GB2119817A - Vacuum deposition apparatus - Google Patents

Vacuum deposition apparatus Download PDF

Info

Publication number
GB2119817A
GB2119817A GB08310932A GB8310932A GB2119817A GB 2119817 A GB2119817 A GB 2119817A GB 08310932 A GB08310932 A GB 08310932A GB 8310932 A GB8310932 A GB 8310932A GB 2119817 A GB2119817 A GB 2119817A
Authority
GB
United Kingdom
Prior art keywords
substrate
sputtering
cathode
magnetic field
coated
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
GB08310932A
Other versions
GB8310932D0 (en
Inventor
Mohammed Nazim Khan
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Dowty Electronics Ltd
Original Assignee
Dowty Electronics Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Dowty Electronics Ltd filed Critical Dowty Electronics Ltd
Priority to GB08310932A priority Critical patent/GB2119817A/en
Publication of GB8310932D0 publication Critical patent/GB8310932D0/en
Publication of GB2119817A publication Critical patent/GB2119817A/en
Withdrawn legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32Gas-filled discharge tubes
    • H01J37/32431Constructional details of the reactor
    • H01J37/3266Magnetic control means
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/22Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
    • C23C14/34Sputtering
    • C23C14/35Sputtering by application of a magnetic field, e.g. magnetron sputtering
    • C23C14/351Sputtering by application of a magnetic field, e.g. magnetron sputtering using a magnetic field in close vicinity to the substrate
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32Gas-filled discharge tubes
    • H01J37/34Gas-filled discharge tubes operating with cathodic sputtering

Landscapes

  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Plasma & Fusion (AREA)
  • Analytical Chemistry (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Materials Engineering (AREA)
  • Mechanical Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Physical Vapour Deposition (AREA)

Abstract

The apparatus including a cathode 4 an anode 8 associated with the substrate 6 to be coated and permanent magnet means 10 whose lines of force are directed substantially parallel to the surface of the substrate 6, at least closely adjacent to that surface, and whose strength is such as to divert high-energy electrons away from the surface in order substantially to prevent them bombarding that surface. <IMAGE>

Description

SPECIFICATION Vacuum deposition apparatus This invention relates to vacuum deposition apparatus and in particular, but not exclusively, to sputtering apparatus.
In a sputtering apparatus the piasma usually contains, in those parts of the sputtering chamber which are remote from the electrodes, unwanted ions of the sputtering gas and low-energy electrons.
In the gap between the electrodes, however, the plasma contains high-energy ions which bombard the target, energetic neutral particles of the material to be sputtered which will coat a surface of a substrate, high-energy electrons which hit the substrate, and photons which arise from the recombinations óf ions and electrons.
The bombardment of the substrate, during sputtering, by high-energy electrons can have a deleterious effect on the sputtered film, particularly when the material being sputtered is a dielectric material, e.g. silicon dioxide.
It is an object of this invention to provide an improved vacuum deposition apparatus.
According to this invention a vacuum deposition apparatus includes a cathode, an anode associated with the substrate to be coated, and means providing a magnetic field whose lines of force are directed substantially parallel to the surface of the substrate to be coated and are at least closely adjacent to that surface and whose strength is such as to divert high-energy electrons away from, and substantially prevent them bombarding, the surface.
The vacuum deposition apparatus may be a sputtering apparatus.
One embodiment of a sputtering apparatus in accordance with one embodiment of the invention, given by way of example, is illustrated in the accompanying drawings of which Figure 1 is a vertical sectional view of the apparatus, and Figure 2 is a section taken along the line 11II of Figure 1.
Referring to the drawings the illustrative apparatus includes a chamber 1 which can be connected to a suitable pump (not shown) for evacuating the chamber.
Near to one end of the chamber there are disposed an earthed metal shield 2, a backing plate 3 and a cathode 4. The cathode 4 is connected to a source of high-power radiofrequency signals (not shown) by way of the backing plate.
Within another part of the chamber there are disposed a worktable 5 which supports a substrate 6 having a surface to be coated. The worktable 5 is within a rectangular recess 7 in an anode structure 8. The anode structure 8 is connected to the earthed base plate of the chamber 1 by means of a connector flange 9. The anode structure of this embodiment of the invention is hollow and water cooled. To that end, the apparatus includes a water inlet pipe 11 and a water outlet pipe 12.
Also within the rectangular recess there are permanent magnets 10 which provide a uniform magnetic field. The lines of force of the magnetic field extend substantially parallel to the surface of the substrate 6 to be coated, say in the direction B shown in Figure 1, and extend someway beyond the substrate 6 towards but not as far as the region adjacent the cathode 4. As mentioned later, the field strength is of a certain value.
In operation the anode structure 8 is at earth potential and will be kept water cooled. A highpower radio-frequency signal is applied to the cathode 4. The application of that signal ionises a sputtering gas which fills the chamber at low pressure; the ions produced bombard the cathode 4 and cause sputtering.
The earthed metal shield 2 prohibits the sputtering of material from the backing plate 3.
The neutral particles of material to be sputtered will coat the surface of the substrate 6.
Any high-energy electrons which enter the region close to the surface to be coated will come under the influence of the magnetic field of the permanent magnets 10. The magnetic field is of such a strength that the trajectory of the electrons will be changed, causing them to move along the lines of force, which extend substantially parallel to the surface to be coated, in a helical trajectory away from the surface of the substrate to be coated. The electrons will, eventually, bombard the earthed anode structure instead of the substrate.
The strength of the magnetic field depends on the energy of the electrons and can readily be computed from the equation: mV By er where m is the electronic mass e is the electronic charge V is the electronic velocity and r is the radius of the helical trajectories of electrons along the magnetic field direction.
The magnetic field produced by the permanent magnets does not extend to the region adjacent the cathode and has a negligible effect on the heavier ions which bombard the cathode and which cause sputtering.
In addition to the magnetic field produced in the region of the substrate (in the above described embodiment, produced by the permanent magnets 10), another magnetic field, known in the art of cathode sputtering, may be generated by other magnetic-fieíd-producing means in the region of the cathode to increase the rate of sputtering.
Claims
1. A vacuum deposition apparatus including a
**WARNING** end of DESC field may overlap start of CLMS **.

Claims (2)

**WARNING** start of CLMS field may overlap end of DESC **. SPECIFICATION Vacuum deposition apparatus This invention relates to vacuum deposition apparatus and in particular, but not exclusively, to sputtering apparatus. In a sputtering apparatus the piasma usually contains, in those parts of the sputtering chamber which are remote from the electrodes, unwanted ions of the sputtering gas and low-energy electrons. In the gap between the electrodes, however, the plasma contains high-energy ions which bombard the target, energetic neutral particles of the material to be sputtered which will coat a surface of a substrate, high-energy electrons which hit the substrate, and photons which arise from the recombinations óf ions and electrons. The bombardment of the substrate, during sputtering, by high-energy electrons can have a deleterious effect on the sputtered film, particularly when the material being sputtered is a dielectric material, e.g. silicon dioxide. It is an object of this invention to provide an improved vacuum deposition apparatus. According to this invention a vacuum deposition apparatus includes a cathode, an anode associated with the substrate to be coated, and means providing a magnetic field whose lines of force are directed substantially parallel to the surface of the substrate to be coated and are at least closely adjacent to that surface and whose strength is such as to divert high-energy electrons away from, and substantially prevent them bombarding, the surface. The vacuum deposition apparatus may be a sputtering apparatus. One embodiment of a sputtering apparatus in accordance with one embodiment of the invention, given by way of example, is illustrated in the accompanying drawings of which Figure 1 is a vertical sectional view of the apparatus, and Figure 2 is a section taken along the line 11II of Figure 1. Referring to the drawings the illustrative apparatus includes a chamber 1 which can be connected to a suitable pump (not shown) for evacuating the chamber. Near to one end of the chamber there are disposed an earthed metal shield 2, a backing plate 3 and a cathode 4. The cathode 4 is connected to a source of high-power radiofrequency signals (not shown) by way of the backing plate. Within another part of the chamber there are disposed a worktable 5 which supports a substrate 6 having a surface to be coated. The worktable 5 is within a rectangular recess 7 in an anode structure 8. The anode structure 8 is connected to the earthed base plate of the chamber 1 by means of a connector flange 9. The anode structure of this embodiment of the invention is hollow and water cooled. To that end, the apparatus includes a water inlet pipe 11 and a water outlet pipe 12. Also within the rectangular recess there are permanent magnets 10 which provide a uniform magnetic field. The lines of force of the magnetic field extend substantially parallel to the surface of the substrate 6 to be coated, say in the direction B shown in Figure 1, and extend someway beyond the substrate 6 towards but not as far as the region adjacent the cathode 4. As mentioned later, the field strength is of a certain value. In operation the anode structure 8 is at earth potential and will be kept water cooled. A highpower radio-frequency signal is applied to the cathode 4. The application of that signal ionises a sputtering gas which fills the chamber at low pressure; the ions produced bombard the cathode 4 and cause sputtering. The earthed metal shield 2 prohibits the sputtering of material from the backing plate 3. The neutral particles of material to be sputtered will coat the surface of the substrate 6. Any high-energy electrons which enter the region close to the surface to be coated will come under the influence of the magnetic field of the permanent magnets 10. The magnetic field is of such a strength that the trajectory of the electrons will be changed, causing them to move along the lines of force, which extend substantially parallel to the surface to be coated, in a helical trajectory away from the surface of the substrate to be coated. The electrons will, eventually, bombard the earthed anode structure instead of the substrate. The strength of the magnetic field depends on the energy of the electrons and can readily be computed from the equation: mV By er where m is the electronic mass e is the electronic charge V is the electronic velocity and r is the radius of the helical trajectories of electrons along the magnetic field direction. The magnetic field produced by the permanent magnets does not extend to the region adjacent the cathode and has a negligible effect on the heavier ions which bombard the cathode and which cause sputtering. In addition to the magnetic field produced in the region of the substrate (in the above described embodiment, produced by the permanent magnets 10), another magnetic field, known in the art of cathode sputtering, may be generated by other magnetic-fieíd-producing means in the region of the cathode to increase the rate of sputtering. Claims
1. A vacuum deposition apparatus including a cathode, an anode associated with the substrate to be coated, and means providing a magnetic field whose lines of force are directed substantially parallel to the surface of the substrate to be coated, are at least closely adjacent to that surface and are of such strength as substantially to direct high-energy electrons away from the surface.
2. A vacuum deposition apparatus substantially as hereinbefore described and as illustrated in the accompanying drawings.
GB08310932A 1982-05-12 1983-04-22 Vacuum deposition apparatus Withdrawn GB2119817A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
GB08310932A GB2119817A (en) 1982-05-12 1983-04-22 Vacuum deposition apparatus

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
GB8213847 1982-05-12
GB08310932A GB2119817A (en) 1982-05-12 1983-04-22 Vacuum deposition apparatus

Publications (2)

Publication Number Publication Date
GB8310932D0 GB8310932D0 (en) 1983-05-25
GB2119817A true GB2119817A (en) 1983-11-23

Family

ID=26282819

Family Applications (1)

Application Number Title Priority Date Filing Date
GB08310932A Withdrawn GB2119817A (en) 1982-05-12 1983-04-22 Vacuum deposition apparatus

Country Status (1)

Country Link
GB (1) GB2119817A (en)

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1160813A (en) * 1966-07-14 1969-08-06 Ibm Ferromagnetic Films
GB1358411A (en) * 1972-11-02 1974-07-03 Electrical Res Ass Sputtering
GB1462241A (en) * 1973-01-12 1977-01-19 Coulter Information Systems Thin film deposition apparatus using segmented target means
GB1484384A (en) * 1974-10-23 1977-09-01 Nordiko Ltd Sputtering method and apparatus
US4046660A (en) * 1975-12-29 1977-09-06 Bell Telephone Laboratories, Incorporated Sputter coating with charged particle flux control

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1160813A (en) * 1966-07-14 1969-08-06 Ibm Ferromagnetic Films
GB1358411A (en) * 1972-11-02 1974-07-03 Electrical Res Ass Sputtering
GB1462241A (en) * 1973-01-12 1977-01-19 Coulter Information Systems Thin film deposition apparatus using segmented target means
GB1484384A (en) * 1974-10-23 1977-09-01 Nordiko Ltd Sputtering method and apparatus
US4046660A (en) * 1975-12-29 1977-09-06 Bell Telephone Laboratories, Incorporated Sputter coating with charged particle flux control

Also Published As

Publication number Publication date
GB8310932D0 (en) 1983-05-25

Similar Documents

Publication Publication Date Title
EP0115119B1 (en) Shaped field magnetron electrode
US6117279A (en) Method and apparatus for increasing the metal ion fraction in ionized physical vapor deposition
EP1489643B1 (en) Method and apparatus for ionized physical vapor deposition
KR890004880B1 (en) Method and device for sputtering
US5800688A (en) Apparatus for ionized sputtering
US6254745B1 (en) Ionized physical vapor deposition method and apparatus with magnetic bucket and concentric plasma and material source
US5948215A (en) Method and apparatus for ionized sputtering
US6197165B1 (en) Method and apparatus for ionized physical vapor deposition
US4434038A (en) Sputtering method and apparatus utilizing improved ion source
JP3775689B2 (en) Method and apparatus for ionizing sputtering of materials
US4525262A (en) Magnetron reactive bias sputtering method and apparatus
US5006218A (en) Sputtering apparatus
US4810347A (en) Penning type cathode for sputter coating
US3669860A (en) Method and apparatus for applying a film to a substrate surface by diode sputtering
US4716340A (en) Pre-ionization aided sputter gun
JPWO2008007784A1 (en) Capacitively coupled magnetic neutral plasma sputtering system
US5288386A (en) Sputtering apparatus and an ion source
US5397448A (en) Device for generating a plasma by means of cathode sputtering and microwave-irradiation
CA1204700A (en) Magnetron reactive bias sputtering method and apparatus
EP0094473B1 (en) Apparatus and method for producing a stream of ions
US4412905A (en) Vacuum deposition apparatus
GB2119817A (en) Vacuum deposition apparatus
JP2007291477A (en) Sputtering apparatus
EP0482891A2 (en) High vacuum magnetron sputter source
JPH02197567A (en) Plasma sputtering device

Legal Events

Date Code Title Description
WAP Application withdrawn, taken to be withdrawn or refused ** after publication under section 16(1)