GB2145827A - An electromagnetic measuring probe - Google Patents
An electromagnetic measuring probe Download PDFInfo
- Publication number
- GB2145827A GB2145827A GB08323381A GB8323381A GB2145827A GB 2145827 A GB2145827 A GB 2145827A GB 08323381 A GB08323381 A GB 08323381A GB 8323381 A GB8323381 A GB 8323381A GB 2145827 A GB2145827 A GB 2145827A
- Authority
- GB
- United Kingdom
- Prior art keywords
- pole
- measuring probe
- piece
- pin
- front face
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
- G01B7/02—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness
- G01B7/06—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness
- G01B7/10—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness using magnetic means, e.g. by measuring change of reluctance
- G01B7/105—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness using magnetic means, e.g. by measuring change of reluctance for measuring thickness of coating
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
Abstract
An electromagnetic measuring probe for measuring the thickness of thin coatings (43) comprises at least one pole piece (21) composed of a magnetic material of high magnetic permeability having a front face facing coating (43). A pin (27) composed of hard metal which has a low magnetic permeability in comparison to pole piece (21) is positioned within a recess (26) in the pole piece (21) so that the external face of the pin constitutes a crowned contact surface. Pin (27) prevents the concentration of magnetic field lines in the area of contact with surface (42) and provides a readout which is practically linear with respect to coating thickness. Winding (33) acts as an excitation winding and winding (36) as an induction winding. A two pole probe is also described. <IMAGE>
Description
SPECIFICATION
Electromagnetic measuring probe
The present invention relates to an electromagnetic measuring probe of the kind comprising at least one pole-piece composed of a magnetic material of high magnetic permeability having a pole-piece front face, a recess machined into the pole-piece front face extending into the body of the pole-piece, a pin composed of another material positioned within the recess,and a crowned contact surface.
An electromagnetic measuring probe of this type has been described in German Patent
Disclosure No. 25 56 340.
German Utility Patent 72 43 91 5 as well as
German Utility Patent 73 36 864 also describe such an apparatus.
The said electromagnetic measuring probe allows the thickness of non-magnetic coatings or platings on magnetic substrate materials to be measured, for instance, a coat of paint on an iron or steel part.
All these measuring probes have an exciter winding which is connected to a constant alternating-current supply. Furthermore, there is an induction winding which generates a voltage U. The voltage in the induction winding is a measure of the thickness of the nonmagnetic coating or plating. This type of thickness measurement for thin coating or platings should at least provide linearity of readout, i.e. a pointer should, for example, deflect twice as far for a coating or plating of double a certain thickness than it does for the said thickness alone. It is highly desirable that thin coating be measured without any influence from the substrate material on the characteristic curve. In this case, thin coatings are considered to be those which generate voltages lying within 0 to 1/3 of the normalized voltage, as defined later in the text.
It is of course a well known fact that the relationships between the generated voltage and the coating thickness are not linear for thin coatings or platings. It is, however, ex actly in this range where linear measurements are most desirable. From the practical point of view, however, the range from 0 to roughly speaking 50 micrometers is interesting as a lower range for coating and plating thicknesses.
Obviously, all this instruments must have facilities for switching ranges. If, for example, thicknesses up to 1000 micrometers are to be measured, and the said thickness is chosen as the upper end-scale value, then a thickness of 10 micrometers will be practically impossible to read.
Since it is impossible to avoid switching measuring ranges, then it is highly desirable that the said voltage is a linear function of coating or plating thickness not only at the lower end of the range but also retains this same linearity to the highest possible thickness values, thus avoiding the necessity of using a different linear function in the upper ranges.
It must also be possible, of course, to make linear measurements in the lower range from
O to 50 micrometers even when the probe is not handled with any particular care.
The conditions of measurement may change neither during a demonstration at a trade fair, nor over the long term in a harsh industrial environment. In the lower range in particular, the geometry of the crowned contact surface is an important factor. In accordance with
Germany Utility Patent 73 36 864 an attempt was made to make the crowned contact surface wear-resistant by depositing a titanium carbide coating onto it, i.e., to contrive that the geometry did not change. The coating, however, is very hard. It is deposited on a relatively soft material. If the thickness of the coating lies between 3 and 1 5 micrometers, it is possible that the titanuim carbide coating will rupture when the probe is set down hard, because the substrate material underneath deforms. It is also not very easy to deposit a uniformly thick coating on the substrate.If the coating is not uniformly thick, then different measured values are obtained depending on whether the probe is set down exactly at the centre of the crowned contact surface or at another position. This realistic numerial example illustrates another problem associated with the measurement of thin coatings which, as yet, has no completely satisfactory solution.
A third problem must also be considered:
The same probe must also be able to measure coatings on both flat surfaces and curved surfaces of small radius of curvature. An example of the latter is e.g., a small nail, a small spring or similar. An object of the invention is to indicate a measuring probe of the type specified in the introduction, which allows linear measurements to be made, particularly in the range of thin coatings, while at the same time avoiding nonlinearity problems which stem from the magnetization curve as well as the geometry of the crowned contact surface. This object is also to be fulfilled for the measurement of small parts.
According to the invention we provide an electromagnetic measuring probe comprising at least one pole-piece composed of a magnetic material of high magnetic permeability having a pole-piece front face, a recess machined into the pole-piece front face extending into the body of the pole-piece, a pin composed of another material positioned within the recess, and a crowned contact surface, wherein the pin is composed of hard metal which has a low magnetic permeability in comparison to the material of the pole-piece and the external front face of the pin comprises the crowned contact surface.
Surprisingly enough, the said configuration brings with it not only the aforementioned linearisation. It also has the result that the characteristic curves for the very hard-magnetic and very soft-magnetic materials are practically identical. For example, the characteristic curve for hardened steel is practically the same as that for soft iron over the entire measuring range. The pin may be circular cylindrical to allow a more uniform magnetic flux density. Moreover commercially available pins designed for other purposes can be used.
Finally, despite the close tolerances of the pin, it can be manufactured inexpensively. The pole-piece may be circular cylindrical to allow not only the pole piece to be inexpensively manufactured to very close tolerances, but also allow the recess to be precisely machined at the correct coaxial position. The pin is preferably composed of sintered hard metal to allow the continued use of weakly magnetisa ble hard metal, but contrary to the case of non-sintered hard metals, allow Vicker's Hardness of 1000 to 2000 to be attained. The sintered hard metal may be titanium or tungsten carbide with a cobalt content of 2 to 10% by volume. These compositions have proven themselves particularly well in practice, whereby the cobalt is responsible for the magnetisability.
The dimension of the pin in a direction transverse to the longitudinal axis of the polepiece is preferably 1/4 to 2/3 of the dimension of the pole-piece. Further, the pin may be several millimeters long and has a diameter of one millimeter or less. Also the pin may be 0.7 mm + 50% and the pole-piece 1.6 mm
+ 50% in the case of a single-pole measuring probe. The crowned contact surface may be a spherical-segment surface, in which the radius of the sphere is from 0.6 to 3 times the diameter of the pole-piece. The linearization can be optimised with respect to the measurement of curved parts and parts with small surfaces areas.
The apparatus according to the invention can also be used as a single-pole probe. It is not restricted to use as a two-pole probe. If it is to be uqed as a single-pole probe however, the additional problem of the stray magnetic field arises. This problem can be eliminated by ensuring that the pole-piece is positioned centrally in a pot core, its front face standing proud of the front face of the pot core wall, the inside wall of the pot core wall being clad with a foil composed of a material with a high magnetic permeability.
The invention is now described using preferred illustrative embodiments.
The accompanying drawings show:
FIG. 1: the substantially enlarged crosssection through a probe which has been set down on a coating or plating,
FIG. 2: the area around the contact surface, enlarged further in order to show better the direction of the magnetic field flux lines,
FIG. 3: a characteristic curve of coating thickness versus normalized voltage for two very different materials plotted on a semilogarithmic scale,
FIG. 5: a cross-section, similar to Fig. 1, but for a two-pole probe.
A pot core 11 composed of soft iron is rotationally symmetric about the geometrical longitudinal axis 1 2. It has a base 1 3 and a circular cylindrical wall 14. In the area of the base 13 there is a horizontal threaded throughbore 16. A grubscrew 17 is screwed into this bore. The base 1 3 has a through-bore 1 8 coaxial to the geometrical longitudinal axis 1 2 which has a diameter substantially smaller than that of the inner base surface 1 9 of the base 13. A circular cylindrical core 21 composed of high-permeability material is positioned in the upper section of the throughbore 18 as per Fig. 1.Its topface 22 is lined up with the top face 23 of the base 1 3. A plastic disc 24, which limits the depth to which the core 21 can be pushed into the through-bore and acts as a stop etc.. is seated on the top face 22 as well as part of the top face 23. The core 21 is clamped into this position by screwing in the grubscrew 1 2. In the lower section of the core 21 as per Fig. 1 is a coaxial blind hole. In this hole is positioned a sintered hard-metal pin which is fixed in the axial direction. The pin is held in position either by a clamping device or by adhesive.
The bottom face 28 of the pin 27 is ground as a spherical cup. It is symmetrical about the longitudinal axis 1 2. The geometry of the bottom face 28 is continued into the bottom face 29 of the core 21. The bottom face 28, 29 is produced by using a technique similar to that used in the optics industry for grinding convex lenses or for the manufacture of watch bezels. The bottom face 28 is therefore of polished quality.
The bottom face 31 of the wall 14 is higher than the highest point of the bottom face 29.
The bottom face 28 is the actual contact surface.
The plastic disc 24 carries two terminals 32. These are connected to a constant alternating current supply. The supply has a frequency of 25 Hz to 5kHz. The frequency cannot be changed, it is in fact permanently set. The applied alternating current is constant at about 3mA. An exciter winding 33 is supplied from the terminals 32. This winding is seated on the core 21.
The plastic disc 24 carries two further terminals 34. These are connected to an induction winding which is also seated on the core 21. In the illustrative embodiment the induction winding 36 is wound around the core 21 in the region of the pin 27, whereas the exciter winding 33 is wound about that region of the core 21 which does not have the blind hole 26.
The base surface 1 9 is covered with a coaxial circular disc 37 composed of highpermeability foil material which has a thickness of roughly 20 to 40 micrometers. The disc 37 has a circular hole 38 lined up with the through-bore 18, the edge of which is positioned on the circular cylindrical external surface of the core 21.
The inner surface 39 of the wall 14 is also lined with a cylinder 41 of the said foil. The top of this cylinder touches the disc 37. The bottom front face 41 is in line with the radial bottom face 31.
The core 21 stands perpendicular to the surface 42 of a coating 43, that has a thickness which is to be measured, that is nonmagnetic and that has been diposited on a magnetisable substrate 44.
When in use, the lines of force 46 must be prevented from concentrating exclusively in the region of the geometrical longitudinal axis 1 2. In fact the lines of force 46 are pushed outwards as per the realistic illustration in Fig.
2 so that in comparison to other cases in point, the magnetic flux lines run practically uniformly across the bottom face 28, 29. The magnetic flux density is not greatest at the point of contact but rather in the stationary annulus surrounding the blind hole 26 and naturally, further up in the massive core 21.
The most favorable case for setting down the probe is when the geometrical longitudinal axis stands perpendicular to the surface 42.
The apparatus is, however, to a large extent insensitive to position even in such cases where the surface 42 contacts another point of the bottom face 28.
The bottom face 29 may not, however, contact the surfae 42, because in this case the old, unfavorable conditions would arise again. On the other hand, if the bottom face 29 were to contact the surface 42, the magnetic reluctance of the entire circuit would be so much lower that this would be easily detected and the measurement recognised as faulty.
In Fig. 3 the thickness in micrometers is plotted on the logarithmic vertical axis. The normalized voltage Un is plotted on the linear horizontal axis, whereby
U - Uo
Un = -------- , where: Ucn Uo Uo is the voltage generated when the probe is set down on the substrate material 44 and the coating 43 is not present.
Uco is the voltage generated when the probe is raised in the air, whereby the distance it is raised is such that the probe is no longer influenced by the magnetic substrate material 44.
U is the voltage which is generated by a measurable coating.
Un therefore lies between 0 and 1.
It can be seen from Fig. 3 that only over a particular length does the characteristic curve 47 for hardened steel lie a little above the characteristic curve 48 for soft iron. The deviation is in fact so small that the-characteristic curve only appears to be slightly thicker in this region. In the remainder of the range the characteristic curves 47, 48 are identical within the accuracy of the drawing. The similarity over the entire range is extremely favorable.
Fig. 4 shows the lower left corner of Fig. 3 on a linear scale. As can be confirmed by laying a straight edge on Fig. 4, the nonlinear deviation is very slight, and the curves 47 and 48 have joined to become a single line. This means that there is a practically linear relationship between thickness and voltage independent of the substrate to be measured.
In the illustrative embodiment the core 21 had a diameter of 1.6 mm. The pin had a diameter of 0.7 mm. The radius of the bottom faces 28, 29 was 1.2 mm. With this probe values up to 1000 micrometer can be covered - naturally after the measuring ranges have been decided upon-whereby Un can be as high as 0.9.
If the pot core 11 is clad with a foil as per the illustrative embodiment, exciter frequencies of up to 5 kHz can be applied to the exciter winding 33. In this manner the design can be still further reduced in size. This allows coatings to be measured in the range 0 to 100 micrometers largely independent of shape, even though, if they are metallic, they cause no noticable eddy-current losses in this range. In this case of the said design the core 21 can have a diameter of 0.8 mm and the pin a diameter of 0.4 mm.
For core probes the inner surface 39 is 1 to 3 times the diameter of the core 21. The length of the pot core 11 lies between 0.5 to 2 times the diameter of the inner surface 39.
In the illustrative embodiment of a two-pole probe as per Fig. 5, analogous to the core 21 there are two cores 49, 51. The top faces of these cores are connected together by a yoke 52. The exciter winding 53 is positioned on the core 49 and the induction winding 53 is positioned on the core 51. In this case two the pins 54, 56, analogous to pin 27, have the said geometry.
This type of two-pole probe is advantageous when measurements are to be made on rough surfaces. Since the probability that both poles are positioned within a hollow or on a hump of the coating are slight, this type of probe averages the measuring effect in a desirable manner.
In addition, two-pole measuring probes have, if the direction lines of force between the two poles can be imagined, an elliptical field, whereby the dependency on shape for measurements on cylindrical materials is much less than is the case for single-pole pot cores, which due to design considerations have a radially symmetric field.
Claims (12)
1. An electromagnetic measuring probe comprising at least one pole-piece composed of a magnetic material of high magnetic permeability having a pole-piece front face, a recess machined into the pole-piece front face extending into the body of the pole-piece, a pin composed of another material positioned within the recess, and a crowned contact surface, wherein the pin (27) is composed of hard metal which has a low magnetic permeability in comparison to the material of the pole-piece (21) and, the external front face (28) of the pin (27) comprises the crowned contact surface.
2. A measuring probe as claimed in claim 1, wherein the pin (27) is circular cylindrical.
3. A measuring probe as claimed in claim
1, wherein the pole-piece (21) is circular cylindrical.
4. A measuring probe as claimed in claim 1, wherein the pin (27) is composed of sintered hard metal.
5. A measuring probe as claimed in claim 4, wherein the sintered hard metal is titanium carbide with a cobalt content of 2 to 20% by volume.
6. A measuring probe as claimed in claim 4, wherein the sintered hard metal is tungsten carbide with a cobalt content of 2 to 20% by volume.
7. A measuring probe as claimed in claim 1, wherein the dimension of the pin in a direction transverse to the longitudinal axis of the pole-piece (21) is 1/4 to 2/3 of the dimension of the pole-piece (21).
8. A measuring probe as claimed in claim 1, wherein the pin (27) is several millimeters long and has a diameter of one millimeter or less.
9. A measuring probe as claimed in claim 8, wherein the pin (27) is 0.7 mm + 50% and the pole-piece (21) is 1.6 mm + 50% in the case of a single pole measuring probe.
10. A measuring probe as claimed in claim 1, wherein the crowned contact surface (28) is a spherical-segment surface, whereby the radius of the sphere is from 0.6 to 3 times the diameter of the pole-piece (21).
11. A measuring probe as claimed in claim 1, wherein the pole-piece (21) is positioned centrally in a pot core (11), its front face (29) standing proud of the front face (31) of the pot core wall (14) and the inside wall (39) of the pot core wall (14) is clad with a foil (35) composed of a material with a high magnetic permeability.
12. A measuring probe as claimed in claim 1, wherein two cores (49) are connected together by means of a yoke (52).
1 3. An electromagnetic measuring probe substantially as described with reference to
Figures 1 and 2 or Figure 5 of the accompanying drawings.
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GB08323381A GB2145827B (en) | 1983-08-31 | 1983-08-31 | Electromagnetic measuring probe |
SG9088A SG9088G (en) | 1983-08-31 | 1988-02-05 | Electromagnetic probe for measuring the thickness of thin coatings on magnetic substances |
HK106888A HK106888A (en) | 1983-08-31 | 1988-12-29 | Electromagnetic probe for measuring the thickness of thin coatings on magnetic substances |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GB08323381A GB2145827B (en) | 1983-08-31 | 1983-08-31 | Electromagnetic measuring probe |
Publications (3)
Publication Number | Publication Date |
---|---|
GB8323381D0 GB8323381D0 (en) | 1983-10-05 |
GB2145827A true GB2145827A (en) | 1985-04-03 |
GB2145827B GB2145827B (en) | 1987-04-08 |
Family
ID=10548128
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
GB08323381A Expired GB2145827B (en) | 1983-08-31 | 1983-08-31 | Electromagnetic measuring probe |
Country Status (3)
Country | Link |
---|---|
GB (1) | GB2145827B (en) |
HK (1) | HK106888A (en) |
SG (1) | SG9088G (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0203536A1 (en) * | 1985-05-28 | 1986-12-03 | Zellweger Uster Ag | Measuring head for the inductive measurement of the thickness of an insulating layer on an electrical conductor |
GB2257520A (en) * | 1991-06-25 | 1993-01-13 | Helmut Fischer Gmbh & Co | Method and device for measuring the thickness of thin layers |
WO1998027400A1 (en) * | 1996-12-18 | 1998-06-25 | Robert Bosch Gmbh | Process for determining the thickness of a layer of electroconductive material |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN103499272A (en) * | 2013-10-10 | 2014-01-08 | 南昌航空大学 | Wide-range magnetic thickness measuring device for non-magnetic coating of ferromagnetic component and detection method of wide-range magnetic thickness measuring device |
-
1983
- 1983-08-31 GB GB08323381A patent/GB2145827B/en not_active Expired
-
1988
- 1988-02-05 SG SG9088A patent/SG9088G/en unknown
- 1988-12-29 HK HK106888A patent/HK106888A/en not_active IP Right Cessation
Cited By (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0203536A1 (en) * | 1985-05-28 | 1986-12-03 | Zellweger Uster Ag | Measuring head for the inductive measurement of the thickness of an insulating layer on an electrical conductor |
US4764724A (en) * | 1985-05-28 | 1988-08-16 | Zellweger Uster Ltd. | Measuring head for inductive measurement of the thickness of an insulating layer on an electric conductor |
GB2257520A (en) * | 1991-06-25 | 1993-01-13 | Helmut Fischer Gmbh & Co | Method and device for measuring the thickness of thin layers |
GB2257520B (en) * | 1991-06-25 | 1995-05-10 | Helmut Fischer Gmbh & Co | Method and probe for measuring the thickness of a thin layer |
WO1998027400A1 (en) * | 1996-12-18 | 1998-06-25 | Robert Bosch Gmbh | Process for determining the thickness of a layer of electroconductive material |
AU726794B2 (en) * | 1996-12-18 | 2000-11-23 | Robert Bosch Gmbh | Procedure for determining the thickness of a layer of electrically conductive material |
US6198278B1 (en) * | 1996-12-18 | 2001-03-06 | Robert Bosch Gmbh | Process for determining the thickness of a layer of electroconductive material deposited on a body |
Also Published As
Publication number | Publication date |
---|---|
GB2145827B (en) | 1987-04-08 |
HK106888A (en) | 1989-01-06 |
SG9088G (en) | 1989-07-07 |
GB8323381D0 (en) | 1983-10-05 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
PE20 | Patent expired after termination of 20 years |