GB0500987D0 - No title available - Google Patents
No title availableInfo
- Publication number
- GB0500987D0 GB0500987D0 GBGB0500987.3A GB0500987A GB0500987D0 GB 0500987 D0 GB0500987 D0 GB 0500987D0 GB 0500987 A GB0500987 A GB 0500987A GB 0500987 D0 GB0500987 D0 GB 0500987D0
- Authority
- GB
- United Kingdom
- Prior art keywords
- title available
- title
- available
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/70—Determining position or orientation of objects or cameras
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K3/00—Tools, devices, or special appurtenances for soldering, e.g. brazing, or unsoldering, not specially adapted for particular methods
- B23K3/08—Auxiliary devices therefor
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N21/956—Inspecting patterns on the surface of objects
- G01N21/95607—Inspecting patterns on the surface of objects using a comparative method
-
- G06K9/4647—
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/0002—Inspection of images, e.g. flaw detection
- G06T7/0004—Industrial image inspection
-
- G06T7/004—
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
- G06V10/00—Arrangements for image or video recognition or understanding
- G06V10/40—Extraction of image or video features
- G06V10/50—Extraction of image or video features by performing operations within image blocks; by using histograms, e.g. histogram of oriented gradients [HoG]; by summing image-intensity values; Projection analysis
- G06V10/507—Summing image-intensity values; Histogram projection analysis
-
- H05K3/3484—
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/30—Assembling printed circuits with electric components, e.g. with resistor
- H05K3/32—Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits
- H05K3/34—Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits by soldering
- H05K3/3457—Solder materials or compositions; Methods of application thereof
- H05K3/3485—Applying solder paste, slurry or powder
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US10/734,395 US6891967B2 (en) | 1999-05-04 | 2003-12-12 | Systems and methods for detecting defects in printed solder paste |
PCT/US2004/041462 WO2005059823A2 (en) | 2003-12-12 | 2004-12-10 | Systems and methods for detecting defects in printed solder paste |
Publications (3)
Publication Number | Publication Date |
---|---|
GB0500987D0 true GB0500987D0 (en) | 2005-02-23 |
GB2427909A GB2427909A (en) | 2007-01-10 |
GB2427909B GB2427909B (en) | 2007-09-26 |
Family
ID=34227134
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
GB0500987A Expired - Fee Related GB2427909B (en) | 2003-12-12 | 2004-12-10 | Systems and methods for machine vision systems |
Country Status (1)
Country | Link |
---|---|
GB (1) | GB2427909B (en) |
Family Cites Families (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE19825829C2 (en) * | 1998-06-10 | 2000-07-27 | Leica Microsystems | Method for determining the distance P of an edge of a structural element on a substrate |
US6366690B1 (en) * | 1998-07-07 | 2002-04-02 | Applied Materials, Inc. | Pixel based machine for patterned wafers |
-
2004
- 2004-12-10 GB GB0500987A patent/GB2427909B/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
GB2427909A (en) | 2007-01-10 |
GB2427909B (en) | 2007-09-26 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
PCNP | Patent ceased through non-payment of renewal fee |
Effective date: 20191210 |