GB1578558A - Apparatus for manufacturing and testing discrete artifacts - Google Patents

Apparatus for manufacturing and testing discrete artifacts Download PDF

Info

Publication number
GB1578558A
GB1578558A GB2110677A GB2110677A GB1578558A GB 1578558 A GB1578558 A GB 1578558A GB 2110677 A GB2110677 A GB 2110677A GB 2110677 A GB2110677 A GB 2110677A GB 1578558 A GB1578558 A GB 1578558A
Authority
GB
United Kingdom
Prior art keywords
display
artifacts
test
last
machine
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB2110677A
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
STC PLC
Original Assignee
Standard Telephone and Cables PLC
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Standard Telephone and Cables PLC filed Critical Standard Telephone and Cables PLC
Priority to GB2110677A priority Critical patent/GB1578558A/en
Publication of GB1578558A publication Critical patent/GB1578558A/en
Expired legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G07CHECKING-DEVICES
    • G07CTIME OR ATTENDANCE REGISTERS; REGISTERING OR INDICATING THE WORKING OF MACHINES; GENERATING RANDOM NUMBERS; VOTING OR LOTTERY APPARATUS; ARRANGEMENTS, SYSTEMS OR APPARATUS FOR CHECKING NOT PROVIDED FOR ELSEWHERE
    • G07C3/00Registering or indicating the condition or the working of machines or other apparatus, other than vehicles
    • G07C3/14Quality control systems
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Automation & Control Theory (AREA)
  • Quality & Reliability (AREA)
  • General Factory Administration (AREA)

Description

(54) APPARATUS FOR MANUFACTURING AND TESTING DISCRETE ARTIFACTS (71) We, STANDARD TELE PHONES AND CABLES LIMITED, a British Company, of 190 Strand, London, W.C.2., England, do hereby declare the invention, for which we pray that a patent may be granted to us, and the method by which it is to be performed, to be particularly described in and by the following statement: This invention relates to apparatus for manufacturing and testing discrete artifacts.
According to the present invention there is provided apparatus for manufacturing and testing discrete artifacts comprising a machine which manufactures the artifacts in a stepwise or indexing manner, there being n manufacturing stations, and is adjustable to change parameters of the artifacts; a test station for testing the artifacts; a computer which stores and analyzes the test results from the test station; and a visual display device whereon the test results are displayed in such a manner that an operator can, by watching the display and making appropriate adjustments to the machine, keep the parameters of the artifacts produced within defined limits, and wherein the display shows, in an associated one of n lines, the results of the tests on the last p artifacts from each of the n stations.
According to the present invention there is provided a method of controlling the manufacture of discrete artifacts produced in a stepwise or indexing manner by an assembly machine which has n manufacturing stations and is adjustable to change parameters of the artifacts, comprising the steps of: testing the artifacts at a test station; storing and analyzing the results in a computer; and displaying the results to an operator on a visual display which shows, in an associated one of n lines, the results of the tests on the last p artifacts from each of the n stations, whereby the operator is made aware of one or more parameters tending to go outside defined limits and can adjust the machine, as a result of watching said displayed results, to keep the parameters within the defined limits.
An embodiment of the invention is described hereinafter with reference to the accompanying diagrams, of which: Figure 1 is a block schematic diagram of a manufacturing and testing arrangement; Figures 2, 3 and 4 are examples of displays which can be produced on the visual display unit in the arrangement of Figure 1; and Figure 5 is an example of a display which can be produced on the input output printer in the arrangement of Figure 1.
The invention is described in relation to the production of sealed magnetic reed contact units, for which it was in the first place developed. However it will be obvious to those skilled in the art that it is not limited to this production, and with suitable and obvious modifications can be applied to the production of other artifacts.
Sealed magnetic reed contact units, hereinafter called reed units, are manufactured by being assembled and sealed on a rotating-turret indexing machine, 1. The details of this manufacture are not relevant here, but after sealing the reed units pass to a cooling and post-processing conveyor, 2.
The conveyor delivers the reed units to a testing station 3, where the magnetic and electrical characteristics of the completed unit are tested. The test station is connected through an interface 4 with a computer 5, typically a minicomputer. The computer, under suitable program control, stores the test data from the testing station, analyzes it, and presents the results of the analysis on a visual display unit 6. It can also present results on an input-output printer 7, and respond to instructions keyed in on the printer's keyboard.
The reed units are processed in assembly boxes on the machine, there being 24 of these boxes. On the visual display unit there is a normally continuous display which shows how the last ten units tested from each assembly box have fared in the test.
The display is (as shown here in Figure 2) in 24 lines, one for each assembly box. At the start of each line is the assembly box number. Along each line are a set of markers showing the outer lower test limit (at 30 ampere-turns), the inner lower test limit (38 AT), the inner upper test limit (50 AT), and the outer upper test limit (58 AT).
Between the outer lower limit and the assembly box number a number may be present to indicate how many, if any, of the last ten reed units tested, fell below the outer lower limit. In line 1, as shown, this number is 3, showing that out of the last ten reed units tested belonging to assembly box 1, 3 were below the outer lower limit.
Between the outer lower limit and the outer upper limit may appear up to ten asterisks indicating the measurements of reed units falling between the outer limits. In line 7 there are 10 asterisks, but in other lines such as line 5, there are fewer asterisks. This is because the measurements of two or more reed units may be within a half-ampere-turn from each other, which is below the resolution of the display, and their asterisks therefore coincide.
Immediately beyond the outer upper limit marker there may be a further number which indicates how many, if any, reed units fall above the outer upper test limit. In line 4, for example, of the last 10 reed units tested belonging to assembly box 4, 1 was below the outer lower limit, 8 were between the outer limits (some being coincident as there are only 6 asterisks), and 1 was above the outer upper limit.
Finally there may be a further number at the end of a line which indicates how many, if any reed units are missing, not tested because for some reason they fail to reach the test station. Thus in line 20, of the last 10 reed units which should have been tested, belonging to assembly box 20, 8 were within not only the outer limits but the inner limits also and 2 never reached the test station.
The display may refer either to operate characteristics or release characteristics, and is selectable by a switch.
A more detailed display, for a given assembly box, can be called up on the visual display unit by keying in a specific code instruction on the keyboard of the inputoutput printer.
In this display the assembly box number appears at the left side of the display, and half-way down. In Figure 3 it is shown as box 12. On the 25 lines of the display (one more than the display in Figure 2) the last 25 measurements are displayed, the earliest at the bottom, the latest at the top. One asterisk in each line shows the value of the measurement, and may be between limits, below the outer lower limit, above the outer upper limit, or missing. Thus in the display shown, out of the last 25 measurements on reed units belonging to box 12, the 4th and 8th (reading from the bottom of the display) were below the outer lower limit, the 16th was missing, the 17th was above the outer upper limit, and the remainder were between outer limits and had the values indicated.
This display also may be for operate characteristics or release characteristics, and is selectable by a switch.
Using these displays an operator in charge of the rotating-turret indexing machine can complete a feed-back loop, indicated in Figure 1 by the line 9. On noticing a drift towards either outer limit he can reset parameters on the machine and thereby halt the drift and bring the measurements back towards the inner limits.
A further display can be called up on the visual display unit which gives a visual check on the output of a machine during a given shift. This is shown in Figure 4 and is self-explanatory.
After the test the reed units are collected in magazines such as 8, each holding a batch of 2000 reed units. For each batch collected a batch "ticket" is printed on the inputoutput printer as shown in Figure 5.
At a later stage the batches may be completely tested in a 100% test machine 10, the test results again being stored in a computer 11, analyzed, and the results of the analysis displayed on an input-output printer 12.
It is preferable that the 100% tester 10 be remote from the assembly machine, to avoid electrical interference from the latter.
The computer 11 may be an independent computer or may be the computer 5 in a time-sharing mode. The input-output printer 12 may be independent or the same as printer 7.
WHAT WE CLAIM IS: 1. Apparatus for manufacturing and testing discrete artifacts comprising a machine which manufactures the artifacts in a stepwise or indexing manner, there being n manufacturing stations, and is adjustable to change parameters of the artifacts; a test station for testing the artifacts; a computer which stores and analyzes the test results from the test station; and a visual display device whereon the test results are displayed in such a manner that an operator can, by watching the display and making appropriate adjustments to the machine, keep the parameters of the artifacts produced within defined limits, and wherein the display shows, in an associated one of n lines, the result of the tests on the last p artifacts from
**WARNING** end of DESC field may overlap start of CLMS **.

Claims (4)

**WARNING** start of CLMS field may overlap end of DESC **. these boxes. On the visual display unit there is a normally continuous display which shows how the last ten units tested from each assembly box have fared in the test. The display is (as shown here in Figure 2) in 24 lines, one for each assembly box. At the start of each line is the assembly box number. Along each line are a set of markers showing the outer lower test limit (at 30 ampere-turns), the inner lower test limit (38 AT), the inner upper test limit (50 AT), and the outer upper test limit (58 AT). Between the outer lower limit and the assembly box number a number may be present to indicate how many, if any, of the last ten reed units tested, fell below the outer lower limit. In line 1, as shown, this number is 3, showing that out of the last ten reed units tested belonging to assembly box 1, 3 were below the outer lower limit. Between the outer lower limit and the outer upper limit may appear up to ten asterisks indicating the measurements of reed units falling between the outer limits. In line 7 there are 10 asterisks, but in other lines such as line 5, there are fewer asterisks. This is because the measurements of two or more reed units may be within a half-ampere-turn from each other, which is below the resolution of the display, and their asterisks therefore coincide. Immediately beyond the outer upper limit marker there may be a further number which indicates how many, if any, reed units fall above the outer upper test limit. In line 4, for example, of the last 10 reed units tested belonging to assembly box 4, 1 was below the outer lower limit, 8 were between the outer limits (some being coincident as there are only 6 asterisks), and 1 was above the outer upper limit. Finally there may be a further number at the end of a line which indicates how many, if any reed units are missing, not tested because for some reason they fail to reach the test station. Thus in line 20, of the last 10 reed units which should have been tested, belonging to assembly box 20, 8 were within not only the outer limits but the inner limits also and 2 never reached the test station. The display may refer either to operate characteristics or release characteristics, and is selectable by a switch. A more detailed display, for a given assembly box, can be called up on the visual display unit by keying in a specific code instruction on the keyboard of the inputoutput printer. In this display the assembly box number appears at the left side of the display, and half-way down. In Figure 3 it is shown as box 12. On the 25 lines of the display (one more than the display in Figure 2) the last 25 measurements are displayed, the earliest at the bottom, the latest at the top. One asterisk in each line shows the value of the measurement, and may be between limits, below the outer lower limit, above the outer upper limit, or missing. Thus in the display shown, out of the last 25 measurements on reed units belonging to box 12, the 4th and 8th (reading from the bottom of the display) were below the outer lower limit, the 16th was missing, the 17th was above the outer upper limit, and the remainder were between outer limits and had the values indicated. This display also may be for operate characteristics or release characteristics, and is selectable by a switch. Using these displays an operator in charge of the rotating-turret indexing machine can complete a feed-back loop, indicated in Figure 1 by the line 9. On noticing a drift towards either outer limit he can reset parameters on the machine and thereby halt the drift and bring the measurements back towards the inner limits. A further display can be called up on the visual display unit which gives a visual check on the output of a machine during a given shift. This is shown in Figure 4 and is self-explanatory. After the test the reed units are collected in magazines such as 8, each holding a batch of 2000 reed units. For each batch collected a batch "ticket" is printed on the inputoutput printer as shown in Figure 5. At a later stage the batches may be completely tested in a 100% test machine 10, the test results again being stored in a computer 11, analyzed, and the results of the analysis displayed on an input-output printer 12. It is preferable that the 100% tester 10 be remote from the assembly machine, to avoid electrical interference from the latter. The computer 11 may be an independent computer or may be the computer 5 in a time-sharing mode. The input-output printer 12 may be independent or the same as printer 7. WHAT WE CLAIM IS:
1. Apparatus for manufacturing and testing discrete artifacts comprising a machine which manufactures the artifacts in a stepwise or indexing manner, there being n manufacturing stations, and is adjustable to change parameters of the artifacts; a test station for testing the artifacts; a computer which stores and analyzes the test results from the test station; and a visual display device whereon the test results are displayed in such a manner that an operator can, by watching the display and making appropriate adjustments to the machine, keep the parameters of the artifacts produced within defined limits, and wherein the display shows, in an associated one of n lines, the result of the tests on the last p artifacts from
each of the n stations.
2. Apparatus as claimed in claim 1, wherein there can also be displayed on an individual one of m lines of the display the test results on the last m artifacts from any one of the n stations.
3. Apparatus for manufacturing and testing discrete artifacts comprising a machine which manufactures the artifacts and is adjustable to change parameters of the artifacts, and substantially as described with reference to the accompanying drawings.
4. A method of controlling the manufacture of discrete artifacts produced in a stepwise or indexing manner by an assembly machine which has n manufacturing stations and is adjustable to change parameters of the artifacts, comprising the steps of: testing the artifacts at a test station; storing and analyzing the results in a computer; and displaying the results to an operator on a visual display which shows, in an associated one of n lines, the results of the tests on the last p artifacts from each of the n stations, whereby the operator is made aware of one or more parameters tending to go outside defined limits and can adjust the machine, as a result of watching said displayed results, to keep the parameters within the defined limits.
GB2110677A 1977-05-19 1977-05-19 Apparatus for manufacturing and testing discrete artifacts Expired GB1578558A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
GB2110677A GB1578558A (en) 1977-05-19 1977-05-19 Apparatus for manufacturing and testing discrete artifacts

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB2110677A GB1578558A (en) 1977-05-19 1977-05-19 Apparatus for manufacturing and testing discrete artifacts

Publications (1)

Publication Number Publication Date
GB1578558A true GB1578558A (en) 1980-11-05

Family

ID=10157335

Family Applications (1)

Application Number Title Priority Date Filing Date
GB2110677A Expired GB1578558A (en) 1977-05-19 1977-05-19 Apparatus for manufacturing and testing discrete artifacts

Country Status (1)

Country Link
GB (1) GB1578558A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2535059A1 (en) * 1982-10-22 1984-04-27 Ld Testers Oy METHOD AND APPARATUS FOR CONTROLLING MATERIAL MADE IN THE FORM OF A CONTINUOUS BAND
FR2543328A1 (en) * 1983-03-22 1984-09-28 Rockwell Rimoldi Spa APPARATUS FOR DATA PROCESSING, ONCE THEY ARE DETERMINED, WITH AUTOMATIC FORMATION OF THE CONTROL DIAGRAM CARRIED OUT USING A MEDIUM AND A RANGE OF VALUES
FR2652014A1 (en) * 1989-09-19 1991-03-22 Fils Speciaux Method and device for the automatic inspection of long products in the course of manufacture

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2535059A1 (en) * 1982-10-22 1984-04-27 Ld Testers Oy METHOD AND APPARATUS FOR CONTROLLING MATERIAL MADE IN THE FORM OF A CONTINUOUS BAND
FR2543328A1 (en) * 1983-03-22 1984-09-28 Rockwell Rimoldi Spa APPARATUS FOR DATA PROCESSING, ONCE THEY ARE DETERMINED, WITH AUTOMATIC FORMATION OF THE CONTROL DIAGRAM CARRIED OUT USING A MEDIUM AND A RANGE OF VALUES
FR2652014A1 (en) * 1989-09-19 1991-03-22 Fils Speciaux Method and device for the automatic inspection of long products in the course of manufacture

Similar Documents

Publication Publication Date Title
US4434489A (en) Automatic test systems
US5284164A (en) Method for improving the quality of products produced in the cigarette manufacturing process
US20180167297A1 (en) Method and apparatus for testing and displaying test results
US5117189A (en) Automatic testing apparatus for electrical switches
KR870008260A (en) Method and apparatus for online interactive monitoring of the execution of fair operating procedures
US5790424A (en) Plant monitoring apparatus and monitoring method
DE69026015T2 (en) Procedure for tuning and balancing the signal strength indicator in a radio telephone
CN101676699B (en) Multipoint temperature acquisition method
DE102017115663A1 (en) Method for operating a measuring point and measuring point
CN110147869A (en) Production line body start-stop data acquisition device, system and method
CN104931907B (en) Digital display electrical measuring amount instrument quality group's check system based on machine vision
GB1578558A (en) Apparatus for manufacturing and testing discrete artifacts
KR20130105453A (en) Fluorescence x-ray analyzing apparatus and method of analyzing fluorescence x-ray
CN108107398A (en) A kind of automatic Verification method and system of measuring apparatus
EP0461191B1 (en) Method and apparatus for automatically calculating the integrity of an electrical coil
US4467279A (en) Temperature compensated resistance test board
EP0441547B1 (en) Simulation of human performance of a process operation procedure
CN110535997A (en) A kind of calibration method, device, equipment and the storage medium of terminal screen light leakage
CN108802512B (en) Power distribution system test method and device
US3576494A (en) Digital computer controlled test system
EP0527321A1 (en) Method for automatic error diagnosis of electrical circuit boards
JPH03245184A (en) Monitor screen testing device
EP0677721A1 (en) Measuring device, in particular for a data acquisition station
CN102451820B (en) Selecting method of electronic product
KR20000077202A (en) Semiconductor device inspection apparatus and semiconductor device inspection method

Legal Events

Date Code Title Description
PS Patent sealed
PCNP Patent ceased through non-payment of renewal fee