GB1129962A - Improvements in or relating to the assessing of surface profiles - Google Patents

Improvements in or relating to the assessing of surface profiles

Info

Publication number
GB1129962A
GB1129962A GB216665A GB216665A GB1129962A GB 1129962 A GB1129962 A GB 1129962A GB 216665 A GB216665 A GB 216665A GB 216665 A GB216665 A GB 216665A GB 1129962 A GB1129962 A GB 1129962A
Authority
GB
United Kingdom
Prior art keywords
photo
light
signal
mean value
output
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB216665A
Inventor
Arthur Tisso Starr
Peter Frederic Thoma Stillwell
Richard Edmund Reason
John Denzil Barr
Thomas Charles Reeve
Robert Claude Spragg
David John Whitehouse
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Rank Organization Ltd
Original Assignee
Rank Organization Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Rank Organization Ltd filed Critical Rank Organization Ltd
Priority to GB216665A priority Critical patent/GB1129962A/en
Priority to DE19661548302 priority patent/DE1548302A1/en
Priority to CH60966A priority patent/CH484411A/en
Priority to GB1725968A priority patent/GB1168372A/en
Priority to DE19681773268 priority patent/DE1773268A1/en
Priority to CH705768A priority patent/CH506777A/en
Publication of GB1129962A publication Critical patent/GB1129962A/en
Expired legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/30Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
    • G01B11/303Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces using photoelectric detection means
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B7/00Measuring arrangements characterised by the use of electric or magnetic techniques
    • G01B7/34Measuring arrangements characterised by the use of electric or magnetic techniques for measuring roughness or irregularity of surfaces

Abstract

1,129,962. Evaluating surface roughness; photo-electric graph reading. RANK ORGANISATION Ltd. Jan.18, 1966 [Jan. 18,1965; Aug.26, 1965], Nos.2166/65and36673/65. Headings G1A and G1N. The surface roughness of a machined material is measured and analysed electrically to determine the average roughness. As shown (Fig. 6), the surface is scanned by a stylus A driven across the test surface by a motor M1 through rack and pinion 4a. The output from a transducer B is fed to a galvanometer 10, whose mirror 11 reflects the light from a lamp 12 on to a film strip 3 for recording the tracer signal. The film record, comprising a contour line separating dark and clear areas, is fixed in a tank 8, and assessed at station 9, light from lamp 12 is fed through that portion of the strip located between sprockets 5a and 18, firstly to a photo-cell 17, giving a signal corresponding to the original gauge signal, and so to a number of individual photo-cells 16, the light passing through a number of lenses 15 and a light filter 15a whose opacity varies along its length in accordance with a predetermined weighting function (Fig. 8) which is symmetrical about the value measured by photo-cell 17 and with alternating positive and negative parts of diminishing amplitude. The outputs from cells 16, some of which are negative, are algebraically added to determine the mean value, which may be added to the record on strip 3. The two signals may also be combined to estimate the roughness as the deviation from the mean value. In a modification, the weighting filter 15a is replaced by electrical weighting of the output of the photo-cell 16. The tracer output may be recorded on a magnetic tape, and the photo-cells replaced by reproducing heads in association with weighted electrical circuits. In another embodiment (Fig. 15), a lamp 51 produces a slit of light across a moving belt 50 through a transparent electrode 55 fed with the gauge signal. The belt 50 is coated with a photoconductive material which is charged by the light to a voltage determined by the signal voltage on electrode 55, located downstream along the belt are capacitor electrodes 56, 57, 58 shaped in accordance with the desired weighting function, which sum the surface charge over its areas, and add the pick-up voltages algebraically to give an output signal voltage which is the required mean value. The corresponding mid-ordinate value is measured by a narrow strip electrode 59. The mean value may be obtained by feeding the gauge signal through an integrating delay network whose characteristic incorporates the weighting function.
GB216665A 1965-01-18 1965-01-18 Improvements in or relating to the assessing of surface profiles Expired GB1129962A (en)

Priority Applications (6)

Application Number Priority Date Filing Date Title
GB216665A GB1129962A (en) 1965-01-18 1965-01-18 Improvements in or relating to the assessing of surface profiles
DE19661548302 DE1548302A1 (en) 1965-01-18 1966-01-12 Checking device for surface profiles
CH60966A CH484411A (en) 1965-01-18 1966-01-18 Methods of testing surfaces
GB1725968A GB1168372A (en) 1965-01-18 1968-04-10 Improvements in or relating to the Assessing of Surface Profiles
DE19681773268 DE1773268A1 (en) 1965-01-18 1968-04-23 Device for measuring the profile of a surface
CH705768A CH506777A (en) 1965-01-18 1968-05-13 Test device for testing surfaces

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
GB216665A GB1129962A (en) 1965-01-18 1965-01-18 Improvements in or relating to the assessing of surface profiles
GB3667365 1965-08-26

Publications (1)

Publication Number Publication Date
GB1129962A true GB1129962A (en) 1968-10-09

Family

ID=26237325

Family Applications (1)

Application Number Title Priority Date Filing Date
GB216665A Expired GB1129962A (en) 1965-01-18 1965-01-18 Improvements in or relating to the assessing of surface profiles

Country Status (3)

Country Link
CH (1) CH484411A (en)
DE (1) DE1548302A1 (en)
GB (1) GB1129962A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2222886A (en) * 1988-09-19 1990-03-21 Tokyo Seimitsu Co Ltd Method and device for measuring a surface contour eg. roughness

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3630124A1 (en) * 1986-09-04 1988-03-17 Feinpruef Feinmess Und Pruefge OPTICALLY WORKING SURFACE Tester
DE3801297C2 (en) * 1988-01-19 1994-03-10 Lukas Simonyi Manfred Process for automatic detection of the surface structure of a workpiece

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2222886A (en) * 1988-09-19 1990-03-21 Tokyo Seimitsu Co Ltd Method and device for measuring a surface contour eg. roughness
DE3931132A1 (en) * 1988-09-19 1990-03-22 Tokyo Seimitsu Co Ltd METHOD AND DEVICE FOR MEASURING A SURFACE CONTOUR
GB2222886B (en) * 1988-09-19 1992-08-19 Tokyo Seimitsu Co Ltd Method and device for measuring surface roughness

Also Published As

Publication number Publication date
CH484411A (en) 1970-01-15
DE1548302A1 (en) 1969-04-17

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