GB2247350B - Method and apparatus for inspecting electronic circuit - Google Patents

Method and apparatus for inspecting electronic circuit

Info

Publication number
GB2247350B
GB2247350B GB9117906A GB9117906A GB2247350B GB 2247350 B GB2247350 B GB 2247350B GB 9117906 A GB9117906 A GB 9117906A GB 9117906 A GB9117906 A GB 9117906A GB 2247350 B GB2247350 B GB 2247350B
Authority
GB
United Kingdom
Prior art keywords
electronic circuit
inspecting electronic
inspecting
circuit
electronic
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
GB9117906A
Other versions
GB9117906D0 (en
GB2247350A (en
Inventor
Kazuo Emmoto
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Publication of GB9117906D0 publication Critical patent/GB9117906D0/en
Publication of GB2247350A publication Critical patent/GB2247350A/en
Application granted granted Critical
Publication of GB2247350B publication Critical patent/GB2247350B/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Adjustable Resistors (AREA)
GB9117906A 1990-08-22 1991-08-20 Method and apparatus for inspecting electronic circuit Expired - Fee Related GB2247350B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2221855A JPH04104074A (en) 1990-08-22 1990-08-22 Electronic printed-circuit board inspection device

Publications (3)

Publication Number Publication Date
GB9117906D0 GB9117906D0 (en) 1991-10-09
GB2247350A GB2247350A (en) 1992-02-26
GB2247350B true GB2247350B (en) 1994-02-16

Family

ID=16773248

Family Applications (1)

Application Number Title Priority Date Filing Date
GB9117906A Expired - Fee Related GB2247350B (en) 1990-08-22 1991-08-20 Method and apparatus for inspecting electronic circuit

Country Status (4)

Country Link
JP (1) JPH04104074A (en)
KR (1) KR920004854A (en)
DE (1) DE4126473A1 (en)
GB (1) GB2247350B (en)

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4400809A (en) * 1981-03-02 1983-08-23 Texas Instruments Incorporated Arbitrary drive for magnetic field waveform control
WO1987001813A1 (en) * 1985-09-23 1987-03-26 Sharetree Limited An oven for the burn-in of integrated circuits
GB2199957A (en) * 1987-01-16 1988-07-20 Teradyne Inc Automatic circuit tester control

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58158566A (en) * 1982-03-17 1983-09-20 Hitachi Ltd Inspecting unit
US4675673A (en) * 1984-01-27 1987-06-23 Oliver Douglas E Programmable pin driver system

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4400809A (en) * 1981-03-02 1983-08-23 Texas Instruments Incorporated Arbitrary drive for magnetic field waveform control
WO1987001813A1 (en) * 1985-09-23 1987-03-26 Sharetree Limited An oven for the burn-in of integrated circuits
GB2199957A (en) * 1987-01-16 1988-07-20 Teradyne Inc Automatic circuit tester control

Also Published As

Publication number Publication date
GB9117906D0 (en) 1991-10-09
JPH04104074A (en) 1992-04-06
KR920004854A (en) 1992-03-28
DE4126473A1 (en) 1992-03-05
GB2247350A (en) 1992-02-26

Similar Documents

Publication Publication Date Title
EP0484141A3 (en) Method and apparatus for testing integrated circuits
HK1033600A1 (en) Method and apparatus for electronic meter testing.
EP0427563A3 (en) Apparatus and method for installation of multi-pin components on circuit boards
GB2278689B (en) Method and apparatus for testing integrated circuits
GB9512101D0 (en) Circuit board test apparatus and method
EP0700008A3 (en) Electronic circuit modeling method and apparatus
HK103896A (en) Electronic device manipulating apparatus and method
GB9116720D0 (en) Function selection circuit for electronic apparatus and control method using the circuit
EP0487315A3 (en) Method and apparatus for electronic component mounting
EP0488031A3 (en) Method of and apparatus for inspecting a printed circuit board
GB9119503D0 (en) Inspection method and apparatus
EP0633478A3 (en) Method and device for testing electronic circuit boards.
EP0529092A4 (en) Method for manufacturing electronic device and apparatus therefor
EP0776151A4 (en) Method and apparatus for soldering inspection of circuit board
EP0487954A3 (en) Method of and apparatus for inspecting line width on printed board
EP0472938A3 (en) Method and device for testing and repairing an integrated circuit
GB2226966B (en) Method and apparatus for forming electrode on electronic component
EP0410436A3 (en) Apparatus and method for testing printed circuit boards
EP0715175A3 (en) Method and apparatus for testing an integrated circuit
IL94179A0 (en) Electronic retouch apparatus and method
GB9316273D0 (en) Method and apparatus for testing frquency-dependent electrical circuits
DE69412175D1 (en) Soldering method and apparatus for connecting electronic circuit arrangements
EP0492217A3 (en) Test apparatus for electronic components
GB2247350B (en) Method and apparatus for inspecting electronic circuit
EP0457339A3 (en) Method and apparatus for the production of circuit boards

Legal Events

Date Code Title Description
746 Register noted 'licences of right' (sect. 46/1977)

Effective date: 19950810

PCNP Patent ceased through non-payment of renewal fee

Effective date: 19960820