GB1278631A - Improvements relating to measuring and testing electrical circuits - Google Patents

Improvements relating to measuring and testing electrical circuits

Info

Publication number
GB1278631A
GB1278631A GB29011/69A GB2901169A GB1278631A GB 1278631 A GB1278631 A GB 1278631A GB 29011/69 A GB29011/69 A GB 29011/69A GB 2901169 A GB2901169 A GB 2901169A GB 1278631 A GB1278631 A GB 1278631A
Authority
GB
United Kingdom
Prior art keywords
circuit
signal
output
input
binary
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB29011/69A
Other languages
English (en)
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Teradyne Inc
Original Assignee
Teradyne Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Teradyne Inc filed Critical Teradyne Inc
Publication of GB1278631A publication Critical patent/GB1278631A/en
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/316—Testing of analog circuits
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K5/00—Manipulating of pulses not covered by one of the other main groups of this subclass
    • H03K5/15—Arrangements in which pulses are delivered at different times at several outputs, i.e. pulse distributors
    • H03K5/15013—Arrangements in which pulses are delivered at different times at several outputs, i.e. pulse distributors with more than two outputs

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Nonlinear Science (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Semiconductor Integrated Circuits (AREA)
GB29011/69A 1968-06-14 1969-06-09 Improvements relating to measuring and testing electrical circuits Expired GB1278631A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US73714168A 1968-06-14 1968-06-14

Publications (1)

Publication Number Publication Date
GB1278631A true GB1278631A (en) 1972-06-21

Family

ID=24962732

Family Applications (2)

Application Number Title Priority Date Filing Date
GB29011/69A Expired GB1278631A (en) 1968-06-14 1969-06-09 Improvements relating to measuring and testing electrical circuits
GB3814/72A Expired GB1278632A (en) 1968-06-14 1969-06-09 Improvements relating to measuring and testing electrical circuits

Family Applications After (1)

Application Number Title Priority Date Filing Date
GB3814/72A Expired GB1278632A (en) 1968-06-14 1969-06-09 Improvements relating to measuring and testing electrical circuits

Country Status (5)

Country Link
US (1) US3562644A (enExample)
JP (1) JPS5037991B1 (enExample)
DE (1) DE1929850A1 (enExample)
FR (1) FR2010912A1 (enExample)
GB (2) GB1278631A (enExample)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4271516A (en) 1978-08-25 1981-06-02 Racal Automation Limited Automatic testing of electrical circuitry

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3659088A (en) * 1970-08-06 1972-04-25 Cogar Corp Method for indicating memory chip failure modes
US3892954A (en) * 1972-04-04 1975-07-01 Westinghouse Electric Corp Programmable, tester for protection and safeguards logic functions
US4002974A (en) * 1975-11-13 1977-01-11 Bell Telephone Laboratories, Incorporated Method and apparatus for testing circuits
US4044244A (en) * 1976-08-06 1977-08-23 International Business Machines Corporation Automatic tester for complex semiconductor components including combinations of logic, memory and analog devices and processes of testing thereof
US4168527A (en) * 1978-02-17 1979-09-18 Winkler Dean A Analog and digital circuit tester
GB1599069A (en) * 1978-05-31 1981-09-30 Ferranti Ltd Testing of circuit arrangements
FR2481461A1 (fr) * 1980-04-25 1981-10-30 Radiotechnique Compelec Dispositif programmable, pour tester les durees d'un signal electrique, notamment d'impulsions
FR2498763A1 (fr) * 1981-01-27 1982-07-30 Commissariat Energie Atomique Systeme de test et de visualisation d'etats de fonctionnement d'un circuit logique
JPS58158566A (ja) * 1982-03-17 1983-09-20 Hitachi Ltd 検査装置
DE9115368U1 (de) * 1991-12-11 1993-04-22 Crisandt, Peter, 5830 Schwelm Vorrichtung zum Stanzen von Verpackungen
US9244118B2 (en) * 2012-12-30 2016-01-26 Global Unichip Corp. Testing system with an isolated switching module

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4271516A (en) 1978-08-25 1981-06-02 Racal Automation Limited Automatic testing of electrical circuitry

Also Published As

Publication number Publication date
JPS5037991B1 (enExample) 1975-12-06
FR2010912A1 (enExample) 1970-02-20
GB1278632A (en) 1972-06-21
DE1929850A1 (de) 1970-01-02
US3562644A (en) 1971-02-09

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Legal Events

Date Code Title Description
PS Patent sealed [section 19, patents act 1949]
PE20 Patent expired after termination of 20 years