GB2040437B - Electrical component testing chamber with air flow therein - Google Patents

Electrical component testing chamber with air flow therein

Info

Publication number
GB2040437B
GB2040437B GB7902629A GB7902629A GB2040437B GB 2040437 B GB2040437 B GB 2040437B GB 7902629 A GB7902629 A GB 7902629A GB 7902629 A GB7902629 A GB 7902629A GB 2040437 B GB2040437 B GB 2040437B
Authority
GB
United Kingdom
Prior art keywords
air flow
electrical component
testing chamber
component testing
chamber
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB7902629A
Other versions
GB2040437A (en
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
DALE ELECTRONICS Ltd
Original Assignee
DALE ELECTRONICS Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by DALE ELECTRONICS Ltd filed Critical DALE ELECTRONICS Ltd
Priority to GB7902629A priority Critical patent/GB2040437B/en
Publication of GB2040437A publication Critical patent/GB2040437A/en
Application granted granted Critical
Publication of GB2040437B publication Critical patent/GB2040437B/en
Expired legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01C—RESISTORS
    • H01C17/00—Apparatus or processes specially adapted for manufacturing resistors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/265—Contactless testing

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
GB7902629A 1979-01-25 1979-01-25 Electrical component testing chamber with air flow therein Expired GB2040437B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
GB7902629A GB2040437B (en) 1979-01-25 1979-01-25 Electrical component testing chamber with air flow therein

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB7902629A GB2040437B (en) 1979-01-25 1979-01-25 Electrical component testing chamber with air flow therein

Publications (2)

Publication Number Publication Date
GB2040437A GB2040437A (en) 1980-08-28
GB2040437B true GB2040437B (en) 1983-02-09

Family

ID=10502723

Family Applications (1)

Application Number Title Priority Date Filing Date
GB7902629A Expired GB2040437B (en) 1979-01-25 1979-01-25 Electrical component testing chamber with air flow therein

Country Status (1)

Country Link
GB (1) GB2040437B (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6036023A (en) * 1997-07-10 2000-03-14 Teradyne, Inc. Heat-transfer enhancing features for semiconductor carriers and devices
CN107442448B (en) * 2017-08-11 2023-05-23 罗博特科智能科技股份有限公司 Drawer type testing device

Also Published As

Publication number Publication date
GB2040437A (en) 1980-08-28

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Legal Events

Date Code Title Description
PCNP Patent ceased through non-payment of renewal fee