FR2940458B1 - Dispositif et procede pour la caracterisation de composants electriques ou electroniques. - Google Patents
Dispositif et procede pour la caracterisation de composants electriques ou electroniques.Info
- Publication number
- FR2940458B1 FR2940458B1 FR0807450A FR0807450A FR2940458B1 FR 2940458 B1 FR2940458 B1 FR 2940458B1 FR 0807450 A FR0807450 A FR 0807450A FR 0807450 A FR0807450 A FR 0807450A FR 2940458 B1 FR2940458 B1 FR 2940458B1
- Authority
- FR
- France
- Prior art keywords
- characterization
- electric
- electronic components
- electronic
- components
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/28—Measuring attenuation, gain, phase shift or derived characteristics of electric four pole networks, i.e. two-port networks; Measuring transient response
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
- G01R35/005—Calibrating; Standards or reference devices, e.g. voltage or resistance standards, "golden" references
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measurement Of Resistance Or Impedance (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR0807450A FR2940458B1 (fr) | 2008-12-24 | 2008-12-24 | Dispositif et procede pour la caracterisation de composants electriques ou electroniques. |
EP09804285A EP2382480A1 (fr) | 2008-12-24 | 2009-01-22 | Dispositif pour la caracterisation de composants electriques ou electroniques |
PCT/FR2009/001472 WO2010072924A1 (fr) | 2008-12-24 | 2009-12-22 | Dispositif pour la caracterisation de composants electriques ou electroniques |
US13/142,007 US20120092032A1 (en) | 2008-12-24 | 2009-12-22 | Device for characterising electric or electronic components |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR0807450A FR2940458B1 (fr) | 2008-12-24 | 2008-12-24 | Dispositif et procede pour la caracterisation de composants electriques ou electroniques. |
Publications (2)
Publication Number | Publication Date |
---|---|
FR2940458A1 FR2940458A1 (fr) | 2010-06-25 |
FR2940458B1 true FR2940458B1 (fr) | 2011-03-04 |
Family
ID=41134331
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
FR0807450A Expired - Fee Related FR2940458B1 (fr) | 2008-12-24 | 2008-12-24 | Dispositif et procede pour la caracterisation de composants electriques ou electroniques. |
Country Status (4)
Country | Link |
---|---|
US (1) | US20120092032A1 (fr) |
EP (1) | EP2382480A1 (fr) |
FR (1) | FR2940458B1 (fr) |
WO (1) | WO2010072924A1 (fr) |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US9177688B2 (en) * | 2011-11-22 | 2015-11-03 | International Business Machines Corporation | Carbon nanotube-graphene hybrid transparent conductor and field effect transistor |
CN103376359B (zh) * | 2012-04-26 | 2015-10-21 | 石家庄杰泰特动力能源有限公司 | 一种适用于新能源汽车的高压直流绝缘监测装置 |
AU2013252839B2 (en) | 2012-04-27 | 2015-09-17 | Boston Scientific Neuromodulation Corporation | Timing channel circuitry for creating pulses in an implantable stimulator device |
WO2023181341A1 (fr) * | 2022-03-25 | 2023-09-28 | ソニーセミコンダクタソリューションズ株式会社 | Puce semi-conductrice |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4816767A (en) * | 1984-01-09 | 1989-03-28 | Hewlett-Packard Company | Vector network analyzer with integral processor |
US5121067A (en) * | 1987-10-06 | 1992-06-09 | Board Of Regents Of Leland Stanford University | Directional sampling bridge |
US6936496B2 (en) * | 2002-12-20 | 2005-08-30 | Hewlett-Packard Development Company, L.P. | Nanowire filament |
-
2008
- 2008-12-24 FR FR0807450A patent/FR2940458B1/fr not_active Expired - Fee Related
-
2009
- 2009-01-22 EP EP09804285A patent/EP2382480A1/fr not_active Withdrawn
- 2009-12-22 WO PCT/FR2009/001472 patent/WO2010072924A1/fr active Application Filing
- 2009-12-22 US US13/142,007 patent/US20120092032A1/en not_active Abandoned
Also Published As
Publication number | Publication date |
---|---|
WO2010072924A1 (fr) | 2010-07-01 |
EP2382480A1 (fr) | 2011-11-02 |
FR2940458A1 (fr) | 2010-06-25 |
US20120092032A1 (en) | 2012-04-19 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
TQ | Partial transmission of property | ||
CD | Change of name or company name |
Owner name: COMMISSARIAT A L ENERGIE ATOMIQUE ET AUX ENERG, FR Effective date: 20150915 Owner name: UNIVERSITE DES SCIENCES ET TECHNOLOGIES DE LIL, FR Effective date: 20150915 |
|
TQ | Partial transmission of property |
Owner name: COMMISSARIAT A L ENERGIE ATOMIQUE ET AUX ENERG, FR Effective date: 20150915 Owner name: UNIVERSITE DES SCIENCES ET TECHNOLOGIES DE LIL, FR Effective date: 20150915 |
|
ST | Notification of lapse |
Effective date: 20160831 |