GB2095857B - Thinning of specimens for examination under the electron microscope - Google Patents

Thinning of specimens for examination under the electron microscope

Info

Publication number
GB2095857B
GB2095857B GB8207950A GB8207950A GB2095857B GB 2095857 B GB2095857 B GB 2095857B GB 8207950 A GB8207950 A GB 8207950A GB 8207950 A GB8207950 A GB 8207950A GB 2095857 B GB2095857 B GB 2095857B
Authority
GB
United Kingdom
Prior art keywords
specimens
thinning
electron microscope
examination under
examination
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB8207950A
Other versions
GB2095857A (en
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Ion Tech Ltd
Original Assignee
Ion Tech Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ion Tech Ltd filed Critical Ion Tech Ltd
Priority to GB8207950A priority Critical patent/GB2095857B/en
Publication of GB2095857A publication Critical patent/GB2095857A/en
Application granted granted Critical
Publication of GB2095857B publication Critical patent/GB2095857B/en
Expired legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N1/00Sampling; Preparing specimens for investigation
    • G01N1/28Preparing specimens for investigation including physical details of (bio-)chemical methods covered elsewhere, e.g. G01N33/50, C12Q
    • G01N1/32Polishing; Etching
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/30Electron-beam or ion-beam tubes for localised treatment of objects
    • H01J37/305Electron-beam or ion-beam tubes for localised treatment of objects for casting, melting, evaporating or etching
    • H01J37/3053Electron-beam or ion-beam tubes for localised treatment of objects for casting, melting, evaporating or etching for evaporating or etching
GB8207950A 1981-03-31 1982-03-18 Thinning of specimens for examination under the electron microscope Expired GB2095857B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
GB8207950A GB2095857B (en) 1981-03-31 1982-03-18 Thinning of specimens for examination under the electron microscope

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
GB8110073 1981-03-31
GB8207950A GB2095857B (en) 1981-03-31 1982-03-18 Thinning of specimens for examination under the electron microscope

Publications (2)

Publication Number Publication Date
GB2095857A GB2095857A (en) 1982-10-06
GB2095857B true GB2095857B (en) 1984-08-08

Family

ID=26278959

Family Applications (1)

Application Number Title Priority Date Filing Date
GB8207950A Expired GB2095857B (en) 1981-03-31 1982-03-18 Thinning of specimens for examination under the electron microscope

Country Status (1)

Country Link
GB (1) GB2095857B (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
BE1007675A3 (en) * 1993-10-28 1995-09-12 Philips Electronics Nv Process for the production of preparations intended for an electron microscope.

Also Published As

Publication number Publication date
GB2095857A (en) 1982-10-06

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Legal Events

Date Code Title Description
PCNP Patent ceased through non-payment of renewal fee