GB1310167A - Method and device for measuring the thickness of a metal deposit on an insulating support - Google Patents

Method and device for measuring the thickness of a metal deposit on an insulating support

Info

Publication number
GB1310167A
GB1310167A GB1347470A GB1347470A GB1310167A GB 1310167 A GB1310167 A GB 1310167A GB 1347470 A GB1347470 A GB 1347470A GB 1347470 A GB1347470 A GB 1347470A GB 1310167 A GB1310167 A GB 1310167A
Authority
GB
United Kingdom
Prior art keywords
thickness
control
film
evaporator
march
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB1347470A
Other languages
English (en)
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Cellophane SA France
Original Assignee
Cellophane SA France
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Cellophane SA France filed Critical Cellophane SA France
Publication of GB1310167A publication Critical patent/GB1310167A/en
Expired legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B7/00Measuring arrangements characterised by the use of electric or magnetic techniques
    • G01B7/02Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness
    • G01B7/06Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness
    • G01B7/10Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness using magnetic means, e.g. by measuring change of reluctance
    • G01B7/105Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness using magnetic means, e.g. by measuring change of reluctance for measuring thickness of coating

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
GB1347470A 1969-03-27 1970-03-20 Method and device for measuring the thickness of a metal deposit on an insulating support Expired GB1310167A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR6909095A FR2036642A5 (enrdf_load_stackoverflow) 1969-03-27 1969-03-27

Publications (1)

Publication Number Publication Date
GB1310167A true GB1310167A (en) 1973-03-14

Family

ID=9031367

Family Applications (1)

Application Number Title Priority Date Filing Date
GB1347470A Expired GB1310167A (en) 1969-03-27 1970-03-20 Method and device for measuring the thickness of a metal deposit on an insulating support

Country Status (2)

Country Link
FR (1) FR2036642A5 (enrdf_load_stackoverflow)
GB (1) GB1310167A (enrdf_load_stackoverflow)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN113916767A (zh) * 2021-09-30 2022-01-11 华中科技大学 一种纳米级金属化膜大气腐蚀测量装置及方法

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2692978A1 (fr) * 1992-06-30 1993-12-31 Alcatel Fibres Optiques Dispositif et procédé de contrôle de l'épaisseur et de la régularité d'un revêtement déposé sur un corps isolant allongé.

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN113916767A (zh) * 2021-09-30 2022-01-11 华中科技大学 一种纳米级金属化膜大气腐蚀测量装置及方法

Also Published As

Publication number Publication date
FR2036642A5 (enrdf_load_stackoverflow) 1970-12-24

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Legal Events

Date Code Title Description
PS Patent sealed
PLNP Patent lapsed through nonpayment of renewal fees