GB2026195A - Optical Apparatus - Google Patents
Optical Apparatus Download PDFInfo
- Publication number
- GB2026195A GB2026195A GB7922100A GB7922100A GB2026195A GB 2026195 A GB2026195 A GB 2026195A GB 7922100 A GB7922100 A GB 7922100A GB 7922100 A GB7922100 A GB 7922100A GB 2026195 A GB2026195 A GB 2026195A
- Authority
- GB
- United Kingdom
- Prior art keywords
- radiation
- bar
- target
- thermally
- optical system
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 230000003287 optical effect Effects 0.000 title claims abstract description 18
- 230000005855 radiation Effects 0.000 claims abstract description 34
- 230000008542 thermal sensitivity Effects 0.000 claims abstract description 4
- 230000004323 axial length Effects 0.000 claims 2
- 230000035945 sensitivity Effects 0.000 description 3
- 238000001931 thermography Methods 0.000 description 2
- 230000005679 Peltier effect Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000003384 imaging method Methods 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 238000000926 separation method Methods 0.000 description 1
- 230000003595 spectral effect Effects 0.000 description 1
- 230000006641 stabilisation Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
- G02B27/0025—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00 for optical correction, e.g. distorsion, aberration
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/52—Radiation pyrometry, e.g. infrared or optical thermometry using comparison with reference sources, e.g. disappearing-filament pyrometer
- G01J5/53—Reference sources, e.g. standard lamps; Black bodies
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Optics & Photonics (AREA)
- Radiation Pyrometers (AREA)
Abstract
Apparatus for assessing the thermal sensitivity of optical systems comprises a test target 4 in the form of a plate in which slits 11 are cut at a predetermined spatial frequency. Radiation from a heated bar 1 is reflected from two separate portions thereof on opposite faces A,B of the bar to the test target 4 by concave mirrors 2, 3, radiation from mirror 3 being reflected by the test target 4 and radiation from the mirror 2 being transmitted through the slits 11 of test target 4 so that the resulting radiation passes along a common path 9 to a collimator 8 and hence to the optical system under test. The bar 1 may be heated at one end by a device 5 and cooled at the other end by a device 6 and the arrangement is such that a temperature gradient is produced along the length of the bar. The mirror 2 is mounted in a movable holder 10 which, by means of a micrometer device 7 can be adjusted along the length of the bar 1 so that the radiation at the test target 4 emerges from portions of the bar 1 which are at different temperatures. <IMAGE>
Description
SPECIFICATION
Variable temperature test target
This invention relates to apparatus for assessing the thermal sensitivity of optical systems, particularly thermal imaging systems.
It is frequently required to measure the temperature sensitivity of thermal imaging systems. This is usually achieved by subjecting the system under test to a radiation test pattern formed by viewing a blackened temperature-controlled element in the form of a plate through a target in the form of a blackened metal plate (held at a fixed temperature) from which slits have been cut corresponding to a predetermined spatial frequency. The temperature of the element behind the target is first raised until the radiation is visible through the target, and the element's temperature is noted.The temperature is then lowered below ambient until the radiation is once more visible through the target, the element's temperature is again noted and the temperature sensitivity at that spatial frequency ("minimum resolvable temperature difference" or MRTD) is taken to be half the temperature difference through which the element was taken. To reduce the size of apparatus which would otherwise be required, the target is commonly viewed through a collimating lens or mirror system so that the target is essentially placed at infinity.
The above system suffers from several disadvantages. The time taken for the element to change temperature and stabilise at a new temperature is considerable and makes measurement very tedious.
Moreover, due to the long time lag the temperature of the target plate is iiable to variation during the interval, thereby invalidating the readings. Afurther difficulty arises in controlling the temperature of the element to a sufficient degree of accuracy, which may be as little as ±0.01"K for accurate assessment of a sensitive optical system.
The present invention is intended to overcome these difficulties.
The present invention provides apparatus for assessing the thermal sensitivity of optical systems, comprising a thermally-controlled element controlled so as to have a termperqture-gradient in one direction, first and second optical systems respectively arranged to direct radiation emanating from first and second portions of said element to a common station, a target located at said common station and defining for said radiation alternate transmissive and reflective regions spaced according to a predetermined spatial frequency, the arrangement being such that, in use, the target transmits radiation from said first optical system and reflects radiation from said second optical system along a common path, and adjustment means connected to one of said optical systems so as effectively to vary along said one direction one of said first and second portions relative to the other.
Thus, in the present invention, the blackened spatial frequency test target of the prior art is replaced by a specularly reflective target in the form of a plate from which slits corresponding to the required spatial frequency have been cut, or alternatively by a target in the form of a plate of material transparentto radiation in the spectral region under consideration having a reflective pattern on one of its surfaces. This target is so arranged that the radiation which emanates from the thermallycontrolled element which is preferably of fairly high thermal conductivity, forms a test pattern caused by some of the radiation passing through the target and some being reflected from it.The temperature difference is achieved by producing a temperature gradient which is preferably uniform in one direction along the element and arranging that the reflected radiaton and transmitted radiation come from different portions of the element, the temperature difference being proportional to the spatial separation between the portions of the element from which the reflected and transmitted radiation emanates. Thus the temperature difference or contrast between the components of the test pattern of radiation can be adjusted by mechanical movement of the optics used to direct the radiation, preferably by imaging the element on the target so that selected portions of the element may be made to provide the transmitted and reflected radiation.
An embodiment of the present invention is shown schematically in the drawing.
The temperature controlled element is in the form of a blackened bar 1 which may be heated at one end only, or heated at one end and cooled at the other (for example, by Peltier effect devices 5 and 6) to maintain the mean temperature close to ambient and so that a temperature gradient is set up along the direction x-x. Radiation from the bar 1 is imaged by concave mirrors 2 and 3 to a common station 12 where there is located a test target 4 which has the test pattern cut in the form of slits 11 which allow radiation from one side A of the bar 1 to pass to the system under test, while radiation from the other side B of the bar is reflected off the target 4 to the same system along a common path 9.When mirrors 2 and 3 are symmetrically placed and the bar 1 and target 4 are located at conjugate foci, the reflected and transmitted radiation comes from the same part of the bar (as measured along its length), so the temperature difference is zero if there is no temperature gradient across the thickness of the bar. If, however, the mirror 2 which is mounted in a holder 10 is moved in a direction parallel to the longitudinal axis of the bar by means of a micrometer drive 7, the portion of side A of the bar which is imaged on the target 4 is shifted by twice this amount and a temperature difference is introduced. The micrometer drive 7 for this movement may be calibrated in terms of this temperature difference. If the mirrors 2 and 3 are both moved in opposite directions twice as great a range of temperature differences can be produced.The lens 8 is a collimator lens focussed on the target 4 so that the target is optically located at infinity. In an alternative form the collimator is reflective.
Since the effective temperature difference is controlled by mechanical movement, this system is free of thermal inertia, so that rapid readings can be taken. Also, since the target 4 itself is not emissive,
the temperature difference in the radiation test
pattern is independent of the target temperature so
that test targets for different spatial frequencies may
be rapidly interchanged without allowance for tem
perature stabilisation to take place. An additional
advantage is that effective temperature differences
very much smaller than that between the ends of the
bar may be accurately produced so that relatively
modest temperature control of the bar is adequate.
The temperature difference between the ends of the
bar may conveniently be monitored by thermocou
ples at each end, and a closed-loop system may be
used to keep this constant.
A potential disadvantage of the present system is
that because the mirrors 2,3 image portions of the
bar 1 onto the target 4 there is a temperature
gradient induced along the test target in addition to
the desired temperature difference between the lines
and the spaces, but by making the bar 1 long in
relation to the length of the target 4 this effect is
minimised so as to be negligible. The apparatus may
be given variable sensitivity by variation of the
temperature gradient along the bar but some time is
then required to allow equilibrium to be reched
when the range is changed. As with other methods,
a collimator lens 8 or mirror may be used to place
the target effectively at infinity, care being taken to
ensure that its entire aperture is filled by radiation
from the bar.
It will now be appreciated that we have described
a means of producing a thermal target of variable
temperature contrast, said means comprising a
thermally emissive bar having a uniform tempera
ture gradient produced along its length, a target in
which the desired pattern comprises thermally re
flecting areas on a transmitting background, or
conversely transmitting areas on a reflecting back
ground, means whereby radiation from a first
selected portion of the aforementioned bar may be
transmitted through the transmissive portions of the
target in such a direction as to be received by the
apparatus with which the target is to be viewed,
means whereby radiation from a second selected
portion of the bar may be reflected from the
reflective portions of the target in the same direction
as the transmitted radiation, and means whereby the
longitudinal position on the bar of one or both of the
aforementioned selected portions may be varied in a
controlled manner.
Claims (8)
1. Apparatus for assessing the thermal sensitiv
ity of optical systems, comprising a thermally
controlled element controlled so as to have a
temperature-gradient in one direction, first and
second optical systems respectively arranged to
direct radiation emanating from first and second
portions of said element to a common station, a target located at said common station and defining
for said radiation alternate transmissive and reflec
tive regions spaced according to a predetermined
spatial frequency, the arrangement being such that,
in use, the target transmits radiation from said first
optical system and reflects radiation from said second optical system along a common path, and adjustment means connected to one of said optical systems so as effectively to vary along said one direction one of said first and second portions relative to the other.
2. Apparatus as claimed in claim 1 wherein said first and second optical systems each image said radiation at said common station.
3. Apparatus as claimed in claim 2, wherein said first optical system comprises a first concave mirror and said second optical system comprises a second concave mirror.
4. Apparatus as claimed in claim 3 wherein said adjustment means comprises a holder for said first concave mirror and a micrometer adjustment device for varying the position of said holder with respectto a fixed support.
5. Apparatus as claimed in any preceding claim, including a collimator in said common path having its focus at said common station.
6. Apparatus as claimed in any preceding claim, wherein said thermally-controlled element is in the form of a thermally-conductive bar the axial length of which is substantially greater than the axial length of said target.
7. Apparatus as claimed in claim 6, wherein said thermally-conductive bar is thermally controlled to have a uniform temperature gradient along its length.
8. Apparatus as claimed in claim 1 and substantially as hereinbefore described with reference to the accompanying drawing.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GB7922100A GB2026195B (en) | 1978-07-20 | 1979-06-25 | Optical apparatus |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GB7830503 | 1978-07-20 | ||
GB7922100A GB2026195B (en) | 1978-07-20 | 1979-06-25 | Optical apparatus |
Publications (2)
Publication Number | Publication Date |
---|---|
GB2026195A true GB2026195A (en) | 1980-01-30 |
GB2026195B GB2026195B (en) | 1982-09-08 |
Family
ID=26268283
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
GB7922100A Expired GB2026195B (en) | 1978-07-20 | 1979-06-25 | Optical apparatus |
Country Status (1)
Country | Link |
---|---|
GB (1) | GB2026195B (en) |
-
1979
- 1979-06-25 GB GB7922100A patent/GB2026195B/en not_active Expired
Also Published As
Publication number | Publication date |
---|---|
GB2026195B (en) | 1982-09-08 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
PCNP | Patent ceased through non-payment of renewal fee |