WO2011114341A1 - An enhanced procedure for cast iron (ci.) investigation for precise investigation of carbon (c) and a few other elements by optical emission spectrometer - Google Patents
An enhanced procedure for cast iron (ci.) investigation for precise investigation of carbon (c) and a few other elements by optical emission spectrometer Download PDFInfo
- Publication number
- WO2011114341A1 WO2011114341A1 PCT/IN2010/000159 IN2010000159W WO2011114341A1 WO 2011114341 A1 WO2011114341 A1 WO 2011114341A1 IN 2010000159 W IN2010000159 W IN 2010000159W WO 2011114341 A1 WO2011114341 A1 WO 2011114341A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- sample
- cast iron
- investigation
- elements
- carbon
- Prior art date
Links
- 238000000034 method Methods 0.000 title claims abstract description 19
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 title claims abstract description 14
- 229910052799 carbon Inorganic materials 0.000 title claims abstract description 14
- 230000003287 optical effect Effects 0.000 title claims abstract description 12
- 229910001018 Cast iron Inorganic materials 0.000 title claims description 12
- 238000011835 investigation Methods 0.000 title claims description 6
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 claims abstract description 6
- 229910052710 silicon Inorganic materials 0.000 claims abstract description 6
- 239000010703 silicon Substances 0.000 claims abstract description 6
- NINIDFKCEFEMDL-UHFFFAOYSA-N Sulfur Chemical compound [S] NINIDFKCEFEMDL-UHFFFAOYSA-N 0.000 claims abstract description 5
- OAICVXFJPJFONN-UHFFFAOYSA-N Phosphorus Chemical compound [P] OAICVXFJPJFONN-UHFFFAOYSA-N 0.000 claims abstract description 4
- 239000005864 Sulphur Substances 0.000 claims abstract description 4
- 229910052698 phosphorus Inorganic materials 0.000 claims abstract description 4
- 239000011574 phosphorus Substances 0.000 claims abstract description 4
- 238000004458 analytical method Methods 0.000 claims description 23
- 229910052751 metal Inorganic materials 0.000 abstract description 7
- 239000002184 metal Substances 0.000 abstract description 7
- 239000000203 mixture Substances 0.000 abstract description 4
- 238000012360 testing method Methods 0.000 abstract description 4
- 238000003908 quality control method Methods 0.000 abstract description 2
- 238000004064 recycling Methods 0.000 abstract description 2
- 239000000126 substance Substances 0.000 abstract description 2
- 239000000523 sample Substances 0.000 description 38
- 238000001228 spectrum Methods 0.000 description 13
- 238000001636 atomic emission spectroscopy Methods 0.000 description 9
- 230000003595 spectral effect Effects 0.000 description 8
- XEEYBQQBJWHFJM-UHFFFAOYSA-N Iron Chemical compound [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 description 6
- 239000013068 control sample Substances 0.000 description 6
- 230000005284 excitation Effects 0.000 description 6
- 239000007788 liquid Substances 0.000 description 4
- 239000006193 liquid solution Substances 0.000 description 4
- 238000003801 milling Methods 0.000 description 4
- 229910052742 iron Inorganic materials 0.000 description 3
- 238000003754 machining Methods 0.000 description 3
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 2
- 229910000831 Steel Inorganic materials 0.000 description 2
- 238000004364 calculation method Methods 0.000 description 2
- 229910052802 copper Inorganic materials 0.000 description 2
- 239000010949 copper Substances 0.000 description 2
- 229910001338 liquidmetal Inorganic materials 0.000 description 2
- 239000007787 solid Substances 0.000 description 2
- 238000010183 spectrum analysis Methods 0.000 description 2
- 239000010959 steel Substances 0.000 description 2
- 229910045601 alloy Inorganic materials 0.000 description 1
- 239000000956 alloy Substances 0.000 description 1
- 238000001675 atomic spectrum Methods 0.000 description 1
- 238000009838 combustion analysis Methods 0.000 description 1
- 238000002485 combustion reaction Methods 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 238000005553 drilling Methods 0.000 description 1
- 238000000921 elemental analysis Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 239000000835 fiber Substances 0.000 description 1
- 230000005283 ground state Effects 0.000 description 1
- 238000010438 heat treatment Methods 0.000 description 1
- BHEPBYXIRTUNPN-UHFFFAOYSA-N hydridophosphorus(.) (triplet) Chemical compound [PH] BHEPBYXIRTUNPN-UHFFFAOYSA-N 0.000 description 1
- 239000003562 lightweight material Substances 0.000 description 1
- WPBNNNQJVZRUHP-UHFFFAOYSA-L manganese(2+);methyl n-[[2-(methoxycarbonylcarbamothioylamino)phenyl]carbamothioyl]carbamate;n-[2-(sulfidocarbothioylamino)ethyl]carbamodithioate Chemical compound [Mn+2].[S-]C(=S)NCCNC([S-])=S.COC(=O)NC(=S)NC1=CC=CC=C1NC(=S)NC(=O)OC WPBNNNQJVZRUHP-UHFFFAOYSA-L 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 239000011159 matrix material Substances 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 238000000926 separation method Methods 0.000 description 1
- 238000004544 sputter deposition Methods 0.000 description 1
- 229910052717 sulfur Inorganic materials 0.000 description 1
- 239000011593 sulfur Substances 0.000 description 1
- 238000012546 transfer Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/28—Investigating the spectrum
- G01J3/443—Emission spectrometry
-
- C—CHEMISTRY; METALLURGY
- C21—METALLURGY OF IRON
- C21C—PROCESSING OF PIG-IRON, e.g. REFINING, MANUFACTURE OF WROUGHT-IRON OR STEEL; TREATMENT IN MOLTEN STATE OF FERROUS ALLOYS
- C21C5/00—Manufacture of carbon-steel, e.g. plain mild steel, medium carbon steel or cast steel or stainless steel
- C21C5/28—Manufacture of steel in the converter
- C21C5/42—Constructional features of converters
- C21C5/46—Details or accessories
- C21C5/4673—Measuring and sampling devices
-
- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
- F27—FURNACES; KILNS; OVENS; RETORTS
- F27D—DETAILS OR ACCESSORIES OF FURNACES, KILNS, OVENS, OR RETORTS, IN SO FAR AS THEY ARE OF KINDS OCCURRING IN MORE THAN ONE KIND OF FURNACE
- F27D5/00—Supports, screens, or the like for the charge within the furnace
- F27D5/0006—Composite supporting structures
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/66—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light electrically excited, e.g. electroluminescence
- G01N21/67—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light electrically excited, e.g. electroluminescence using electric arcs or discharges
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/66—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light electrically excited, e.g. electroluminescence
- G01N21/69—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light electrically excited, e.g. electroluminescence specially adapted for fluids, e.g. molten metal
-
- C—CHEMISTRY; METALLURGY
- C21—METALLURGY OF IRON
- C21C—PROCESSING OF PIG-IRON, e.g. REFINING, MANUFACTURE OF WROUGHT-IRON OR STEEL; TREATMENT IN MOLTEN STATE OF FERROUS ALLOYS
- C21C5/00—Manufacture of carbon-steel, e.g. plain mild steel, medium carbon steel or cast steel or stainless steel
- C21C5/52—Manufacture of steel in electric furnaces
- C21C2005/5288—Measuring or sampling devices
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
- Y02P10/00—Technologies related to metal processing
- Y02P10/20—Recycling
Definitions
- This invention is based on analysis of cast iron by Optical Emission Spectrometer. Its specific used for analysis of Carbon (C) and a few other elements like Silicon (Si), Sulphur (S) & Phosphorus (P). All operations are automatic using software and timings are optimized.
- C Carbon
- Si Silicon
- S Sulphur
- P Phosphorus
- a hand-held, self-contained, battery-powered test instrument for analyzing composition of a sample includes an exciter for exciting at least a portion of the sample, a compact cross-dispersed spectrometer for receiving an optical signal from the excited portion of the sample and a processor for processing spectral data about the optical signal from the spectrometer.
- the exciter may include a spark generator and a counter electrode, a laser or other device for generating the optical signal from the sample portion.
- the spectrometer has a wavelength range broad enough to enable the test instrument to detect and determine relative quantities of carbon, phosphorous, sulfur, manganese, silicon, iron and other elements necessary to identify common alloys.
- the spectrometer includes a structural member made of a light-weight material having a small coefficient of thermal expansion (CTE).
- CTE coefficient of thermal expansion
- the invention relates to a method for the spectral analysis of metal samples with the following steps: a. Recording of a spectrum of an unknown sample with a number of preset excitation parameters
- a method and apparatus of atomic emission spectrometry includes confining a solution within an emission chamber for on-line analysis or individual sample analysis. An electrical discharge created within the liquid to directly excite an internal portion of the liquid within the liquid solution. The atomic emission is totally enclosed within a liquid solution pocket. A fiber optic probe is connected directly to the excited internal portion within the liquid and to a suitable analyzer which analyzes the atomic spectral lines to determine the atomic elements within the liquid solution.
- the system can be used for individual element analysis or a multiple element analysis by use of an array spectrometer, with a simultaneous display of the complete atomic spectrum of multiple elements in a liquid solution, all in less than a period of one second.
- the liquid sample flows through the emission chamber with the electrical discharge created as time spaced discharges which are subsequently integrated by the analyzer to produce individual element related signals.
- the invention relates to a sample machining device, in particular for preparing samples for OES and/or XRF and/or combustion analyses, having at least one sample holder, and to provide a development which is advantageous in use proposes that the machining device includes a cylindrical milling cutter, the cylindrical milling cutter and the sample holder being movable relative to one another in such a manner that a sample which can be held in the sample holder can be divided by means of the cylindrical milling cutter to produce a free piece and a remainder piece of the sample which can still be held in the sample holder, and that at least one additional tool, in particular a drilling or separate milling tool, is provided in order to produce chips from the remainder piece of the sample.
- the machining device includes a cylindrical milling cutter, the cylindrical milling cutter and the sample holder being movable relative to one another in such a manner that a sample which can be held in the sample holder can be divided by means of the cylindrical milling cutter to produce a free piece and a remainder piece of the sample which can still be held in
- the invention relates to a sample analysis device in which, according to the invention, the abovementioned sample machining device and means for carrying out OES analysis and/or XRF analysis and/or combustion analysis are provided.
- the invention relates to a method for the spectral analysis of metal samples with the following steps: a. Recording of a spectrum of an unknown sample with a number of preset excitation parameters, b. Comparison of the spectrum with stored spectra of a number of control samples, c. Determination of the control sample with the best concordance of spectra, d.
- an analysis system for directly analyzing solid samples by atomic emission spectroscopy wherein the system includes an atomic spectral lamp (1) of the type which enables a solid sample to be analyzed to be demountable located as a cathode of the lamp (1), means (2) for producing a primary electric discharge by cathodic sputtering from the sample via connection (8) and a secondary boosted discharge for analytical emission via connection (9), spectral wave length analysis device (4) being arranged to receive and determine the intensity of spectral lines emitted by the lamp (1), and control means (3) for controlling the system, the current level of the sample cathode and the operation of the spectral wave length analysis device (4) being controlled on the basis of output from the photomultiplier tube (7) such that the intensity of the spectral lines is maximized and the relationship between spectral line intensity and concentration of the corresponding element in the sample is maintained in a region which is substantially linear Object of the invention
- Analyzing chemical composition of samples is important in many contexts, including identifying and segregating metal types (particularly various types of iron and steel) in outdoor metal recycling facilities, quality control testing in factories and forensic work.
- Optical emission spectroscopy OES is a mature, strong technology for the elemental analysis of materials.
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- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Chemical & Material Sciences (AREA)
- Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Pathology (AREA)
- General Health & Medical Sciences (AREA)
- Biochemistry (AREA)
- Immunology (AREA)
- Analytical Chemistry (AREA)
- Life Sciences & Earth Sciences (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- General Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Materials Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Mechanical Engineering (AREA)
- Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
Abstract
This technique is very functional for Analyzing chemical composition of sample in many Situations, including identifying and segregating metal types in outdoor metal recycling facilities, quality control testing in factories and forensic work. In this method when analyzing any sample on an Optical Emission Spectrometer. The sample is kept on the spark stand of the OES. After the initial Pre-burn period when sparking and combination start, the sample is moved using a stepper motor. It has been established that one gets good accuracy for all elements like Silicon (Si), Sulphur (S) & Phosphorus (P) including Carbon. All operations are automatic using software and timings are optimized.
Description
Title of Invention
An enhanced procedure for Cast Iron (C.I.) investigation for precise investigation of Carbon (C) and a few other elements by Optical Emission
Spectrometer
Field of invention
This invention is based on analysis of cast iron by Optical Emission Spectrometer. Its specific used for analysis of Carbon (C) and a few other elements like Silicon (Si), Sulphur (S) & Phosphorus (P). All operations are automatic using software and timings are optimized.
Prior Art
In the existing system as given in United States Patent Application 20080212074 / WIPO Patent Application WO/2008/103937 wherein, A hand-held, self-contained, battery-powered test instrument for analyzing composition of a sample includes an exciter for exciting at least a portion of the sample, a compact cross-dispersed spectrometer for receiving an optical signal from the excited portion of the sample and a processor for processing spectral data about the optical signal from the spectrometer. The exciter may include a spark generator and a counter electrode, a laser or other device for generating the optical signal from the sample portion. The spectrometer has a wavelength range broad enough to enable the test instrument to detect and determine relative quantities of carbon, phosphorous, sulfur, manganese,
silicon, iron and other elements necessary to identify common alloys. The spectrometer includes a structural member made of a light-weight material having a small coefficient of thermal expansion (CTE). The spectrometer is dimensionally stable over a range of expected ambient temperatures, without controlling the temperature of the spectrometer
In the existing system as given in United States Patent Application 20080198377 wherein, the invention relates to a method for the spectral analysis of metal samples with the following steps: a. Recording of a spectrum of an unknown sample with a number of preset excitation parameters
b. Comparison of the spectrum with stored spectra of a number of control samples, c. Determination of the control sample with the best concordance of spectra, d. Setting of the excitation parameters, which are stored for the best and closest control sample determined in step c
e. Recording of the spectrum of the unknown sample with the excitation parameters set in step d,
f. Calculation of the intensity ratios of the analysis lines stored for the control sample and the internal standards of the spectrum recorded in step e.
In the existing system as given in United States Patent 5278629 /WO/ 1993/001486 wherein A method and apparatus of atomic emission spectrometry includes confining a solution within an emission chamber for on-line analysis or individual sample analysis. An electrical discharge created within the liquid to directly excite an internal portion of the liquid within the liquid solution. The atomic emission is totally
enclosed within a liquid solution pocket. A fiber optic probe is connected directly to the excited internal portion within the liquid and to a suitable analyzer which analyzes the atomic spectral lines to determine the atomic elements within the liquid solution. The system can be used for individual element analysis or a multiple element analysis by use of an array spectrometer, with a simultaneous display of the complete atomic spectrum of multiple elements in a liquid solution, all in less than a period of one second. In an on-line system, the liquid sample flows through the emission chamber with the electrical discharge created as time spaced discharges which are subsequently integrated by the analyzer to produce individual element related signals.
In the existing system as given in United States Patent 7305897 wherein The invention relates to a sample machining device, in particular for preparing samples for OES and/or XRF and/or combustion analyses, having at least one sample holder, and to provide a development which is advantageous in use proposes that the machining device includes a cylindrical milling cutter, the cylindrical milling cutter and the sample holder being movable relative to one another in such a manner that a sample which can be held in the sample holder can be divided by means of the cylindrical milling cutter to produce a free piece and a remainder piece of the sample which can still be held in the sample holder, and that at least one additional tool, in particular a drilling or separate milling tool, is provided in order to produce chips from the remainder piece of the sample. Moreover, the invention relates to a sample analysis device in which, according to the invention, the abovementioned sample machining device and means for carrying out OES analysis and/or XRF analysis and/or combustion analysis are provided.
In the existing system as given' in IPC8 Class: AG01J330FI, USPC Class: 356313, wherein the invention relates to a method for the spectral analysis of metal samples with the following steps: a. Recording of a spectrum of an unknown sample with a number of preset excitation parameters, b. Comparison of the spectrum with stored spectra of a number of control samples, c. Determination of the control sample with the best concordance of spectra, d. Setting of the excitation parameters, which are stored for the best and closest control sample determined in step c, e. Recording of the spectrum of the unknown sample with the excitation parameters set in step d, f. Calculation of the intensity ratios of the analysis lines stored for the control sample and the internal standards of the spectrum recorded in step e
In the existing system as given in US Patent 4824249 wherein An analysis system for directly analyzing solid samples by atomic emission spectroscopy wherein the system includes an atomic spectral lamp (1) of the type which enables a solid sample to be analyzed to be demountable located as a cathode of the lamp (1), means (2) for producing a primary electric discharge by cathodic sputtering from the sample via connection (8) and a secondary boosted discharge for analytical emission via connection (9), spectral wave length analysis device (4) being arranged to receive and determine the intensity of spectral lines emitted by the lamp (1), and control means (3) for controlling the system, the current level of the sample cathode and the operation of the spectral wave length analysis device (4) being controlled on the basis of output from the photomultiplier tube (7) such that the intensity of the spectral lines is maximized and the relationship between spectral line intensity and concentration of the corresponding element in the sample is maintained in a region which is substantially linear
Object of the invention
In existing process cast Iron analysis is not accurate analysis for carbon (C) and a few other elements like Silicon (Si). This is so because of the high concentration of C in C.I. In steels C is normally present up to a maximum concentration of 1.50%, whereas in C.I., S.G. Iron etc., C is normally higher than 1.50%. It could be even up to 4.50% or more.
When C.I. /S.G.I, etc. solidify the Carbon separates out and hence the metal matrix is not identical. Metallurgists & chemists who analyse C.I. have found a method to overcome this separation. As a substitute of taking "as cast" C.I. samples for analysis, they transfer out a liquid metal sample from the heating system into a copper mould to form a relatively thin sample, typically 8 to 10mm thick. Since the sample is thin and the copper mould conducts the heat away, the liquid metal solidifies quickly to form "chill cast" sample. The time taken to solidify is short leaving the Carbon hardly any time to separate. A uniformly homogeneous sample is thus obtained which is then polished before it is analysed on an Optical Emission Spectrometer.
In this method when analyzing any sample on an Optical Emission Spectrometer. The sample is kept on the spark stand of the OES. After the initial Pre-burn period when sparking and combination start, the sample is moved using a stepper motor. It has been established that one gets good accuracy for all elements including Carbon
Detailed Description and scope of the Invention
Analyzing chemical composition of samples is important in many contexts, including identifying and segregating metal types (particularly various types of iron and steel) in outdoor metal recycling facilities, quality control testing in factories and forensic work. Several analytical methods are available. Optical emission spectroscopy (OES) is a mature, strong technology for the elemental analysis of materials.
In OES, a small quantity of sample material is vaporized and excited above atomic ground state. Emissions characteristic of elements in the vaporized sample are captured- by a light guide, which sends the light to a spectrometer, which produces and analyzes a spectrum from the light, so as to yield the elemental composition. In existing process cast Iron analysis is not accurate analysis for carbon© and a few other elements like Silicon (Si), Sulphur (S) & Phosphorus (P). In this method when analyzing any sample on an Optical Emission Spectrometer. The sample is kept on the spark stand of the OES. After the initial Pre-burn period when sparking and combination start,, the sample is moved using a stepper motor. It has been established that one gets good accuracy for all elements including Carbon. All operations are automatic using software and timings are optimized.
Claims
(1) An enhanced procedure for Cast Iron (C.I.) investigation for precise investigation of Carbon (C) and a few other elements by Optical Emission Spectrometer.
(2) An enhanced procedure for Cast Iron is consisting of Optical Emission Spectrometer.
(3) An enhanced procedure for Cast Iron is claimed as claim 1 wherein its specific used for analysis of Carbon (C) and a few other elements like Silicon (Si), Sulphur (S) & Phosphorus (P).
(4) An enhanced procedure for Cast Iron is claimed as claim 1 wherein). All operations are automatic using software and timings are optimized.
(5) An enhanced procedure for Cast Iron is claimed as claim 1 wherein when analyzing any sample is kept on the spark stand of the OES.
(6) An enhanced procedure for Cast Iron is claimed as claim 1 wherein after the initial Pre-burn period when sparking and combination start, the sample is moved using a stepper motor.
(7) An enhanced procedure for Cast Iron is claimed as claim 1 wherein It has been established that gets good accuracy for all elements including Carbon.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| PCT/IN2010/000159 WO2011114341A1 (en) | 2010-03-18 | 2010-03-18 | An enhanced procedure for cast iron (ci.) investigation for precise investigation of carbon (c) and a few other elements by optical emission spectrometer |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| PCT/IN2010/000159 WO2011114341A1 (en) | 2010-03-18 | 2010-03-18 | An enhanced procedure for cast iron (ci.) investigation for precise investigation of carbon (c) and a few other elements by optical emission spectrometer |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| WO2011114341A1 true WO2011114341A1 (en) | 2011-09-22 |
Family
ID=44648499
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| PCT/IN2010/000159 WO2011114341A1 (en) | 2010-03-18 | 2010-03-18 | An enhanced procedure for cast iron (ci.) investigation for precise investigation of carbon (c) and a few other elements by optical emission spectrometer |
Country Status (1)
| Country | Link |
|---|---|
| WO (1) | WO2011114341A1 (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103424396A (en) * | 2013-07-11 | 2013-12-04 | 江苏联峰能源装备有限公司 | Method for quickly analyzing all elements in cast iron sample by using emission spectrums |
| CN106706533A (en) * | 2016-12-30 | 2017-05-24 | 杭州谱育科技发展有限公司 | Sample intelligent analysis method |
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3736059A (en) * | 1971-06-17 | 1973-05-29 | W Schuhknecht | Device for spectrochemical analysis of solutions |
| US5141314A (en) * | 1991-03-01 | 1992-08-25 | Thermo Jarrell Ash Corporation | Spectroanalytical system |
| US5521698A (en) * | 1994-02-02 | 1996-05-28 | Thermo Jarrell Ash Corporation | Analysis system |
| US5699155A (en) * | 1993-07-26 | 1997-12-16 | Kawasaki Steel Corporation | Emission spectral analysis method and instrument therefor |
| US20030168132A1 (en) * | 2001-03-06 | 2003-09-11 | Nsk Ltd. | Method for measuring particle size of inclusion in metal by emission spectrum intensity of element constituting inclusion in metal, and method for forming particle size distribution of inclusion in metal, and apparatus for executing that method |
| US20060023210A1 (en) * | 2004-08-02 | 2006-02-02 | Spetro Analytical Instruments Gmbh & Co. Kg | Apparatus and method for the spectroscopic determination of carbon |
| US20090079980A1 (en) * | 2007-02-23 | 2009-03-26 | Thermo Niton Analyzers Llc | Compact Cross-Dispersed Spectrometer for Extended Spectral Range |
-
2010
- 2010-03-18 WO PCT/IN2010/000159 patent/WO2011114341A1/en active Application Filing
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3736059A (en) * | 1971-06-17 | 1973-05-29 | W Schuhknecht | Device for spectrochemical analysis of solutions |
| US5141314A (en) * | 1991-03-01 | 1992-08-25 | Thermo Jarrell Ash Corporation | Spectroanalytical system |
| US5699155A (en) * | 1993-07-26 | 1997-12-16 | Kawasaki Steel Corporation | Emission spectral analysis method and instrument therefor |
| US5521698A (en) * | 1994-02-02 | 1996-05-28 | Thermo Jarrell Ash Corporation | Analysis system |
| US20030168132A1 (en) * | 2001-03-06 | 2003-09-11 | Nsk Ltd. | Method for measuring particle size of inclusion in metal by emission spectrum intensity of element constituting inclusion in metal, and method for forming particle size distribution of inclusion in metal, and apparatus for executing that method |
| US20060023210A1 (en) * | 2004-08-02 | 2006-02-02 | Spetro Analytical Instruments Gmbh & Co. Kg | Apparatus and method for the spectroscopic determination of carbon |
| US20090079980A1 (en) * | 2007-02-23 | 2009-03-26 | Thermo Niton Analyzers Llc | Compact Cross-Dispersed Spectrometer for Extended Spectral Range |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103424396A (en) * | 2013-07-11 | 2013-12-04 | 江苏联峰能源装备有限公司 | Method for quickly analyzing all elements in cast iron sample by using emission spectrums |
| CN106706533A (en) * | 2016-12-30 | 2017-05-24 | 杭州谱育科技发展有限公司 | Sample intelligent analysis method |
| CN106706533B (en) * | 2016-12-30 | 2019-11-01 | 杭州谱育科技发展有限公司 | Sample intelligent analysis method |
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