GB0008221D0 - Non-destructive testing probe and method - Google Patents

Non-destructive testing probe and method

Info

Publication number
GB0008221D0
GB0008221D0 GB0008221A GB0008221A GB0008221D0 GB 0008221 D0 GB0008221 D0 GB 0008221D0 GB 0008221 A GB0008221 A GB 0008221A GB 0008221 A GB0008221 A GB 0008221A GB 0008221 D0 GB0008221 D0 GB 0008221D0
Authority
GB
United Kingdom
Prior art keywords
destructive testing
testing probe
probe
destructive
testing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
GB0008221A
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Individual
Original Assignee
Individual
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Individual filed Critical Individual
Priority to GB0008221A priority Critical patent/GB0008221D0/en
Publication of GB0008221D0 publication Critical patent/GB0008221D0/en
Priority to GB0013715A priority patent/GB2361065A/en
Ceased legal-status Critical Current

Links

GB0008221A 2000-04-05 2000-04-05 Non-destructive testing probe and method Ceased GB0008221D0 (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
GB0008221A GB0008221D0 (en) 2000-04-05 2000-04-05 Non-destructive testing probe and method
GB0013715A GB2361065A (en) 2000-04-05 2000-06-07 Flaw detecting probe and method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB0008221A GB0008221D0 (en) 2000-04-05 2000-04-05 Non-destructive testing probe and method

Publications (1)

Publication Number Publication Date
GB0008221D0 true GB0008221D0 (en) 2000-05-24

Family

ID=9889142

Family Applications (2)

Application Number Title Priority Date Filing Date
GB0008221A Ceased GB0008221D0 (en) 2000-04-05 2000-04-05 Non-destructive testing probe and method
GB0013715A Withdrawn GB2361065A (en) 2000-04-05 2000-06-07 Flaw detecting probe and method

Family Applications After (1)

Application Number Title Priority Date Filing Date
GB0013715A Withdrawn GB2361065A (en) 2000-04-05 2000-06-07 Flaw detecting probe and method

Country Status (1)

Country Link
GB (2) GB0008221D0 (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2007088395A1 (en) 2006-02-03 2007-08-09 Bae Systems Plc Improvements relating to damage sensors

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57179656A (en) * 1981-04-28 1982-11-05 Mitsubishi Heavy Ind Ltd Eddy current test method
FR2538116A1 (en) * 1982-12-21 1984-06-22 Cgr DEVICE FOR MEASURING STRUCTURAL DEFECTS OF GOING OBJECTS
DE3517114A1 (en) * 1985-05-11 1986-11-13 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V., 8000 München Eddy-current method for studying stress corrosion cracking in austenitic components, and appliance for implementing the method
JPS62112053A (en) * 1985-11-08 1987-05-23 Toshiba Corp Flaw inspection device
US4855677A (en) * 1988-03-11 1989-08-08 Westinghouse Electric Corp. Multiple coil eddy current probe and method of flaw detection
JPH08334496A (en) * 1995-06-07 1996-12-17 Sumitomo Chem Co Ltd Prove for flaw detection

Also Published As

Publication number Publication date
GB2361065A (en) 2001-10-10
GB0013715D0 (en) 2000-07-26

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Legal Events

Date Code Title Description
AT Applications terminated before publication under section 16(1)