FR3082052B1 - Dispositif electronique integre destine a fonctionner dans des environnements a temperature variable - Google Patents

Dispositif electronique integre destine a fonctionner dans des environnements a temperature variable Download PDF

Info

Publication number
FR3082052B1
FR3082052B1 FR1854829A FR1854829A FR3082052B1 FR 3082052 B1 FR3082052 B1 FR 3082052B1 FR 1854829 A FR1854829 A FR 1854829A FR 1854829 A FR1854829 A FR 1854829A FR 3082052 B1 FR3082052 B1 FR 3082052B1
Authority
FR
France
Prior art keywords
voltage
terminal
electronic device
integrated electronic
temperature environments
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
FR1854829A
Other languages
English (en)
Other versions
FR3082052A1 (fr
Inventor
Philippe Galy
Renan LETHIECQ
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
STMicroelectronics SA
Original Assignee
STMicroelectronics SA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by STMicroelectronics SA filed Critical STMicroelectronics SA
Priority to FR1854829A priority Critical patent/FR3082052B1/fr
Priority to US16/429,544 priority patent/US10659034B2/en
Priority to CN201920821398.3U priority patent/CN209993598U/zh
Priority to CN201910475230.6A priority patent/CN110556372A/zh
Publication of FR3082052A1 publication Critical patent/FR3082052A1/fr
Application granted granted Critical
Publication of FR3082052B1 publication Critical patent/FR3082052B1/fr
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
    • H01L27/04—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body
    • H01L27/06—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including a plurality of individual components in a non-repetitive configuration
    • H01L27/07—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including a plurality of individual components in a non-repetitive configuration the components having an active region in common
    • H01L27/0705—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including a plurality of individual components in a non-repetitive configuration the components having an active region in common comprising components of the field effect type
    • H01L27/0727—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including a plurality of individual components in a non-repetitive configuration the components having an active region in common comprising components of the field effect type in combination with diodes, or capacitors or resistors
    • H01L27/0738—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including a plurality of individual components in a non-repetitive configuration the components having an active region in common comprising components of the field effect type in combination with diodes, or capacitors or resistors in combination with resistors only
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
    • H01L27/0203—Particular design considerations for integrated circuits
    • H01L27/0248—Particular design considerations for integrated circuits for electrical or thermal protection, e.g. electrostatic discharge [ESD] protection
    • H01L27/0251—Particular design considerations for integrated circuits for electrical or thermal protection, e.g. electrostatic discharge [ESD] protection for MOS devices
    • H01L27/0296—Particular design considerations for integrated circuits for electrical or thermal protection, e.g. electrostatic discharge [ESD] protection for MOS devices involving a specific disposition of the protective devices
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
    • H01L27/12—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being other than a semiconductor body, e.g. an insulating body
    • H01L27/1203—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being other than a semiconductor body, e.g. an insulating body the substrate comprising an insulating body on a semiconductor body, e.g. SOI
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
    • H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
    • H01L29/76—Unipolar devices, e.g. field effect transistors
    • H01L29/772—Field effect transistors
    • H01L29/78—Field effect transistors with field effect produced by an insulated gate
    • H01L29/786—Thin film transistors, i.e. transistors with a channel being at least partly a thin film
    • H01L29/78606—Thin film transistors, i.e. transistors with a channel being at least partly a thin film with supplementary region or layer in the thin film or in the insulated bulk substrate supporting it for controlling or increasing the safety of the device
    • H01L29/78618—Thin film transistors, i.e. transistors with a channel being at least partly a thin film with supplementary region or layer in the thin film or in the insulated bulk substrate supporting it for controlling or increasing the safety of the device characterised by the drain or the source properties, e.g. the doping structure, the composition, the sectional shape or the contact structure
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
    • H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
    • H01L29/76—Unipolar devices, e.g. field effect transistors
    • H01L29/772—Field effect transistors
    • H01L29/78—Field effect transistors with field effect produced by an insulated gate
    • H01L29/786—Thin film transistors, i.e. transistors with a channel being at least partly a thin film
    • H01L29/78606—Thin film transistors, i.e. transistors with a channel being at least partly a thin film with supplementary region or layer in the thin film or in the insulated bulk substrate supporting it for controlling or increasing the safety of the device
    • H01L29/78639—Thin film transistors, i.e. transistors with a channel being at least partly a thin film with supplementary region or layer in the thin film or in the insulated bulk substrate supporting it for controlling or increasing the safety of the device with a drain or source connected to a bulk conducting substrate
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
    • H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
    • H01L29/76—Unipolar devices, e.g. field effect transistors
    • H01L29/772—Field effect transistors
    • H01L29/78—Field effect transistors with field effect produced by an insulated gate
    • H01L29/786—Thin film transistors, i.e. transistors with a channel being at least partly a thin film
    • H01L29/78645—Thin film transistors, i.e. transistors with a channel being at least partly a thin film with multiple gate
    • H01L29/78648—Thin film transistors, i.e. transistors with a channel being at least partly a thin film with multiple gate arranged on opposing sides of the channel
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
    • H03K17/14—Modifications for compensating variations of physical values, e.g. of temperature
    • H03K17/145—Modifications for compensating variations of physical values, e.g. of temperature in field-effect transistor switches
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
    • H03K17/51—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used
    • H03K17/56—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used by the use, as active elements, of semiconductor devices
    • H03K17/687—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used by the use, as active elements, of semiconductor devices the devices being field-effect transistors
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K3/00—Circuits for generating electric pulses; Monostable, bistable or multistable circuits
    • H03K3/02—Generators characterised by the type of circuit or by the means used for producing pulses
    • H03K3/353—Generators characterised by the type of circuit or by the means used for producing pulses by the use, as active elements, of field-effect transistors with internal or external positive feedback
    • H03K3/356—Bistable circuits
    • H03K3/356017—Bistable circuits using additional transistors in the input circuit
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K2217/00—Indexing scheme related to electronic switching or gating, i.e. not by contact-making or -breaking covered by H03K17/00
    • H03K2217/0018—Special modifications or use of the back gate voltage of a FET

Landscapes

  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Ceramic Engineering (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)

Abstract

Dispositif électronique intégré, comprenant un substrat de type silicium sur isolant et au moins un transistor MOS (TR) réalisé dans et sur ledit substrat, et comprenant une région de grille (G) configurée pour recevoir une tension de commande, une grille arrière (BG) configurée pour recevoir une tension d'ajustement, et dans lequel la région source (S) comporte une première borne (B1) destinée à être reliée à une tension de référence et une deuxième borne (B2) réalisées de part et d'autre d'une portion résistive (Rs) de la région de source (S), la première borne (B1) étant configurée pour délivrer une tension dont la valeur est représentative de la température du dispositif (DIS), le dispositif (DIS) comportant des moyens d'ajustement (MA) configurés pour délivrer sur la grille arrière (BG), une tension d'ajustement dont la valeur dépend de la valeur de la tension de commande et de la valeur de la tension délivrée par la première borne (B1).
FR1854829A 2018-06-04 2018-06-04 Dispositif electronique integre destine a fonctionner dans des environnements a temperature variable Expired - Fee Related FR3082052B1 (fr)

Priority Applications (4)

Application Number Priority Date Filing Date Title
FR1854829A FR3082052B1 (fr) 2018-06-04 2018-06-04 Dispositif electronique integre destine a fonctionner dans des environnements a temperature variable
US16/429,544 US10659034B2 (en) 2018-06-04 2019-06-03 Integrated electronic device suitable for operation in variable-temperature environments
CN201920821398.3U CN209993598U (zh) 2018-06-04 2019-06-03 集成电子器件
CN201910475230.6A CN110556372A (zh) 2018-06-04 2019-06-03 适用于在变温环境下操作的集成电子器件

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FR1854829 2018-06-04
FR1854829A FR3082052B1 (fr) 2018-06-04 2018-06-04 Dispositif electronique integre destine a fonctionner dans des environnements a temperature variable

Publications (2)

Publication Number Publication Date
FR3082052A1 FR3082052A1 (fr) 2019-12-06
FR3082052B1 true FR3082052B1 (fr) 2020-06-26

Family

ID=63312076

Family Applications (1)

Application Number Title Priority Date Filing Date
FR1854829A Expired - Fee Related FR3082052B1 (fr) 2018-06-04 2018-06-04 Dispositif electronique integre destine a fonctionner dans des environnements a temperature variable

Country Status (3)

Country Link
US (1) US10659034B2 (fr)
CN (2) CN209993598U (fr)
FR (1) FR3082052B1 (fr)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR3082052B1 (fr) * 2018-06-04 2020-06-26 Stmicroelectronics Sa Dispositif electronique integre destine a fonctionner dans des environnements a temperature variable

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005260658A (ja) * 2004-03-12 2005-09-22 Nec Electronics Corp 半導体装置
CN103098198B (zh) * 2010-09-03 2015-04-22 三菱电机株式会社 半导体装置
JP5674687B2 (ja) * 2012-01-17 2015-02-25 株式会社東芝 スイッチ回路、および電力供給装置
JP6126949B2 (ja) * 2013-09-02 2017-05-10 ルネサスエレクトロニクス株式会社 温度センサ
US9837439B1 (en) * 2016-08-12 2017-12-05 Globalfoundries Inc. Compensation of temperature effects in semiconductor device structures
FR3082052B1 (fr) * 2018-06-04 2020-06-26 Stmicroelectronics Sa Dispositif electronique integre destine a fonctionner dans des environnements a temperature variable

Also Published As

Publication number Publication date
CN110556372A (zh) 2019-12-10
US20190372568A1 (en) 2019-12-05
US10659034B2 (en) 2020-05-19
CN209993598U (zh) 2020-01-24
FR3082052A1 (fr) 2019-12-06

Similar Documents

Publication Publication Date Title
US4730228A (en) Overtemperature detection of power semiconductor components
CH642451A5 (fr) Dispositif detecteur de temperature.
US20190123556A1 (en) Bidirectional precision surge clamp with near-zero dynamic resistance and ultra-low leakage current
EP0773437A3 (fr) Capteur de température et utilisations de ce capteur
JPH075225A (ja) 金属・酸化物・半導体電界効果トランジスタのドレイン電流を監視する回路構造体
FR2901634A1 (fr) Procede et dispositif de mesure de temperature de jonction d'un composant electronique.
FR3082052B1 (fr) Dispositif electronique integre destine a fonctionner dans des environnements a temperature variable
EP1566717A1 (fr) Dispositif de génération d'une tension électrique de référence de précision améliorée et circuit intégré électronique correspondant
FR2672749A1 (fr) Amplificateur operationnel a transconductance a grande excursion de mode commun.
FR2543376A1 (fr) Convertisseur tension-courant de haute precision, en particulier pour basses tensions d'alimentation
US20220216867A1 (en) Electronic Circuit and Sensor System
EP2913849B1 (fr) Dispositif electronique avec transistor hemt polarisé en inverse
US7368784B2 (en) Thermal protection device for an integrated power MOS
US7705661B2 (en) Current control apparatus applied to transistor
FR2896643B1 (fr) Dispositif de commande d'un transistor mos
JP2014055933A (ja) 半導体物理量センサおよびその製造方法
FR2683353A1 (fr) Multiplicateur analogique mosfet.
JP3764848B2 (ja) 半導体装置
US5864230A (en) Variation-compensated bias current generator
JP3982090B2 (ja) 半導体イオンセンサ
FR2688904A1 (fr) Circuit de generation de tension de reference.
FR2875335A1 (fr) Circuit electronique a double alimentation et a moyens de protection contre les claquages, et moyens de protection correspondants
US6304121B1 (en) Process strength indicator
JPH08139200A (ja) トランジスタ・ゲート駆動電圧発生回路及びそのトランジスタの製造方法
EP0143038A1 (fr) Dispositif de protection contre des courts-circuits dans une matrice de composants électroniques

Legal Events

Date Code Title Description
PLFP Fee payment

Year of fee payment: 2

PLSC Publication of the preliminary search report

Effective date: 20191206

PLFP Fee payment

Year of fee payment: 3

ST Notification of lapse

Effective date: 20220205