GB2169153A - Connector terminal testing device - Google Patents

Connector terminal testing device Download PDF

Info

Publication number
GB2169153A
GB2169153A GB08432711A GB8432711A GB2169153A GB 2169153 A GB2169153 A GB 2169153A GB 08432711 A GB08432711 A GB 08432711A GB 8432711 A GB8432711 A GB 8432711A GB 2169153 A GB2169153 A GB 2169153A
Authority
GB
United Kingdom
Prior art keywords
examination
connector
frame
probe portion
head
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
GB08432711A
Other versions
GB8432711D0 (en
GB2169153B (en
Inventor
Shinichi Ozawa
Masayuki Mizutani
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sumitomo Wiring Systems Ltd
Original Assignee
Tokai Electric Wire Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokai Electric Wire Co Ltd filed Critical Tokai Electric Wire Co Ltd
Priority to GB08432711A priority Critical patent/GB2169153B/en
Publication of GB8432711D0 publication Critical patent/GB8432711D0/en
Publication of GB2169153A publication Critical patent/GB2169153A/en
Application granted granted Critical
Publication of GB2169153B publication Critical patent/GB2169153B/en
Expired legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R11/00—Individual connecting elements providing two or more spaced connecting locations for conductive members which are, or may be, thereby interconnected, e.g. end pieces for wires or cables supported by the wire or cable and having means for facilitating electrical connection to some other wire, terminal, or conductive member, blocks of binding posts
    • H01R11/11—End pieces or tapping pieces for wires, supported by the wire and for facilitating electrical connection to some other wire, terminal or conductive member
    • H01R11/18—End pieces terminating in a probe
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G01R31/66—Testing of connections, e.g. of plugs or non-disconnectable joints
    • G01R31/68—Testing of releasable connections, e.g. of terminals mounted on a printed circuit board
    • G01R31/69—Testing of releasable connections, e.g. of terminals mounted on a printed circuit board of terminals at the end of a cable or a wire harness; of plugs; of sockets, e.g. wall sockets or power sockets in appliances

Abstract

A connector terminal testing device includes a frame (1), a testing head (2) mounted on the frame for linear push-pull movement, a connector holder (3) mounted on the frame for receiving a connector (5), and an operating means (4) for driving the testing head (1) towards and away from the connector holder (3). Probes (9) project from the head (1). Each probe has a front probe (17A) portion and a rear probe portion (17B) slidably received in a metallic tube (15) and independently biased forwardly such that a predetermined gap (G) is formed between the probe portions when they are in the free condition. The rear probe portion is electrically insulated from the metallic tube. The front probe portion is moved into the metallic tube so as to make electric contact with the rear probe portion when pressed by a corresponding terminal of the connector at the time of the test. <IMAGE>

Description

SPECIFICATION Connector terminal examination device BACKGROUND OF THE INVENTION The present invention relates to a connectorterminal examination device for examining states of insertion of wire terminals in a connector to checkforthe positions and conductivity ofthe wire terminals.
Japanese Utility Model Publication Nos. 18545/1978 and 8221/1980 disclose connector terminal examination devices. Both ofthese known devices have a main body provided in thefront side thereof with a connectorfitting portion and a plurality of parallel examination pins projected from the main body towards the connector to be examined. The examination pins are urged towards the connector and are divided into two portions at their longitudinal mid portions. During the examination, when the portions ofthe pins remote from the main body are contacted and pushed by the terminals, these portions are moved backward into contact with the other portions ofthe pins to complete electric circuits, thus allowing the examination of the states of the connector terminals.
The examination device proposed in Publication No. 18545/1978, however, involves certain problems concerning the mounting of the connector on a jig, as well as easiness ofthe examination. On the other hand, the examination device disclosed in Publication No.8821/1980, wherein the examination pins are directly received by the through holes formed in the main body ofthe device, suffers from a problem in that the end pins, i.e., the pin portions remote from the main body, which are forced to move reciprocatingly, friction on the wall of the through bores to produce fine ducts and powders ofthe plasticwhich is used as the material of the main body. In addition, the examination performance is often impaired due to conduction failure caused bythe plastic powders coming between two portions of the pins.
SUMMARYOFTHE INVENTION Accordingly, an aim ofthe invention is to provide a connectorterminal examination device (referred to simply as "examination device", hereinunder) which permits a highly stable examination of the connector terminal, thereby overcoming the above-described problems ofthe prior art.
To this end, according to the invention, there is provided a connectorterminal examination device comprising: aframe; an examination head mounted on the frame for linear movement in one and the other directions; a connector holder mounted on the frame at one side of the examination head and adapted to receive a connector inserted from the upperside thereof; and an operating means disposed on the frame at the opposite side ofthe examination head to the connector holder; wherein the examination head has a plurality of probes projectedforwardlythere- from, each ofthe probes having a front probe portion and a rear probe portion slidably received in a metallic tube and independently biased forwardly such that a predetermined gap is formed between the probe portions when they are in the freed condition, the rear probe portion being electrically insulated from the metallictube, thefront probe portions being adapted to be moved intothemetallictubesoasto make electric contact with the rear probe portion when pressed by a corresponding terminal of the connector at the time ofthe examination.
The above and otherfeatures and advantages of the invention will become clearfrom the following description ofthe preferred embodiment when the same is read in conjunction with the accompanying drawings.
BRIEF DESCRIPTION OFTHE DRAWINGS Fig. is a perspective view of an embodiment ofthe invention; Fig. 2 is a front elevational view of the embodiment shown in fig. 1; and Fig.3 is a front elevational view of a probe for use in an examination head of the embodiment shown in Fig.
1.
DESCRIPTION OF THE PREFERRED EMBODIMENT Referring to Figs. 1 to 3, an embodiment of the terminal examination device ofthe invention includes a channel-shaped frame 1 having a substantially U-shaped cross-section, and an examination head 2 mounted on an intermediate portion oftheframe 1.
The examination head 2 has a plurality of examination probes 9 and is movable back and forth on the frame 1.
A connector holder3 isfixed to the front end portion of the frame 1 so as to oppose the examination head 2.
The holder3 has a connector mounting portion which is opened upwardly such as to surround the connector 5 mounted therein. The wires 14 ofthe connector 5 are inserted into opening 7 formed in a holder plate 8. In this state, the connector 5 is held with its rear peripheral edge 5' held in contactwith the holder plate 8 so as not to be withdrawn rearwardly. An operation lever 10 is provided on the frame 1 at the rear side of the examination head 1. The operation lever 10 is connected,through a link 12 secured to the point of action thereof, to an operation shaft 11 provided at the rear end ofthe examination head 2. The operation lever 10, link 12 and the operation shaft 11 in combination constitute an operation means 4.The arrangement is such that a forward inclination and backward retraction to upright position ofthe operation lever applies amplified pressing and tensing forces to the examination head 2, so that the examination head moved forwardly and rearwardly along the frame 1. In the drawings, a reference numeral 20 denotes a guide forthe operation shaft 11.
More specifically, the examination head 2 is provided at its front portion with a recess 21 which partially receives the head of the connector 5. Through holes are formed to extend from the bottom of the recess rearwardly of the examination head 2. The examination probes 9 are inserted into these through holes with their heads projected into the recess 21. It will be seenthatthe positions and numberofthe examination probes 9 correspond to those of the terminals 13 in the connector 5 to be examined.
The drawing(s) originally filed was (were) informal and the print here reproduced is taken from a later filed formal copy.
As will be seen from Fig. 3, the examination probe 9 is constituted by a front probe portion 17A and a rear probe portion 1 7B which are slidably received by a metallic tube 16. The front probe portion 1 7A and the rear probe portion 1 7B are biased forwardly independently of each other In the freed state of these probe portions 17Aand 17B, a small gap is formed between the rear end ofthefront probe portion 17A and the front end ofthe rear probe portion 17B.Namely, in the freed state, the front half part ofthe front probe portion 17A projectsfrom the metallic tube 16 and is biased forwardly by a coiled spring 18Awhich acts between a step 17' formed on an intermediate portion ofthefront half part and the metallictube 16. In the illustrated freed state, the front probe portion 1 7A rests atthe lower dead point On the other hand, the rear probe portion 1 7B has front half part mc led in the metallictube 16, whilethe rear end of the sclme is received in a metllicsheath 19togetherwith a coiled spring 18B acting on the rearendtherof.Thesheath 19 is connected at its front portion to the metallic tube 16 through the medium ofthe insulating member21.The rear probe 1 portion 17B is biased forwardly bythe coiled spring 1 8B which is received in the sheath 19. In the freed state, the rear probe portion 1 7B rests at the illustrated lower dead point such that a gap G is formed between itselfandthefrontprobe portion 17A.
When the front probe portion 17A is moved into the metallictube 16 by an external force, the front probe portion 17A is made to contactwith the rear probe portion 17B to establish an electric conduction there between.
In the use oftheterminal examination device, the connector 5 to be exárnined is inserted into the connector holder3 from the upper side as shown in Fig. 2. Thereafter, the operation lever 10 is inclined forwardly so that an amplified force is applied to the examination head 2to urge the same forwardly.
Consequently, the front edge ofthe connector 5 comes to be received in the recess 21 in the front end portion ofthe examination head 2. When the terminals 13 are mounted correctly in the connector 5, the front probe portions 17A interfere with the terminals 13 so as to be moved into the metallic tube 16 overcoming the force ofthe coiled spring 1 8A, and is made to contact with the rear probe portions 17B. By connecting the wires 14 of the terminals 13tothewires 15 connectedto respective sheathes 19 accomodating the rear probe portions 17B, closed circuits including the terminals 13 are completed so that the conductiv ity, i.e., the states of mounting of the terminals 13, can be confirmed.Namely, anyterminal mounted in a wrong manner does not press the front probe portion 17Asothatthe circuit remains openedthus indicating the wrong mounting ofterminal.
As has been described,theterminal examination device ofthe invention incorporates a hermetic examination probe having a metallictubewhich receives the rear half part of the front probe portion 17A and the front half part ofthe rear probe portion 17B. Sincethe sliding ofthe front and rear probe portions 17A and 17B take place in the form of metal-to-metal contact state, the wear ofthe sliding parts inevitable in the conventional device is avoided.
Consequently, the invention offoreign matters and attaching of plastic powder and dust to the contact surfaces of probe portions are eliminated to stabilize the operation ofthe examination device.
In the terminal examination device ofthe invention, amplified pressing and pulling forces are applied by the forward inclination and backward retraction to the upright position ofthe operation lever provided atthe rearsideoftheexamination head, whilethe connector to beexaminedcan be put into the examination position simply by being inserted into the connector holder from the upper side. The terminal examination device ofthe invention, therefore, can be operated easily such that, while the connector is put into and out ofthe examination position by one of the operator's hand, the operation lever is handled by the other hand.
Furthermore, since an amplified force is available for driving the examination head back and forth, the examination is conducted easily. Moreover, the probe assembly constructed as a unit can be handled easily for mounting and demounting on the examination head, which in turn facilitates the protective maintenance considerably.
Thus, the terminal examination device ofthe invention offers advantages such that as an enhanced stability and reliability ofthe examination and improvement in the easiness ofthe examination.
Although the invention has been described through specific terms, it is to be noted herethatthedescribed embodiment is only illustrative and various changes and modifications may be imparted thereto without departing from the scope ofthe invention.

Claims (3)

1. Aconnectorterminal examination devicecomprising: a frame; an examination head mounted on said frame for linear movement in one and the other directions; a connector holder mounted on said frame at one side of said examination head and adapted to receive a connector inserted from the upper side thereof; and an operating means disposed on said frame at the opposite side of said examination head to said connector holder and adapted to drive said examination head towards and awayfrom said connector holder; wherein said examination head has a plurality of probes projected forwardlytherefrom, each of said probes having a front probe portion and a rear probe portion slidably received in a metallic tube and independently biased forwardly such that a predetermined gap is formed between said probe portions when they are in the freed condition, said rear probe portion being electrically insulated from said metallic tube, said front probe portions being adapted to be moved into said metallic tube so as to make electric contactwith said rear probe portion when pressed by a corresponding terminal of said connector atthetime ofthe examination.
2. A connector examination device according to Claim 1, wherein said operating means includes an operation leverwhich is adapted to drive said examination headthroughtheaction of a link.
3. Aconnectorterminal examination devicesubstantially as described with referencetothe drawings.
GB08432711A 1984-12-28 1984-12-28 Connector terminal examination device Expired GB2169153B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
GB08432711A GB2169153B (en) 1984-12-28 1984-12-28 Connector terminal examination device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB08432711A GB2169153B (en) 1984-12-28 1984-12-28 Connector terminal examination device

Publications (3)

Publication Number Publication Date
GB8432711D0 GB8432711D0 (en) 1985-02-06
GB2169153A true GB2169153A (en) 1986-07-02
GB2169153B GB2169153B (en) 1988-08-03

Family

ID=10571765

Family Applications (1)

Application Number Title Priority Date Filing Date
GB08432711A Expired GB2169153B (en) 1984-12-28 1984-12-28 Connector terminal examination device

Country Status (1)

Country Link
GB (1) GB2169153B (en)

Cited By (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4814697A (en) * 1986-03-26 1989-03-21 Feinmetall Gmbh Testing adapter
EP0354124A1 (en) * 1988-08-03 1990-02-07 AEROSPATIALE Société Nationale Industrielle Apparatus for checking the correct snapping of the pins of a multiple pin connector
GB2243727A (en) * 1990-04-02 1991-11-06 Sumitomo Wiring Systems Contact probe
DE9200253U1 (en) * 1992-01-11 1992-02-27 Tsk Testsysteme Gmbh & Co, 4952 Porta Westfalica, De
US5131851A (en) * 1990-09-26 1992-07-21 Crown Equipment Corporation Vehicle mounted battery connector assist unit
EP0565080A2 (en) * 1992-04-07 1993-10-13 Yazaki Corporation Inspection device for inspecting continuity of terminal in a connector
US5292267A (en) * 1989-12-15 1994-03-08 Kabushiki Kaisha Toshiba Connector unit with movable connector
GB2270427A (en) * 1992-09-07 1994-03-09 Sumitomo Wall Systems Ltd Connector inspecting apparatus
GB2281454A (en) * 1993-08-24 1995-03-01 Sumitomo Wall Systems Ltd Connector inspecting apparatus
EP0654856A2 (en) * 1993-11-18 1995-05-24 Sumitomo Wiring Systems, Ltd. Connector examination and correction devices and methods for examining and correcting same
US5429519A (en) * 1992-09-03 1995-07-04 Sumitomo Wiring Systems, Ltd. Connector examining device
GB2290419A (en) * 1994-06-13 1995-12-20 Sumitomo Wiring Systems Test and fault correction device for electrical connector
DE19525229A1 (en) * 1994-07-22 1996-02-01 Yazaki Corp Determining position of part of multiple plug connector using multistep method, for testing cable harness connections
DE4425169A1 (en) * 1994-07-19 1996-02-01 Lang Dahlke Helmut Spring contact pin for test adapter
GB2308454A (en) * 1995-12-21 1997-06-25 Fujitsu Icl Computers Oy Apparatus for testing an electronic module
EP0790504A1 (en) * 1996-02-16 1997-08-20 Sumitomo Wiring Systems, Ltd. Connector detecting device
US6157197A (en) * 1997-02-24 2000-12-05 Sumitomo Wiring Systems, Ltd. Auto-lock type continuity check unit
DE10227613A1 (en) * 2002-06-20 2004-01-29 Spinner Gmbh Elektrotechnische Fabrik Coaxial plug connector has annular shoulder in mantle surface of plug head behind screw thread at plug-in end engaged by clamp device during testing
CN102346226A (en) * 2010-07-22 2012-02-08 矢崎总业株式会社 Operation control structure for continuity test device
EP3813203A1 (en) * 2019-10-25 2021-04-28 Schleuniger AG Cable testing device

Cited By (36)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4814697A (en) * 1986-03-26 1989-03-21 Feinmetall Gmbh Testing adapter
EP0354124A1 (en) * 1988-08-03 1990-02-07 AEROSPATIALE Société Nationale Industrielle Apparatus for checking the correct snapping of the pins of a multiple pin connector
FR2635193A1 (en) * 1988-08-03 1990-02-09 Aerospatiale DEVICE FOR MONITORING THE CORRECT LOCKING OF THE PINS OF A MULTI-PIN OUTLET
US5292267A (en) * 1989-12-15 1994-03-08 Kabushiki Kaisha Toshiba Connector unit with movable connector
GB2243727B (en) * 1990-04-02 1994-07-13 Sumitomo Wall Systems Ltd Contact probe in electric conductivity tester
GB2243727A (en) * 1990-04-02 1991-11-06 Sumitomo Wiring Systems Contact probe
US5131851A (en) * 1990-09-26 1992-07-21 Crown Equipment Corporation Vehicle mounted battery connector assist unit
DE9200253U1 (en) * 1992-01-11 1992-02-27 Tsk Testsysteme Gmbh & Co, 4952 Porta Westfalica, De
US5498966A (en) * 1992-04-07 1996-03-12 Yazaki Corporation Inspection device for inspecting continuity of terminal in a connector
EP0565080A3 (en) * 1992-04-07 1994-09-21 Yazaki Corp Inspection device for inspecting continuity of terminal in a connector
EP0565080A2 (en) * 1992-04-07 1993-10-13 Yazaki Corporation Inspection device for inspecting continuity of terminal in a connector
US5429519A (en) * 1992-09-03 1995-07-04 Sumitomo Wiring Systems, Ltd. Connector examining device
US5419711A (en) * 1992-09-07 1995-05-30 Sumitomo Wiring Systems, Ltd. Connector inspecting apparatus
GB2270427A (en) * 1992-09-07 1994-03-09 Sumitomo Wall Systems Ltd Connector inspecting apparatus
GB2270427B (en) * 1992-09-07 1996-03-13 Sumitomo Wall Systems Ltd Connector inspecting apparatus
US5582523A (en) * 1992-09-07 1996-12-10 Sumitomo Wiring Systems, Ltd. Connector inspecting apparatus
GB2281454B (en) * 1993-08-24 1997-04-16 Sumitomo Wiring Systems Connector inspecting apparatus
GB2281454A (en) * 1993-08-24 1995-03-01 Sumitomo Wall Systems Ltd Connector inspecting apparatus
EP0654856A2 (en) * 1993-11-18 1995-05-24 Sumitomo Wiring Systems, Ltd. Connector examination and correction devices and methods for examining and correcting same
US5859534A (en) * 1993-11-18 1999-01-12 Sumitomo Wiring Systems Connector examination and correction devices and methods examining and correcting same
EP0654856A3 (en) * 1993-11-18 1997-05-14 Sumitomo Wiring Systems Connector examination and correction devices and methods for examining and correcting same.
GB2290419A (en) * 1994-06-13 1995-12-20 Sumitomo Wiring Systems Test and fault correction device for electrical connector
US5629627A (en) * 1994-06-13 1997-05-13 Sumitomo Wiring Systems, Ltd. Inspection device for a waterproof connector
GB2290419B (en) * 1994-06-13 1998-02-25 Sumitomo Wiring Systems Inpection device for a waterproof connector
DE4425169A1 (en) * 1994-07-19 1996-02-01 Lang Dahlke Helmut Spring contact pin for test adapter
DE4425169C2 (en) * 1994-07-19 1998-03-12 Lang Dahlke Helmut Test adapter
DE19525229A1 (en) * 1994-07-22 1996-02-01 Yazaki Corp Determining position of part of multiple plug connector using multistep method, for testing cable harness connections
GB2308454A (en) * 1995-12-21 1997-06-25 Fujitsu Icl Computers Oy Apparatus for testing an electronic module
US5831438A (en) * 1996-02-16 1998-11-03 Sumitomo Wiring Systems, Ltd. Device for testing a connector having multiple terminals therein
EP0790504A1 (en) * 1996-02-16 1997-08-20 Sumitomo Wiring Systems, Ltd. Connector detecting device
US6157197A (en) * 1997-02-24 2000-12-05 Sumitomo Wiring Systems, Ltd. Auto-lock type continuity check unit
US6480004B1 (en) 1997-02-24 2002-11-12 Sumitomo Wiring Systems, Ltd. Method of testing continuity using an auto-lock continuity check unit
DE10227613A1 (en) * 2002-06-20 2004-01-29 Spinner Gmbh Elektrotechnische Fabrik Coaxial plug connector has annular shoulder in mantle surface of plug head behind screw thread at plug-in end engaged by clamp device during testing
CN102346226A (en) * 2010-07-22 2012-02-08 矢崎总业株式会社 Operation control structure for continuity test device
CN102346226B (en) * 2010-07-22 2014-01-29 矢崎总业株式会社 Operation control structure for continuity test device
EP3813203A1 (en) * 2019-10-25 2021-04-28 Schleuniger AG Cable testing device

Also Published As

Publication number Publication date
GB8432711D0 (en) 1985-02-06
GB2169153B (en) 1988-08-03

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Legal Events

Date Code Title Description
PCNP Patent ceased through non-payment of renewal fee

Effective date: 20021228