GB2081009A - Electron irradiation of power transistors - Google Patents

Electron irradiation of power transistors Download PDF

Info

Publication number
GB2081009A
GB2081009A GB8109087A GB8109087A GB2081009A GB 2081009 A GB2081009 A GB 2081009A GB 8109087 A GB8109087 A GB 8109087A GB 8109087 A GB8109087 A GB 8109087A GB 2081009 A GB2081009 A GB 2081009A
Authority
GB
United Kingdom
Prior art keywords
lifetime
transistors
radiation
electron
collector
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
GB8109087A
Other languages
English (en)
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
CBS Corp
Original Assignee
Westinghouse Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Westinghouse Electric Corp filed Critical Westinghouse Electric Corp
Publication of GB2081009A publication Critical patent/GB2081009A/en
Withdrawn legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/02Semiconductor bodies ; Multistep manufacturing processes therefor
    • H01L29/12Semiconductor bodies ; Multistep manufacturing processes therefor characterised by the materials of which they are formed
    • H01L29/16Semiconductor bodies ; Multistep manufacturing processes therefor characterised by the materials of which they are formed including, apart from doping materials or other impurities, only elements of Group IV of the Periodic Table
    • H01L29/167Semiconductor bodies ; Multistep manufacturing processes therefor characterised by the materials of which they are formed including, apart from doping materials or other impurities, only elements of Group IV of the Periodic Table further characterised by the doping material
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/26Bombardment with radiation
    • H01L21/263Bombardment with radiation with high-energy radiation

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Ceramic Engineering (AREA)
  • Health & Medical Sciences (AREA)
  • Toxicology (AREA)
  • Manufacturing & Machinery (AREA)
  • Bipolar Transistors (AREA)
  • Thyristors (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
GB8109087A 1980-07-24 1981-03-24 Electron irradiation of power transistors Withdrawn GB2081009A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US17178780A 1980-07-24 1980-07-24

Publications (1)

Publication Number Publication Date
GB2081009A true GB2081009A (en) 1982-02-10

Family

ID=22625139

Family Applications (1)

Application Number Title Priority Date Filing Date
GB8109087A Withdrawn GB2081009A (en) 1980-07-24 1981-03-24 Electron irradiation of power transistors

Country Status (7)

Country Link
JP (1) JPS5753978A (zh)
BR (1) BR8101653A (zh)
CA (1) CA1165467A (zh)
DE (1) DE3111598A1 (zh)
FR (1) FR2487575A1 (zh)
GB (1) GB2081009A (zh)
IN (1) IN153170B (zh)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4806497A (en) * 1986-09-17 1989-02-21 Bbc Brown Boveri Ag Method for producing large-area power semiconductor components
US5151766A (en) * 1989-05-18 1992-09-29 Asea Brown Boveri Ltd. Semiconductor component
WO2005015641A1 (en) * 2003-08-02 2005-02-17 Zetex Plc Biopolar transistor with a low saturation voltage

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3933527A (en) * 1973-03-09 1976-01-20 Westinghouse Electric Corporation Fine tuning power diodes with irradiation
US4075037A (en) * 1976-05-17 1978-02-21 Westinghouse Electric Corporation Tailoring of recovery charge in power diodes and thyristors by irradiation

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4806497A (en) * 1986-09-17 1989-02-21 Bbc Brown Boveri Ag Method for producing large-area power semiconductor components
US5151766A (en) * 1989-05-18 1992-09-29 Asea Brown Boveri Ltd. Semiconductor component
WO2005015641A1 (en) * 2003-08-02 2005-02-17 Zetex Plc Biopolar transistor with a low saturation voltage
US7923751B2 (en) 2003-08-02 2011-04-12 Zetex Plc Bipolar transistor with a low saturation voltage

Also Published As

Publication number Publication date
FR2487575B1 (zh) 1984-06-15
DE3111598A1 (de) 1982-03-11
BR8101653A (pt) 1982-08-17
CA1165467A (en) 1984-04-10
FR2487575A1 (fr) 1982-01-29
JPS5753978A (ja) 1982-03-31
IN153170B (zh) 1984-06-09

Similar Documents

Publication Publication Date Title
Graul et al. High-performance transistors with arsenic-implanted polysil emitters
US3515956A (en) High-voltage semiconductor device having a guard ring containing substitutionally active ions in interstitial positions
US4259683A (en) High switching speed P-N junction devices with recombination means centrally located in high resistivity layer
US4948989A (en) Radiation-hardened temperature-compensated voltage reference
Carlson et al. Lifetime control in silicon power devices by electron or gamma irradiation
Mertens et al. Measurement of the minority-carrier transport parameters in heavily doped silicon
Wieder Emitter effects in shallow bipolar devices: Measurements and consequences
US4047976A (en) Method for manufacturing a high-speed semiconductor device
Manoliu et al. P n junctions in polycristalline-silicon films
US4099998A (en) Method of making zener diodes with selectively variable breakdown voltages
US3933527A (en) Fine tuning power diodes with irradiation
US3982269A (en) Semiconductor devices and method, including TGZM, of making same
US5747872A (en) Fast power diode
US3460009A (en) Constant gain power transistor
US3725148A (en) Individual device tuning using localized solid-state reactions
US4177477A (en) Semiconductor switching device
US5468660A (en) Process for manufacturing an integrated bipolar power device and a fast diode
CA1293334C (en) Method of manufacturing semiconductor device with overvoltage self-protection
GB2081009A (en) Electron irradiation of power transistors
CA1085964A (en) Irradiation for rapid turn-off reverse blocking diode thyristor
Rai-Choudhury et al. Electron irradiation induced recombination centers in silicon-minority carrier lifetime control
US3840887A (en) Selective irradiation of gated semiconductor devices to control gate sensitivity
Kamins et al. MOSFET's in electron-beam recrystallized polysilicon
US4230791A (en) Control of valley current in a unijunction transistor by electron irradiation
Hower et al. Electron irradiation of power transistors

Legal Events

Date Code Title Description
WAP Application withdrawn, taken to be withdrawn or refused ** after publication under section 16(1)