GB2178542B - Improved signature analysis device for electronic circuits - Google Patents
Improved signature analysis device for electronic circuitsInfo
- Publication number
- GB2178542B GB2178542B GB8611880A GB8611880A GB2178542B GB 2178542 B GB2178542 B GB 2178542B GB 8611880 A GB8611880 A GB 8611880A GB 8611880 A GB8611880 A GB 8611880A GB 2178542 B GB2178542 B GB 2178542B
- Authority
- GB
- United Kingdom
- Prior art keywords
- analysis device
- electronic circuits
- signature analysis
- improved signature
- improved
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/26—Functional testing
- G06F11/273—Tester hardware, i.e. output processing circuits
- G06F11/277—Tester hardware, i.e. output processing circuits with comparison between actual response and known fault-free response
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- Computer Hardware Design (AREA)
- Quality & Reliability (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Tests Of Electronic Circuits (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US76155885A | 1985-08-01 | 1985-08-01 |
Publications (3)
Publication Number | Publication Date |
---|---|
GB8611880D0 GB8611880D0 (en) | 1986-06-25 |
GB2178542A GB2178542A (en) | 1987-02-11 |
GB2178542B true GB2178542B (en) | 1990-07-11 |
Family
ID=25062580
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
GB8611880A Expired - Fee Related GB2178542B (en) | 1985-08-01 | 1986-05-15 | Improved signature analysis device for electronic circuits |
Country Status (5)
Country | Link |
---|---|
JP (1) | JPS6232376A (en) |
CN (1) | CN86101621A (en) |
DE (1) | DE3625919A1 (en) |
FR (1) | FR2585845A1 (en) |
GB (1) | GB2178542B (en) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5231314A (en) * | 1992-03-02 | 1993-07-27 | National Semiconductor Corporation | Programmable timing circuit for integrated circuit device with test access port |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB1294280A (en) * | 1970-05-12 | 1972-10-25 | Ibm | Testing circuits |
GB1464515A (en) * | 1974-09-03 | 1977-02-16 | Hewlett Packard Co | Apparatus and method for testing digital circuits |
EP0130610A1 (en) * | 1983-07-05 | 1985-01-09 | International Business Machines Corporation | System data path stressing |
EP0131708A2 (en) * | 1983-07-13 | 1985-01-23 | ANT Nachrichtentechnik GmbH | Circuit for testing a digital circuit |
EP0136204A2 (en) * | 1983-08-01 | 1985-04-03 | FAIRCHILD CAMERA & INSTRUMENT CORPORATION | Control of signal timing apparatus in automatic test systems using minimal memory |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4551837A (en) * | 1983-03-25 | 1985-11-05 | International Telephone & Telegraph Corp. | High speed operational recurring signature evaluator for digital equipment tester |
-
1986
- 1986-03-13 CN CN198686101621A patent/CN86101621A/en active Pending
- 1986-05-15 GB GB8611880A patent/GB2178542B/en not_active Expired - Fee Related
- 1986-07-04 FR FR8609794A patent/FR2585845A1/en active Pending
- 1986-07-04 JP JP61158637A patent/JPS6232376A/en active Pending
- 1986-07-31 DE DE19863625919 patent/DE3625919A1/en not_active Withdrawn
Patent Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB1294280A (en) * | 1970-05-12 | 1972-10-25 | Ibm | Testing circuits |
GB1464515A (en) * | 1974-09-03 | 1977-02-16 | Hewlett Packard Co | Apparatus and method for testing digital circuits |
EP0130610A1 (en) * | 1983-07-05 | 1985-01-09 | International Business Machines Corporation | System data path stressing |
EP0131708A2 (en) * | 1983-07-13 | 1985-01-23 | ANT Nachrichtentechnik GmbH | Circuit for testing a digital circuit |
EP0136204A2 (en) * | 1983-08-01 | 1985-04-03 | FAIRCHILD CAMERA & INSTRUMENT CORPORATION | Control of signal timing apparatus in automatic test systems using minimal memory |
EP0136207A1 (en) * | 1983-08-01 | 1985-04-03 | FAIRCHILD CAMERA & INSTRUMENT CORPORATION | Test period generator for automatic test equipment |
Also Published As
Publication number | Publication date |
---|---|
GB8611880D0 (en) | 1986-06-25 |
JPS6232376A (en) | 1987-02-12 |
CN86101621A (en) | 1987-01-28 |
FR2585845A1 (en) | 1987-02-06 |
GB2178542A (en) | 1987-02-11 |
DE3625919A1 (en) | 1987-02-12 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
PCNP | Patent ceased through non-payment of renewal fee |