GB2231681A - Optical microscope having movable light spot in object plane - Google Patents

Optical microscope having movable light spot in object plane Download PDF

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Publication number
GB2231681A
GB2231681A GB8910307A GB8910307A GB2231681A GB 2231681 A GB2231681 A GB 2231681A GB 8910307 A GB8910307 A GB 8910307A GB 8910307 A GB8910307 A GB 8910307A GB 2231681 A GB2231681 A GB 2231681A
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GB
United Kingdom
Prior art keywords
lens
light
objective lens
object plane
plane
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
GB8910307A
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GB8910307D0 (en
GB2231681B (en
Inventor
Ozef Zbigniew Ulanowski
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
HATFIELD POLYTECHNIC
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HATFIELD POLYTECHNIC
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by HATFIELD POLYTECHNIC filed Critical HATFIELD POLYTECHNIC
Priority to GB8910307A priority Critical patent/GB2231681B/en
Publication of GB8910307D0 publication Critical patent/GB8910307D0/en
Priority to EP90312592A priority patent/EP0486732A1/en
Publication of GB2231681A publication Critical patent/GB2231681A/en
Priority to US07/793,631 priority patent/US5225929A/en
Application granted granted Critical
Publication of GB2231681B publication Critical patent/GB2231681B/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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Classifications

    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00Microscopes
    • G02B21/0004Microscopes specially adapted for specific applications
    • G02B21/002Scanning microscopes
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00Microscopes
    • G02B21/06Means for illuminating specimens
    • G02B21/08Condensers
    • G02B21/082Condensers for incident illumination only

Abstract

A microscope has supplementary means, for producing a light spot S in the object plane of the microscope objective lens MO, which comprises a light source from which a collimated light beam is derived, a focusing lens L1 receiving the collimated beam and a coupling lens L2 disposed between said first lens L1 and the objective lens MO. The supplementary means has the following features: (i) the focal point F of the focusing lens L1 is in the plane of the image of a specimen in said object plane as obtained through the objective lens MO and the coupling lens L2, (ii) the light beam fills the clear aperture of the objective lens MO and (iii) the focusing lens L1 is movable in a plane perpendicular to its axis. The focusing lens L1 and the light source may be movable together perpendicularly to said axis, or the focusing lens L1 may be movable perpendicularly to said axis on its own (Figs. 2, 4). <IMAGE>

Description

:2:2 3 JL G a 1 optical Microscopes This invention relates to optical
microscopes having supplementary means for delivering a beam of light into an optical microscope so that:
a) the said beam is focused into a small spot in the object plane of the microscope objective lens; b) the said spot can be moved freely within the said object plane.
More particularly, but not exclusively, the invention is intended to be used in conjunction with a semiconductor laser to produce a spot of light small enough to create electromagnetic gradient forces for trapping micro-particles and living cells.
In certain applications involving the microscopes there arises a need to focus a light on to a specimen under observation. include irradiating small specimens with trapping micro- particles in optical gradient Such spots can be obtained by introducing use of optical small spot of Possible uses laser light, f orce traps. light from a secondary source such as a semi-conductor laser into the optical path of the microscope and using the objective lens to focus the light. Additionally, some means of manipulating the position of the spot of light within the field of view of the microscope should be provided.
According to the invention a microscope is provided with a supplementary means for producing a light spot S in the object plane of the microscope objective lens, the means comprising a light source from which a collimated light beam is derived, a focusing lens Ll receiving the collimated beam and a coupling lens L2 dispos-ed between said first lens Ll and the objective lens MO whereby a light spot is produced from said collimated beam in the object plane of the objective lens MO, (i) the focal point F of the focusing lens L1 being in the plane of the image of a specimen in said object plane as obtained through the objective lens MO and the coupling lens L2, (ii) the light beam filling the clear aperture of the objective lens MO without substantial light loss and (iii) the focusing lens L1 being movable in a plane perpendicular to its axis to displace the light spot S in the object plane of the objective lens MO, the parameters of the system being such that the axial ray of light from said light source always passes through the second principal point (i.e. that on the object side) of the objective lens MO. The focusing lens Ll may additionally be capable of limited movement parallel to its axis so that the light spot is displaced a short distance from the object plane of the objective lens Mo. 20 In a first embodiment the light source is moved together with the focusing lens Ll perpendicularly to said axis. In a second embodiment of the invention, the focusing lens Ll is movable perpendicularly to said axis relatively to the collimated light beam. The invention will now be further explained by way of example with reference to the two aforesaid embodiments which are shown in Figures 1 and 2 respectively of the accompanying annotated drawings. Figures 3 and 4 of the drawings show modifications of the Figures 1 and 2 systems 2 - v respectively.
In order to efficiently focus light into a small spot one should utilise the whole clear aperture of the lens used for focusing. For example, for the case of a gaussian laser beam the size of the spot will be:
D=4 Tr where wavelength of lightr f - focal length of the lens, Q - beam diameter at the lens.
A beam narrower than the aperture would not produce a spot of the minimum (i.e. diffraction limited) size.
Conversely, a wider beam would result in a loss of light is power. The above should be true regardless of the position of the spot, i.e. whether it is displaced away from the optical axis or not. In the present invention the above requirements are met by ensuring that:
a) the beam is expanded to fill the clear aperture of the objective lens; b) the axial ray of light emerging from the light source always passes through the second (i.e. object side) principal point of the objective lens.
Further, in order to adapt the laser beam to finite conjugate ratio of the microscope objective lens beam must be made slightly divergent. This is achieved arranging the focal point F of the focusing lens Ll in plane of the image of the specimen as obtained through objective lens MO and the coupling lens L2.
3 - the the ' by the the The light produced by a semi-conductor laser can be collimated by means of lenses, prisms or a combination of both into a beam of circular cross- section. Such a beam can have divergence sufficiently low that it results in an additional contribution to the size of the final spot of light produced by the present invention comparable in magnitude or smaller than the size pertaining to formula (1). Thus when the present invention is used in conjunction with a semi-conductor laser and a collimator producing a quasi-parallel beam of sufficiently low divergence the size of the spot of light can be close to or less than 1 1M M.
The optical systems of the two embodiments have the following features:
1. The focal point F of the focusing lens Ll as stated above is in, or close to, the plane of the image of the specimen in the objective lens MO and the coupling lens L2. If the lens L1 is a positive one the focal point F is the second (rear) focal point; if it is a negative one the focal point F (imaginary) is the first (front) focal point.
In the second embodiment the lens Ll must be positive.
2. The laser beam fills the whole aperture of the microscope objective lens MO, irrespectively of the deflection of the beam. This is achieved by a judicious choice of the focal lengths of the lenses used.
3. In the first embodiment the second (object side) principal point of the microscope objective lens MO coincides with the second focal point of the coupling lens L2. - 4. In the second embodiment the focusing lens Ll 1 1 and the second (object side) principal point of the microscope objective lens MO are in the conjugate planes of the coupling lens L2.
5. The mirror M allows viewing the specimen and is such that it reflects a tubstantial part of the visible light originating from the specimen and transmits a substantial part of the light emitted by the laser.
6. In the first embodiment the laser, collimator and focusing lens assembly can be moved as a unit in the plane perpendicular to the optical axis of the said assembly whereby the focused light spot S is moved within the object plane of the microscope by an amount proportional to but generally smaller than the displacement of the said assembly. If desired the said assembly may also be made capable of displacement parallel to the said axis the said displacement resulting in a respective displacement of the said light spot S away from the said object plane.
7. In the second embodiment the focusing lens L1 can be displaced in the plane perpendicular to the optical axis of the said lens and possibly it can also be displaced parallel to the said axis the respective displacements having the same influence on the position of the focused light spot S as in point 6 above.
The formulae for the first embodiment may be derived as follows. It is assumed that all distances are measured between appropriate principal points of the lenses.
The diameter ( 2 of the laser beam in the plane of the coupling lens L2 is described by:
(R 2 = l(d/ifli-1) (2) where:
Cel original diameter of the laser beam, d distance between the lenses Ll and L2, f 1 focal length of the lens Ll (note that f negative for a negative-power lens).
The virtual image of the focal point F in the lens L2 is formed at the distance ú from the objective lens MO (see Fig. 3). Because the distance between L2 and MO is equal to f 2 the lens equation for the lens L2 takes the form:
l/f2=1/(d-f 1)-1/(f_f2) (3) The diameter(Di of the beam in the plane of the lens MO is:
2/ (ff 2) (4) By combining equations (2), (3) and (4) we obtain the expression:
f 2 /If 11 (c. 1 (5) which allows choosing the focal lengths of the lenses given the collimated beam diameter and the diameter CP which is determined by the size of the clear aperture of the objective lens Mo. The latter can be calculated with the aid of the approximate formula:
Q.::2- 2 N f 3 /n (6) where N and f 3 are, respectively, the numerical aperture and the focal length of the objective lens MO and n is the refractive index of the medium in which the specimen is immersed. It must be remembered that the focal length f 2 determines the distance between the coupling lens L2 and the objective lens MO. Having chosen the focal lengths, one can c -z obtain the distance d between the focusing lens L1 and the coupling lens L2 from formula (2) (note again that fl can be either positive or negative, depending on the type of the lens Ll). The length t is equal to the object-to-image distance of the microscope (usually 195mm) less the focal length f 3 of the objective lens.
The formulae for the second embodiment may be derived as follows. It is again assumed that all distances are measured between appropriate principal points of the lenses.
The diameter (C 2 of the laser beam in the plane of the coupling lens L2 is described by the equation:
0 2 Q 1 (d/f l- 1) (7) where:
1 D- (l - original diameter of the laser beam, d - distance between the lenses Ll and L2, f 1 - focal length of the lens Ll.
Because the lenses Ll and MO are in the conjugate planes of the lens L2 the lens equation for the lens L2 can now be written as:
l/f2 =1/d+l/d' where d' is the distance between the lenses L2 and Mo. We also have:
i/f 2 =1/(d-f 1)-1/(t-d') (9) since the virtual image of the focal point F in the lens L2 is formed at the distance 1 from the objective lens Mo. The diameter Q Of the beam in the plane of the lens MO is & 2 1-d'/P (10) By combining equations (7), (8'), (9) and (10) we obtain:
d'/f 2=Q/Q1 +1 (11) Having chosen d' and f 2 one can calculate d from formula (8) and f 1 from formula (9).
In a modification of the present invention shown in Figures 3 and 4 the viewing path and laser beam path have been interchanged as compared with Figures 1 and 2 respectively. Also therefore the mirror M should transmit a substantial part of the visible light originating from the specimen and reflect a substantial part of the light emitted by the laser.
In a further modification of the above described embodiments the mirror M can be such that it reflects most of the visible light (used for viewing) and transmits most is of the laser light (used for producing the light spot) in the case of the embodiments shown in Figures 1 and 2.
Again, the reverse should be the case for the embodiments shown in Figures 3 and 4. The above can be accomplished with the aid of an interference filter designed for oblique incidence. Such a filter can be chosen to transmit and reflect only at desired wavelengths or wavelength ranges and thus separate the viewing path from the laser light path more efficiently.
If a high-power light source producing invisible radiation is used additional protection to the viewer can be afforded by placing a blocking filter between the mirror M and the eyepiece of the microscope.
Finally, a laser providing a collimated beam can be used rather than a separate collimator being provided.

Claims (4)

1. A microscope provided with a supplementary means for producing a light spot S in the object plane of the microscope objective lens, characterised in that the means comprises a light source from which a collimated light beam is derived, a focusing lens Ll receiving the collimated beam and a coupling lens L2 disposed between said first lens Ll and the objective lens MO whereby a light spot is produced from said collimated beam in the object plane of the objective lens MO, (i) the focal point F of the focusing lens Ll being in the plane of the image of a specimen in said object plane as obtained through the objective lens MO and the coupling lens L2, (ii) the light beam filling the clear aperture of the objective lens MO without substantial light loss and (iii) the focusing lens Ll being movable in a plane perpendicular to its axis to move the light spot S in the object plane of the objective lens MOI the parameters of the system being such that the axial ray of light from said light source always passes through the second principal point (i.e. that on the object side) of the objective lens MO.
2 A microscope according to claim 1, characterised in that the focusing lens Ll and the light source are movable together perpendicularly to said axis.
3. A microscope according to claim 1, characterised in that the focusing lens Ll is movable perpendicularly to said axis relatively to the collimated light beam.
4. A microscope according to any one of claims 1 to 3, characterised in that said light source is a laser source 11 and a mirror M is disposed between the coupling lens L2 and the objective lens MO so that the laser light and the visible light from a specimen have a common path between the mirror M and the objective lens MO and become split at the mirror M by reflection of one of said lights and transmission of the other.
01 Published 1990 atThePatertOfnce,Statz.tT-ouse.66.'71 High I-lolborI', LondOnWC1R4TP.Purth,, copies maybe obtainedfromThe Patent Ofrice. Sales Branch, St Maxy Cray. Orpington, Kent BR5 3RD. Printed by Multiplex techniques ltd, St Mai-j Cray, Kent, Con. 1187
GB8910307A 1989-05-05 1989-05-05 Optical microscopes Expired - Fee Related GB2231681B (en)

Priority Applications (3)

Application Number Priority Date Filing Date Title
GB8910307A GB2231681B (en) 1989-05-05 1989-05-05 Optical microscopes
EP90312592A EP0486732A1 (en) 1989-05-05 1990-11-20 Optical microscopes
US07/793,631 US5225929A (en) 1989-05-05 1991-11-18 Device for producing a light spot in a microscope

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB8910307A GB2231681B (en) 1989-05-05 1989-05-05 Optical microscopes

Publications (3)

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GB8910307D0 GB8910307D0 (en) 1989-06-21
GB2231681A true GB2231681A (en) 1990-11-21
GB2231681B GB2231681B (en) 1993-04-21

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GB8910307A Expired - Fee Related GB2231681B (en) 1989-05-05 1989-05-05 Optical microscopes

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US (1) US5225929A (en)
EP (1) EP0486732A1 (en)
GB (1) GB2231681B (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6251101B1 (en) 1998-06-26 2001-06-26 Visx, Incorporated Surgical laser system microscope with separated ocular and objective lenses

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6133986A (en) * 1996-02-28 2000-10-17 Johnson; Kenneth C. Microlens scanner for microlithography and wide-field confocal microscopy
DE19954933A1 (en) * 1999-11-10 2001-05-17 Zeiss Carl Jena Gmbh Arrangement for coupling optical tweezers and / or a processing beam into a microscope
US6898006B2 (en) * 2001-12-26 2005-05-24 Olympus Optical Co., Ltd. Microscope
US7282729B2 (en) * 2003-08-20 2007-10-16 Xyratex Technology Limited Fabry-Perot resonator apparatus and method for observing low reflectivity surfaces
US11506877B2 (en) 2016-11-10 2022-11-22 The Trustees Of Columbia University In The City Of New York Imaging instrument having objective axis and light sheet or light beam projector axis intersecting at less than 90 degrees

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1579254A (en) * 1976-03-15 1980-11-19 Mochida Pharm Co Ltd Laser optical apparatus
GB2070274A (en) * 1980-02-22 1981-09-03 Leitz Ernst Gmbh Optical device for injecting light spot

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3460880A (en) * 1964-12-18 1969-08-12 Beckman Instruments Inc Point illumination and scanning mechanism for microscopes
DE2843287A1 (en) * 1977-10-05 1979-04-19 Canon Kk EYE EXAMINATION INSTRUMENT
FR2517837A1 (en) * 1981-12-04 1983-06-10 Anvar DEVICE OPTIMIZING THE COUPLING OF TWO OPTICAL SYSTEMS FOR OBJECT OBSERVATION AND ANALYSIS

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1579254A (en) * 1976-03-15 1980-11-19 Mochida Pharm Co Ltd Laser optical apparatus
GB2070274A (en) * 1980-02-22 1981-09-03 Leitz Ernst Gmbh Optical device for injecting light spot

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6251101B1 (en) 1998-06-26 2001-06-26 Visx, Incorporated Surgical laser system microscope with separated ocular and objective lenses

Also Published As

Publication number Publication date
GB8910307D0 (en) 1989-06-21
US5225929A (en) 1993-07-06
EP0486732A1 (en) 1992-05-27
GB2231681B (en) 1993-04-21

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PCNP Patent ceased through non-payment of renewal fee

Effective date: 19960505