FR3004262B1 - Procede d'etude de la fiabilite en temperature d'un composant electronique - Google Patents
Procede d'etude de la fiabilite en temperature d'un composant electroniqueInfo
- Publication number
- FR3004262B1 FR3004262B1 FR1353184A FR1353184A FR3004262B1 FR 3004262 B1 FR3004262 B1 FR 3004262B1 FR 1353184 A FR1353184 A FR 1353184A FR 1353184 A FR1353184 A FR 1353184A FR 3004262 B1 FR3004262 B1 FR 3004262B1
- Authority
- FR
- France
- Prior art keywords
- investigating
- electronic component
- temperature reliability
- reliability
- temperature
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2855—Environmental, reliability or burn-in testing
- G01R31/2856—Internal circuit aspects, e.g. built-in test features; Test chips; Measuring material aspects, e.g. electro migration [EM]
- G01R31/2858—Measuring of material aspects, e.g. electro-migration [EM], hot carrier injection
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2855—Environmental, reliability or burn-in testing
- G01R31/2872—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation
- G01R31/2874—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation related to temperature
- G01R31/2875—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation related to temperature related to heating
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/302—Contactless testing
- G01R31/308—Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation
- G01R31/311—Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation of integrated circuits
Landscapes
- Engineering & Computer Science (AREA)
- Environmental & Geological Engineering (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Toxicology (AREA)
- Cooling Or The Like Of Semiconductors Or Solid State Devices (AREA)
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR1353184A FR3004262B1 (fr) | 2013-04-09 | 2013-04-09 | Procede d'etude de la fiabilite en temperature d'un composant electronique |
PCT/EP2014/055257 WO2014166701A1 (fr) | 2013-04-09 | 2014-03-17 | Procede d'etude de la fiabilite en temperature d'un composant electronique |
EP14712244.4A EP2984494A1 (de) | 2013-04-09 | 2014-03-17 | Verfahren zur untersuchung der temperaturzuverlässigkeit eines elektronischen bauelements |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR1353184A FR3004262B1 (fr) | 2013-04-09 | 2013-04-09 | Procede d'etude de la fiabilite en temperature d'un composant electronique |
Publications (2)
Publication Number | Publication Date |
---|---|
FR3004262A1 FR3004262A1 (fr) | 2014-10-10 |
FR3004262B1 true FR3004262B1 (fr) | 2015-05-15 |
Family
ID=49274731
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
FR1353184A Expired - Fee Related FR3004262B1 (fr) | 2013-04-09 | 2013-04-09 | Procede d'etude de la fiabilite en temperature d'un composant electronique |
Country Status (3)
Country | Link |
---|---|
EP (1) | EP2984494A1 (de) |
FR (1) | FR3004262B1 (de) |
WO (1) | WO2014166701A1 (de) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN114152863B (zh) * | 2021-11-27 | 2023-12-08 | 北京工业大学 | 一种智能可控温的GaN功率循环实验装置 |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6078183A (en) * | 1998-03-03 | 2000-06-20 | Sandia Corporation | Thermally-induced voltage alteration for integrated circuit analysis |
US6483326B1 (en) * | 1999-08-10 | 2002-11-19 | Advanced Micro Devices, Inc. | Localized heating for defect isolation during die operation |
FR2959018B1 (fr) * | 2010-04-20 | 2012-08-31 | European Aeronautic Defence & Space Co Eads France | Procedes et dispositifs de mise sous contrainte d'un circuit integre |
-
2013
- 2013-04-09 FR FR1353184A patent/FR3004262B1/fr not_active Expired - Fee Related
-
2014
- 2014-03-17 WO PCT/EP2014/055257 patent/WO2014166701A1/fr active Application Filing
- 2014-03-17 EP EP14712244.4A patent/EP2984494A1/de not_active Withdrawn
Also Published As
Publication number | Publication date |
---|---|
WO2014166701A1 (fr) | 2014-10-16 |
EP2984494A1 (de) | 2016-02-17 |
FR3004262A1 (fr) | 2014-10-10 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
PLFP | Fee payment |
Year of fee payment: 4 |
|
PLFP | Fee payment |
Year of fee payment: 5 |
|
PLFP | Fee payment |
Year of fee payment: 6 |
|
PLFP | Fee payment |
Year of fee payment: 7 |
|
PLFP | Fee payment |
Year of fee payment: 8 |
|
PLFP | Fee payment |
Year of fee payment: 9 |
|
ST | Notification of lapse |
Effective date: 20221205 |