FR2010912A1 - - Google Patents

Info

Publication number
FR2010912A1
FR2010912A1 FR6919734A FR6919734A FR2010912A1 FR 2010912 A1 FR2010912 A1 FR 2010912A1 FR 6919734 A FR6919734 A FR 6919734A FR 6919734 A FR6919734 A FR 6919734A FR 2010912 A1 FR2010912 A1 FR 2010912A1
Authority
FR
France
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
FR6919734A
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Teradyne Inc
Original Assignee
Teradyne Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Teradyne Inc filed Critical Teradyne Inc
Publication of FR2010912A1 publication Critical patent/FR2010912A1/fr
Withdrawn legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/316—Testing of analog circuits
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K5/00—Manipulating of pulses not covered by one of the other main groups of this subclass
    • H03K5/15—Arrangements in which pulses are delivered at different times at several outputs, i.e. pulse distributors
    • H03K5/15013—Arrangements in which pulses are delivered at different times at several outputs, i.e. pulse distributors with more than two outputs

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Nonlinear Science (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Semiconductor Integrated Circuits (AREA)
FR6919734A 1968-06-14 1969-06-13 Withdrawn FR2010912A1 (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US73714168A 1968-06-14 1968-06-14

Publications (1)

Publication Number Publication Date
FR2010912A1 true FR2010912A1 (fr) 1970-02-20

Family

ID=24962732

Family Applications (1)

Application Number Title Priority Date Filing Date
FR6919734A Withdrawn FR2010912A1 (fr) 1968-06-14 1969-06-13

Country Status (5)

Country Link
US (1) US3562644A (fr)
JP (1) JPS5037991B1 (fr)
DE (1) DE1929850A1 (fr)
FR (1) FR2010912A1 (fr)
GB (2) GB1278631A (fr)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2360889A1 (fr) * 1976-08-06 1978-03-03 Ibm Appareil d'essai automatique pour composants a semi-conducteur complexes et procede d'essai de tels composants
FR2481461A1 (fr) * 1980-04-25 1981-10-30 Radiotechnique Compelec Dispositif programmable, pour tester les durees d'un signal electrique, notamment d'impulsions
FR2498763A1 (fr) * 1981-01-27 1982-07-30 Commissariat Energie Atomique Systeme de test et de visualisation d'etats de fonctionnement d'un circuit logique

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3659088A (en) * 1970-08-06 1972-04-25 Cogar Corp Method for indicating memory chip failure modes
US3892954A (en) * 1972-04-04 1975-07-01 Westinghouse Electric Corp Programmable, tester for protection and safeguards logic functions
US4002974A (en) * 1975-11-13 1977-01-11 Bell Telephone Laboratories, Incorporated Method and apparatus for testing circuits
US4168527A (en) * 1978-02-17 1979-09-18 Winkler Dean A Analog and digital circuit tester
GB1599069A (en) * 1978-05-31 1981-09-30 Ferranti Ltd Testing of circuit arrangements
JPS58158566A (ja) * 1982-03-17 1983-09-20 Hitachi Ltd 検査装置
DE9115368U1 (fr) * 1991-12-11 1993-04-22 Crisandt, Peter, 5830 Schwelm, De
US9244118B2 (en) * 2012-12-30 2016-01-26 Global Unichip Corp. Testing system with an isolated switching module

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2360889A1 (fr) * 1976-08-06 1978-03-03 Ibm Appareil d'essai automatique pour composants a semi-conducteur complexes et procede d'essai de tels composants
FR2481461A1 (fr) * 1980-04-25 1981-10-30 Radiotechnique Compelec Dispositif programmable, pour tester les durees d'un signal electrique, notamment d'impulsions
FR2498763A1 (fr) * 1981-01-27 1982-07-30 Commissariat Energie Atomique Systeme de test et de visualisation d'etats de fonctionnement d'un circuit logique
EP0057147A1 (fr) * 1981-01-27 1982-08-04 Commissariat à l'Energie Atomique Système de test et de visualisation d'états de fonctionnement d'un circuit logique

Also Published As

Publication number Publication date
US3562644A (en) 1971-02-09
GB1278632A (en) 1972-06-21
JPS5037991B1 (fr) 1975-12-06
DE1929850A1 (de) 1970-01-02
GB1278631A (en) 1972-06-21

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Legal Events

Date Code Title Description
ST Notification of lapse