GB1431205A - Monolithic semiconductor circuit arrangement - Google Patents
Monolithic semiconductor circuit arrangementInfo
- Publication number
- GB1431205A GB1431205A GB2582573A GB2582573A GB1431205A GB 1431205 A GB1431205 A GB 1431205A GB 2582573 A GB2582573 A GB 2582573A GB 2582573 A GB2582573 A GB 2582573A GB 1431205 A GB1431205 A GB 1431205A
- Authority
- GB
- United Kingdom
- Prior art keywords
- fet
- potential
- current
- over
- fed
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 239000004065 semiconductor Substances 0.000 title 1
- 230000001419 dependent effect Effects 0.000 abstract 2
- 230000004048 modification Effects 0.000 abstract 2
- 238000012986 modification Methods 0.000 abstract 2
- 210000000352 storage cell Anatomy 0.000 abstract 2
- 230000005669 field effect Effects 0.000 abstract 1
- 230000000087 stabilizing effect Effects 0.000 abstract 1
Classifications
-
- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05F—SYSTEMS FOR REGULATING ELECTRIC OR MAGNETIC VARIABLES
- G05F3/00—Non-retroactive systems for regulating electric variables by using an uncontrolled element, or an uncontrolled combination of elements, such element or such combination having self-regulating properties
- G05F3/02—Regulating voltage or current
- G05F3/08—Regulating voltage or current wherein the variable is dc
- G05F3/10—Regulating voltage or current wherein the variable is dc using uncontrolled devices with non-linear characteristics
- G05F3/16—Regulating voltage or current wherein the variable is dc using uncontrolled devices with non-linear characteristics being semiconductor devices
- G05F3/20—Regulating voltage or current wherein the variable is dc using uncontrolled devices with non-linear characteristics being semiconductor devices using diode- transistor combinations
- G05F3/24—Regulating voltage or current wherein the variable is dc using uncontrolled devices with non-linear characteristics being semiconductor devices using diode- transistor combinations wherein the transistors are of the field-effect type only
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
- G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
- G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
- G11C11/41—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming static cells with positive feedback, i.e. cells not needing refreshing or charge regeneration, e.g. bistable multivibrator or Schmitt trigger
- G11C11/413—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing, timing or power reduction
- G11C11/417—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing, timing or power reduction for memory cells of the field-effect type
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
- H01L27/0203—Particular design considerations for integrated circuits
- H01L27/0214—Particular design considerations for integrated circuits for internal polarisation, e.g. I2L
- H01L27/0218—Particular design considerations for integrated circuits for internal polarisation, e.g. I2L of field effect structures
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Physics & Mathematics (AREA)
- Power Engineering (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Nonlinear Science (AREA)
- Electromagnetism (AREA)
- Radar, Positioning & Navigation (AREA)
- Automation & Control Theory (AREA)
- Static Random-Access Memory (AREA)
- Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
- Semiconductor Memories (AREA)
- Amplifiers (AREA)
Abstract
1431205 Stabilizing bi-stable circuits INTERNATIONAL BUSINESS MACHINES CORP 30 May 1973 [30 June 1972] 25825/73 Heading H3T A FET storage circuit comprises crosscoupled field effect transistors T 1 , T 2 storing binary information and transistors T 3 , T 4 reading out and writing; the latter being held non-conductive for inoperation over word line WL whereby T 1 and T 2 are separated from bit lines B0 B1 and fed from V L over FET's T 5 and T 6 , whose gates are linked to a circuit supplying a potential dependent on the threshold of the FET's. For read out or write a signal on word line WL drives T 3 , T 4 conductive, so that for read the potentials at points 1, 2 are applied to bit lines B0, B1 and to the read amplifiers; while for write the signals are fed into storage transistors T 1 , T 2 over T 3 , T 4 . Current in T 5 , T 6 must compensate the leakage in T 1 , T 2 respectively and for T 1 conducting and T 2 blocked, the potential of point 2 must be held by current in T 6 compensating leakage current of blocked T 2 , while T 5 , T 6 must have high resistance. Thus the difference between the gate to source voltage and the threshold voltage must be as low as possible, which is achieved by applying to the gate electrodes a potential dependent on the respective threshold voltages of the FET's. The FET's T 7 , T 8 , T 9 , T 10 , T 11 simulate the operation of the connected storage cells with T 8 corresponding to T 6 when T 1 is conducting and T 9 corresponding to transistor T 1 while T 7 determines the current in a chain interconnecting potential V H and the potential V R ; derived from voltage division by FET's T 10 , T 11 across potentials V L , V H . The potential V G at 3 = V R + V T9 + V T8 corresponding to threshold voltages of T 8 , T 9 is applied to the gates of T 5 , T 6 . In a modification (Fig. 2) Vg is developed and fed to the storage cells over an interface stage comprising a further series of FET's; yet another FET being connected into the chain of T 7 , T 8 , T 9 with the interface FET's in series between V H and earth and their gates energized from the junctions of T 7 and the additional FET and from T 8 , T 9 respectively to develop potential V G at the junction of the decoupling FET's. Mathematics is given. A further modification (Fig. 3, not shown) derives additional compensation by utilizing another FET stage and also feedback stages.
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE19722232274 DE2232274C2 (en) | 1972-06-30 | 1972-06-30 | Static semiconductor memory with field effect transistors |
Publications (1)
Publication Number | Publication Date |
---|---|
GB1431205A true GB1431205A (en) | 1976-04-07 |
Family
ID=5849362
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
GB2582573A Expired GB1431205A (en) | 1972-06-30 | 1973-05-30 | Monolithic semiconductor circuit arrangement |
Country Status (5)
Country | Link |
---|---|
JP (1) | JPS545937B2 (en) |
DE (1) | DE2232274C2 (en) |
FR (1) | FR2241929B1 (en) |
GB (1) | GB1431205A (en) |
IT (1) | IT981508B (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0029231A1 (en) * | 1979-11-19 | 1981-05-27 | Nec Corporation | Reference voltage generator circuit |
Families Citing this family (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3970875A (en) * | 1974-11-21 | 1976-07-20 | International Business Machines Corporation | LSI chip compensator for process parameter variations |
JPS54152845A (en) * | 1978-05-24 | 1979-12-01 | Hitachi Ltd | High dielectric strength mosfet circuit |
DE2855844C2 (en) * | 1978-12-22 | 1984-06-07 | Texas Instruments Deutschland Gmbh, 8050 Freising | Circuit for an amplifier with a field effect transistor |
US4394751A (en) * | 1980-10-23 | 1983-07-19 | Standard Microsystems Corporation | Low power storage cell |
JPS5799765A (en) * | 1980-12-12 | 1982-06-21 | Fujitsu Ltd | Semiconductor resistance element |
JPS5813885A (en) * | 1981-07-15 | 1983-01-26 | 松下電工株式会社 | Door made of wood |
US4433252A (en) * | 1982-01-18 | 1984-02-21 | International Business Machines Corporation | Input signal responsive pulse generating and biasing circuit for integrated circuits |
JPH0493997U (en) * | 1990-12-21 | 1992-08-14 | ||
JP3017871B2 (en) * | 1991-01-02 | 2000-03-13 | テキサス インスツルメンツ インコーポレイテツド | Variation detection circuit on chip for IC device |
Family Cites Families (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3508084A (en) * | 1967-10-06 | 1970-04-21 | Texas Instruments Inc | Enhancement-mode mos circuitry |
JPS528660A (en) * | 1975-07-09 | 1977-01-22 | Hitachi Ltd | Anaerobic digestion of organic waste fluid |
-
1972
- 1972-06-30 DE DE19722232274 patent/DE2232274C2/en not_active Expired
-
1973
- 1973-03-21 IT IT2188673A patent/IT981508B/en active
- 1973-05-30 GB GB2582573A patent/GB1431205A/en not_active Expired
- 1973-06-12 JP JP6547173A patent/JPS545937B2/ja not_active Expired
- 1973-06-26 FR FR7324276A patent/FR2241929B1/fr not_active Expired
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0029231A1 (en) * | 1979-11-19 | 1981-05-27 | Nec Corporation | Reference voltage generator circuit |
Also Published As
Publication number | Publication date |
---|---|
DE2232274C2 (en) | 1982-05-06 |
FR2241929B1 (en) | 1976-06-18 |
JPS4959541A (en) | 1974-06-10 |
FR2241929A1 (en) | 1975-03-21 |
JPS545937B2 (en) | 1979-03-23 |
DE2232274A1 (en) | 1974-01-31 |
IT981508B (en) | 1974-10-10 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
PS | Patent sealed | ||
PCNP | Patent ceased through non-payment of renewal fee |