GB0303697D0 - Measurement technique - Google Patents
Measurement techniqueInfo
- Publication number
- GB0303697D0 GB0303697D0 GBGB0303697.7A GB0303697A GB0303697D0 GB 0303697 D0 GB0303697 D0 GB 0303697D0 GB 0303697 A GB0303697 A GB 0303697A GB 0303697 D0 GB0303697 D0 GB 0303697D0
- Authority
- GB
- United Kingdom
- Prior art keywords
- measurement technique
- measurement
- technique
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
- G01Q40/00—Calibration, e.g. of probes
- G01Q40/02—Calibration standards and methods of fabrication thereof
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Radiology & Medical Imaging (AREA)
- Length Measuring Devices By Optical Means (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GB0303697A GB2401934A (en) | 2003-02-18 | 2003-02-18 | Measurement technique and system based on sub-nano-scale reference patterns |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GB0303697A GB2401934A (en) | 2003-02-18 | 2003-02-18 | Measurement technique and system based on sub-nano-scale reference patterns |
Publications (2)
Publication Number | Publication Date |
---|---|
GB0303697D0 true GB0303697D0 (en) | 2003-03-19 |
GB2401934A GB2401934A (en) | 2004-11-24 |
Family
ID=9953224
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
GB0303697A Withdrawn GB2401934A (en) | 2003-02-18 | 2003-02-18 | Measurement technique and system based on sub-nano-scale reference patterns |
Country Status (1)
Country | Link |
---|---|
GB (1) | GB2401934A (en) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7800761B2 (en) | 2006-04-12 | 2010-09-21 | Massachusetts Institute Of Technology | Infrared interferometric-spatial-phase imaging using backside wafer marks |
CN102889866B (en) * | 2012-09-28 | 2015-10-28 | 西安交通大学 | Length metering source tracing method using Graphene bond distance as mete-wand |
Family Cites Families (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2775464B2 (en) * | 1989-04-27 | 1998-07-16 | キヤノン株式会社 | Position detection device |
WO1992012528A1 (en) * | 1991-01-11 | 1992-07-23 | Hitachi Limited | Surface atom machining method and apparatus |
KR100597014B1 (en) * | 2001-01-10 | 2006-07-06 | 재단법인서울대학교산학협력재단 | The method of generating a pattern using a crystal structure of material |
AU2003211027A1 (en) * | 2002-03-27 | 2003-10-13 | Nanoink, Inc. | Method and apparatus for aligning patterns on a substrate |
-
2003
- 2003-02-18 GB GB0303697A patent/GB2401934A/en not_active Withdrawn
Also Published As
Publication number | Publication date |
---|---|
GB2401934A (en) | 2004-11-24 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
WAP | Application withdrawn, taken to be withdrawn or refused ** after publication under section 16(1) |