GB1234576A - - Google Patents

Info

Publication number
GB1234576A
GB1234576A GB1234576DA GB1234576A GB 1234576 A GB1234576 A GB 1234576A GB 1234576D A GB1234576D A GB 1234576DA GB 1234576 A GB1234576 A GB 1234576A
Authority
GB
United Kingdom
Prior art keywords
specimen
ray
rays
bombarded
aug
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
Other languages
English (en)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from DE19671673039 external-priority patent/DE1673039A1/de
Application filed filed Critical
Publication of GB1234576A publication Critical patent/GB1234576A/en
Expired legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/2209Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material using wavelength dispersive spectroscopy [WDS]
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00Investigating materials by wave or particle radiation
    • G01N2223/07Investigating materials by wave or particle radiation secondary emission
    • G01N2223/076X-ray fluorescence
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00Investigating materials by wave or particle radiation
    • G01N2223/07Investigating materials by wave or particle radiation secondary emission
    • G01N2223/079Investigating materials by wave or particle radiation secondary emission incident electron beam and measuring excited X-rays

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
GB1234576D 1967-08-30 1968-08-29 Expired GB1234576A (cs)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE19671673039 DE1673039A1 (de) 1967-08-30 1967-08-30 Anregung von Proben mit Roentgenstrahlen und/oder Elektronen

Publications (1)

Publication Number Publication Date
GB1234576A true GB1234576A (cs) 1971-06-03

Family

ID=5686515

Family Applications (1)

Application Number Title Priority Date Filing Date
GB1234576D Expired GB1234576A (cs) 1967-08-30 1968-08-29

Country Status (2)

Country Link
FR (1) FR1578532A (cs)
GB (1) GB1234576A (cs)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
NL7806330A (nl) * 1978-06-12 1979-12-14 Philips Nv Roentgenspektrometer.

Also Published As

Publication number Publication date
FR1578532A (cs) 1969-08-14

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Legal Events

Date Code Title Description
PS Patent sealed
PLNP Patent lapsed through nonpayment of renewal fees