GB1364930A - Microscope employing a beam of chargedparticles - Google Patents

Microscope employing a beam of chargedparticles

Info

Publication number
GB1364930A
GB1364930A GB3875371A GB3875371A GB1364930A GB 1364930 A GB1364930 A GB 1364930A GB 3875371 A GB3875371 A GB 3875371A GB 3875371 A GB3875371 A GB 3875371A GB 1364930 A GB1364930 A GB 1364930A
Authority
GB
United Kingdom
Prior art keywords
lens
filter
field
electrostatic
microscope
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB3875371A
Other languages
English (en)
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Philips Electronics UK Ltd
Original Assignee
Philips Electronic and Associated Industries Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Philips Electronic and Associated Industries Ltd filed Critical Philips Electronic and Associated Industries Ltd
Publication of GB1364930A publication Critical patent/GB1364930A/en
Expired legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J29/00—Details of cathode-ray tubes or of electron-beam tubes of the types covered by group H01J31/00
    • H01J29/84—Traps for removing or diverting unwanted particles, e.g. negative ions, fringing electrons; Arrangements for velocity or mass selection
    • H01J29/845—Traps for removing or diverting unwanted particles, e.g. negative ions, fringing electrons; Arrangements for velocity or mass selection by means of magnetic systems
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02—Details
    • H01J37/04—Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement or ion-optical arrangement
    • H01J37/05—Electron or ion-optical arrangements for separating electrons or ions according to their energy or mass

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Electron Tubes For Measurement (AREA)
GB3875371A 1970-08-21 1971-08-18 Microscope employing a beam of chargedparticles Expired GB1364930A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
NL7012388A NL7012388A (enExample) 1970-08-21 1970-08-21

Publications (1)

Publication Number Publication Date
GB1364930A true GB1364930A (en) 1974-08-29

Family

ID=19810828

Family Applications (1)

Application Number Title Priority Date Filing Date
GB3875371A Expired GB1364930A (en) 1970-08-21 1971-08-18 Microscope employing a beam of chargedparticles

Country Status (5)

Country Link
CA (1) CA934075A (enExample)
DE (1) DE2137510C3 (enExample)
FR (1) FR2104604A5 (enExample)
GB (1) GB1364930A (enExample)
NL (1) NL7012388A (enExample)

Cited By (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3979590A (en) * 1974-04-01 1976-09-07 U.S. Philips Corporation Electron microscope comprising an energy analyzer
US4779046A (en) * 1985-06-28 1988-10-18 Cameca Electron beam integrated circuit tester
US5798524A (en) * 1996-08-07 1998-08-25 Gatan, Inc. Automated adjustment of an energy filtering transmission electron microscope
US6184524B1 (en) 1996-08-07 2001-02-06 Gatan, Inc. Automated set up of an energy filtering transmission electron microscope
EP1067576A3 (en) * 1999-07-05 2001-05-16 Jeol Ltd. Energy filter and electron microscope using the same
FR2801137A1 (fr) * 1999-11-16 2001-05-18 Schlumberger Technologies Inc Colonne a faisceau ionique focalise, filtre dans un filtre a energie
WO2005024889A1 (en) * 2003-09-11 2005-03-17 ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH Single stage charged particle beam energy width reduction system for charged particle beam system
WO2008087386A1 (en) * 2007-01-15 2008-07-24 Oxford Instruments Analytical Limited Charged particle analyser system and method
US8569693B2 (en) 2011-04-13 2013-10-29 Fei Company Distortion free stigmation of a TEM
US8692196B2 (en) 2008-09-22 2014-04-08 Fei Company Method of use for a multipole detector for a transmission electron microscope
US8841630B2 (en) 2009-11-18 2014-09-23 Fei Company Corrector for axial aberrations of a particle-optical lens
US8884245B2 (en) 2005-11-02 2014-11-11 Fei Company Corrector for the correction of chromatic aberrations in a particle-optical apparatus

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0555911B1 (en) * 1992-02-12 1999-01-07 Koninklijke Philips Electronics N.V. Method of reducing a spatial spread within an electron beam, and an electron beam apparatus suitable for carrying out such a method
JP4527289B2 (ja) * 1998-12-17 2010-08-18 エフ イー アイ カンパニ オージェ電子の検出を含む粒子光学装置

Cited By (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3979590A (en) * 1974-04-01 1976-09-07 U.S. Philips Corporation Electron microscope comprising an energy analyzer
US4779046A (en) * 1985-06-28 1988-10-18 Cameca Electron beam integrated circuit tester
US5798524A (en) * 1996-08-07 1998-08-25 Gatan, Inc. Automated adjustment of an energy filtering transmission electron microscope
US6184524B1 (en) 1996-08-07 2001-02-06 Gatan, Inc. Automated set up of an energy filtering transmission electron microscope
EP1067576A3 (en) * 1999-07-05 2001-05-16 Jeol Ltd. Energy filter and electron microscope using the same
FR2801137A1 (fr) * 1999-11-16 2001-05-18 Schlumberger Technologies Inc Colonne a faisceau ionique focalise, filtre dans un filtre a energie
WO2005024889A1 (en) * 2003-09-11 2005-03-17 ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH Single stage charged particle beam energy width reduction system for charged particle beam system
EP1521289A1 (en) * 2003-09-11 2005-04-06 ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH Single stage charged particle beam energy width reduction system for charged particle beam system
US8884245B2 (en) 2005-11-02 2014-11-11 Fei Company Corrector for the correction of chromatic aberrations in a particle-optical apparatus
WO2008087386A1 (en) * 2007-01-15 2008-07-24 Oxford Instruments Analytical Limited Charged particle analyser system and method
US8692196B2 (en) 2008-09-22 2014-04-08 Fei Company Method of use for a multipole detector for a transmission electron microscope
US8841630B2 (en) 2009-11-18 2014-09-23 Fei Company Corrector for axial aberrations of a particle-optical lens
US8569693B2 (en) 2011-04-13 2013-10-29 Fei Company Distortion free stigmation of a TEM

Also Published As

Publication number Publication date
CA934075A (en) 1973-09-18
NL7012388A (enExample) 1972-02-23
DE2137510A1 (de) 1972-02-24
DE2137510B2 (de) 1978-03-16
FR2104604A5 (enExample) 1972-04-14
DE2137510C3 (de) 1978-11-09

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Legal Events

Date Code Title Description
PS Patent sealed
PCNP Patent ceased through non-payment of renewal fee