GB2100447B - Marking apparatus - Google Patents

Marking apparatus

Info

Publication number
GB2100447B
GB2100447B GB8211532A GB8211532A GB2100447B GB 2100447 B GB2100447 B GB 2100447B GB 8211532 A GB8211532 A GB 8211532A GB 8211532 A GB8211532 A GB 8211532A GB 2100447 B GB2100447 B GB 2100447B
Authority
GB
United Kingdom
Prior art keywords
marking apparatus
marking
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB8211532A
Other versions
GB2100447A (en
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Electric Co Ltd filed Critical Nippon Electric Co Ltd
Publication of GB2100447A publication Critical patent/GB2100447A/en
Application granted granted Critical
Publication of GB2100447B publication Critical patent/GB2100447B/en
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/316—Testing of analog circuits
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07342—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being at an angle other than perpendicular to test object, e.g. probe card

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
GB8211532A 1981-04-22 1982-04-21 Marking apparatus Expired GB2100447B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1981058182U JPS57170551U (en) 1981-04-22 1981-04-22

Publications (2)

Publication Number Publication Date
GB2100447A GB2100447A (en) 1982-12-22
GB2100447B true GB2100447B (en) 1985-09-25

Family

ID=13076862

Family Applications (1)

Application Number Title Priority Date Filing Date
GB8211532A Expired GB2100447B (en) 1981-04-22 1982-04-21 Marking apparatus

Country Status (3)

Country Link
US (1) US4568879A (en)
JP (1) JPS57170551U (en)
GB (1) GB2100447B (en)

Families Citing this family (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59140442U (en) * 1983-03-11 1984-09-19 富士通株式会社 Marking equipment for semiconductor devices
JPS61100942A (en) * 1984-10-22 1986-05-19 Canon Inc Discrimination of substandard chip
EP0419725A1 (en) * 1989-09-29 1991-04-03 Hugo Dr. Moschüring Measuring spot for microwave components
US5089774A (en) * 1989-12-26 1992-02-18 Sharp Kabushiki Kaisha Apparatus and a method for checking a semiconductor
US5420522A (en) * 1991-12-04 1995-05-30 Texas Instruments Incorporated Method and system for fault testing integrated circuits using a light source
US5416428A (en) * 1993-02-09 1995-05-16 Everett Charles Technologies, Inc. Marker probe
IT1273339B (en) * 1994-02-24 1997-07-08 Circuit Line Spa MARKING SYSTEM FOR PRINTED CIRCUITS
US5640100A (en) * 1994-10-22 1997-06-17 Tokyo Electron Limited Probe apparatus having probe card exchanging mechanism
US6122562A (en) * 1997-05-05 2000-09-19 Applied Materials, Inc. Method and apparatus for selectively marking a semiconductor wafer
KR100256052B1 (en) * 1997-07-29 2000-06-01 윤종용 Inker testing apparatus and method therefor
US6051845A (en) * 1998-03-25 2000-04-18 Applied Materials, Inc. Method and apparatus for selectively marking a semiconductor wafer
JP2002190504A (en) * 2000-12-22 2002-07-05 Umc Japan Mark formation method, device thereof and analyzer
US6642708B1 (en) * 2001-02-14 2003-11-04 Mark Jay Dragan Marker system for test fixture
US6702489B2 (en) * 2002-07-03 2004-03-09 Taiwan Semiconductor Manufacturing Co., Ltd Inking apparatus with multi-positioning capability
US7022976B1 (en) * 2003-04-02 2006-04-04 Advanced Micro Devices, Inc. Dynamically adjustable probe tips
US7243038B2 (en) * 2004-03-04 2007-07-10 Dowtech, Inc. Method and apparatus for testing circuit boards
JP2016057187A (en) * 2014-09-10 2016-04-21 株式会社東芝 Analyzer
DE102019129972A1 (en) * 2019-11-06 2021-05-06 Ingun Prüfmittelbau Gmbh Marking device for marking circuit cards tested with a test device

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3345567A (en) * 1964-02-26 1967-10-03 Kulicke And Soffa Mfg Company Multipoint probe apparatus for electrically testing multiple surface points within small zones
US3437929A (en) * 1965-08-05 1969-04-08 Electroglas Inc Automatically indexed probe assembly for testing semiconductor wafers and the like
US3641972A (en) * 1970-09-29 1972-02-15 Collins Radio Co Probe assembly

Also Published As

Publication number Publication date
JPS57170551U (en) 1982-10-27
GB2100447A (en) 1982-12-22
US4568879A (en) 1986-02-04

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Legal Events

Date Code Title Description
PCNP Patent ceased through non-payment of renewal fee

Effective date: 19960421