FR3052573B1 - Procede et systeme de determination de la consommation dynamique d'un module au sein d'un dispositif electronique, par exemple un systeme sur puce - Google Patents

Procede et systeme de determination de la consommation dynamique d'un module au sein d'un dispositif electronique, par exemple un systeme sur puce Download PDF

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Publication number
FR3052573B1
FR3052573B1 FR1655364A FR1655364A FR3052573B1 FR 3052573 B1 FR3052573 B1 FR 3052573B1 FR 1655364 A FR1655364 A FR 1655364A FR 1655364 A FR1655364 A FR 1655364A FR 3052573 B1 FR3052573 B1 FR 3052573B1
Authority
FR
France
Prior art keywords
chip
module
determining
electronic device
dynamic consumption
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
FR1655364A
Other languages
English (en)
Other versions
FR3052573A1 (fr
Inventor
Bruno Delplanque
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
STMicroelectronics SA
Original Assignee
STMicroelectronics SA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by STMicroelectronics SA filed Critical STMicroelectronics SA
Priority to FR1655364A priority Critical patent/FR3052573B1/fr
Priority to US15/357,244 priority patent/US10145870B2/en
Publication of FR3052573A1 publication Critical patent/FR3052573A1/fr
Application granted granted Critical
Publication of FR3052573B1 publication Critical patent/FR3052573B1/fr
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R22/00—Arrangements for measuring time integral of electric power or current, e.g. electricity meters
    • G01R22/06—Arrangements for measuring time integral of electric power or current, e.g. electricity meters by electronic methods
    • G01R22/10—Arrangements for measuring time integral of electric power or current, e.g. electricity meters by electronic methods using digital techniques
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31721—Power aspects, e.g. power supplies for test circuits, power saving during test
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31727—Clock circuits aspects, e.g. test clock circuit details, timing aspects for signal generation, circuits for testing clocks
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F1/00—Details not covered by groups G06F3/00 - G06F13/00 and G06F21/00
    • G06F1/26—Power supply means, e.g. regulation thereof
    • G06F1/32—Means for saving power
    • G06F1/3203—Power management, i.e. event-based initiation of a power-saving mode
    • G06F1/3234—Power saving characterised by the action undertaken
    • G06F1/324—Power saving characterised by the action undertaken by lowering clock frequency
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R21/00—Arrangements for measuring electric power or power factor
    • G01R21/133—Arrangements for measuring electric power or power factor by using digital technique
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04L—TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
    • H04L7/00—Arrangements for synchronising receiver with transmitter
    • H04L7/0008—Synchronisation information channels, e.g. clock distribution lines
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02D—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN INFORMATION AND COMMUNICATION TECHNOLOGIES [ICT], I.E. INFORMATION AND COMMUNICATION TECHNOLOGIES AIMING AT THE REDUCTION OF THEIR OWN ENERGY USE
    • Y02D10/00—Energy efficient computing, e.g. low power processors, power management or thermal management

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Power Engineering (AREA)
  • Tests Of Electronic Circuits (AREA)
FR1655364A 2016-06-10 2016-06-10 Procede et systeme de determination de la consommation dynamique d'un module au sein d'un dispositif electronique, par exemple un systeme sur puce Expired - Fee Related FR3052573B1 (fr)

Priority Applications (2)

Application Number Priority Date Filing Date Title
FR1655364A FR3052573B1 (fr) 2016-06-10 2016-06-10 Procede et systeme de determination de la consommation dynamique d'un module au sein d'un dispositif electronique, par exemple un systeme sur puce
US15/357,244 US10145870B2 (en) 2016-06-10 2016-11-21 Method and system for determining the dynamic consumption of a module within an electronic device such as a system on chip

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FR1655364A FR3052573B1 (fr) 2016-06-10 2016-06-10 Procede et systeme de determination de la consommation dynamique d'un module au sein d'un dispositif electronique, par exemple un systeme sur puce
FR1655364 2016-06-10

Publications (2)

Publication Number Publication Date
FR3052573A1 FR3052573A1 (fr) 2017-12-15
FR3052573B1 true FR3052573B1 (fr) 2018-06-15

Family

ID=56557823

Family Applications (1)

Application Number Title Priority Date Filing Date
FR1655364A Expired - Fee Related FR3052573B1 (fr) 2016-06-10 2016-06-10 Procede et systeme de determination de la consommation dynamique d'un module au sein d'un dispositif electronique, par exemple un systeme sur puce

Country Status (2)

Country Link
US (1) US10145870B2 (fr)
FR (1) FR3052573B1 (fr)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10862465B1 (en) * 2019-09-02 2020-12-08 Quantum Machines Quantum controller architecture

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7138824B1 (en) * 2004-05-10 2006-11-21 Actel Corporation Integrated multi-function analog circuit including voltage, current, and temperature monitor and gate-driver circuit blocks
US8909948B2 (en) * 2008-12-05 2014-12-09 Stmicroelectronics International N.V. On-chip power management
US8868956B1 (en) * 2009-12-16 2014-10-21 Applied Micro Circuits Corporation System-on-chip with feedback loop for processor frequency control
US8689023B2 (en) * 2011-10-17 2014-04-01 Freescale Semiconductor, Inc. Digital logic controller for regulating voltage of a system on chip
KR102001414B1 (ko) * 2012-09-27 2019-07-18 삼성전자주식회사 데이터 트랜잭션에 따라 전력공급을 제어하는 시스템-온-칩 및 그 동작방법
US20150212152A1 (en) * 2014-01-24 2015-07-30 Texas Instruments Incorporated Testing of integrated circuits during at-speed mode of operation

Also Published As

Publication number Publication date
FR3052573A1 (fr) 2017-12-15
US10145870B2 (en) 2018-12-04
US20170356938A1 (en) 2017-12-14

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