GB2161019B - Electron microscope with interchargeable lens - Google Patents
Electron microscope with interchargeable lensInfo
- Publication number
- GB2161019B GB2161019B GB08510291A GB8510291A GB2161019B GB 2161019 B GB2161019 B GB 2161019B GB 08510291 A GB08510291 A GB 08510291A GB 8510291 A GB8510291 A GB 8510291A GB 2161019 B GB2161019 B GB 2161019B
- Authority
- GB
- United Kingdom
- Prior art keywords
- interchargeable
- lens
- electron microscope
- microscope
- electron
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y10/00—Nanotechnology for information processing, storage or transmission, e.g. quantum computing or single electron logic
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/04—Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement or ion-optical arrangement
- H01J37/10—Lenses
- H01J37/14—Lenses magnetic
- H01J37/141—Electromagnetic lenses
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/04—Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement or ion-optical arrangement
- H01J37/10—Lenses
- H01J37/14—Lenses magnetic
- H01J37/141—Electromagnetic lenses
- H01J37/1413—Means for interchanging parts of the lens, e. g. pole pieces within the tube
Landscapes
- Chemical & Material Sciences (AREA)
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Electromagnetism (AREA)
- Analytical Chemistry (AREA)
- Nanotechnology (AREA)
- Mathematical Physics (AREA)
- Theoretical Computer Science (AREA)
- Crystallography & Structural Chemistry (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP8362884A JPS60230343A (en) | 1984-04-27 | 1984-04-27 | Electron lens assembly and electron ray device fitted with the assembly |
Publications (3)
Publication Number | Publication Date |
---|---|
GB8510291D0 GB8510291D0 (en) | 1985-05-30 |
GB2161019A GB2161019A (en) | 1986-01-02 |
GB2161019B true GB2161019B (en) | 1988-11-16 |
Family
ID=13807733
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
GB08510291A Expired GB2161019B (en) | 1984-04-27 | 1985-04-23 | Electron microscope with interchargeable lens |
Country Status (2)
Country | Link |
---|---|
JP (1) | JPS60230343A (en) |
GB (1) | GB2161019B (en) |
Families Citing this family (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2777840B2 (en) * | 1990-11-30 | 1998-07-23 | セイコーインスツルメンツ株式会社 | Electron beam equipment |
EP1530229B1 (en) | 2003-11-04 | 2012-04-04 | ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH | Beam optical component for charged particle beams |
AU2010307046B2 (en) | 2009-10-12 | 2016-04-28 | Perkinelmer U.S. Llc | Assemblies for ion and electron sources and methods of use |
EP2722866A1 (en) * | 2012-10-22 | 2014-04-23 | Fei Company | Configurable charged-particle beam apparatus |
CN110231354B (en) * | 2019-05-31 | 2020-09-08 | 武汉大学 | Non-laser-excited four-dimensional transmission electron microscope device and using method thereof |
EP3872837A1 (en) * | 2020-02-25 | 2021-09-01 | The Provost, Fellows, Scholars and other Members of Board of Trinity College Dublin | Pole piece for an electron microscope |
Family Cites Families (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3346736A (en) * | 1964-09-22 | 1967-10-10 | Applied Res Lab Inc | Electron probe apparatus having an objective lens with an aperture for restricting fluid flow |
US3345529A (en) * | 1966-08-29 | 1967-10-03 | Ibm | Electron beam column with demountable flux-generating assembly and beam-forming elements |
-
1984
- 1984-04-27 JP JP8362884A patent/JPS60230343A/en active Pending
-
1985
- 1985-04-23 GB GB08510291A patent/GB2161019B/en not_active Expired
Also Published As
Publication number | Publication date |
---|---|
GB8510291D0 (en) | 1985-05-30 |
GB2161019A (en) | 1986-01-02 |
JPS60230343A (en) | 1985-11-15 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
732 | Registration of transactions, instruments or events in the register (sect. 32/1977) | ||
732 | Registration of transactions, instruments or events in the register (sect. 32/1977) | ||
732 | Registration of transactions, instruments or events in the register (sect. 32/1977) | ||
PCNP | Patent ceased through non-payment of renewal fee |
Effective date: 19960423 |