GB1433608A - Data processing systems - Google Patents

Data processing systems

Info

Publication number
GB1433608A
GB1433608A GB3421873A GB3421873A GB1433608A GB 1433608 A GB1433608 A GB 1433608A GB 3421873 A GB3421873 A GB 3421873A GB 3421873 A GB3421873 A GB 3421873A GB 1433608 A GB1433608 A GB 1433608A
Authority
GB
United Kingdom
Prior art keywords
register
test
store
test data
data
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB3421873A
Other languages
English (en)
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Siemens Corp
Original Assignee
Siemens Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Siemens Corp filed Critical Siemens Corp
Publication of GB1433608A publication Critical patent/GB1433608A/en
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/48—Arrangements in static stores specially adapted for testing by means external to the store, e.g. using direct memory access [DMA] or using auxiliary access paths
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
    • G11C29/38—Response verification devices

Landscapes

  • Techniques For Improving Reliability Of Storages (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Tests Of Electronic Circuits (AREA)
GB3421873A 1972-08-28 1973-07-18 Data processing systems Expired GB1433608A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE2242279A DE2242279C3 (de) 1972-08-28 1972-08-28 Schaltungsanordnung zur Ermittlung von Fehlern in einer Speichereinheit eines programmgesteuerten Datenvermittlungssystems

Publications (1)

Publication Number Publication Date
GB1433608A true GB1433608A (en) 1976-04-28

Family

ID=5854775

Family Applications (1)

Application Number Title Priority Date Filing Date
GB3421873A Expired GB1433608A (en) 1972-08-28 1973-07-18 Data processing systems

Country Status (11)

Country Link
US (1) US3869603A (enExample)
BE (1) BE804101A (enExample)
BR (1) BR7306629D0 (enExample)
CA (1) CA990859A (enExample)
CH (1) CH562477A5 (enExample)
DE (1) DE2242279C3 (enExample)
FR (1) FR2198663A5 (enExample)
GB (1) GB1433608A (enExample)
IT (1) IT993042B (enExample)
NL (1) NL7311713A (enExample)
ZA (1) ZA735164B (enExample)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4024386A (en) * 1974-11-19 1977-05-17 Texas Instruments Incorporated Electronic calculator or digital processor chip having test mode of operation
NL7416755A (nl) * 1974-12-23 1976-06-25 Philips Nv Werkwijze en inrichting voor het testen van een digitaal geheugen.
US4271512A (en) * 1979-03-30 1981-06-02 Lyhus Arlan J Information collection and storage system with memory test circuit
US5210639A (en) * 1983-12-30 1993-05-11 Texas Instruments, Inc. Dual-port memory with inhibited random access during transfer cycles with serial access
US4878168A (en) * 1984-03-30 1989-10-31 International Business Machines Corporation Bidirectional serial test bus device adapted for control processing unit using parallel information transfer bus
US5349578A (en) * 1991-05-10 1994-09-20 Nec Corporation Time slot switching function diagnostic system
US6385236B1 (en) 1998-10-05 2002-05-07 Lsi Logic Corporation Method and Circuit for testing devices with serial data links

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3579199A (en) * 1969-02-03 1971-05-18 Gen Motors Corp Method and apparatus for fault testing a digital computer memory

Also Published As

Publication number Publication date
FR2198663A5 (enExample) 1974-03-29
BR7306629D0 (pt) 1974-07-11
BE804101A (fr) 1974-02-28
CH562477A5 (enExample) 1975-05-30
US3869603A (en) 1975-03-04
DE2242279B2 (de) 1979-03-22
DE2242279C3 (de) 1979-11-15
DE2242279A1 (de) 1974-03-07
IT993042B (it) 1975-09-30
CA990859A (en) 1976-06-08
NL7311713A (enExample) 1974-03-04
ZA735164B (en) 1974-07-31
AU5877873A (en) 1975-02-06

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Legal Events

Date Code Title Description
PS Patent sealed [section 19, patents act 1949]
PCNP Patent ceased through non-payment of renewal fee