GB1151271A - Automatic + X-Axis Detector, Marker, Sorter and Collector for Crystal Wafer Blanks - Google Patents

Automatic + X-Axis Detector, Marker, Sorter and Collector for Crystal Wafer Blanks

Info

Publication number
GB1151271A
GB1151271A GB730167A GB730167A GB1151271A GB 1151271 A GB1151271 A GB 1151271A GB 730167 A GB730167 A GB 730167A GB 730167 A GB730167 A GB 730167A GB 1151271 A GB1151271 A GB 1151271A
Authority
GB
United Kingdom
Prior art keywords
crystal
crystals
axis orientation
axis
photo
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB730167A
Inventor
Robert Birrell
Howard H Aiken
James B Cummins
Maynard W Richards
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Aiken Industries Inc
Original Assignee
Aiken Industries Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Aiken Industries Inc filed Critical Aiken Industries Inc
Priority to GB730167A priority Critical patent/GB1151271A/en
Publication of GB1151271A publication Critical patent/GB1151271A/en
Expired legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00Photometry, e.g. photographic exposure meter
    • G01J1/10Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void
    • G01J1/12Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void using wholly visual means

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Processing Of Stones Or Stones Resemblance Materials (AREA)
  • Crystals, And After-Treatments Of Crystals (AREA)

Abstract

1,151,271. Shoots. AIKEN INDUSTRIES Inc. 15 Feb., 1967, No. 7301/67. Heading B8S. [Also in Division G1] The + X-axis of quartz crystal wafer blanks is detected photo-electrically using polarized light in order that the crystals may be collected together in the same orientation. In one arrangement, Figs. 3 and 4, in which the crystals are sorted and collected into four groups of different + X-axis orientation, the individual crystals are marked to indicate the +X-axis orientation. A crystal CW arrives at the window 70 of the detection station and is held there by a solenoid-operated finger 74 while the - X-axis orientation is detected. This is done by use of a system (shown diagrammatically in Fig. 4) including a light source 188 directing light on to four mirrors 190 so that four light beams are passed through the corners of the crystal CW from beneath the latter. Four pairs of photo-resistive cells 212a-212d are arranged to receive the respective light beams through polarizers. The pairs of cells are connected in a bridge network forming part of the control circuit 214 (detailed in Fig. 13, not shown). Unbalance of the bridge can occur in four ways to cause energization and/or non- energization of solenoids 92 and 106 through SCR's and a timing circuit including a relaxation oscillator for delay purposes, in four different combinations causing actuation and/or non-actuation of blade members 90, and 102 and 104. Thus a crystal CW can be directed into an appropriate branch 62, 64, 66 or 68 (formed as grooves in the sloping board 24). Amotor 136 continuously drives a shaft 133 which, through cams, Figs. 5-7 (not shown), causes stop fingers (156) to be raised periodically in grooves 62-68 to stop any crystal to allow a marker assembly 140 to mark the crystal with the appropriate + X-axis orientation indication, and also causes a crystal, on arrival at the bottom of a groove, to be fed into a magazine 52. When full, a magazine, Figs. 9-12 (not shown), is removed by unscrewing screws 130. An arrangement is also described, Fig. 16 (not shown), in which the grooves in the sloping board are specially shaped to cause rotation, through 90 or 180 degrees, of some of the crystals after release from the detection station, so as to arrange all the crystals in a single + X- axis orientation direction at a single collector station. An arrangement in which there is only a single guide path for blanks, from detection station to collector station, Fig. 17 (not shown), uses a turn-table controlled in accordance with the detector circuit output, to rotate crystals as required so as to all be similarly +X-axis orientated. Instead of using a plurality of light beams in the photo-electric system, a single polarized beam may be used, the crystal being rotated during detection.
GB730167A 1967-02-15 1967-02-15 Automatic + X-Axis Detector, Marker, Sorter and Collector for Crystal Wafer Blanks Expired GB1151271A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
GB730167A GB1151271A (en) 1967-02-15 1967-02-15 Automatic + X-Axis Detector, Marker, Sorter and Collector for Crystal Wafer Blanks

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB730167A GB1151271A (en) 1967-02-15 1967-02-15 Automatic + X-Axis Detector, Marker, Sorter and Collector for Crystal Wafer Blanks

Publications (1)

Publication Number Publication Date
GB1151271A true GB1151271A (en) 1969-05-07

Family

ID=9830497

Family Applications (1)

Application Number Title Priority Date Filing Date
GB730167A Expired GB1151271A (en) 1967-02-15 1967-02-15 Automatic + X-Axis Detector, Marker, Sorter and Collector for Crystal Wafer Blanks

Country Status (1)

Country Link
GB (1) GB1151271A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2003084767A2 (en) * 2002-04-05 2003-10-16 Numerouno Gruppo Di Comunicazione, S.R.L. Verify security documents by means of polarised light
EP1755087A3 (en) * 2005-08-04 2007-10-24 Numerouno Ricerche S.r.L. Method and device for the detection of counterfeit documents and banknotes

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2003084767A2 (en) * 2002-04-05 2003-10-16 Numerouno Gruppo Di Comunicazione, S.R.L. Verify security documents by means of polarised light
WO2003084767A3 (en) * 2002-04-05 2004-02-26 Numerouno Gruppo Di Comunicazi Verify security documents by means of polarised light
EP1755087A3 (en) * 2005-08-04 2007-10-24 Numerouno Ricerche S.r.L. Method and device for the detection of counterfeit documents and banknotes
US7403272B1 (en) 2005-08-04 2008-07-22 Numerouno Ricerche S.R.L. Method and device for the detection of counterfeit documents and banknotes

Similar Documents

Publication Publication Date Title
US4209254A (en) System for monitoring the movements of one or more point sources of luminous radiation
GB1209563A (en) Sorting arrangement
GB1143211A (en) Bottle sorting machine and method
GB1140801A (en) Electromagnetic wave apparatus
US3122237A (en) Electrical apparatus for reading and sorting code bearing elements
US3242485A (en) Infrared acquisition aid for a tracking system
GB1151271A (en) Automatic + X-Axis Detector, Marker, Sorter and Collector for Crystal Wafer Blanks
GB1089636A (en) Improvements in or relating to light deflection systems
US3038079A (en) Semiconductive differential photodetector for two dimensional discrimination
GB844306A (en) Improvements in record card reading devices
US2792175A (en) Card reading station
US3494576A (en) Self-contained and automatic guidance system for directing a missile towards a radiation-emitting target
ES300352A1 (en) Improvements in and relating to the inspection of transparent or translucent containers
GB1063140A (en) Improvements in or relating to tool-setting gauges
JPS5260692A (en) Automatic multi-item analyzer
SE7412408L (en) POLARIZER
JPS57135914A (en) Light flux rotating device
JPS57161721A (en) Polarization eliminating circuit
US3180991A (en) Reticle for an infrared tracking system having groups of spokes and each spoke of each group parallel with the other spoke
JPS51118449A (en) Polarizing prism
COLWELL et al. A new high-efficiency time-of-flight system(High efficiency time of flight system using continuously modulated neutron beam)
GB1055968A (en) Autocollimator
SU360986A1 (en) DEVICE FOR AUTOMATIC POSTER thin
JPS57172732A (en) Relative position detecting device for mask substrate and wafer
JPS57133410A (en) Laser alignment device

Legal Events

Date Code Title Description
PS Patent sealed
PCNP Patent ceased through non-payment of renewal fee