GB1582380A - Electron spectrometer - Google Patents

Electron spectrometer Download PDF

Info

Publication number
GB1582380A
GB1582380A GB29089/77A GB2908977A GB1582380A GB 1582380 A GB1582380 A GB 1582380A GB 29089/77 A GB29089/77 A GB 29089/77A GB 2908977 A GB2908977 A GB 2908977A GB 1582380 A GB1582380 A GB 1582380A
Authority
GB
United Kingdom
Prior art keywords
resonance
electrons
energy
stream
scattering
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB29089/77A
Other languages
English (en)
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
International Business Machines Corp
Original Assignee
International Business Machines Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by International Business Machines Corp filed Critical International Business Machines Corp
Publication of GB1582380A publication Critical patent/GB1582380A/en
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
    • G21K1/10—Scattering devices; Absorbing devices; Ionising radiation filters
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/44—Energy spectrometers, e.g. alpha-, beta-spectrometers

Landscapes

  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Electron Tubes For Measurement (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
GB29089/77A 1976-07-16 1977-07-11 Electron spectrometer Expired GB1582380A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US05/705,982 US4090076A (en) 1976-07-16 1976-07-16 High resolution electron energy device and method

Publications (1)

Publication Number Publication Date
GB1582380A true GB1582380A (en) 1981-01-07

Family

ID=24835726

Family Applications (1)

Application Number Title Priority Date Filing Date
GB29089/77A Expired GB1582380A (en) 1976-07-16 1977-07-11 Electron spectrometer

Country Status (7)

Country Link
US (1) US4090076A (cg-RX-API-DMAC7.html)
JP (1) JPS5856958B2 (cg-RX-API-DMAC7.html)
CA (1) CA1091364A (cg-RX-API-DMAC7.html)
DE (1) DE2729988A1 (cg-RX-API-DMAC7.html)
FR (1) FR2358744A1 (cg-RX-API-DMAC7.html)
GB (1) GB1582380A (cg-RX-API-DMAC7.html)
IT (1) IT1113768B (cg-RX-API-DMAC7.html)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4641103A (en) * 1984-07-19 1987-02-03 John M. J. Madey Microwave electron gun
JPH07120516B2 (ja) * 1990-07-26 1995-12-20 株式会社東芝 低エネルギ−電子の照射方法および照射装置
US5444243A (en) * 1993-09-01 1995-08-22 Hitachi, Ltd. Wien filter apparatus with hyperbolic surfaces
CN109143313B (zh) * 2018-08-24 2022-02-11 中国人民解放军空军工程大学 一种电子能量甄别器
GB2604137A (en) * 2021-02-25 2022-08-31 Modular Energy Tech Ltd Experimentation and electricity generation apparatus
CN114371213B (zh) * 2022-01-05 2023-07-21 中国科学院物理研究所 磁性氦原子散射谱仪

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3582648A (en) * 1968-06-05 1971-06-01 Varian Associates Electron impact time of flight spectrometer
US3670172A (en) * 1970-04-20 1972-06-13 Advanced Research Instr System Charged particle generating and utilizing
US3806728A (en) * 1970-05-27 1974-04-23 C Lindholm Electron impact spectrometer with an improved source of monochromatic electrons
US3769513A (en) * 1972-12-14 1973-10-30 Perkin Elmer Corp Ion kinetic energy spectrometer
US3836775A (en) * 1973-03-08 1974-09-17 Princeton Applied Res Corp Electron impact spectrometer of high sensitivity and large helium tolerance and process of characterizing gaseous atoms and molecules by the energy loss spectrum

Also Published As

Publication number Publication date
JPS5856958B2 (ja) 1983-12-17
DE2729988A1 (de) 1978-02-02
JPS5312390A (en) 1978-02-03
US4090076A (en) 1978-05-16
CA1091364A (en) 1980-12-09
FR2358744B1 (cg-RX-API-DMAC7.html) 1980-04-04
FR2358744A1 (fr) 1978-02-10
IT1113768B (it) 1986-01-20

Similar Documents

Publication Publication Date Title
Bleakney et al. A new mass spectrometer with improved focusing properties
CA1249381A (en) Low noise tandem quadrupole mass spectrometers and method
Hall et al. A penetrating field electron-ion coincidence spectrometer for use in photoionization studies
Brode The quantitative study of the collisions of electrons with atoms
Spohr et al. Threshold photoelectron detector for use in the vacuum ultraviolet
US5206508A (en) Tandem mass spectrometry systems based on time-of-flight analyzer
US3953732A (en) Dynamic mass spectrometer
EP0952607B1 (en) Simultaneous detection isotopic ratio mass spectrometer
US2427484A (en) Ionic gas analysis
GB2306766A (en) Mass spectrometer
US6008491A (en) Time-of-flight SIMS/MSRI reflectron mass analyzer and method
GB1582380A (en) Electron spectrometer
Gspann Negatively charged helium-4 clusters
Kimmel et al. A time‐of‐flight spectrometer for low‐energy neutral and ionized alkalis
Fleischmann et al. Small-angle scattering in stripping collisions of hydrogen atoms having energies of 1 to 10 keV in various gases
Ender et al. Accelerator SIMS at PSI/ETH Zurich
US2768301A (en) Method of mass spectral analysis with negative ions
Roussel et al. Contamination of a beam of metastable helium atoms by fast neutral atoms: Characteristics of the secondary emission of these atoms at low energy (100 eV) in interaction with the surface of a solid
Del Rosario Use of an Electron Multiplier Tube as a New Technique in Disintegration Experiments
Bayly et al. A mass and energy spectrometer for secondary ion analysis
Meierjohann et al. Dissociative excitation and ionisation in H2+—He collisions
JP2798425B2 (ja) 質量分析装置
Hori et al. Electron energy spectrometer of retarding field type
Horton et al. The ionization of helium by neutral helium atoms
US6815689B1 (en) Mass spectrometry with enhanced particle flux range

Legal Events

Date Code Title Description
PS Patent sealed [section 19, patents act 1949]
PCNP Patent ceased through non-payment of renewal fee