 of the V-shaped groove 9. The light is then reflected downwardly there to the underside 35. Once it has passed through the carrier plate 3, it issues at the underside 35. If the laser light is then to be coupled into an optical fibre or to be used as a collimated beam, the lens 37 is ananged at the outlet point.
To monitor operation of the laser diode 13 and to control the output power in the event of temperature changes and ageing, the laser diode 13 irradiates light to the oblique wall 23 at which it is reflected toward the photodiode 2 1.
The material of the layer 31 is particularly important mi this optical module. As already mentioned, it has to have a defined refractive index which is also constant and reproducible. It also has to be free from stray centres caused, for example, by fillers and to have high transparency at the emission wavelength of the laser diode 13. Finally, it is also necessary for the material to have low thermal expansion.
In an embodiment of the invention, not shown, the recess 7 is made in two stages. The laser chip 13 is mounted on the base 11 of the higher stage such that the lightemitting region rests directly on the solder layer (Epi-down mounting). The end face simultaneously rests at the edge of the transition from the higher to the lower stage so light is initially also emitted into the space fined by the layer 3 1 before it passes into the carrier at the oblique lateral wall 41. The distance between the laser diode 13 and the lateral wall 41 can be smaller in this arrangement and this may be advantageous for laser diodes with a large opening angle of emission.
9
Claims (20)
1. Method of producing an optical module suitable for coupling an optical fibre with at least one transmitting or receiving element which is placed on a first side of a transparent carrier, a beam path extending from the transmitting or receiving element to the opposite side of the carrier, characterised in that an optically transparent layer which surrounds at least the transmitting or receiving element is applied.
2. Method according to claim 1, characterised in that a preferably troughshaped recess into which the transmitting or receiving element is inserted is formed on the first side of the carrier.
3. Method according to claim 1 or 2, characterised in that a further layer (33) which serves as a moisture barrier is applied to the optically transparent layer (3 1).
4. Method according to one of the preceding claims, characterised in that the transmitting or receiving element is connected to the carrier by a solder layer.
5. Method according to one of the preceding claims, characterised in that a lacquer lens is transferred into the carrier on the second side (35) of the carrier (3), the lacquer lens being produced by a photolithographic process and subsequent melting of the lacquer.
6. Method according to claim 2, characterised in that the recess is produced by a wet chemical etching process.
7. Optical module for coupling an optical fibre, with a translucent carrier (3) and a transmitting or receiving element (13) which is applied to a first side (5) of the carrier (3), characterised by an optically parent layer (3 1) which surrounds at least the transmitting or receivmig element ( 13).
8. Optical module according to claim 7, characterised in that the carrier (3) has, on the first side, at least one preferably trough-shaped recess (7) into which the transmitting or receiving element (13) is introduced, the beam path of the transmitting or receiving element being directed to an oblique lateral wall (4 1) of the recess (7).
9. Optical module according to claim 6 or 7, characterised in that adjacent to the oblique lateral wall (41) of the recess (7) there is provided a preferably Vshaped groove (9) of which one wall (43) lies in the beam path as a reflective face.
10. Optical module according to one of claims 6 to 9, characterised in that a lens (37) is provided on a second side (35) of the carrier (3) opposite the first side.
11. Optical module according to one of claims 7 to 10, characterised in that a flirther layer (33) which acts as a moisture barrier is formed on the external surface of the first layer (3 1).
12. Optical module according to one of claims 7 to 11, characterised in that the material of the carrier (3) is silicon.
13. Optical module according to one of claims 7 to 12, characterised in that the material of the first layer (3 1) is organic.
14. Optical module according to one of claims 7 to 13, characterised in that the transmitting or receiving element is a semiconductor laser diode which emits light m the wavelength range above 1100 run.
IS. Optical module according to claim 14, characterised in that the laser diode (13) emits light in an opening angle of 10 to 5T.
16. Optical module according to claim 14 or 15, characterised in that the laser diode (13) is allocated a monitor photodiode (2 1) which is formed on the first side (5) of the carrier (3) and is also surrounded by the first layer (3 1), for the monitoring thereof.
17. Optical module according to one of claims 7 to 16, characterised in that marldngs are formed on the first and/or second side for adjustment.
18. Optical module according to one of claims 7 to 17, characterised in that the first and/or second side of the carrier (3) is provided with a non-reflective layer.
19. Method of producing an optical module substantially as hereinbefore described with reference to the accompanying drawing.
20. Optical module substantially as hereinbefore described with reference to the accompanying drawmig.
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE19616969A DE19616969A1 (en) | 1996-04-27 | 1996-04-27 | Optical assembly for coupling an optical waveguide and method for producing the same |
Publications (3)
Publication Number | Publication Date |
---|---|
GB9708025D0 GB9708025D0 (en) | 1997-06-11 |
GB2312551A true GB2312551A (en) | 1997-10-29 |
GB2312551B GB2312551B (en) | 1998-09-23 |
Family
ID=7792687
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
GB9708025A Expired - Fee Related GB2312551B (en) | 1996-04-27 | 1997-04-21 | Optical module for coupling an optical fibre and method of producing it |
Country Status (3)
Country | Link |
---|---|
DE (1) | DE19616969A1 (en) |
FR (1) | FR2748123A1 (en) |
GB (1) | GB2312551B (en) |
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WO2000041281A1 (en) * | 1998-12-30 | 2000-07-13 | Honeywell Inc. | Method and apparatus for hermetically sealing photonic devices |
US6488417B2 (en) | 1999-12-07 | 2002-12-03 | Infineon Technologies Ag | Opto-electronic assembly having an integrated imaging system |
US6792178B1 (en) | 2000-01-12 | 2004-09-14 | Finisar Corporation | Fiber optic header with integrated power monitor |
US6793405B1 (en) | 1998-08-05 | 2004-09-21 | Seiko Epson Corporation | Optical module |
US6969204B2 (en) | 2002-11-26 | 2005-11-29 | Hymite A/S | Optical package with an integrated lens and optical assemblies incorporating the package |
GB2419229A (en) * | 2004-10-13 | 2006-04-19 | Agilent Technologies Inc | Laser Arrangement |
US7078671B1 (en) | 2001-08-06 | 2006-07-18 | Shipley Company, L.L.C. | Silicon optical microbench devices and wafer-level testing thereof |
US7208725B2 (en) | 1998-11-25 | 2007-04-24 | Rohm And Haas Electronic Materials Llc | Optoelectronic component with encapsulant |
US7329056B2 (en) | 2003-09-15 | 2008-02-12 | Rohm And Haas Electronic Materials Llc | Device package and methods for the fabrication and testing thereof |
CN100391066C (en) * | 2003-09-19 | 2008-05-28 | 安华高科技光纤Ip(新加坡)私人有限公司 | Integrated photoelectronic device |
US10319654B1 (en) | 2017-12-01 | 2019-06-11 | Cubic Corporation | Integrated chip scale packages |
US10684389B2 (en) | 2015-08-21 | 2020-06-16 | Stmicroelectronics (Research & Development) Limited | Molded range and proximity sensor with optical resin lens |
EP4024628A4 (en) * | 2019-08-29 | 2023-10-25 | Kyocera Corporation | Optical element mounting package, electronic device, and electronic module |
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Publication number | Priority date | Publication date | Assignee | Title |
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DE19810624A1 (en) * | 1998-03-12 | 1999-09-16 | Bosch Gmbh Robert | Electro-optical module |
EP1097483A2 (en) * | 1998-06-30 | 2001-05-09 | Robert Bosch Gmbh | Device for detecting electromagnetic radiation |
DE19845484C2 (en) * | 1998-10-02 | 2002-09-26 | Infineon Technologies Ag | Micro-optical component and method for its production |
US6920168B1 (en) * | 2000-02-22 | 2005-07-19 | Triquint Technology Holding Co. | Optical assembly |
EP1146570A1 (en) * | 2000-04-14 | 2001-10-17 | Infineon Technologies AG | Semiconductor light emitting device and method for the manufacture of a carrier |
DE10032796A1 (en) * | 2000-06-28 | 2002-01-17 | Infineon Technologies Ag | optomodule |
FR2977715A1 (en) | 2011-07-08 | 2013-01-11 | St Microelectronics Grenoble 2 | OPTICAL ELECTRONIC HOUSING |
FR2977714B1 (en) * | 2011-07-08 | 2013-07-26 | St Microelectronics Grenoble 2 | OPTICAL ELECTRONIC HOUSING |
FR2988519A1 (en) | 2012-03-22 | 2013-09-27 | St Microelectronics Grenoble 2 | OPTICAL ELECTRONIC HOUSING |
DE102022106941A1 (en) | 2022-03-24 | 2023-09-28 | Ams-Osram International Gmbh | OPTOELECTRONIC SEMICONDUCTOR LASER COMPONENT |
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EP0690515A1 (en) * | 1994-06-30 | 1996-01-03 | Eastman Kodak Company | Optoelectronic assembly and methods for producing and using the same |
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DE4323828C2 (en) * | 1993-07-16 | 1995-12-14 | Ant Nachrichtentech | Arrangement for coupling at least one optical fiber end to an optoelectronic transmitter or receiver module |
US5384873A (en) * | 1993-10-04 | 1995-01-24 | Motorola, Inc. | Optical interface unit and method of making |
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1996
- 1996-04-27 DE DE19616969A patent/DE19616969A1/en not_active Withdrawn
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- 1997-04-25 FR FR9705142A patent/FR2748123A1/en active Pending
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EP0081827A2 (en) * | 1981-12-11 | 1983-06-22 | Sanyo Electric Co., Ltd. | Semiconductor optical logic device |
US5226052A (en) * | 1990-05-08 | 1993-07-06 | Rohm, Ltd. | Laser diode system for cutting off the environment from the laser diode |
EP0690515A1 (en) * | 1994-06-30 | 1996-01-03 | Eastman Kodak Company | Optoelectronic assembly and methods for producing and using the same |
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US6793405B1 (en) | 1998-08-05 | 2004-09-21 | Seiko Epson Corporation | Optical module |
US7348550B2 (en) | 1998-11-25 | 2008-03-25 | Rohm And Haas Electronic Materials Llc | Optoelectronic component with front to side surface electrical conductor |
US7781727B2 (en) | 1998-11-25 | 2010-08-24 | Nuvotronics, Llc | Optoelectronic component comprising an encapsulant |
US7355166B2 (en) | 1998-11-25 | 2008-04-08 | Rohm And Haas Electronic Materials Llc | Optoelectronic component having electrical connection and formation method thereof |
US7208725B2 (en) | 1998-11-25 | 2007-04-24 | Rohm And Haas Electronic Materials Llc | Optoelectronic component with encapsulant |
US7288758B2 (en) | 1998-11-25 | 2007-10-30 | Rohm And Haas Electronic Materials Llc | Wafer-level optoelectronic device substrate |
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US6588949B1 (en) | 1998-12-30 | 2003-07-08 | Honeywell Inc. | Method and apparatus for hermetically sealing photonic devices |
WO2000041281A1 (en) * | 1998-12-30 | 2000-07-13 | Honeywell Inc. | Method and apparatus for hermetically sealing photonic devices |
US6488417B2 (en) | 1999-12-07 | 2002-12-03 | Infineon Technologies Ag | Opto-electronic assembly having an integrated imaging system |
US6792178B1 (en) | 2000-01-12 | 2004-09-14 | Finisar Corporation | Fiber optic header with integrated power monitor |
US7078671B1 (en) | 2001-08-06 | 2006-07-18 | Shipley Company, L.L.C. | Silicon optical microbench devices and wafer-level testing thereof |
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US6969204B2 (en) | 2002-11-26 | 2005-11-29 | Hymite A/S | Optical package with an integrated lens and optical assemblies incorporating the package |
US9647420B2 (en) | 2003-09-15 | 2017-05-09 | Nuvotronics, Inc. | Package and methods for the fabrication and testing thereof |
US9817199B2 (en) | 2003-09-15 | 2017-11-14 | Nuvotronics, Inc | Device package and methods for the fabrication and testing thereof |
US7329056B2 (en) | 2003-09-15 | 2008-02-12 | Rohm And Haas Electronic Materials Llc | Device package and methods for the fabrication and testing thereof |
US7888793B2 (en) | 2003-09-15 | 2011-02-15 | Nuvotronics, Llc | Device package and methods for the fabrication and testing thereof |
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GB2419229B (en) * | 2004-10-13 | 2009-08-19 | Agilent Technologies Inc | Laser arrangement and related manufacturing method |
GB2419229A (en) * | 2004-10-13 | 2006-04-19 | Agilent Technologies Inc | Laser Arrangement |
US10684389B2 (en) | 2015-08-21 | 2020-06-16 | Stmicroelectronics (Research & Development) Limited | Molded range and proximity sensor with optical resin lens |
US11137517B2 (en) | 2015-08-21 | 2021-10-05 | Stmicroelectronics (Research & Development) Limited | Molded range and proximity sensor with optical resin lens |
US11693149B2 (en) | 2015-08-21 | 2023-07-04 | Stmicroelectronics (Research & Development) Limited | Molded range and proximity sensor with optical resin lens |
US10319654B1 (en) | 2017-12-01 | 2019-06-11 | Cubic Corporation | Integrated chip scale packages |
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Also Published As
Publication number | Publication date |
---|---|
GB2312551B (en) | 1998-09-23 |
FR2748123A1 (en) | 1997-10-31 |
GB9708025D0 (en) | 1997-06-11 |
DE19616969A1 (en) | 1997-10-30 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
PCNP | Patent ceased through non-payment of renewal fee |
Effective date: 20010421 |