GB2086670B - Test fixture with translator - Google Patents
Test fixture with translatorInfo
- Publication number
- GB2086670B GB2086670B GB8132722A GB8132722A GB2086670B GB 2086670 B GB2086670 B GB 2086670B GB 8132722 A GB8132722 A GB 8132722A GB 8132722 A GB8132722 A GB 8132722A GB 2086670 B GB2086670 B GB 2086670B
- Authority
- GB
- United Kingdom
- Prior art keywords
- translator
- test fixture
- fixture
- test
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
- G01R1/07364—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch
- G01R1/07378—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch using an intermediate adapter, e.g. space transformers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
- G01R1/07357—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with flexible bodies, e.g. buckling beams
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Measuring Leads Or Probes (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US20231580A | 1980-10-30 | 1980-10-30 |
Publications (2)
Publication Number | Publication Date |
---|---|
GB2086670A GB2086670A (en) | 1982-05-12 |
GB2086670B true GB2086670B (en) | 1985-03-20 |
Family
ID=22749363
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
GB8132722A Expired GB2086670B (en) | 1980-10-30 | 1981-10-30 | Test fixture with translator |
Country Status (4)
Country | Link |
---|---|
JP (1) | JPS57101769A (en) |
DE (1) | DE3142817A1 (en) |
FR (1) | FR2493671A1 (en) |
GB (1) | GB2086670B (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US12032003B2 (en) | 2019-08-07 | 2024-07-09 | Technoprobe, S.P.A. | Probe head for electronic devices and corresponding probe card |
Families Citing this family (22)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE3337915A1 (en) * | 1982-10-21 | 1984-05-24 | Feinmetall Gmbh, 7033 Herrenberg | Contacting device |
GB2146849B (en) * | 1983-09-17 | 1987-08-05 | Marconi Instruments Ltd | Electrical test probe head assembly |
DE3340243A1 (en) * | 1983-11-08 | 1985-05-23 | Hans-Jürgen 6477 Limeshain Wagner | Device for testing printed-circuit boards |
DE3343274A1 (en) * | 1983-11-30 | 1985-06-05 | Feinmetall Gmbh, 7033 Herrenberg | CONTACT DEVICE |
US4686467A (en) * | 1984-03-21 | 1987-08-11 | Dit-Mco International Corp. | Circuit board testing system |
US4774462A (en) * | 1984-06-11 | 1988-09-27 | Black Thomas J | Automatic test system |
DE3504606A1 (en) * | 1985-02-11 | 1986-08-14 | Helmuth 4952 Porta Westfalica Kahl | DEVICE FOR CHECKING CABLES THAT HAVE PLUGS |
US4764722A (en) * | 1985-10-28 | 1988-08-16 | International Business Machines Corporation | Coaxial probe |
US4884024A (en) * | 1985-11-19 | 1989-11-28 | Teradyne, Inc. | Test pin assembly for circuit board tester |
DE3606877A1 (en) * | 1986-03-03 | 1987-09-10 | Siemens Ag | DEVICE FOR EQUIPPING AN ADAPTER WITH CONTACT NEEDLES FOR A PCB CHECKING DEVICE |
DE3639361A1 (en) * | 1986-11-18 | 1988-05-19 | Luther Erich | DEVICE FOR CHECKING PCBS |
DE3722485A1 (en) * | 1987-07-03 | 1989-01-12 | Deutsche Telephonwerk Kabel | Elastic contact needle and contacting device |
US4803424A (en) * | 1987-08-31 | 1989-02-07 | Augat Inc. | Short-wire bed-of-nails test fixture |
DE8714018U1 (en) * | 1987-10-19 | 1988-12-01 | Siemens AG, 1000 Berlin und 8000 München | Test needle for electrical testing of circuit boards |
DE4406538A1 (en) | 1994-02-28 | 1995-08-31 | Mania Gmbh | Printed circuit board test device with test adapter and method for setting the same |
US7059046B2 (en) | 2002-06-24 | 2006-06-13 | Delaware Capital Formation, Inc. | Method for producing a captive wired test fixture and fixture therefor |
CN100595598C (en) * | 2003-11-14 | 2010-03-24 | 温特沃斯实验室公司 | Die design with integrated assembly aid |
EP2110673A1 (en) * | 2008-04-17 | 2009-10-21 | Technoprobe S.p.A | Testing head having vertical probes provided with stopping means to avoid their upward and downward escape from respective guide holes |
KR20170125070A (en) | 2015-03-13 | 2017-11-13 | 테크노프로브 에스.피.에이. | A test head with a vertical probe that makes improved slide movement within each guide hole under different operating conditions and accurately maintains the probe within the test head |
DE102018204106A1 (en) * | 2018-03-16 | 2019-09-19 | Feinmetall Gmbh | Test card for electrically connecting a test object with an electrical test device |
IT201900014208A1 (en) * | 2019-08-07 | 2021-02-07 | Technoprobe Spa | Measuring head of electronic devices and relative measuring card |
KR20210121553A (en) * | 2020-03-30 | 2021-10-08 | (주)포인트엔지니어링 | Probe head and probe card having the same |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE1903088A1 (en) * | 1969-01-22 | 1971-01-21 | Siemens Ag | Contact device |
US3970934A (en) * | 1974-08-12 | 1976-07-20 | Akin Aksu | Printed circuit board testing means |
US4027935A (en) * | 1976-06-21 | 1977-06-07 | International Business Machines Corporation | Contact for an electrical contactor assembly |
-
1981
- 1981-10-28 FR FR8120222A patent/FR2493671A1/en not_active Withdrawn
- 1981-10-28 JP JP56171525A patent/JPS57101769A/en active Pending
- 1981-10-28 DE DE19813142817 patent/DE3142817A1/en not_active Withdrawn
- 1981-10-30 GB GB8132722A patent/GB2086670B/en not_active Expired
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US12032003B2 (en) | 2019-08-07 | 2024-07-09 | Technoprobe, S.P.A. | Probe head for electronic devices and corresponding probe card |
Also Published As
Publication number | Publication date |
---|---|
JPS57101769A (en) | 1982-06-24 |
DE3142817A1 (en) | 1982-07-08 |
FR2493671A1 (en) | 1982-05-07 |
GB2086670A (en) | 1982-05-12 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
PCNP | Patent ceased through non-payment of renewal fee |