GB2292809A

GB2292809A - Method and apparatus for sorting components

Info

Publication number: GB2292809A
Application number: GB9417693A
Authority: GB
Inventors: John Ridley
Original assignee: Texas Instruments Ltd
Current assignee: Texas Instruments Ltd
Priority date: 1994-08-31
Filing date: 1994-08-31
Publication date: 1996-03-06
Also published as: GB9417693D0

Abstract

An apparatus for sorting components into two or more grades comprises a container 3 or 4 for storing tested components of a given grade, a testing device 1 and means for opening and closing the container. In use, only one container is open when the testing device determines that the component under test is of the grade to be stored in the container (e.g. pass) and the container is closed when the testing device determines that the component under test is of any other grade (e.g. fail). The arrangement avoids the prior art procedure where the operator selected in which open-topped container to store the component, which could lead to errors as a result of fatigue etc. <IMAGE>

Description

Method and apparatus for sorting components.

The invention relates to the sorting of components into different grades. The invention relates especially to the sorting of electrical components or electronic devices.

Electronic devices are commonly tested and sorted by hand, using automatic testing equipment (ATE). The device to be tested is inserted into the ATE, which evaluates the characteristics of the device and places it into one of the previously determined grades. The type of grading used varies according to, for example, the type of device being tested. In some circumstances the devices are graded into only, for example, two grades: "good" devices, being those that pass all the tests and "bad" devices which fail one or more tests. In other circumstances, it might be desirable to grade and sort the devices into more than two grades, for example "good" devices and various grades of "bad" devices depending on the outcome of the tests carried out by the testing device.The ATE indicates the result of the tests to the test operator on, for example, a monitor or a print-out.

According to a known method of sorting devices, a test operator sits at a testing station, and is provided with a number of device trays. One tray is provided for the un-tested devices and two or more trays are provided for each of the different grades of tested device. The operator tests a device in the ATE and then places the device in the appropriate tray according to the grade accorded to the device and indicated by the ATE. The procedure is repeated for each device.

The testing procedure is repetitive and can become monotonous for the operator. As a result, the operator may place the tested device in the wrong tray. If, for example, a working device is placed in the tray for nonfunctioning devices, then that results in financial loss for the company manufacturing the devices. On the other hand, if a broken device is placed in a tray for devices that are functional and are to be delivered to customers, then the consequences are clearly serious and unacceptable.

The present invention seeks to mitigate the abovementioned problems associated with hand-testing and handsorting of electronic devices, and provides a method and apparatus for grading and sorting devices which reduces the number of devices incorrectly sorted.

Accordingly, the present invention provides apparatus for sorting components into two or more grades comprising a container for storing tested components of a given grade, a testing device, means for opening and closing the container, wherein, in use, the container is open when the testing device determines that the component under test is of the grade to be stored in the container and the container is closed when the testing device determines that the component under test is of any other grade.

Because the container for any given grade is closed whenever a component of another grade is tested, the components of different grades cannot be put in that container. A component of the appropriate grade when tested, however, can be put in the correct container because the container is open when it is tested.

Preferably, the apparatus is for sorting electrical components or electronic devices.

Preferably, a container is provided for storing each predetermined grade of component, and the apparatus comprises means for opening and closing each container, and, in use, each container is open when the testing device determines that the component under test is of the grade to be stored in that container and the container is closed when the testing device determines that the component under test is of any other grade. In that way, when a component is tested, the only container that is open is the container into which the component should be placed. More than one container may be provided for any or each grade of component.

Advantageously, an output signal from the testing device controls the means for opening and closing of the or each container. The testing device may be connected directly to the means for opening and closing the container or each, or else an electronic interface may be provided between the testing device and the containers.

The means for opening and closing the container advantageously comprises a lid and operating means for opening and/or closing the lid. Alternatively, the means for opening and closing the container may comprise, for example, a drawer, or a door, or a hatch.

Advantageously, the lid-operating means comprises a solenoid. A solenoid is a simple current-operated component that may be used for opening and/or closing the lid of the containers. Advantageously, the lid of the or each container is arranged so that it is closed by gravity when the solenoid is turned off. Alternatively, a spring may be arranged on the lid or the like so that the lid closes when the solenoid is turned off. That arrangement avoids the need for the test operator to close the container after a component has been placed inside, or to have a separate mechanism for closing the container.

Preferably, a microswitch is provided on the or each container for indicating when the container is closed. A device for indicating when the lid is closed is useful for preventing mistakes and a microswitch is a simple and reliable device for indicating that the lid is closed.

Preferably, the testing device is automatic testing equipment, examples of which are widely available and commonly used in the semiconductor industry.

The present invention also provides a method of sorting components into two or more grades wherein components are tested in a testing device and a container for storing components of a given grade of device is open when a component of that given grade is tested and the container is closed when a component of any other grade is tested.

The invention further provides a method of sorting components into two or more grades including testing components in a testing device and providing at least one container for storing components of a given grade and causing the container to be open when a component is determined to be of that given grade by the testing operation and to be closed when a component is determined to be of any other grade by the testing operation.

Preferably, the method is for sorting electrical components or electrical devices.

Preferably, a signal derived from the testing device controls the operation of means for opening and/or closing the container.

Preferably, the lid of the container is closed after the testing of a first component and before the testing of a subsequent component.

An apparatus according to the invention will now be described with reference to the accompanying drawings, of which: Fig. 1 is a block diagram of the apparatus; Fig. 2 is a view from the front of a container for tested devices; Fig. 3 is a view from above of the container shown in Fig. 2; Fig. 4 is a view from one end of the container shown in Fig. 2; and Fig. 5 is a view from the other end of the container shown in Fig. 2.

As shown in Fig. 1, the apparatus comprises a testing device in the form of an ATE 1 which is electrically connected to and supplies signals to an electronic interface 2. The electronic interface 2 is electrically connected to two containers 3, 4 for storing tested devices.

With reference to Figs. 2 to 5, each container 3, 4 for storing the tested devices consists of a box comprising a base part 5 and a lid part 6, the lid 6 being hinged to the base along one edge. The box is rectangular in cross-section and is large enough to hold 10 trays of 50 Quad Flat Pack (QFP) packages. The box is formed so that when the lid 6 is open, a device can easily be inserted into the box. When the lid 6 is shut, the box is closed and a device cannot be put into the box. A lid-opening means, indicated generally by the reference numeral 7, in the form of a solenoid 8 and an arm 9 is attached to the box. The solenoid 8 is attached to the back face of the box on the base. The arm 9 is jointed at its mid-point and is attached at one end to the lid 6 of the box. The other end of the arm 9 is arranged within the solenoid 8.A microswitch (not shown) is fitted internally in the vicinity of the junction of the base 5 and the lid 6 of the box, at the point indicated by the reference numberal 10, to detect when the lid 6 is closed. A switch (not shown) is also provided for turning off the signal from the ATE 1 to the electronic interface 2 when the device has been tested.

The ATE is pre-programmed to test devices and to grade them according to the results of those tests. In this example there are only two grades of device, and the devices may be considered as as either "good" devices, that is to say those devices that pass all of the tests, or "bad" devices, that is those devices that fail at least one of the tests. The ATE outputs a signal which represents the grade allocated to the device being tested and that signal is supplied to the electronic interface.

The interface analyses that signal and responds according to the signal from the ATE.

When the ATE indicates that the device that is tested is a good device, the interface produces a current only in the connection between the interface and the first box 3. The current drives the solenoid attached to the first box and hence opens that box. There is no current in the connection between the interface and the second box, and so the solenoid attached to the second box is not turned on, and that box stays closed. Hence, only the box for "good" devices opens and the device cannot be placed in the wrong box. Similarly, when a "bad" device is tested, the ATE supplies an appropriate signal to the interface, which decodes the signal, and accordingly produces a current only in the connection between the interface and the second box. The current drives the solenoid on the second box so that the lid on the second box opens.There is no current in the connection between the first box so the solenoid on that box is not turned on and the box is not opened.

By this arrangement, when a device of one grade is tested, the container provided for storing the other grade of device does not open and it is not possible to put the tested device in the wrong container.

Accordingly, the type of sorting mistakes encountered previously may be avoided. The apparatus facilitates the sorting of the devices.

When the device has been tested and t:he appropriate box has opened, the device is removed from the ATE and placed in the relevant box. The switch (riot shown) for turning off the signal from the ATE is then operated.

There is then no current in the connection between the interface and the boxes and the solenoid attached to the open box is therefore turned off. The lid of each box is arranged so that when the solenoid is turned off, the lid drops shut under gravity. The microswitch inside the box indicates when the box is properly closed. If the box is not properly closed, then testing may be discontinued.

The apparatus may be arranged so that it can be used for sorting devices into more than two grades. One or more containers are provided for each grade of device, and the ATE and the electronic interface are adapted so that only those containers intended to receive a given grade of device open when a device of that grade is tested. This ensures that the device cannot be put in the wrong box, and can always be placed in a correct container.

As will be clear to the person skilled in the art, the apparatus can be adapted to be used with many different types of ATEs used for hand testing.

Claims

Claims.

1. Apparatus for sorting components into two or more grades comprising a container for storing tested components of a given grade, a testing device, means for opening and closing the container, wherein, in use, the container is open when the testing device determines that the component under test is of the grade to be stored in the container and the container is closed when the testing device determines that the component under test is of any other grade.

2. Apparatus as claimed in claim 1 for sorting electrical components.

3. Apparatus as claimed in claim 2 for sorting electronic devices.

4. Apparatus as claimed in any one of claims 1 to 3 wherein at least one container is provided for storing each predetermined grade of component, comprising means for opening and closing each container, and wherein, in use, each container is open when the testing device determines that the component under test is of the grade to be stored in that container and that container is closed when the testing device determines that the component under test is of any other grade.

5. Apparatus as claimed in any one of claims 1 to 4 wherein an output signal from the testing device controls the opening and/or closing of the or each container.

6. Apparatus as claimed in any one of claims 1 to 5 wherein the means for opening and closing the container comprises a lid and operating means for opening and/or closing the lid.

7. Apparatus as claimed in claim 6 in which the lid-operating means comprises a solenoid.

8. Apparatus as claimed in claim 7 in which the lid of the or each container is arranged so that it is closed by gravity when the solenoid is turned off.

9. Apparatus as claimed in any one of claims 1 to 8 comprising a microswitch arranged on the or each container for indicating when it is closed.

10. Apparatus as claimed in any one of claims 1 to 9 in which the testing device is automatic testing equipment.

11. A method of sorting components into two or more grades wherein components are tested in a testing device and a container for storing components of a given grade of component is open when a component of that given grade is tested and the container is closed when a component of any other grade is tested.

12. A method of sorting components into two or more grades including testing components in a testing device and providing at least one container for storing components of a given grade and causing the or each container to be open when a component is determined to be of that given grade by the testing operation and to be closed when a component is determined to be of any other grade by the testing operation.

13. A method as claimed in claim 11 or claim 12 for sorting electrical components.

14. A method as claimed in claim 13 for sorting electronic devices.

15. A method of sorting components as claimed in any one of claims 11 to 14 wherein a signal derived from the testing device controls the operation of means for opening and/or closing the container.

16. A method as claimed in any one of claims 11 to 15 in which the container is closed after the testing of a first component and before the testing of a subsequent component.

17. Apparatus substantially as hereinbefore described with reference to and as shown in the accompanying drawings.

18. A method of sorting components substantially as hereinbefore described with reference to the accompanying drawings.