GB0008221D0 - Non-destructive testing probe and method - Google Patents
Non-destructive testing probe and methodInfo
- Publication number
- GB0008221D0 GB0008221D0 GB0008221A GB0008221A GB0008221D0 GB 0008221 D0 GB0008221 D0 GB 0008221D0 GB 0008221 A GB0008221 A GB 0008221A GB 0008221 A GB0008221 A GB 0008221A GB 0008221 D0 GB0008221 D0 GB 0008221D0
- Authority
- GB
- United Kingdom
- Prior art keywords
- destructive testing
- testing probe
- probe
- destructive
- testing
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Ceased
Links
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GB0008221A GB0008221D0 (en) | 2000-04-05 | 2000-04-05 | Non-destructive testing probe and method |
GB0013715A GB2361065A (en) | 2000-04-05 | 2000-06-07 | Flaw detecting probe and method |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GB0008221A GB0008221D0 (en) | 2000-04-05 | 2000-04-05 | Non-destructive testing probe and method |
Publications (1)
Publication Number | Publication Date |
---|---|
GB0008221D0 true GB0008221D0 (en) | 2000-05-24 |
Family
ID=9889142
Family Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
GB0008221A Ceased GB0008221D0 (en) | 2000-04-05 | 2000-04-05 | Non-destructive testing probe and method |
GB0013715A Withdrawn GB2361065A (en) | 2000-04-05 | 2000-06-07 | Flaw detecting probe and method |
Family Applications After (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
GB0013715A Withdrawn GB2361065A (en) | 2000-04-05 | 2000-06-07 | Flaw detecting probe and method |
Country Status (1)
Country | Link |
---|---|
GB (2) | GB0008221D0 (en) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2007088395A1 (en) | 2006-02-03 | 2007-08-09 | Bae Systems Plc | Improvements relating to damage sensors |
Family Cites Families (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS57179656A (en) * | 1981-04-28 | 1982-11-05 | Mitsubishi Heavy Ind Ltd | Eddy current test method |
FR2538116A1 (en) * | 1982-12-21 | 1984-06-22 | Cgr | DEVICE FOR MEASURING STRUCTURAL DEFECTS OF GOING OBJECTS |
DE3517114A1 (en) * | 1985-05-11 | 1986-11-13 | Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V., 8000 München | Eddy-current method for studying stress corrosion cracking in austenitic components, and appliance for implementing the method |
JPS62112053A (en) * | 1985-11-08 | 1987-05-23 | Toshiba Corp | Flaw inspection device |
US4855677A (en) * | 1988-03-11 | 1989-08-08 | Westinghouse Electric Corp. | Multiple coil eddy current probe and method of flaw detection |
JPH08334496A (en) * | 1995-06-07 | 1996-12-17 | Sumitomo Chem Co Ltd | Prove for flaw detection |
-
2000
- 2000-04-05 GB GB0008221A patent/GB0008221D0/en not_active Ceased
- 2000-06-07 GB GB0013715A patent/GB2361065A/en not_active Withdrawn
Also Published As
Publication number | Publication date |
---|---|
GB2361065A (en) | 2001-10-10 |
GB0013715D0 (en) | 2000-07-26 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
AT | Applications terminated before publication under section 16(1) |