GB2098813A - Apparatus for testing or processing electromechanical or electronic components - Google Patents
Apparatus for testing or processing electromechanical or electronic components Download PDFInfo
- Publication number
- GB2098813A GB2098813A GB8208449A GB8208449A GB2098813A GB 2098813 A GB2098813 A GB 2098813A GB 8208449 A GB8208449 A GB 8208449A GB 8208449 A GB8208449 A GB 8208449A GB 2098813 A GB2098813 A GB 2098813A
- Authority
- GB
- United Kingdom
- Prior art keywords
- support plate
- plate
- carrier plate
- testing
- mounting frame
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
- G01R1/07314—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support
- G01R1/07328—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support for testing printed circuit boards
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Tests Of Electronic Circuits (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
Apparatus for testing or processing electromechanical or electronic components, such as printed circuits, comprises a support plate (2) which supports a component or test piece and is connected securely to a mounting frame (1). A test pin carrier plate (8) is movably arranged in the interior of the aforesaid frame (1). By producing a vacuum the test pin carrier plate (8) is moved towards the component or test piece (13) so that the latter remains stationary and therefore cannot be deformed. The support plate and test pin carrier plate may be constructed as one or two parts and may be changeable to be specific to the component to be tested. <IMAGE>
Description
SPECIFICATION
Apparatus for testing or processing electromechanical components
This invention relates to an apparatus for testing or processing of electromechanical or electronic components, such as printed or etched circuits.
In order to test printed circuits, it has been proposed to produce a metallically conductive connection between the component being tested and a measuring instrument by means of elastic or sprung test pins. The connecting of the component to be tested or test piece with the test pins is effected by means of a vacuum, the reduced pressure being used to draw the test piece downwards against the test pins to make contact.
For test pieces which differ electrically or geometrically from one another an airtight adapter unit (vacuum chamber) specific to the particular test piece is required in each case, and this involves considerable expense. The movement of the test piece may cause the circuit panels to deform, and this may result in hair cracks. The previously proposed testing apparatus is complicated in operation, and only suitable for automation to a limited extent.
It is an objection of the invention to provide an apparatus for testing or processing electromechanical or electronic components, such as printed circuits, in an inexpensive manner, which apparatus may be capable of being operated safely, easily and reliably.
According to the present invention there is provided apparatus for testing or processing electromechanical or electronic components, wherein a support plate for supporting a component to be tested is connected to a mounting frame in the interior of which a test pin carrier plate is movably arranged, and wherein means are provided for producing a vacuum between the two plates in order to move the carrier plate towards the support plate in the direction of a component to be tested for testing the latter.
In order to enable the invention to be more readily understood, reference will now be made to the accompanying drawings, which illustrate diagrammatically and by way of example:
Figure 1 is an exploded perspective view of a testing apparatus,
Figure 2 is a section through the apparatus shown in Fig. 1, likewise is an exploded view,
Figures 3 and 4 are each a section through part of the apparatus showing a test pin carrier plate of the apparatus in two different positions,
Figure 5 is a perspective view of a modification of part of the apparatus shown in Figs. 1 to 4,
Figure 6 is a perspective view of a modification of another part of the apparatus shown in
Figs. 1 to 4,
Figure 7 is a section through part of the testing apparatus formed from the parts shown in Figs. 5 and 6.
Referring now to Figs. 1 to 4, there is shown apparatus for testing an electronic component such as a printed circuit. The apparatus comprises a mounting frame 1, on which a support plate 2 of synthetic plastic material is fixed by means of screws 3 which engage in projections 4 formed in the interior of the frame 1, the support plate 2 serving to support a component or test piece such as a printed circuit to be tested.
A rubber sealing element 6 for the test piece support plate 2 and for a carrier plate 8 bears on an encircling inwardly directed, bottom strip or flange 5. Conveniently the support plate 2 is formed underneath with a continuous sealing rib 7 which is pressed against the rubber sealing element ò and holds the support plate 2 spaced from the flange 5.
The test pin carrier plate 8 which is arranged to be movable vertically between two end positions is situated between the support plate 2 and the flange 5 as clearly shown in
Figs. 3 and 4. The rubber sealing element 6, which can consist of a cellular rubber sheet or a rubber strip, can be adhesively secured to the lower edge region of the carrier plate 8, and seals the air gap between the rib 7 and the mounting frame 1 and also the gap between the support plate 2 and carrier plate 8.
The carrier plate 8 is urged by means of springs 10 towards its lower end position shown in Fig. 3, and carries upwardly projecting test pins 11 which are secured elastically in a manner known per se on the carrier plate 8. When a vacuum is produced in the airtight space between the two plates 2 and 8, the carrier plate 8 is drawn upwards by suction in opposition to the spring force and the test pins 11 come into contact with a printed circuit panel 14 of a test piece 13.
If the test piece 13 comprises projecting components or connections at a side at which contact will be made in the case of subassemblies usually the side with soldered connections-an intermediate plate 16 adapted to requirements and with suitable openings allows the desired spacing to be kept between the test piece 13 and the test pin carrier plate 8. Various contacting planes can be achieved by forming different openings in this intermediate plate 16. A sealing plate 17 seals the test piece 13 relative to the intermediate plate
16 and the support plate 2 respectively.
Centring pins 18 may be arranged on the support plate 2 or on the carrier plate 8 and serve for aligning the plates.
A vacuum connection conduit 23 for the production of a vacuum pressure between the support plate 2 and the carrier plate 8 can enter the support plate 2 from above. It may also open from below into the carrier plate 8, or alternatively can be introduced laterally into the frame 1 or, if the apparatus is closed by means of a cover, can be arranged above on the cover. The connection (e.g. a flange or a screwed connection) of the vacuum connection conduit is not shown in detail.
In order to ensure inexpensive production of the test piece support palte 2 and the test pin carrier plate 8, these may each be made in two pieces as shown in Figs. 5 to 7. Thus, the test piece support plate 2 comprises a reception portion 19 specific to the test piece and readily interchangeable, and a frame portion 20 which is screwed to the mounting frame 1. The rib 7 is screwed to the frame portion 20. The carrier plate 8 also comprises an inner portion 21 which carries the test pins
11 and is readily interchangeable, and an outer frame portion 22. The two frame portions 20 and 22 have a step 24 which allows the reception portion 19 to be pressed from above against the frame portion 20 and also the carrier plate portion 21 to be pressed from below against the frame portion 22, by means of suitable clamping elements.The step arrangement in the frames 20, 22 is sealed in airtight manner by means of a sealing ring made e.g. of rubber, and a vacuum connection conduit may open into the frame 20 from above or into the frame 22 from below.
In the use of the present testing apparatus, the test piece remains stationary, since the test pin carrier plate is drawn upwards by suction. Deformation of the test piece can thus be obviated, and hair cracks also do not occur when dealing with large panels.
Furthermore, material abraded on contact making cannot settle between the frame and the rubber sealing element.
The test pin carrier plate may be made from commercially conventional synthetic plastics sheet material, so that there is no need to glue-on spacer strips.
The apparatus is advantageous from the cost aspect, since both the test piece support plate and the test pin carrier plate comprise interchangeable plate portions, which means a saving in costs when there are a plurality of different test pieces. Furthermore, the individual parts of the apparatus are readily accessible for automation purposes, and the test pins are easily accessible when they have to be interchanged.
it is easy to clean the apparatus by blowing it off, to remove abraded material from contact making.
Quick conversion to other conductor panel types is possible while there is no need to change the vacuum hose inlet since it opens into the outer stationary frames.
Claims (10)
1. Apparatus for testing or processing electromechanical or electronic components, wherein a support plate for supporting a component to be tested is connected to a mounting frame, in the interior of which a test pin carrier plate is movably arranged, and wherein means are provided for producing a vaccum between the two plates in order to move the carrier plate towards the support plate in the direction of a component to be tested for testing the latter.
2. Apparatus as claimed in Claim 1, wherein the support plate consists of an interchangeable plate portion specific to the component to be tested and of a frame portion mounted on said mounting frame.
3. Apparatus as claimed in Claim 1 or 2, wherein the test pin carrier plate comprises an interchangeable plate portion carrying test pins and a frame portion testing in the mounting frame.
4. Apparatus as claimed in any one of
Claims 1 to 3, wherein the support plate is secured in the mounting frame in a sealingtight manner.
5. Apparatus as claimed in any one of
Claims 1 to 4, wherein springs are provided for urging said carrier plate towards a lower end position.
6. Apparatus as claimed in Claim 4, wherein the support plate comprises an encircling rib which is pressed against a sealing element situated on an encircling bottom strip or flange of the mounting frame.
7. Apparatus as claimed in Claim 6, wherein the sealing element is connected to the lower edge region of the carrier plate, and seals a lateral gap between the support plate and the carrier plate and also a gap between the support plate and the mounting frame.
8. Apparatus as claimed in any one of
Claims 1 to 7, wherein a sealing element and an intermediate plate formed with openings and constructed as a spacer plate are provided between the support plate and the component to be tested.
9. Apparatus as claimed in Claim 8, wherein centring pins are provided for aligning and centring the plates.
10. Apparatus for testing or processing electromechanical or electronic components substantially as hereinbefore described with reference to Figs. 1 to 4 or 5 to 7 of the accompanying drawings.
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE19818108547U DE8108547U1 (en) | 1981-03-24 | 1981-03-24 | MACHINING OR TESTING DEVICE FOR ELECTROMECHANICAL, ELECTRONIC OR THE LIKE COMPONENTS OR ASSEMBLIES, ESPECIALLY FOR PRINTED, ETCHED OR THE LIKE CIRCUITS |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| GB2098813A true GB2098813A (en) | 1982-11-24 |
Family
ID=6725996
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| GB8208449A Withdrawn GB2098813A (en) | 1981-03-24 | 1982-03-23 | Apparatus for testing or processing electromechanical or electronic components |
Country Status (5)
| Country | Link |
|---|---|
| JP (1) | JPS57173769A (en) |
| CH (1) | CH633403A5 (en) |
| DE (1) | DE8108547U1 (en) |
| FR (1) | FR2502791A1 (en) |
| GB (1) | GB2098813A (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP0115135A1 (en) * | 1982-12-27 | 1984-08-08 | Genrad, Inc. | Electrical test fixture for printed circuit boards and the like |
| US4626776A (en) * | 1984-06-07 | 1986-12-02 | O. B. Test Group, Inc. | Programmable test fixture |
| GB2342793A (en) * | 1998-10-13 | 2000-04-19 | Samsung Electronics Co Ltd | Test system with test probes of different heights |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE3678825D1 (en) * | 1985-11-01 | 1991-05-23 | Hewlett Packard Co | BRACKET FOR PCB TEST. |
| JPH0161678U (en) * | 1987-10-15 | 1989-04-19 |
-
1981
- 1981-03-24 DE DE19818108547U patent/DE8108547U1/en not_active Expired
-
1982
- 1982-03-09 CH CH145182A patent/CH633403A5/en not_active IP Right Cessation
- 1982-03-23 JP JP57046165A patent/JPS57173769A/en active Pending
- 1982-03-23 GB GB8208449A patent/GB2098813A/en not_active Withdrawn
- 1982-03-24 FR FR8205017A patent/FR2502791A1/en not_active Withdrawn
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP0115135A1 (en) * | 1982-12-27 | 1984-08-08 | Genrad, Inc. | Electrical test fixture for printed circuit boards and the like |
| US4626776A (en) * | 1984-06-07 | 1986-12-02 | O. B. Test Group, Inc. | Programmable test fixture |
| GB2342793A (en) * | 1998-10-13 | 2000-04-19 | Samsung Electronics Co Ltd | Test system with test probes of different heights |
| GB2342793B (en) * | 1998-10-13 | 2001-01-03 | Samsung Electronics Co Ltd | Unified test system and method |
| US6259265B1 (en) | 1998-10-13 | 2001-07-10 | Samsung Electronics Co., Ltd. | Unified test system and method for testing printed circuit boards |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS57173769A (en) | 1982-10-26 |
| DE8108547U1 (en) | 1981-07-16 |
| CH633403A5 (en) | 1982-11-30 |
| FR2502791A1 (en) | 1982-10-01 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| WAP | Application withdrawn, taken to be withdrawn or refused ** after publication under section 16(1) |