GB1343529A - Method of x-ray crystal analysis and an x-ray goniometer for performing the method - Google Patents
Method of x-ray crystal analysis and an x-ray goniometer for performing the methodInfo
- Publication number
- GB1343529A GB1343529A GB3880371A GB3880371A GB1343529A GB 1343529 A GB1343529 A GB 1343529A GB 3880371 A GB3880371 A GB 3880371A GB 3880371 A GB3880371 A GB 3880371A GB 1343529 A GB1343529 A GB 1343529A
- Authority
- GB
- United Kingdom
- Prior art keywords
- axis
- crystal
- ray
- film
- camera
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/205—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials using diffraction cameras
Landscapes
- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Abstract
1343529 X-ray apparatus STOE & CIE GmbH 18 Aug 1971 [18 Aug 1970] 38803/71 Heading H5R An X-ray eponiometer includes a collimator 12 for the X-ray beam X, and a pivotable unit in the form of a hinged parallelogram with rails 21 and 22 pivotable on bearings 19 and 20 and connected to a wobble mechanism, and supporting a crystal support 18 for holding a crystal K and rotating it about the axis A, and orthogonally directed alternative supports U and J for a camera unit which includes a disc-shaped film magazine, whereby with the film rotated parallel to the axis A Buerger photographs may be taken, while with the film supported normal to that axis de-Jong-Bauman photographs may be obtained. At the end of rail 22 adjacent to the crystal mount 18 is a bearing for an arcuate bracket 31 the other end of which is joined by a pivot 17 to a slide 25a which is adjustable along a segment 25 which is itself mounted for rotation by a motor about an axis 26 coincident with the beam X. For producing a Buerger photograph, the diaphragm 30 and camera B are positioned in planes parallel to the axis A, as shown in Fig. 1, and slide 25a is secured to the segment 25 by screw 39 at a desired angle Á to the beam X, whereafter rotation of the arc 25 about axis 26 causes rails 21 and 22 to wobble through Á. For a de-Jong-Bauman photograph, the apparatus is arranged as in Fig. 2, with the slide 25a, and hence the rails 21 and 22, set to a desired angle, and with the camera B and a diaphragm 34 positioned normal to the crystal rotation axis, the crystal and the film being synchronously rotated about their respective axes by an electric motor. The camera mounts are adjustable to permit variation of the distance between the film plane and the crystal, so that the scale of the Buerger and the de-Jong-Bauman photographs may be made the same.
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE19702041031 DE2041031C (en) | 1970-08-18 | Method and device for X-ray crystal structure investigation |
Publications (1)
Publication Number | Publication Date |
---|---|
GB1343529A true GB1343529A (en) | 1974-01-10 |
Family
ID=5780092
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
GB3880371A Expired GB1343529A (en) | 1970-08-18 | 1971-08-18 | Method of x-ray crystal analysis and an x-ray goniometer for performing the method |
Country Status (2)
Country | Link |
---|---|
US (1) | US3714426A (en) |
GB (1) | GB1343529A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CZ309823B6 (en) * | 2022-05-16 | 2023-11-08 | Tescan Group, A.S. | A method of creating a precessional electron diffraction pattern |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2004013683A2 (en) * | 2002-07-13 | 2004-02-12 | University Of Georgia Research Foundation, Inc. | Monitoring signal-to-noise ratio in x-ray diffraction data |
WO2004077023A2 (en) * | 2003-02-27 | 2004-09-10 | University Of Georgia Research Foundation, Inc. | High-throughput structure and electron density determination |
JP6685078B2 (en) * | 2013-03-15 | 2020-04-22 | プロト マニュファクチャリング リミテッド | X-ray diffractometer and method for driving X-ray diffractometer |
Family Cites Families (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US2819405A (en) * | 1954-03-26 | 1958-01-07 | Bell Telephone Labor Inc | Automatic recording diffractometer and plotter |
US3108185A (en) * | 1960-06-22 | 1963-10-22 | Martin J Buerger | Precession instrument for use in the photography of the reciprocal lattice of a crystal |
US3394255A (en) * | 1965-06-28 | 1968-07-23 | Picker Corp | Diffraction mechanism in which a monochromator diffracts the X-ray beam in planes transverse to an axis of specimen rotation |
GB1183702A (en) * | 1966-03-30 | 1970-03-11 | Ass Elect Ind | Improvements relating to X-Ray Analysing Apparatus. |
SE327573B (en) * | 1967-03-13 | 1970-08-24 | Incentive Res & Dev Ab | |
SE322066B (en) * | 1968-01-25 | 1970-03-23 | Incentive Res & Dev Ab |
-
1971
- 1971-02-26 US US00119102A patent/US3714426A/en not_active Expired - Lifetime
- 1971-08-18 GB GB3880371A patent/GB1343529A/en not_active Expired
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CZ309823B6 (en) * | 2022-05-16 | 2023-11-08 | Tescan Group, A.S. | A method of creating a precessional electron diffraction pattern |
Also Published As
Publication number | Publication date |
---|---|
US3714426A (en) | 1973-01-30 |
DE2041031A1 (en) | 1972-02-24 |
DE2041031B2 (en) | 1972-09-28 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
PS | Patent sealed [section 19, patents act 1949] | ||
PCNP | Patent ceased through non-payment of renewal fee |