GB9417693D0 - Method and apparatus for sorting components - Google Patents

Method and apparatus for sorting components

Info

Publication number
GB9417693D0
GB9417693D0 GB9417693A GB9417693A GB9417693D0 GB 9417693 D0 GB9417693 D0 GB 9417693D0 GB 9417693 A GB9417693 A GB 9417693A GB 9417693 A GB9417693 A GB 9417693A GB 9417693 D0 GB9417693 D0 GB 9417693D0
Authority
GB
United Kingdom
Prior art keywords
container
testing device
grade
under test
open
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
GB9417693A
Other versions
GB2292809A (en
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Texas Instruments Ltd
Original Assignee
Texas Instruments Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Texas Instruments Ltd filed Critical Texas Instruments Ltd
Priority to GB9417693A priority Critical patent/GB2292809A/en
Publication of GB9417693D0 publication Critical patent/GB9417693D0/en
Publication of GB2292809A publication Critical patent/GB2292809A/en
Withdrawn legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2834—Automated test systems [ATE]; using microprocessors or computers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/01—Subjecting similar articles in turn to test, e.g. "go/no-go" tests in mass production; Testing objects at points as they pass through a testing station
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Sorting Of Articles (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)

Abstract

An apparatus for sorting components into two or more grades comprises a container 3 or 4 for storing tested components of a given grade, a testing device 1 and means for opening and closing the container. In use, only one container is open when the testing device determines that the component under test is of the grade to be stored in the container (e.g. pass) and the container is closed when the testing device determines that the component under test is of any other grade (e.g. fail). The arrangement avoids the prior art procedure where the operator selected in which open-topped container to store the component, which could lead to errors as a result of fatigue etc. <IMAGE>
GB9417693A 1994-08-31 1994-08-31 Method and apparatus for sorting components Withdrawn GB2292809A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
GB9417693A GB2292809A (en) 1994-08-31 1994-08-31 Method and apparatus for sorting components

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB9417693A GB2292809A (en) 1994-08-31 1994-08-31 Method and apparatus for sorting components

Publications (2)

Publication Number Publication Date
GB9417693D0 true GB9417693D0 (en) 1994-10-19
GB2292809A GB2292809A (en) 1996-03-06

Family

ID=10760750

Family Applications (1)

Application Number Title Priority Date Filing Date
GB9417693A Withdrawn GB2292809A (en) 1994-08-31 1994-08-31 Method and apparatus for sorting components

Country Status (1)

Country Link
GB (1) GB2292809A (en)

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3003630A (en) * 1960-04-26 1961-10-10 Western Electric Co Apparatus for sorting resistors and control circuitry

Also Published As

Publication number Publication date
GB2292809A (en) 1996-03-06

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Legal Events

Date Code Title Description
WAP Application withdrawn, taken to be withdrawn or refused ** after publication under section 16(1)