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G02B21/082—Condensers for incident illumination only
G—PHYSICS
G01—MEASURING; TESTING
G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
G01B11/00—Measuring arrangements characterised by the use of optical techniques
G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
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FR752247D1932-03-101933-03-10Procédé d'examen microscopique de la constitution des surfaces et instrument destiné à cet examen
ExpiredFR752247A
(fr)