GB2154315A - Improvements in or relating to the analysis of materials - Google Patents
Improvements in or relating to the analysis of materials Download PDFInfo
- Publication number
- GB2154315A GB2154315A GB08503996A GB8503996A GB2154315A GB 2154315 A GB2154315 A GB 2154315A GB 08503996 A GB08503996 A GB 08503996A GB 8503996 A GB8503996 A GB 8503996A GB 2154315 A GB2154315 A GB 2154315A
- Authority
- GB
- United Kingdom
- Prior art keywords
- analysing
- light guide
- radiation
- spectrometer
- metal body
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/71—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited
- G01N21/718—Laser microanalysis, i.e. with formation of sample plasma
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/85—Investigating moving fluids or granular solids
- G01N21/8507—Probe photometers, i.e. with optical measuring part dipped into fluid sample
Landscapes
- Health & Medical Sciences (AREA)
- Physics & Mathematics (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- Optics & Photonics (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Plasma & Fusion (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Abstract
The invention provides an arrangement for analysing a material comprising the steps of exciting a portion of the material by means of a pulsed beam from a laser 10, transmitting the radiation produced by the excitation of the material through a light guide 8 and analysing the radiation so transmitted in a spectrometer 11 including facility for analysis in the infra-red region of the spectrum. <IMAGE>
Description
SPECIFICATION
Improvements in or relating to the Analysis of Materials
This invention relates to the analysis of materials.
According to one aspect of the invention there is provided a method of analysing a material comprising the steps of exciting a portion of the material by means of a pulsed laser beam, transmitting the radiation produced by the excitation of the material through a light guide and analysing the radiation so transmitted in a spectrometer including facility for analysis in the infra-red region of the spectrum.
According to another aspect of the present invention, there is provided apparatus for analysing a material comprising means for generating a pulsed laser beam for exciting a portion of the material, a light guide for transmission of the radiation produced by the excitation of the material to a spectrometer; the spectrometer incorporating analysing means working in the infra-red region of the spectrum.
The invention is especially, although not exclusively, applicable to the analysis of molten metals in a melting, refining or containing vessel; or solid material such as ferrous scrap for classification purposes; or of metal from a melt allowed to solidify in a liquid metal probe; or of slag material from a metal melt.
The use of a laser beam ensures a practical and suitable source of power for excitation purposes, and the pulsing beam enables the provision of sufficient power for excitation with the use of a reasonably sized generator.
Thus, with liquid steel analysis, adequate excitation power has bebn provided with a 0.75 watt laser. Pulses of a few (e.g. 20) nanoseconds duration have been found appropriate.
The spectrometer may be gated to receive transmitted radiation a predetermined time after excitation of the material to improve the signal to noise ratio (as hereinafter explained).
The invention is based partly upon the realisation that light guide means can be used with great convenience and suitability for transmitting radiation. However, one serious difficulty with light guides is the transmission of, for example, carbon, sulphur and phosphorus spectral lines. Appropriate lines in the ultra-violet range are effectively absorbed by the glass or quartz from which light guides are manufactured.This problem is overcome in the invention by the provision of facility for analysis in the infra-red region of the spectrum, the analysis may be in the range 250nm to 11 00nm which covers the infra-red range of approximately 700nm to 1 1 OOnm, and indeed the invention is also based upon the realisation that, contrary to expectation, the relatively weak infra-red spectral lines for such elements can provide quantitative analytical information via a light guide.
The Applicants have found that whereas, as suggested above, no material capable of use in a light guide has yet been identified having a sufficiently high transmission index in the < 200nm region of the spectrum (where the carbon and sulphur and phosphorus spectral lines presently used for analysis are located) to permit determination of these elements with any certainty, the appropriate spectrum lines in the infra-red region (such as those around 900nm) of the spectrum can be transmitted through a glass or quartz light guide and enable the analysis of carbon, sulphur and phorphorus, provided the radiation from the metal excitation is sufficiently strong.
The spectrometric analysis apparatus may comprise a photodiode array detector or a photo-multiplier arrangement.
The laser is arranged to provide a pulsing beam, spectral measurements being made in a synchronised time gated sequence so as to receive excited radiation generated from the sample being tested but not general radiation.
Additionally, or in the alternative, the laser may be subjected to variable tuning so as to provide optimum excitation for various spectral lines.
Where the apparatus is for use in the analysis of molten metal in a vessel, the light guide per se may, but need not, contact the molten metal. The apparatus may be arranged for continuous or semi-continuous sequential operation, in which case the light guide or light guides may be provided with thermal protection from the molten metal. Alternatively, the apparatus may be arranged for single individual readings at discrete intervals so that the light guide or guides need only be physically associated with the molten metal intermittently. In this case the guide or guides may be provided with disposable tips.
The light guide or guides may be introduced into the vessel through the top or through the side walls thereof.
The apparatus may incorporate temperature sensing means arranged to operate using radiation from the metal body transmitted through the light guide.
In order that the invention may be more readily understood, two embodiments thereof will now be described by way of example with reference to the accompanying drawings in which:
Figure 1 is a diagrammatic representation of apparatus for the analysis of molten steel in a containing vessel;
Figure 2 illustrates an alternative arrangement of part of the apparatus of Fig. 1; and
Figure 3 is a graph showing time gating operation of the spectrometer.
It will be seen from Fig. 1 that steel 1 having a coating layer of slag 2 is contained within vessel 3.
Projecting into the vessel 3 so as to penetrate to the surface of the steel below the level of the layer of slag 2 is a probe 4. The probe is protected at its end by means of a ceramic collar 5 suitably cooled and pressurised, to prevent damage by and entry of metal, by a flow of inert gas entering at port 6 and exiting at restricted port 7. Contained in the probe is a quartz light guide 8 terminated by lens 9 in the probe and split above the probe to lead to a laser 10 and spectrometer 11.
In operation, a pulsed beam from laser 10 is transmitted through light guide 8 and focussed by lens 9 onto the surface of the steel 1 causing ablation, ionisation and excitation.
The resultant excited radiation is transmitted by lens 9 and light guide 8 to spectrometer 11 comprising diffraction grating, primary and secondary slits and detectors. The detectors will be photodiode arrays and/or photomultipliers capable of operating in the spectral region 250-1 OOOnm and will have the facility of providing time resolution (gating) to eliminate recording of the initial burst of background radiation and optimise line to background ratios. Electrical signals, from detectors, corresponding to the intensities of the desired element lines and background measurements will be converted to percentage concentration and displayed as such by electronics unit 1 2.
Fig. 2 shows an alternative form for probe 4. The probe 4 functions generally as described above in relation to the arrangement of Fig. 1.
However, in this case the laser rods, flash lamps and 'Q' switch 1 3 are mounted in the top of the probe 4. Laser unit 1 3 is connected to its power and coolant supplies by cable and pipes 14. Lens 9 focusses the laser on the surface of metal 1. A second lens 1 5 transmits the excited radiation via light guide 1 6 to the spectrometer.
Laser excitation of the material (in this case liquid metal) provides a spectral continuum of radiation in addition to the characteristic line or lines sought. To improve the signal (spectral line) to noise (spectral continuum) ratio at the spectrometer this is time gated so as to reduce the initial high intensity background peak. This feature is illustrated in the graph of
Fig. 3 of received excitation radiation against time. The laser pulse period (20 nano seconds) is represented at 20 with the time gate shut. The gate is opened as shown at 21 after approximately 9 micro seconds after initiation of the laser pulse. The received continuum radiation after attenuation is shown at 22, and the received carbon 909.4nm characteristic radiation at 23 with the time gate open.
The importance of the gate can be seen from the fact that without its use the peak of 22 would be larger by am approximate ratio of 1000:1, swamping the carbon characteristic peak.
For scrap (raw material) sorting the invention may be applied in a manner not illustrated by presenting individual pieces of scrap (raw material) over a small aperture by a continuous feed system. The laser beam is directed upwards at the specimen which is held stationary for such time as is necessary to ablate any non-representative material from the surface and carry out an analysis. A lens system is used to focus the laser excited emissions onto a light guide linked to a spectrometer. Monitoring of the various element emissions is used to determine the length of the stationary period and ensure a representative analysis is obtained. Time gating of the detectors is used to maximise line to background ratios for all elements measured. On conclusion of the analysis the material is automatically directed to the appropriate collection point.
Claims (11)
1. A method of analysing a material comprising the steps of exciting a portion of the material by means of a pulsed laser beam.
transmitting the radiation produced by the excitation of the material through a light guide and analysing the radiation so transmitted in a spectrometer including facility for analysing in the infra-red region of the spectrum.
2. A method according to claim 1 wherein the spectrometer is gated to receive transmitted radiation a predetermined time after excitation of the material.
3. A method according to claim 1 or 2 wherein the material is liquid metal within a metallurgical vessel.
4. A method according to claim 3 wherein the liquid metal is steel.
5. A method according to claim 2 or 3 wherein the method is carried out in a continuous or semi-continuous sequential operation during a metallurgical process.
6. A method according to claim 1 or 2 wherein the meterial is a solid metal body.
7. A method according to any one of the preceding claims wherein the laser is subject in operation to variable tuning.
8. A method according to any one of the preceding claims wherein the laser is at least partially transmitted to the metal body by a light guide.
9. A method for analysing a metal body substantially as hereinbefore described with reference to the accompanying drawings.
1 0. Apparatus for analysing a material comprising means for generating a pulsed laser beam for exciting a portion of the material, a light guide for transmission of the radiation produced by the excitation of the material to a spectrometer; the spectrometer incorporating analysing means working in the infra-red region of the spectrum.
11. Apparatus according to claim 10 wherein the spectrometer includes gating means for receiving transmitted radiation a predetermined time after excitation of the material.
1 2. Apparatus according to claim 10 or 11 for analysing molten metal within a metallurgical vessel light guide is provided with thermal protection adjacent the metal body.
1 3. Apparatus according to clam 10, 11 or 1 2 including temperature sensing means arranged to operate using radiation from the metal body transmitted through the light guide.
1 4. Apparatus according to claim 10, 11, 1 2 or 1 3 wherein the laser is arranged to be transmitted at least partially to the metal body by a light guide.
1 5. Apparatus for analysing a metal body substantially as shown in and as hereinbefore described with reference to the accompanying drawings.
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GB848403976A GB8403976D0 (en) | 1984-02-15 | 1984-02-15 | Analysis of materials |
Publications (3)
Publication Number | Publication Date |
---|---|
GB8503996D0 GB8503996D0 (en) | 1985-03-20 |
GB2154315A true GB2154315A (en) | 1985-09-04 |
GB2154315B GB2154315B (en) | 1987-12-31 |
Family
ID=10556642
Family Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
GB848403976A Pending GB8403976D0 (en) | 1984-02-15 | 1984-02-15 | Analysis of materials |
GB08503996A Expired GB2154315B (en) | 1984-02-15 | 1985-02-15 | Improvements in or relating to the analysis of materials |
Family Applications Before (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
GB848403976A Pending GB8403976D0 (en) | 1984-02-15 | 1984-02-15 | Analysis of materials |
Country Status (1)
Country | Link |
---|---|
GB (2) | GB8403976D0 (en) |
Cited By (22)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0362577A2 (en) * | 1988-10-03 | 1990-04-11 | Fried. Krupp AG Hoesch-Krupp | Process for optically bringing an element analysis system and a laser in touch with liquid metal in a crucible |
WO1990008311A1 (en) * | 1989-01-13 | 1990-07-26 | Iowa State University Research Foundation, Inc. | Apparatus and method for transient thermal infrared emission spectrometry |
US5075552A (en) * | 1989-01-13 | 1991-12-24 | Iowa State University Research Foundation Inc. | Apparatus and method for transient thermal infrared emission spectrometry |
EP0469083A1 (en) * | 1989-04-21 | 1992-02-05 | Lehigh University | Transient spectroscopic method and apparatus for in-process analysis of molten metal |
US5379103A (en) * | 1993-05-06 | 1995-01-03 | Apti, Inc. | Method and apparatus for in situ detection of minute amounts of trace elements |
EP1482302A1 (en) * | 2002-04-19 | 2004-12-01 | Energy Research Company | Apparatus and method for in situ, real time measurements of properties of liquids |
US6909505B2 (en) | 2002-06-24 | 2005-06-21 | National Research Council Of Canada | Method and apparatus for molten material analysis by laser induced breakdown spectroscopy |
WO2005059527A1 (en) * | 2003-12-17 | 2005-06-30 | Heraeus Electro-Nite International N.V. | Method for analysis of a fused material device and dipping sensor |
NL1029612C2 (en) * | 2005-07-26 | 2007-01-29 | Corus Technology B V | Method for analyzing liquid metal and device for use therein. |
WO2007128014A1 (en) * | 2006-05-09 | 2007-11-15 | Innsitec Laser Technologies Gmbh | Immersion probe for lips apparatuses |
EP1914534A2 (en) * | 2006-10-06 | 2008-04-23 | Heraeus Electro-Nite International N.V. | Immersion lance for analysing molten masses and liquids |
US7419530B2 (en) | 2002-07-05 | 2008-09-02 | Aleris Switzerland Gmbh C/O K+P Treuhangesellschaft | Method for fractional crystallisation of a molten metal |
US7442228B2 (en) | 2001-10-03 | 2008-10-28 | Aleris Switzerland Gmbh C/O K+P Treuhangesellschaft | Method and device for controlling the proportion of crystals in a liquid-crystal mixture |
US7531023B2 (en) | 2004-03-19 | 2009-05-12 | Aleris Switzerland Gmbh | Method for the purification of a molten metal |
US7537639B2 (en) | 2003-11-19 | 2009-05-26 | Aleris Switzerland Gmbh | Method of cooling molten metal during fractional crystallisation |
US7648559B2 (en) | 2002-07-05 | 2010-01-19 | Aleris Switzerland Gmbh C/O K+P Treuhangesellschaft | Method for fractional crystallisation of a metal |
US7892318B2 (en) | 2006-06-28 | 2011-02-22 | Aleris Switzerland Gmbh C/O K+P Treuhandgesellschaft | Crystallisation method for the purification of a molten metal, in particular recycled aluminium |
US7955414B2 (en) | 2006-07-07 | 2011-06-07 | Aleris Switzerland Gmbh | Method and device for metal purification and separation of purified metal from metal mother liquid such as aluminium |
CN1898553B (en) * | 2003-12-17 | 2011-10-05 | 贺利氏电子耐特国际股份公司 | Method for analysis of a molten material, device and immersion sensor |
US8313554B2 (en) | 2006-06-22 | 2012-11-20 | Aleris Switzerland Gmbh | Method for the separation of molten aluminium and solid inclusions |
DE102013009962B3 (en) * | 2013-06-14 | 2014-11-06 | K+S Aktiengesellschaft | LIBS viewing tube |
EP4336173A1 (en) * | 2022-09-09 | 2024-03-13 | AMAG casting GmbH | Method of controlling or regulating a melting furnace (1) and melting furnace (1), namely a shaft furnace, for melting metal |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR20240045249A (en) * | 2021-08-05 | 2024-04-05 | 내셔날 리서치 카운실 오브 캐나다 | Fire resistant lance assembly and fire resistant lance tube |
Citations (6)
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GB1587723A (en) * | 1977-05-06 | 1981-04-08 | Andrew Corp | Laser apparatus |
EP0047094A1 (en) * | 1980-08-21 | 1982-03-10 | Oriel Scientific Limited | Analytical optical instruments |
EP0081785A2 (en) * | 1981-12-11 | 1983-06-22 | Hitachi, Ltd. | Plasma monitor |
WO1984000101A1 (en) * | 1982-06-28 | 1984-01-19 | Univ Johns Hopkins | Electro-optical device for monitoring instantaneous singlet oxygen concentration produced during the treatment of cancer by means of photochemotherapy |
GB2126717A (en) * | 1982-08-31 | 1984-03-28 | Hamamatsu Photonics Kk | Device for diagnosing cancers |
GB2130092A (en) * | 1982-09-04 | 1984-05-31 | Strahlen Umweltforsch Gmbh | Method and apparatus for illuminating cavities |
-
1984
- 1984-02-15 GB GB848403976A patent/GB8403976D0/en active Pending
-
1985
- 1985-02-15 GB GB08503996A patent/GB2154315B/en not_active Expired
Patent Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB1587723A (en) * | 1977-05-06 | 1981-04-08 | Andrew Corp | Laser apparatus |
EP0047094A1 (en) * | 1980-08-21 | 1982-03-10 | Oriel Scientific Limited | Analytical optical instruments |
EP0081785A2 (en) * | 1981-12-11 | 1983-06-22 | Hitachi, Ltd. | Plasma monitor |
WO1984000101A1 (en) * | 1982-06-28 | 1984-01-19 | Univ Johns Hopkins | Electro-optical device for monitoring instantaneous singlet oxygen concentration produced during the treatment of cancer by means of photochemotherapy |
GB2126717A (en) * | 1982-08-31 | 1984-03-28 | Hamamatsu Photonics Kk | Device for diagnosing cancers |
GB2130092A (en) * | 1982-09-04 | 1984-05-31 | Strahlen Umweltforsch Gmbh | Method and apparatus for illuminating cavities |
Cited By (32)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0362577A3 (en) * | 1988-10-03 | 1991-03-20 | Fried. Krupp AG Hoesch-Krupp | Process for optically bringing an element analysis system and a laser in touch with liquid metal in a crucible |
EP0362577A2 (en) * | 1988-10-03 | 1990-04-11 | Fried. Krupp AG Hoesch-Krupp | Process for optically bringing an element analysis system and a laser in touch with liquid metal in a crucible |
WO1990008311A1 (en) * | 1989-01-13 | 1990-07-26 | Iowa State University Research Foundation, Inc. | Apparatus and method for transient thermal infrared emission spectrometry |
US5075552A (en) * | 1989-01-13 | 1991-12-24 | Iowa State University Research Foundation Inc. | Apparatus and method for transient thermal infrared emission spectrometry |
EP0469083A1 (en) * | 1989-04-21 | 1992-02-05 | Lehigh University | Transient spectroscopic method and apparatus for in-process analysis of molten metal |
EP0469083A4 (en) * | 1989-04-21 | 1992-06-03 | Lehigh University | Transient spectroscopic method and apparatus for in-process analysis of molten metal |
US5379103A (en) * | 1993-05-06 | 1995-01-03 | Apti, Inc. | Method and apparatus for in situ detection of minute amounts of trace elements |
US7442228B2 (en) | 2001-10-03 | 2008-10-28 | Aleris Switzerland Gmbh C/O K+P Treuhangesellschaft | Method and device for controlling the proportion of crystals in a liquid-crystal mixture |
EP1482302A1 (en) * | 2002-04-19 | 2004-12-01 | Energy Research Company | Apparatus and method for in situ, real time measurements of properties of liquids |
US6909505B2 (en) | 2002-06-24 | 2005-06-21 | National Research Council Of Canada | Method and apparatus for molten material analysis by laser induced breakdown spectroscopy |
US7419530B2 (en) | 2002-07-05 | 2008-09-02 | Aleris Switzerland Gmbh C/O K+P Treuhangesellschaft | Method for fractional crystallisation of a molten metal |
US7648559B2 (en) | 2002-07-05 | 2010-01-19 | Aleris Switzerland Gmbh C/O K+P Treuhangesellschaft | Method for fractional crystallisation of a metal |
US7537639B2 (en) | 2003-11-19 | 2009-05-26 | Aleris Switzerland Gmbh | Method of cooling molten metal during fractional crystallisation |
AU2008249182B2 (en) * | 2003-12-17 | 2011-10-06 | Heraeus Electro-Nite International N.V. | Method for analysis of a fused material device and dipping sensor |
CN1898553B (en) * | 2003-12-17 | 2011-10-05 | 贺利氏电子耐特国际股份公司 | Method for analysis of a molten material, device and immersion sensor |
RU2457467C2 (en) * | 2003-12-17 | 2012-07-27 | Хераеус Электро-Ните Интернациональ Н.В. | Immersion sensor (versions) |
WO2005059527A1 (en) * | 2003-12-17 | 2005-06-30 | Heraeus Electro-Nite International N.V. | Method for analysis of a fused material device and dipping sensor |
AU2004299940B2 (en) * | 2003-12-17 | 2008-12-04 | Heraeus Electro-Nite International N.V. | Method for analysis of a fused material device and dipping sensor |
US7365841B2 (en) | 2003-12-17 | 2008-04-29 | Heraeus Electro-Nite International N.V. | Method for analysis of a molten material, device and immersion sensor |
AU2004299940C1 (en) * | 2003-12-17 | 2009-05-14 | Heraeus Electro-Nite International N.V. | Method for analysis of a fused material device and dipping sensor |
US7531023B2 (en) | 2004-03-19 | 2009-05-12 | Aleris Switzerland Gmbh | Method for the purification of a molten metal |
NL1029612C2 (en) * | 2005-07-26 | 2007-01-29 | Corus Technology B V | Method for analyzing liquid metal and device for use therein. |
WO2007012440A1 (en) * | 2005-07-26 | 2007-02-01 | Aleris Switzerland Gmbh | Method for analyzing liquid metal and device for use in this method |
WO2007128014A1 (en) * | 2006-05-09 | 2007-11-15 | Innsitec Laser Technologies Gmbh | Immersion probe for lips apparatuses |
US8313554B2 (en) | 2006-06-22 | 2012-11-20 | Aleris Switzerland Gmbh | Method for the separation of molten aluminium and solid inclusions |
US7892318B2 (en) | 2006-06-28 | 2011-02-22 | Aleris Switzerland Gmbh C/O K+P Treuhandgesellschaft | Crystallisation method for the purification of a molten metal, in particular recycled aluminium |
US7955414B2 (en) | 2006-07-07 | 2011-06-07 | Aleris Switzerland Gmbh | Method and device for metal purification and separation of purified metal from metal mother liquid such as aluminium |
EP1914534A2 (en) * | 2006-10-06 | 2008-04-23 | Heraeus Electro-Nite International N.V. | Immersion lance for analysing molten masses and liquids |
EP1914534A3 (en) * | 2006-10-06 | 2014-03-12 | Heraeus Electro-Nite International N.V. | Immersion lance for analysing molten masses and liquids |
DE102013009962B3 (en) * | 2013-06-14 | 2014-11-06 | K+S Aktiengesellschaft | LIBS viewing tube |
US9625391B2 (en) | 2013-06-14 | 2017-04-18 | K+S Aktiengesellschaft | LIBS measurement tube |
EP4336173A1 (en) * | 2022-09-09 | 2024-03-13 | AMAG casting GmbH | Method of controlling or regulating a melting furnace (1) and melting furnace (1), namely a shaft furnace, for melting metal |
Also Published As
Publication number | Publication date |
---|---|
GB8503996D0 (en) | 1985-03-20 |
GB8403976D0 (en) | 1984-03-21 |
GB2154315B (en) | 1987-12-31 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
732 | Registration of transactions, instruments or events in the register (sect. 32/1977) | ||
PCNP | Patent ceased through non-payment of renewal fee |
Effective date: 19970215 |