GB2186144A - Optical demultiplexer - Google Patents

Optical demultiplexer Download PDF

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Publication number
GB2186144A
GB2186144A GB08700322A GB8700322A GB2186144A GB 2186144 A GB2186144 A GB 2186144A GB 08700322 A GB08700322 A GB 08700322A GB 8700322 A GB8700322 A GB 8700322A GB 2186144 A GB2186144 A GB 2186144A
Authority
GB
United Kingdom
Prior art keywords
detector
light
detectors
reflected
components
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
GB08700322A
Other versions
GB8700322D0 (en
Inventor
Craig George Sawyers
Allen William Mabbitt
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
PA Consulting Services Ltd
Original Assignee
PA Consulting Services Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by PA Consulting Services Ltd filed Critical PA Consulting Services Ltd
Priority to PCT/GB1987/000061 priority Critical patent/WO1987004862A1/en
Priority to EP87901072A priority patent/EP0256075A1/en
Publication of GB8700322D0 publication Critical patent/GB8700322D0/en
Publication of GB2186144A publication Critical patent/GB2186144A/en
Withdrawn legal-status Critical Current

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Classifications

    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B6/00Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings
    • G02B6/24Coupling light guides
    • G02B6/42Coupling light guides with opto-electronic elements
    • G02B6/4201Packages, e.g. shape, construction, internal or external details
    • G02B6/4204Packages, e.g. shape, construction, internal or external details the coupling comprising intermediate optical elements, e.g. lenses, holograms
    • G02B6/4215Packages, e.g. shape, construction, internal or external details the coupling comprising intermediate optical elements, e.g. lenses, holograms the intermediate optical elements being wavelength selective optical elements, e.g. variable wavelength optical modules or wavelength lockers
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B6/00Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings
    • G02B6/24Coupling light guides
    • G02B6/26Optical coupling means
    • G02B6/28Optical coupling means having data bus means, i.e. plural waveguides interconnected and providing an inherently bidirectional system by mixing and splitting signals
    • G02B6/293Optical coupling means having data bus means, i.e. plural waveguides interconnected and providing an inherently bidirectional system by mixing and splitting signals with wavelength selective means
    • G02B6/29379Optical coupling means having data bus means, i.e. plural waveguides interconnected and providing an inherently bidirectional system by mixing and splitting signals with wavelength selective means characterised by the function or use of the complete device
    • G02B6/2938Optical coupling means having data bus means, i.e. plural waveguides interconnected and providing an inherently bidirectional system by mixing and splitting signals with wavelength selective means characterised by the function or use of the complete device for multiplexing or demultiplexing, i.e. combining or separating wavelengths, e.g. 1xN, NxM
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/02Details
    • H01L31/0236Special surface textures
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/02Details
    • H01L31/0236Special surface textures
    • H01L31/02363Special surface textures of the semiconductor body itself, e.g. textured active layers
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/08Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof in which radiation controls flow of current through the device, e.g. photoresistors
    • H01L31/10Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof in which radiation controls flow of current through the device, e.g. photoresistors characterised by potential barriers, e.g. phototransistors
    • H01L31/101Devices sensitive to infrared, visible or ultraviolet radiation
    • H01L31/102Devices sensitive to infrared, visible or ultraviolet radiation characterised by only one potential barrier
    • H01L31/108Devices sensitive to infrared, visible or ultraviolet radiation characterised by only one potential barrier the potential barrier being of the Schottky type
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B6/00Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings
    • G02B6/24Coupling light guides
    • G02B6/26Optical coupling means
    • G02B6/28Optical coupling means having data bus means, i.e. plural waveguides interconnected and providing an inherently bidirectional system by mixing and splitting signals
    • G02B6/293Optical coupling means having data bus means, i.e. plural waveguides interconnected and providing an inherently bidirectional system by mixing and splitting signals with wavelength selective means
    • G02B6/29304Optical coupling means having data bus means, i.e. plural waveguides interconnected and providing an inherently bidirectional system by mixing and splitting signals with wavelength selective means operating by diffraction, e.g. grating
    • G02B6/29305Optical coupling means having data bus means, i.e. plural waveguides interconnected and providing an inherently bidirectional system by mixing and splitting signals with wavelength selective means operating by diffraction, e.g. grating as bulk element, i.e. free space arrangement external to a light guide
    • G02B6/2931Diffractive element operating in reflection

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Electromagnetism (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Optics & Photonics (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)

Abstract

A detector for demultiplexing light signals containing components of differing wavelengths (L1, L2), comprises a plurality of Schottky barrier detectors (26, 28) having parallel-grooved surfaces successively receiving the light at angles of incidence (A1, A2) such that components L1 are absorbed by plasmon resonance at Shottky barrier detector 26 and components L2 are similarly absorbed at Schottky barrier detector 28. <IMAGE>

Description

SPECIFICATION Optical demultiplexer Field of invention This invention concerns optical demultiplexers by which light of one wavelength can be separated from light of another wavelength.
Background to the invention In optical fibre communication systems, higher data transmission rates can be achieved by transmitting light signals at two differing wavelengths along the same optical path. Two preferred wavelengths for fibre optic transmission paths are 1.3 um and 1.55 um.
It is an object of the invention to provide a device by which light of one wavelength can be separated from light of the other wavelength.
It is another object of the invention to provide a device which can be adapted to separate any number of light signals provided they are all of differing wavelengths.
Summary of the invention According to the present invention a detector which is capable of demultiplexing n light signals each having a different wavelength L1, L2 .... Ln comprises a first Schottky barrier detector the light receptive surface of which is profiled with a plurality of parallel grooves or ridges so that surface plasmon resonance will occur if light is incident then and (n-1) further Schottky barrier detectors each having a light receptive surface which is profiled in a similar manner to the first; projection means for projecting light containing all n signals onto the light receptive surface of a first of the detectors at an angle of incidence Al, such that surface plasmon resonance, and therefore absorption, will occur in respect of any component having a wavelength L1, all other components being reflected by the surface, and wherein a second one of the detectors is arranged to receive any light reflected by the first detector surface at an angle of incidence A2 such that surface plasmon resonance (and therfore absorption) will ocur at the second detector in respect of any component having a wavelength L2, all other components being reflected by the surface, and each of the (n-2) remaining detectors is arranged to receive light in its turn from a preceeding detector in a manner similar to that in which the said second detector, receives light from the first detector at angles of incidence A3, A4 .. An, such that resonance (and therefore absorption) will occur at each said detector in respect of a different one of the components L3, L4 .... Ln, and any remaining components will be reflected.
The condition for establishing surface plasmon resonance is related to the groove pitch Ag, the light wavelength A, and the angle of incidence U by the equation (to first order):
where Em is the (complex) dielectric constant of the metal. For typical metals, Em is nearly real, negative, and has modules much larger than unity (eg. silver, Em - -40 in the visible range). Thus the quantity (Em/Em+1)z is very close to unity. Generally, therefore:1 n 1 - sinO+~ - A, Ag A, which corresponds to the equation identifying diffraction of light by a grating, when the nth diffracted order emerges at an angle of 900 to the normal (ie. skims the surface of the metal).
In the simple case in which it is derived to separate two components L1 and L2 both present in an input signal, two detectors are provided, one receptive of the light signal at an angle of incidence Al such that any L1 component sets up surface plasmon resonance in the first detector surface and is therefore absorbed and detected, whilst all other wavelengths (including L2) are reflected, and a second detector positioned relative to the first so as to receive any light reflected from the first detector at an angle of incidence A2, such that any component of wavelength L2 is absorbed (and therefore detected) by the second detector.
The invention will be described by way of example with reference to the accompanying drawings in which: Figure 1 is an enlarged cross section through a Schottky barrier detector having a profiled surface as required by the invention, Figure 2 illustrates graphically the variation of reflected energy with wavelength, for a given angle of incidence, and Figure 3 illustrates diagramatically how two detectors can be arranged to provide for demultiplexing two signals L1 and L2.
In Fig. 1 a Schottky barrier detector is shown in part as being formed from n-type silicon (layer 10), and a thin metal layer 12, forming a receiving and reflecting surface 14. The silicon is profiled so as to define a plurality of parallel grooves 16, 18 etc. separated by ridges 20, 22 etc..
A light beam 24 is shown incident on the surface 24 at an angle A. If the wavelength of the light in the beam 24 is varied in the range of wavelengths LA to LB then for a given spacing and depth of the grooves 16, 18 etc, a response curve of reflected energy against wavelength will be obtained as is shown in Fig. 2. Here reflected power R is plotted against wavelength and it will be seen that at one particular wavelength. LF, the reflected energy is substantially zero. It is at this wavelength that surface plasmon resonance occurs, resulting in virtually 100% absorption of the light of that wavelength.
A similar response curve is obtained if, instead of varying wavelength, light of constant wavelength is projected onto a profiled surface at differing angles of incidence.
In the present invention, this fact is utilised to advantage in that the angle of incidence Al is selected so that resonance (and therefore absorption) occurs at wavelength L1 at detector 26 leaving predominantly L2 components to pass to detector 28. This is angled relative to 26 so that the angle of incidence A2 is such that resonance and absorption occur at wavelength L2 at the second detector.
The electrical output from detector 36 will thus be proportional to the L1 wavelength component and that from 28 will be proportional to the L2 wavelength component, in the input light beam 30.

Claims (7)

1. According to the present invention a detector which is capable of demultiplexing n light signals each having a different wavelength L1, L2 .... Ln comprises a first Schottky barrier detector the light receptive surface of which is profiled with a plurality of parallel grooves or ridges so that surface plasmon resonance will occur if light is incident therein and (n-1) further Schottky barrier detectors each having a light receptive surface which is also profiled with parallel grooves or ridges; projection means for projecting light containing all n signals onto the light receptive surface of a first of the detectors at such an angle of incidence that surface plasmon resonance, and therefore absorption, will occur in respect of any component having a wavelength L1, all other components being reflected by the surface, and wherein a second one of the detectors is arranged to receive any light reflected by the first detector surface at such an angle of incidence that surface plasmon resonance (and therefore absorption) will occur at the second detector in respect of any component haveing a wavelength L2, all other components being reflected by the surface, and each of the (n-2) remaining detectors is arranged to receive light in its turn from a preceding detector, in a manner similar to that in which the said second detector receives light from the first detector, each at such an angle or incidence that resonance (and therefore absorption) will occur at each said detector in respect of a different one of the components L3, L4 .... Ln, and any remaining components will be reflected.
2. A detector capable of demultiplexing n light signals each having a different wavelength L1, L2 ... Ln, comprising a first Schottky barrier detector the light receptive surface of which is profiled with a plurality of parallel grooves or ridges so that surface plasmon resonance will occur if light is incident therein and (n- 1) further Schottky barrier detectors each having a light receptive surface which is profiled in a similar manner to the first; projection means for projecting light containing all n signals onto the light receptive surface of a first of the detectors at an angle of incidence Al, such that surface plasmon resonance, and therefore absorption, will occur in respect of any component having a wavelength L1, all other components being reflected by the surface, and wherein a second one of the detectors is arranged to receive any light reflected by the first detector surface at an angle of incidence A2 such that surface plasmon resonance (and therefore absorption) will occur at the second detector in respect of any component having a wavelength L2, all other components being reflected by the surface, and each of the (n-2) remaining detectors is arranged to receive light in its turn from a preceding detector, in a manner similar to that in which the said second detector receives light from the first detector, at angles of incidence A3, A4 .. An, such that resonance (and therefore absorption) will occur at each said detector in respect of a different one of the components L3, L4 .. . Ln, and any remaining components will be reflected.
3. A detector according to claim 1 or 2, comprising two Schottky barrier detectors for separating light signals of two differing wavelengths.
4. A detector according to any one of claim 1 to 3, wherein each Schottky barrier detector comprises an n-type silicon substrate having a profiled surface and a thin metal layer of uniform thickness deposited on the profiled surface of the substrate.
5. A detector according to any of claims 1 to 4, wherein each Schottky barrier detector is profiled with a smoothly undulating surface forming a series of alternating parallel grooves and ridges.
6. A detector according to any of claims 1 to 5, including means for measuring the electrical output of each of the Schottky barrier detectors.
7. A detector capable of demultiplexing n light signals respectively having differing wavelengths L1, L2 . . Ln substantially as hereinbefore described with reference to the accompanying drawings.
GB08700322A 1986-01-30 1987-01-08 Optical demultiplexer Withdrawn GB2186144A (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
PCT/GB1987/000061 WO1987004862A1 (en) 1986-01-30 1987-01-29 Optical demultiplexer
EP87901072A EP0256075A1 (en) 1986-01-30 1987-01-29 Optical demultiplexer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB868602309A GB8602309D0 (en) 1986-01-30 1986-01-30 Optical memultiplexer

Publications (2)

Publication Number Publication Date
GB8700322D0 GB8700322D0 (en) 1987-02-11
GB2186144A true GB2186144A (en) 1987-08-05

Family

ID=10592240

Family Applications (2)

Application Number Title Priority Date Filing Date
GB868602309A Pending GB8602309D0 (en) 1986-01-30 1986-01-30 Optical memultiplexer
GB08700322A Withdrawn GB2186144A (en) 1986-01-30 1987-01-08 Optical demultiplexer

Family Applications Before (1)

Application Number Title Priority Date Filing Date
GB868602309A Pending GB8602309D0 (en) 1986-01-30 1986-01-30 Optical memultiplexer

Country Status (2)

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JP (1) JPS63502545A (en)
GB (2) GB8602309D0 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2004079829A1 (en) * 2003-03-04 2004-09-16 Spectalis Corp. Schottky barrier photodetectors

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2004079829A1 (en) * 2003-03-04 2004-09-16 Spectalis Corp. Schottky barrier photodetectors
US7026701B2 (en) 2003-03-04 2006-04-11 Spectalis Corp. Schottky barrier photodetectors

Also Published As

Publication number Publication date
JPS63502545A (en) 1988-09-22
GB8700322D0 (en) 1987-02-11
GB8602309D0 (en) 1986-03-05

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WAP Application withdrawn, taken to be withdrawn or refused ** after publication under section 16(1)