GB0124937D0 - Apparatus for detecting defects in semiconductor devices and methods of using the same - Google Patents
Apparatus for detecting defects in semiconductor devices and methods of using the sameInfo
- Publication number
- GB0124937D0 GB0124937D0 GBGB0124937.4A GB0124937A GB0124937D0 GB 0124937 D0 GB0124937 D0 GB 0124937D0 GB 0124937 A GB0124937 A GB 0124937A GB 0124937 D0 GB0124937 D0 GB 0124937D0
- Authority
- GB
- United Kingdom
- Prior art keywords
- methods
- same
- semiconductor devices
- detecting defects
- defects
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 230000007547 defect Effects 0.000 title 1
- 239000004065 semiconductor Substances 0.000 title 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/26—Electron or ion microscopes; Electron or ion diffraction tubes
- H01J37/266—Measurement of magnetic or electric fields in the object; Lorentzmicroscopy
- H01J37/268—Measurement of magnetic or electric fields in the object; Lorentzmicroscopy with scanning beams
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67242—Apparatus for monitoring, sorting or marking
- H01L21/67288—Monitoring of warpage, curvature, damage, defects or the like
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/302—Contactless testing
- G01R31/305—Contactless testing using electron beams
- G01R31/307—Contactless testing using electron beams of integrated circuits
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
- H01L22/10—Measuring as part of the manufacturing process
- H01L22/14—Measuring as part of the manufacturing process for electrical parameters, e.g. resistance, deep-levels, CV, diffusions by electrical means
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/26—Electron or ion microscopes
- H01J2237/28—Scanning microscopes
- H01J2237/2813—Scanning microscopes characterised by the application
- H01J2237/2817—Pattern inspection
Landscapes
- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Computer Hardware Design (AREA)
- General Physics & Mathematics (AREA)
- Physics & Mathematics (AREA)
- Power Engineering (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- General Engineering & Computer Science (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Tests Of Electronic Circuits (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020000070009A KR100351059B1 (en) | 2000-11-23 | 2000-11-23 | apparauts for detecting electrical defect in semiconductor device and electrical defect detection method of semiconductor device using the same |
Publications (3)
Publication Number | Publication Date |
---|---|
GB0124937D0 true GB0124937D0 (en) | 2001-12-05 |
GB2372629A GB2372629A (en) | 2002-08-28 |
GB2372629B GB2372629B (en) | 2003-04-23 |
Family
ID=19700921
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
GB0124937A Expired - Fee Related GB2372629B (en) | 2000-11-23 | 2001-10-17 | Apparatus for detecting defects in semiconductor devices and methods of using the same |
Country Status (7)
Country | Link |
---|---|
JP (1) | JP3833928B2 (en) |
KR (1) | KR100351059B1 (en) |
CN (1) | CN1193419C (en) |
DE (1) | DE10151127A1 (en) |
FR (1) | FR2817621B1 (en) |
GB (1) | GB2372629B (en) |
TW (1) | TW503504B (en) |
Families Citing this family (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN100557431C (en) * | 2002-10-08 | 2009-11-04 | 应用材料以色列公司 | Use the method and the system of X-ray emission monitoring program |
KR100499160B1 (en) * | 2003-01-15 | 2005-07-01 | 삼성전자주식회사 | Method for wafer inspection and apparatus for the same |
US7402801B2 (en) | 2005-04-12 | 2008-07-22 | Umci Ltd | Inspecting method of a defect inspection device |
CN100403508C (en) * | 2005-06-29 | 2008-07-16 | 联华电子股份有限公司 | Defect detection component and detecting and producing method thereof |
KR100744234B1 (en) * | 2005-12-28 | 2007-07-30 | 동부일렉트로닉스 주식회사 | Method for inspection well to well junction leakage |
CN102193062B (en) * | 2010-03-19 | 2013-07-31 | 中芯国际集成电路制造(北京)有限公司 | Method for detecting source leakage defect of PMOS (P-channel metal oxide semiconductor) device |
CN101881687A (en) * | 2010-05-28 | 2010-11-10 | 上海宏力半导体制造有限公司 | Leak detection device of semiconductor manufacturing platform as well as use method and platform thereof |
CN103456655B (en) * | 2012-05-30 | 2016-03-23 | 南亚科技股份有限公司 | The detection method of semiconductor blind hole |
JP2015070195A (en) * | 2013-09-30 | 2015-04-13 | ソニー株式会社 | Semiconductor device and test method |
KR102575017B1 (en) * | 2016-11-17 | 2023-09-05 | 삼성디스플레이 주식회사 | Detecting method for defect of glass substrate |
KR102324622B1 (en) * | 2018-12-12 | 2021-11-12 | 어플라이드 머티리얼즈 이스라엘 리미티드 | Process monitoring |
Family Cites Families (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4415851A (en) * | 1981-05-26 | 1983-11-15 | International Business Machines Corporation | System for contactless testing of multi-layer ceramics |
EP0504944B1 (en) * | 1991-03-22 | 1998-09-23 | Nec Corporation | Method of analyzing fault using electron beam |
JPH09320505A (en) * | 1996-03-29 | 1997-12-12 | Hitachi Ltd | Electron beam type inspecting method, device therefor, manufacture of semiconductor, and its manufacturing line |
JPH09312318A (en) * | 1996-05-21 | 1997-12-02 | Hitachi Ltd | Pattern defect inspection device |
JP2907146B2 (en) * | 1996-09-11 | 1999-06-21 | 日本電気株式会社 | Method and apparatus for searching for specific part of memory LSI |
US6504393B1 (en) * | 1997-07-15 | 2003-01-07 | Applied Materials, Inc. | Methods and apparatus for testing semiconductor and integrated circuit structures |
KR20000027700A (en) * | 1998-10-29 | 2000-05-15 | 이창세 | Method for measuring crystal defect affecting electric characteristics of wafer |
US6232787B1 (en) * | 1999-01-08 | 2001-05-15 | Schlumberger Technologies, Inc. | Microstructure defect detection |
-
2000
- 2000-11-23 KR KR1020000070009A patent/KR100351059B1/en not_active IP Right Cessation
-
2001
- 2001-09-25 TW TW090123595A patent/TW503504B/en not_active IP Right Cessation
- 2001-10-16 CN CNB011364254A patent/CN1193419C/en not_active Expired - Fee Related
- 2001-10-16 FR FR0113329A patent/FR2817621B1/en not_active Expired - Fee Related
- 2001-10-17 GB GB0124937A patent/GB2372629B/en not_active Expired - Fee Related
- 2001-10-17 DE DE10151127A patent/DE10151127A1/en not_active Withdrawn
- 2001-11-15 JP JP2001350215A patent/JP3833928B2/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
FR2817621A1 (en) | 2002-06-07 |
DE10151127A1 (en) | 2002-06-06 |
TW503504B (en) | 2002-09-21 |
GB2372629B (en) | 2003-04-23 |
CN1193419C (en) | 2005-03-16 |
JP3833928B2 (en) | 2006-10-18 |
GB2372629A (en) | 2002-08-28 |
FR2817621B1 (en) | 2005-08-05 |
KR20020040092A (en) | 2002-05-30 |
CN1355558A (en) | 2002-06-26 |
JP2002228608A (en) | 2002-08-14 |
KR100351059B1 (en) | 2002-09-05 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
EP1261022A4 (en) | Apparatus for detecting defect in device and method of detecting defect | |
IL151332A0 (en) | Method and apparatus for indicating the conditions in an absorbent article | |
AU4351601A (en) | Wafer processing apparatus and method | |
AU9160801A (en) | Device and method for measuring angles | |
GB0300391D0 (en) | Apparatus and method for investigating semiconductor wafers | |
DE60036825D1 (en) | Wafer polishing apparatus and method | |
EP1308992A4 (en) | Device and method for processing substrate | |
GB2383422B (en) | Method and apparatus for well testing | |
EP1443322A4 (en) | Concentration measuring method and concentration measuring device | |
AU2002353481A1 (en) | Method and apparatus for measuring stress in semiconductor wafers | |
SG102568A1 (en) | Semiconductor device test apparatus | |
EP1130626A3 (en) | Method and apparatus for manufacturing semiconductor device | |
EP1462789A4 (en) | Method and device for inspecting tire | |
EP1296359A4 (en) | Device and method for managing semiconductor producing apparatus | |
SG106081A1 (en) | Apparatus and method for testing semiconductor devices | |
GB2382136B (en) | Method and apparatus for flow measurement | |
AU2001273766A1 (en) | Device and method for cleaning articles used in the production of semiconductor components | |
EP1285219A4 (en) | Area measurement device and method | |
GB2372629B (en) | Apparatus for detecting defects in semiconductor devices and methods of using the same | |
SG97186A1 (en) | Method and apparatus for inspecting components | |
SG87166A1 (en) | Method for producing semiconductor device and apparatus usable therein | |
GB2362757B (en) | Method and apparatus for manufacturing semiconductor device | |
GB0100248D0 (en) | Method and apparatus for inspecting an object | |
SG119154A1 (en) | Apparatus and method for testing semiconductor devices | |
AU2002352036A8 (en) | Method and device for the continuous testing of materials |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
PCNP | Patent ceased through non-payment of renewal fee |
Effective date: 20121017 |