GB1234576A - - Google Patents
Info
- Publication number
- GB1234576A GB1234576A GB1234576DA GB1234576A GB 1234576 A GB1234576 A GB 1234576A GB 1234576D A GB1234576D A GB 1234576DA GB 1234576 A GB1234576 A GB 1234576A
- Authority
- GB
- United Kingdom
- Prior art keywords
- specimen
- ray
- rays
- bombarded
- aug
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/2209—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material using wavelength dispersive spectroscopy [WDS]
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/07—Investigating materials by wave or particle radiation secondary emission
- G01N2223/076—X-ray fluorescence
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/07—Investigating materials by wave or particle radiation secondary emission
- G01N2223/079—Investigating materials by wave or particle radiation secondary emission incident electron beam and measuring excited X-rays
Landscapes
- Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE19671673039 DE1673039A1 (de) | 1967-08-30 | 1967-08-30 | Anregung von Proben mit Roentgenstrahlen und/oder Elektronen |
Publications (1)
Publication Number | Publication Date |
---|---|
GB1234576A true GB1234576A (cs) | 1971-06-03 |
Family
ID=5686515
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
GB1234576D Expired GB1234576A (cs) | 1967-08-30 | 1968-08-29 |
Country Status (2)
Country | Link |
---|---|
FR (1) | FR1578532A (cs) |
GB (1) | GB1234576A (cs) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
NL7806330A (nl) * | 1978-06-12 | 1979-12-14 | Philips Nv | Roentgenspektrometer. |
-
1968
- 1968-08-23 FR FR1578532D patent/FR1578532A/fr not_active Expired
- 1968-08-29 GB GB1234576D patent/GB1234576A/en not_active Expired
Also Published As
Publication number | Publication date |
---|---|
FR1578532A (cs) | 1969-08-14 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
PS | Patent sealed | ||
PLNP | Patent lapsed through nonpayment of renewal fees |