GB201701310D0 - Ion detector assembly - Google Patents
Ion detector assemblyInfo
- Publication number
- GB201701310D0 GB201701310D0 GBGB1701310.3A GB201701310A GB201701310D0 GB 201701310 D0 GB201701310 D0 GB 201701310D0 GB 201701310 A GB201701310 A GB 201701310A GB 201701310 D0 GB201701310 D0 GB 201701310D0
- Authority
- GB
- United Kingdom
- Prior art keywords
- detector assembly
- ion detector
- ion
- assembly
- detector
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/025—Detectors specially adapted to particle spectrometers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
- G01N27/62—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating the ionisation of gases, e.g. aerosols; by investigating electric discharges, e.g. emission of cathode
- G01N27/622—Ion mobility spectrometry
- G01N27/623—Ion mobility spectrometry combined with mass spectrometry
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/29—Measurement performed on radiation beams, e.g. position or section of the beam; Measurement of spatial distribution of radiation
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/0027—Methods for using particle spectrometers
- H01J49/0031—Step by step routines describing the use of the apparatus
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/26—Mass spectrometers or separator tubes
- H01J49/34—Dynamic spectrometers
- H01J49/40—Time-of-flight spectrometers
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GB1701310.3A GB2562990A (en) | 2017-01-26 | 2017-01-26 | Ion detector assembly |
PCT/GB2018/050188 WO2018138485A1 (en) | 2017-01-26 | 2018-01-23 | Ion detector assembly |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GB1701310.3A GB2562990A (en) | 2017-01-26 | 2017-01-26 | Ion detector assembly |
Publications (2)
Publication Number | Publication Date |
---|---|
GB201701310D0 true GB201701310D0 (en) | 2017-03-15 |
GB2562990A GB2562990A (en) | 2018-12-05 |
Family
ID=58462858
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
GB1701310.3A Withdrawn GB2562990A (en) | 2017-01-26 | 2017-01-26 | Ion detector assembly |
Country Status (2)
Country | Link |
---|---|
GB (1) | GB2562990A (en) |
WO (1) | WO2018138485A1 (en) |
Families Citing this family (16)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB201613988D0 (en) | 2016-08-16 | 2016-09-28 | Micromass Uk Ltd And Leco Corp | Mass analyser having extended flight path |
GB2567794B (en) | 2017-05-05 | 2023-03-08 | Micromass Ltd | Multi-reflecting time-of-flight mass spectrometers |
GB2563571B (en) | 2017-05-26 | 2023-05-24 | Micromass Ltd | Time of flight mass analyser with spatial focussing |
WO2019030476A1 (en) | 2017-08-06 | 2019-02-14 | Anatoly Verenchikov | Ion injection into multi-pass mass spectrometers |
WO2019030475A1 (en) | 2017-08-06 | 2019-02-14 | Anatoly Verenchikov | Multi-pass mass spectrometer |
EP3662502A1 (en) | 2017-08-06 | 2020-06-10 | Micromass UK Limited | Printed circuit ion mirror with compensation |
US11049712B2 (en) | 2017-08-06 | 2021-06-29 | Micromass Uk Limited | Fields for multi-reflecting TOF MS |
WO2019030477A1 (en) | 2017-08-06 | 2019-02-14 | Anatoly Verenchikov | Accelerator for multi-pass mass spectrometers |
EP3662501A1 (en) | 2017-08-06 | 2020-06-10 | Micromass UK Limited | Ion mirror for multi-reflecting mass spectrometers |
WO2019030471A1 (en) | 2017-08-06 | 2019-02-14 | Anatoly Verenchikov | Ion guide within pulsed converters |
GB201806507D0 (en) | 2018-04-20 | 2018-06-06 | Verenchikov Anatoly | Gridless ion mirrors with smooth fields |
GB201807605D0 (en) | 2018-05-10 | 2018-06-27 | Micromass Ltd | Multi-reflecting time of flight mass analyser |
GB201807626D0 (en) | 2018-05-10 | 2018-06-27 | Micromass Ltd | Multi-reflecting time of flight mass analyser |
GB201808530D0 (en) | 2018-05-24 | 2018-07-11 | Verenchikov Anatoly | TOF MS detection system with improved dynamic range |
GB201810573D0 (en) | 2018-06-28 | 2018-08-15 | Verenchikov Anatoly | Multi-pass mass spectrometer with improved duty cycle |
GB201901411D0 (en) | 2019-02-01 | 2019-03-20 | Micromass Ltd | Electrode assembly for mass spectrometer |
Family Cites Families (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB1161395A (en) * | 1966-05-17 | 1969-08-13 | Ass Elect Ind | Improvements relating to Mass Spectrometers |
JPS58184251A (en) * | 1982-04-21 | 1983-10-27 | Toshiba Corp | Mass spectrometer |
EP0193311A3 (en) * | 1985-02-22 | 1987-11-04 | Finnigan Corporation | Ion detector |
JPH0224950A (en) * | 1988-07-14 | 1990-01-26 | Jeol Ltd | Mass analyzing device with simultaneous sensing |
GB8912580D0 (en) * | 1989-06-01 | 1989-07-19 | Vg Instr Group | Charged particle energy analyzer and mass spectrometer incorporating it |
US6828729B1 (en) * | 2000-03-16 | 2004-12-07 | Burle Technologies, Inc. | Bipolar time-of-flight detector, cartridge and detection method |
EP1376650A4 (en) * | 2001-03-26 | 2008-05-21 | Kanazawa Inst Of Technology | Scanning atom probe and analysis method using scanning atom probe |
US6906321B2 (en) * | 2003-07-25 | 2005-06-14 | Shimadzu Corporation | Time-of-flight mass spectrometer |
-
2017
- 2017-01-26 GB GB1701310.3A patent/GB2562990A/en not_active Withdrawn
-
2018
- 2018-01-23 WO PCT/GB2018/050188 patent/WO2018138485A1/en active Application Filing
Also Published As
Publication number | Publication date |
---|---|
GB2562990A (en) | 2018-12-05 |
WO2018138485A1 (en) | 2018-08-02 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
WAP | Application withdrawn, taken to be withdrawn or refused ** after publication under section 16(1) |